Amendment 1 - Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages

Specifies a small-scale laboratory screening procedure for comparing the relative burning behaviour of vertically or horizontally oriented specimens made from plastic and other non-metallic materials, exposed to a small-flame ignition source of 50 W nominal power.  These test methods determine the linear burning rate and the afterflame/afterglow times, as well as the damaged length of specimens.  Applicable to solid and cellular materials that have an apparent density of not less than 250 kg/m3, determined in accordance with ISO 845.  They do not apply to materials that shrink away from applied flame without igniting;  ISO 9773 should be used for thin flexible materials.  The test methods described provide classification systems which may be used for quality assurance, or the pre-selection of component materials of products.  May be used for the pre-selection of a material, providing positive results are obtained at a thickness equal to the smallest thickness used in the application.  Has the status of a basic safety publication in accordance with Guide 104.

Amendement 1 - Normalisation mécanique des dispositifs à semiconducteurs - Partie 4: Système de codification et classification en formes des structures des boîtiers pour dispositifs à semiconducteurs

Spécifie un mode opératoire de criblage à petite échelle en laboratoire pour comparer la réaction au feu relative d'éprouvettes, en position verticale ou horizontale, faites de plastiques ou autres matériaux non métalliques, exposées à une source d'allumage constituée d'une petite flamme, d'une puissance nominale de 50 W.  Les présentes méthodes d'essai déterminent la vitesse linéaire de combustion et les durées de flamme et d'incandescence résiduelles ainsi que la longeur endommagée des éprouvettes.  Elles sont applicables aux matériaux solides et alvéolaires ayant une masse volumique apparente supérieure ou égale à 250 kg/m3, déterminée conformément à l'ISO 845.  Elles ne sont pas applicables aux matériaux qui se retractent devant la flamme appliquée sans s'allumer.  Il convient d'utiliser l'ISO 9773 pour les matériaux minces et souples de cette sorte.  Les présentes méthodes d'essai fournissent des systèmes de classification qui peuvent être utilisés pour l'assurance de qualité ou la présélection des matériaux constitutifs des produits.  Les méthodes d'essai décrites peuvent être utilisées pour la présélection d'un matériau, sous réserve que des résultats acceptables soient obtenus sur une épaisseur d'éprouvette égale à la plus petite épaisseur utilisée dans l'application.  A le statut d'une publication fondamentale de sécurité conformément au Guide 104 de la CEI.

General Information

Status
Published
Publication Date
26-Mar-2018
Current Stage
PPUB - Publication issued
Start Date
09-Apr-2018
Completion Date
27-Mar-2018
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IEC 60191-4 ®
Edition 3.0 2018-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 1
AM ENDEMENT 1
Mechanical standardization of semiconductor devices –
Part 4: Coding system and classification into forms of package outlines for
semiconductor device packages
Normalisation mécanique des dispositifs à semiconducteurs –
Partie 4: Système de codification et classification en formes des structures des
boîtiers pour dispositifs à semiconducteurs

IEC 60191-4:2013-10/AMD1:2018-03(en-fr)

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IEC 60191-4 ®
Edition 3.0 2018-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 1
AM ENDEMENT 1
Mechanical standardization of semiconductor devices –

Part 4: Coding system and classification into forms of package outlines for

semiconductor device packages
Normalisation mécanique des dispositifs à semiconducteurs –

Partie 4: Système de codification et classification en formes des structures des

boîtiers pour dispositifs à semiconducteurs

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.080.01 ISBN 978-2-8322-5495-0

– 2 – IEC 60191-4:2013/AMD1:2018
© IEC 2018
FOREWORD
This amendment has been prepared by subcommittee 47D: Semiconductor devices packaging,
of IEC technical committee 47: Semiconductor devices.
The text of this amendment is based on the following documents:
CDV Report on voting
47D/897/CDV 47D/904/RVC
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
Add, after Annexes A and B, the following new Annex C:
Annex C
(informative)
Terminology of semiconductor package outlines
To prevent misuse, misunderstanding and confusion of terminology of semiconductor package
outline, correct terms and descriptions are required to be indicated in the international
standards.
Correct terms and descriptions of semiconductor package outline including package code
variations are listed in Table C.1.

© IEC 2018
Table C.1 – Package name and parts name
Classification Term Description
Package name Ball Grid Array Package A package with the balls or bumps
placed in a row of 3 x 3 or more, or in
(BGA)
grid, on the upper or lower side of its
body
Package name Low Profile Ball Grid Array Package BGA with the seated height of over
1,2 mm and up to 1,7 mm
(LBGA)
Package name Thin Ball Grid Array Package BGA with the seated height of over
1,0 mm and up to 1,2 mm
(TBGA)
Package name Very Thin Ball Grid Array Package BGA with the seated height of over
0,8 mm and up to 1,0 mm
(VBGA)
Package name Very-very Thin Ball Grid Array Package BGA with the seated height of over
0,65 mm and up to 0,8 mm
(WBGA)
Package name Ultra-thin Ball Grid Array Package BGA with the seated height of over
0,5 mm and up to 0,65 mm
(UBGA)
Package name Extra Thin Ball Grid Array Package BGA with the seated height of up to
0,5 mm
(XBGA)
Package name Heat Sink Ball Grid Array Package BGA with a heat sink
(HBGA)
Package name Heat Sink Low Profile Ball Grid Array Package LBGA with a heat sink
(HLBGA)
Package name Heat Sink Thin Ball Grid Array Package TBGA with a heat sink
(HTBGA)
Package name Heat Sink Very Thin Ball Grid Array Package VBGA with a heat sink
(HVBGA)
Package name Heat Sink Very-very Thin Ball Grid Array WBGA with a heat sink
Package
(HWBGA)
Package name Heat Sink Ultra-thin Ball Grid Array Package UBGA with a heat sink
(HUBGA)
Package name Heat Sink Extra Thin Ball Grid Array Package XBGA with a heat sink
(HXBGA)
Package name Fine Pitch Ball Grid Array Package BGA with the terminal pitch of up to
0,8 mm
(FBGA)
Package name Low Profile Fine Pitch Ball Grid Array Package FBGA with the seated height of over
1,2 mm and up to 1,7 mm
(LFBGA)
Package name Thin Fine Pitch Ball Grid Array Package FBGA with the seated height of over
1,0 mm and up to 1,2 mm
(TFBGA)
Package name Very Thin Fine Pitch Ball Grid Array Package FBGA with the seated height of over
0,8 mm and up to 1,0 mm
(VFBGA)
Package name Very-very Thin Fine Pitch Ball Grid Array FBGA with the seated height of over
Package 0,65 mm and up to 0,8 mm
(WFBGA)
– 4 – IEC 60191-4:2013/AMD1:2018
© IEC 2018
Classification Term Description
Package name Ultra-thin Fine Pitch Ball Grid Array Package FBGA with the seated height of over
0,5 mm and up to 0,65 mm
(UFBGA)
Package name Extra Thin Fine Pitch Ball Grid Array Package FBGA with the seated height of up to
0,5 mm
(XFBGA)
Package name Terminal for stack Fine Pitch Ball Grid Array FBGA with the terminals for layer stack
Package
(PFBGA)
Package name Terminal for stack Low Profile Fine Pitch Ball LFBGA with the terminals for layer stack
Grid Array Package
(PLFBGA)
Package name Terminal for stack Thin Fine Pitch Ball Grid TFBGA with the terminals for layer stack
Array Package
(PTFBGA)
Package name Terminal for stack Very Thin Fine Pitch Ball Grid VFBGA with the terminals for layer stack
Array Package
(PVFBGA)
Package name Terminal for stack Very-very Thin Fine Pitch WFBGA with the terminals for layer stack
Ball Grid Array Package
(PWFBGA)
Package name Terminal for stack Ultra-thin Fine Pitch Ball Grid UFBGA with the terminals for layer stack
Array Package
(PUFBGA)
Package name Terminal for stack Extra Thin Fine Pitch Ball XFBGA with the terminals for layer stack
Grid Array Package
(PXFBGA)
Package name Interstitial Ball Grid Array Package Interstitial BGA
(IBGA)
Package name Plastic Ball Grid Array Package Plastic BGA
(P-BGA)
Package name Ceramic Ball Grid Array Package Ceramic BGA
(C-BGA)
Package name Silicon Fine Pitch Ball Grid Array Package Silicon FBGA
(S-FBGA)
Package name Dual Inline Package A package with the leads extended from
the two sides of its body and used for
(DIP)
through-hole mounting
Package name Shrink Dual Inline Package Shrink DIP
(SDIP)
Package name Heat Sink Dual Inline Package DIP with a heat sink
(HDIP)
Package name Heat Sink Shrink Dual Inline Package SDIP with a heat sink
(HSDIP)
Package name Piggyback Dual Inline Package Piggyback DIP
(PDIP)
Package name Plastic Dual Inline Package Plastic DIP
(P-DIP)
© IEC 2018
Classification Term Description
Package name Ceramic Dual Inline Package Ceramic DIP
(C-DIP)
Package name Glass-Sealed Ceramic Dual Inline Package Glass-sealed ceramic DIP
(G-DIP)
Package name Glass-Sealed Ceramic Window Dual Inline Glass-sealed ceramic DIP with a window
Package
(G-DDIP)
Package name Dual Tape Carrier Package A package with the leads extended from
the two sides of its body and consisting
(DTP)
of the tapes
Package name Dual Tape Carrier Package Type 1 DTP Type-1
(DTP(1))
Package name Dual Tape Carrier Package Type 2 DTP Type-2
(DTP(2))
Package name Land Grid Array Package A package without pins and with the
lands placed in a row of 3 x 3 or more, or
(LGA)
in grid, on the upper or lower side of its
body
Package name Low Profile Land Grid Array Package LGA with the seated height of over
1,2 mm and up to 1,7 mm
(LLGA)
Package name Thin Land Grid Array Package LGA with the seated height of over
1,0 mm and up to 1,2 mm
(TLGA)
Package name Very Thin Land Grid Array Package LGA with the seated height of over
0,8 mm and up to 1,0 mm
(VLGA)
Package name Very-very Thin Land Grid Array Package LGA with the seated height of over
0,65 mm and up to 0,8 mm
(WLGA)
Package name Ultra-thin Land Grid Array Package LGA with the seated height of over
0,5 mm and up to 0,65 mm
(ULGA)
Package name Extra Thin Land Grid Array Package LGA with the seated height of up to
0,5 mm
(XLGA)
Package name Heat Sink Land Grid Array Package LGA with a heat sink
(HLGA)
Package name Heat Sink Low Profile Land Grid Array Package LLGA with a heat sink
(HLLGA)
Package name Heat Sink Thin Land Grid Array Package TLGA with a heat sink
(HTLGA)
Package name Heat Sink Very Thin Land Grid Array Package VLGA with a heat sink
(HVLGA)
Package name Heat Sink Very-very Thin Land Grid Array WLGA with a heat sink
Package
(HWLGA)
Package name Heat Sink Ultra-thin Land Grid Array Package ULGA with a heat sink
(HULGA)
Package name Heat Sink Extra Thin Land Grid Array Package XLGA with a heat sink
(HXLGA)
– 6 – IEC 60191-4:2013/AMD1:2018
© IEC 2018
Classifi
...

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