IEC 61300-3-47:2014
(Main)Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-47: Examinations and measurements - End face geometry of PC/APC spherically polished ferrules using interferometry
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-47: Examinations and measurements - End face geometry of PC/APC spherically polished ferrules using interferometry
IEC 61300-3-47:2014 describes a procedure to measure the end face geometry of a spherically polished ferrule or connector. Within this standard the words "ferrule" and "connector" can be used interchangeably.
Keywords: end face geometry, spherically polished ferrule or connector
Dispositifs d'interconnexion et composants passifs fibroniques - Procédures fondamentales d'essais et de mesures - Partie 3-47 : Examens et mesures - Géométrie de l’extrémité des férules PC/APC polies de façon sphérique par interférométrie
IEC 61300-3-47:2014 décrit une procédure de mesure de la géometrie de l'extrémité d'une férule ou d’un connecteur poli de façon sphérique. Dans la présente norme, les termes « férule » et « connecteur » peuvent être utilisés de manière interchangeable.
Mots clés: géométrie de l’extrémité, connecteur poli de façon sphérique ou férule
General Information
- Status
- Published
- Publication Date
- 23-Jul-2014
- Technical Committee
- SC 86B - Fibre optic interconnecting devices and passive components
- Drafting Committee
- WG 4 - TC 86/SC 86B/WG 4
- Current Stage
- PPUB - Publication issued
- Start Date
- 24-Jul-2014
- Completion Date
- 15-Aug-2014
Relations
- Effective Date
- 05-Sep-2023
- Effective Date
- 05-Sep-2023
- Effective Date
- 05-Sep-2023
- Effective Date
- 05-Sep-2023
- Effective Date
- 09-Feb-2026
Overview
IEC 61300-3-47:2014 specifies an interferometric procedure to examine and measure the end face geometry of PC/APC spherically polished ferrules or connectors. It defines how to record and compute critical geometry parameters (radius of curvature, apex offset, fibre height, end-face angle) using an optical interferometer combined with a microscope and camera. Within this standard the terms “ferrule” and “connector” are used interchangeably.
Key topics and technical requirements
- Measured parameters
- Radius of curvature (domed portion of the end face)
- Apex offset (distance between ferrule axis and dome vertex)
- Fibre height (average distance between the fibre end and a fitted virtual spherical surface)
- End-face angle, tilt and key angle for angled/flat polished ferrules
- Measurement system
- Interferometer (e.g., Michelson-type) producing interference fringes
- Ferrule/connector holder with axial alignment capability
- Microscope + camera with a minimum field of view of 250 µm; software for fringe analysis
- Calibration and performance requirements
- XY calibration (radius of curvature) uncertainty: better than ±0.1 mm for radii 5–30 mm
- Z calibration (fibre height) uncertainty: better than ±10 nm
- Apex offset repeatability: maximum difference < 5 µm when rotated 180° (non-angled ferrules)
- Tilt and key angle measurement uncertainty: typically better than ±0.03° (tilt) and ±0.1° (key) for flat polished ferrules
- Normative/Informative annexes
- Annex A: interferometer calibration procedures
- Annex B: measurement procedure for angled convex-polished ferrules
- Annex C: formulas for computing ferrule end-face geometry
Applications and who uses this standard
- Manufacturers of fibre optic connectors and ferrules - for production QC and process control
- Test laboratories and quality assurance teams - for acceptance testing and certification
- Design and R&D engineers - to validate polishing processes and connector performance
- Field service and failure analysis - to investigate connector end-face defects that affect optical performance Practical uses include ensuring physical contact quality, minimizing insertion loss/return loss variations, and verifying connector interchangeability.
Related standards
- This document is part of the IEC 61300 series (Fibre optic interconnecting devices and passive components – Basic test and measurement procedures). IEC 61300-3-47 consolidates and replaces several earlier parts (e.g., 3-15, 3-16, 3-17, 3-23).
Keywords: end face geometry, spherically polished ferrule or connector, interferometry, radius of curvature, apex offset, fibre height.
IEC 61300-3-47:2014 - Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-47: Examinations and measurements - End face geometry of PC/APC spherically polished ferrules using interferometry Released:7/24/2014 Isbn:9782832217085
IEC 61300-3-47:2014 - Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-47: Examinations and measurements - End face geometry of PC/APC spherically polished ferrules using interferometry
Get Certified
Connect with accredited certification bodies for this standard
TL 9000 QuEST Forum
Telecommunications quality management system.

ANCE
Mexican certification and testing association.

Intertek Slovenia
Intertek testing, inspection, and certification services in Slovenia.
Sponsored listings
Frequently Asked Questions
IEC 61300-3-47:2014 is a standard published by the International Electrotechnical Commission (IEC). Its full title is "Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-47: Examinations and measurements - End face geometry of PC/APC spherically polished ferrules using interferometry". This standard covers: IEC 61300-3-47:2014 describes a procedure to measure the end face geometry of a spherically polished ferrule or connector. Within this standard the words "ferrule" and "connector" can be used interchangeably. Keywords: end face geometry, spherically polished ferrule or connector
IEC 61300-3-47:2014 describes a procedure to measure the end face geometry of a spherically polished ferrule or connector. Within this standard the words "ferrule" and "connector" can be used interchangeably. Keywords: end face geometry, spherically polished ferrule or connector
IEC 61300-3-47:2014 is classified under the following ICS (International Classification for Standards) categories: 33.060.30 - Radio relay and fixed satellite communications systems; 33.180.20 - Fibre optic interconnecting devices. The ICS classification helps identify the subject area and facilitates finding related standards.
IEC 61300-3-47:2014 has the following relationships with other standards: It is inter standard links to IEC 61300-3-17:1999, IEC 61300-3-23:1998, IEC 61300-3-16:2003, IEC 61300-3-15:2006, EN 3745-306:2025. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
IEC 61300-3-47:2014 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
IEC 61300-3-47 ®
Edition 1.0 2014-07
INTERNATIONAL
STANDARD
colour
inside
Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures –
Part 3-47: Examinations and measurements – End face geometry of PC/APC
spherically polished ferrules using interferometry
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.
IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé Fax: +41 22 919 03 00
CH-1211 Geneva 20 info@iec.ch
Switzerland www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
IEC Catalogue - webstore.iec.ch/catalogue Electropedia - www.electropedia.org
The stand-alone application for consulting the entire The world's leading online dictionary of electronic and
bibliographical information on IEC International Standards, electrical terms containing more than 30 000 terms and
Technical Specifications, Technical Reports and other definitions in English and French, with equivalent terms in 14
documents. Available for PC, Mac OS, Android Tablets and additional languages. Also known as the International
iPad. Electrotechnical Vocabulary (IEV) online.
IEC publications search - www.iec.ch/searchpub IEC Glossary - std.iec.ch/glossary
The advanced search enables to find IEC publications by a More than 55 000 electrotechnical terminology entries in
variety of criteria (reference number, text, technical English and French extracted from the Terms and Definitions
committee,…). It also gives information on projects, replaced clause of IEC publications issued since 2002. Some entries
and withdrawn publications. have been collected from earlier publications of IEC TC 37,
77, 86 and CISPR.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Customer Service Centre - webstore.iec.ch/csc
details all new publications released. Available online and If you wish to give us your feedback on this publication or
also once a month by email. need further assistance, please contact the Customer Service
Centre: csc@iec.ch.
IEC 61300-3-47 ®
Edition 1.0 2014-07
INTERNATIONAL
STANDARD
colour
inside
Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures –
Part 3-47: Examinations and measurements – End face geometry of PC/APC
spherically polished ferrules using interferometry
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
Q
ICS 33.180.20 ISBN 978-2-8322-1708-5
– 2 – IEC 61300-3-47:2014 © IEC 2014
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Terms and definitions . 5
3 Measurement by interferometer . 7
3.1 General . 7
3.2 Ferrule/connector holder . 7
3.3 Optical interferometric system . 8
3.4 Microscope with camera. 8
4 Requirements for the interferometer . 8
4.1 XY calibration (radius of curvature) . 8
4.2 Z calibration (fibre height) . 8
4.3 Alignment of ferrule axis with the interferometer’s optical axis (apex offset
calibration) . 8
4.4 Tilt and key angle . 8
5 Measurement method . 8
5.1 General . 8
5.2 Measurement regions . 9
5.3 Measurement procedure for the radius of curvature . 9
5.4 Measurement procedure for the dome eccentricity (apex offset) . 10
5.5 Measurement procedure for fibre height . 10
6 Details to be specified . 13
Annex A (normative) Calibration for the interferometer . 14
A.1 XY calibration . 14
A.2 Z calibration . 14
A.3 Alignment of the ferule axis with the optical axis of the interferometer (“apex
offset calibration”) . 14
A.4 Tilt and key angle . 14
Annex B (informative) Measurement procedure for end face “angle error” of angled
convex polished ferrules . 15
Annex C (informative) Formula for calculating ferrule end face geometry . 17
Figure 1 – Radius of curvature of a spherically polished ferrule end face . 5
Figure 2 – Apex offset of a spherically polished ferrule end face . 6
Figure 3 – Fibre height of a spherically polished ferrule end face . 6
Figure 4 – Ferrule end face angle for spherically polished ferrules . 7
Figure 5 – Interferometer . 7
Figure 6 – Ferrule end face and measurement regions . 9
Figure 7 – Ferrule end face surface . 11
Figure 8 – Fitting region and averaging region of the ferrule end face surface . 11
Figure 9 – Converted end face surface of the ferrule . 12
Figure 10 – Converted ferrule end face surface without the extracting region . 12
Figure B.1 – Example of key error calculated from interference pattern for a convex
polished ferrule . 15
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIBRE OPTIC INTERCONNECTING
DEVICES AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –
Part 3-47: Examinations and measurements –
End face geometry of PC/APC spherically
polished ferrules using interferometry
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61300-3-47 has been prepared by subcommittee 86B: Fibre optic
interconnecting devices and passive components, of IEC technical committee 86: Fibre optics.
This standard merges IEC 61300-3-15, IEC 61300-3-16, IEC 61300-3-17 and IEC 61300-3-23.
After publication of this standard IEC 61300-3-15, IEC 61300-3-16, IEC 61300-3-17 and
IEC 61300-3-23 will be withdrawn.
– 4 – IEC 61300-3-47:2014 © IEC 2014
The text of this standard is based on the following documents:
FDIS Report on voting
86B/3773/FDIS 86B/3805/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 61300 series, published under the general title, Fibre optic
interconnecting and passive components – Basic test and measurement procedures, can be
found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
FIBRE OPTIC INTERCONNECTING
DEVICES AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –
Part 3-47: Examinations and measurements –
End face geometry of PC/APC spherically
polished ferrules using interferometry
1 Scope
This part of IEC 61300 describes a procedure to measure the end face geometry of a
spherically polished ferrule or connector. Within this standard the words “ferrule” and
“connector” can be used interchangeably.
2 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
2.1
radius of curvature
B
radius of curvature of the portion of the spherically polished ferrule end face which is domed
for physical contact
Note 1 to entry: It is assumed that the end face is spherical, although in practice the end face is often aspherical
(see Figure 1).
B
IEC
Figure 1 – Radius of curvature of a spherically polished ferrule end face
2.2
apex offset
C
distance between the axis of the ferrule and the line parallel to the axis which passes through
the vertex (or highest point on the dome), formed by spherically polishing the ferrul
...
IEC 61300-3-47 ®
Edition 1.0 2014-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures –
Part 3-47: Examinations and measurements – End face geometry of PC/APC
spherically polished ferrules using interferometry
Dispositifs d’interconnexion et composants passifs fibroniques – Procédures
fondamentales d’essais et de mesures –
Partie 3-47: Examens et mesures – Géométrie de l’extrémité des férules PC/APC
polies de façon sphérique par interférométrie
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.
Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de l'IEC ou du Comité national de l'IEC du pays du demandeur. Si vous avez des
questions sur le copyright de l'IEC ou si vous désirez obtenir des droits supplémentaires sur cette publication, utilisez
les coordonnées ci-après ou contactez le Comité national de l'IEC de votre pays de résidence.
IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.
IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org
The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,
variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English
committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.
and withdrawn publications. Also known as the International Electrotechnical Vocabulary
(IEV) online.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Glossary - std.iec.ch/glossary
details all new publications released. Available online and 67 000 electrotechnical terminology entries in English and
once a month by email. French extracted from the Terms and Definitions clause of
IEC publications issued since 2002. Some entries have been
IEC Customer Service Centre - webstore.iec.ch/csc collected from earlier publications of IEC TC 37, 77, 86 and
If you wish to give us your feedback on this publication or CISPR.
need further assistance, please contact the Customer Service
Centre: sales@iec.ch.
A propos de l'IEC
La Commission Electrotechnique Internationale (IEC) est la première organisation mondiale qui élabore et publie des
Normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.
A propos des publications IEC
Le contenu technique des publications IEC est constamment revu. Veuillez vous assurer que vous possédez l’édition la
plus récente, un corrigendum ou amendement peut avoir été publié.
Recherche de publications IEC - Electropedia - www.electropedia.org
webstore.iec.ch/advsearchform Le premier dictionnaire d'électrotechnologie en ligne au
La recherche avancée permet de trouver des publications IEC monde, avec plus de 22 000 articles terminologiques en
en utilisant différents critères (numéro de référence, texte, anglais et en français, ainsi que les termes équivalents dans
comité d’études,…). Elle donne aussi des informations sur les 16 langues additionnelles. Egalement appelé Vocabulaire
projets et les publications remplacées ou retirées. Electrotechnique International (IEV) en ligne.
IEC Just Published - webstore.iec.ch/justpublished Glossaire IEC - std.iec.ch/glossary
Restez informé sur les nouvelles publications IEC. Just 67 000 entrées terminologiques électrotechniques, en anglais
Published détaille les nouvelles publications parues. et en français, extraites des articles Termes et Définitions des
Disponible en ligne et une fois par mois par email. publications IEC parues depuis 2002. Plus certaines entrées
antérieures extraites des publications des CE 37, 77, 86 et
Service Clients - webstore.iec.ch/csc CISPR de l'IEC.
Si vous désirez nous donner des commentaires sur cette
publication ou si vous avez des questions contactez-nous:
sales@iec.ch.
IEC 61300-3-47 ®
Edition 1.0 2014-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures –
Part 3-47: Examinations and measurements – End face geometry of PC/APC
spherically polished ferrules using interferometry
Dispositifs d’interconnexion et composants passifs fibroniques – Procédures
fondamentales d’essais et de mesures –
Partie 3-47: Examens et mesures – Géométrie de l’extrémité des férules PC/APC
polies de façon sphérique par interférométrie
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.180.20 ISBN 978-2-8322-7188-9
– 2 – IEC 61300-3-47:2014 © IEC 2014
CONTENTS
CONTENTS . 2
FOREWORD . 3
1 Scope . 5
2 Terms and definitions . 5
3 Measurement by interferometer . 7
3.1 General . 7
3.2 Ferrule/connector holder . 7
3.3 Optical interferometric system . 8
3.4 Microscope with camera. 8
4 Requirements for the interferometer . 8
4.1 XY calibration (radius of curvature) . 8
4.2 Z calibration (fibre height) . 8
4.3 Alignment of ferrule axis with the interferometer’s optical axis (apex offset
calibration) . 8
4.4 Tilt and key angle . 8
5 Measurement method . 8
5.1 General . 8
5.2 Measurement regions . 8
5.3 Measurement procedure for the radius of curvature . 9
5.4 Measurement procedure for the dome eccentricity (apex offset) . 10
5.5 Measurement procedure for fibre height . 10
6 Details to be specified . 13
Annex A (normative) Calibration for the interferometer . 14
A.1 XY calibration . 14
A.2 Z calibration . 14
A.3 Alignment of the ferule axis with the optical axis of the interferometer (“apex
offset calibration”) . 14
A.4 Tilt and key angle . 14
Annex B (informative) Measurement procedure for end face “angle error” of angled
convex polished ferrules . 15
Annex C (informative) Formula for calculating ferrule end face geometry . 17
Figure 1 – Radius of curvature of a spherically polished ferrule end face . 5
Figure 2 – Apex offset of a spherically polished ferrule end face . 6
Figure 3 – Fibre height of a spherically polished ferrule end face . 6
Figure 4 – Ferrule end face angle for spherically polished ferrules . 7
Figure 5 – Interferometer . 7
Figure 6 – Ferrule end face and measurement regions . 9
Figure 7 – Ferrule end face surface . 11
Figure 8 – Fitting region and averaging region of the ferrule end face surface . 11
Figure 9 – Converted end face surface of the ferrule . 12
Figure 10 – Converted ferrule end face surface without the extracting region . 12
Figure B.1 – Example of key error calculated from interference pattern for a convex
polished ferrule . 15
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIBRE OPTIC INTERCONNECTING
DEVICES AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –
Part 3-47: Examinations and measurements –
End face geometry of PC/APC spherically
polished ferrules using interferometry
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61300-3-47 has been prepared by subcommittee 86B: Fibre optic
interconnecting devices and passive components, of IEC technical committee 86: Fibre optics.
This standard merges IEC 61300-3-15, IEC 61300-3-16, IEC 61300-3-17 and IEC 61300-3-23.
After publication of this standard IEC 61300-3-15, IEC 61300-3-16, IEC 61300-3-17 and
IEC 61300-3-23 will be withdrawn.
– 4 – IEC 61300-3-47:2014 © IEC 2014
This bilingual version (2019-07) corresponds to the English version, published in 2014-07.
The text of this standard is based on the following documents:
FDIS Report on voting
86B/3773/FDIS 86B/3805/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 61300 series, published under the general title, Fibre optic
interconnecting and passive components – Basic test and measurement procedures, can be
found on the IEC website.
The French version of this standard has not been voted upon.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
FIBRE OPTIC INTERCONNECTING
DEVICES AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –
Part 3-47: Examinations and measurements –
End face geometry of PC/APC spherically
polished ferrules using interferometry
1 Scope
This part of IEC 61300 describes a procedure to measure the end face geometry of a
spherically polished ferrule or connector. Within this standard the words “ferrule” and
“connector” can be used interchangeably.
2 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
2.1
radius of curvature
B
radius of curvature of the portion of the spherically polished ferrule end face which is domed
for physical contact
Note 1 to entry: It is assumed that the end face is spherical, although in practice the end face is often aspherical
(see Figure 1).
Figure 1 – Radius of curvature of a spherically polished ferrule end face
2.2
apex offset
C
distance between the axis of the ferrule and the line parallel to the axis which passes through
the vertex (or highest point on the dome), formed by spherically polishing the ferrule, as
shown in Figure 2
– 6 – IEC 61300-3-47:2014 © IEC 2014
Figure 2 – Apex offset of a spherically polished ferrule end face
2.3
fibre height
average distance between the fibre end face and a virtual spherical surface which is fitted to
the spherically polished ferrule end face (see Annex C)
Note 1 to entry: It is assumed that a circular region of the ferrule end face, which is centred to the ferrule axis, is
spherical although in practice the end face is often aspherical. A positive value indicates fibre undercut (see
Figure 3a). A negative value indicates fibre protrusion (see Figure 3b).
Figure 3a – Fibre height +A
Figure 3b – Fibre height –A (protrusion)
Figure 3 – Fibre height of a spherically polished ferrule end face
2.4
end face angle
angle (θ) between the plane perpendicular to the axis of the ferrule, and the straight line
tangent to the polished surface at the fibre centre in the direction of the nominal angle (see
Figure 4)
Figure 4 – Ferrule end face angle for spherically polished ferrules
3 Measurement by interferometer
3.1 General
A typical interferometer configuration is shown in Figure 5. The apparatus consists of a
suitable ferrule/connector holder, an optical interferometric system combined with a
microscope and a camera.
Figure 5 – Interferometer
3.2 Ferrule/connector holder
This is a suitable device to hold the ferrule/connector in a fixed alignment position with
respect to the optical axis of the interferometer. The holder is designed such that the portion
of the ferrule closest to the end face is secured by the holder. The ferrule shall be aligned by
holding it over a distance of at least twice the ferrule diameter. The ferrules axis should be
adjustable in order to make it parallel to the optical axis of the interferometer. Alternatively,
this can be carried out by positioning the reference mirror of the interferometer. For angled
polished ferrules adjustments are necessary to align the polish angle axis with the optical axis
of the interferometer.
– 8 – IEC 61300-3-47:2014 © IEC 2014
3.3 Optical interferometric system
A suitable optical interferometric system (for example a Michelson interferometer) displays an
image with interference fringes of the ferrule’s end face.
3.4 Microscope with camera
The image of the end face is projected on to the camera with a minimum field of view of
250 µm. Software processes the image(s) and calculates the required parameters.
4 Requirements for the interferometer
4.1 XY calibration (radius of curvature)
The interferometer shall have the ability to measure the radius of curvature with measurement
uncertainty better than ±0,1 mm for radii from 5 mm to 30 mm. See Annex A.
4.2 Z calibration (fibre height)
The interferometer shall have the ability to measure the fibre height with measurement
uncertainty better than ±10 nm. See Annex A.
4.3 Alignment of ferrule axis with the interferometer’s optical axis (apex offset
calibration)
The interferometer shall have the ability to measure the apex offset with a maximum
difference of less than 5 µm between two measurements where the second measurement is
made after rotating the ferrule by 180°. See Annex A.
NOTE This test is only possible with non-angled ferrules.
4.4 Tilt and key angle
When measuring angled connectors, calibration of the holder position is required.
Measurement of a flat polished ferrule should have a measurement uncertainty better than
±0,1° for the key angle and ±0,03° for the tilt angle.
NOTE The key angle is the angular rotational misalignment between the ferrule mating surface of an angled end
face connector, and its design orientation angle with respect to its key (see Annex B).
5 Measurement method
5.1 General
For all measurements, the instrument should be adjusted such that
a) a sample is placed in the measurement holder,
b) the image of the ferrule end face in the fibre zone is seen on the monitor,
c) the interference fringes appear on the ferrule end face,
d) the ferrule axis is correctly aligned with the optical axis of the interferometer (“apex offset
calibration”),
e) all other instrument calibrations have been performed,
f) the system is configured according to the type of measurement to be performed (e.g. PC
or APC ferrule/connector).
5.2 Measurement regions
Three regions shall be defined on the ferrule end face for the measurement (see Figure 6).
a) Fitting region: the fitting region is set on the ferrule surface, and defined by a circular
region having a diameter, D, minus a circular region having a diameter, E, (the extracting
region). The fitting region shall be defined in order to cover the contact zone of the ferrule
end face when the ferrule is mated.
b) Extracting region: the extracting region, which includes the fibre end face region and the
adhesive region, is defined by a circle having a diameter E.
c) Averaging region: the averaging region is set on the fibre surface, and defined by a
circular region “having a diameter F”. This region is used for fibre height A averaging.
The 3 regions should be concentric on the ferrule axis. For connectors with 125 µm nominal
fibre diameter and a radius of curvature of nominally 5 mm to 30 mm, the values of the
diameters D, E and F are as follows:
D = 250 µm
E = 140 µm
F = 50 µm
Figure 6 – Ferrule end face and measurement regions
5.3 Measurement procedure for the radius of curvature
The following steps shall be taken:
a) Measure the surface of the end face with the interferometer, recording the three-
dimensional surface measurement data on its surface data processing unit (see Figure 7).
– 10 – IEC 61300-3-47:2014 © IEC 2014
b) Correct the surface data, taking into account the refractive indices and the absorption
coefficients of the fibre and the ferrule.
c) Using the data from the fitting regions, calculate the “best fit” radius of curvature
(Annex C).
5.4 Measurement procedure for the dome eccentricity (apex offset)
The following steps shall be taken:
a) Measure the surface of the end face with the interferometer, recording the three-
dimensional surface measurement data on its surface data processing unit (see Figure 7).
b) Correct the surface data, taking into account the refractive indices and the absorption
coefficients of the fibre and the ferrule.
c) From the analysis of the interference image(s) the normal distance between the centre of
the sphere (Annex C) fitted to the surface over the fitting region and the fibre axis shall be
measured. This value corresponds to the apex offset.
5.5 Measurement procedure for fibre height
The following steps shall be taken:
a) Measure the surface of the end face with the interferometer, recording the three-
dimensional surface measurement data on its surface data processing unit (see Figure 7).
b) Correct the surface data, taking into account the refractive indices and the absorption
coefficients of the fibre and the ferrule.
c) Using only the data within the averaging region and the fitting region evaluate A (see
Figure 7 to Figure 10 and Annex C).
The calculation shall be as follows:
1) Create a converted surface from the corrected surface data by subtracting the “best fit”
radius of curvature from the spherical surface data between the fitting region. The fitting
region of the converted surface may be flat when the ferrule end face has an ideal
spherical surface (See Figure 9).
2) Calculate an average surface height on the fibre averaging region and an average surface
height on the fitted ferrule portion from the converted surface. The fibre height, A, is
measured as the difference between the two average surface heights, as shown in
Figure 10. A positive value indicates fibre undercut. A negative value indicates fibre
protrusion.
Figure 7 – Ferrule end face surface
Figure 8 – Fitting region and averaging region of the ferrule end face surface
– 12 – IEC 61300-3-47:2014 © IEC 2014
Figure 9 – Converted end face surface of the ferrule
Figure 10 – Converted ferrule end face surface without the extracting region
The difference in refractive indices and the absorption coefficients between the ferrule and
the fibre should be taken into account when processing the measured surface data. If the
procedure is done without consideration of the difference, the procedure described in this
clause may not accurately show the fibre undercut or protrusion.
6 Details to be specified
The following details, as applicable, shall be specified in the relevant specification:
– Type of interferometry;
– Nominal angle of tilt, e.g. PC/APC;
– Instrument configuration (keying adapter, ferrule holder, etc.);
– Rotational tolerance of the ferrule position in the holder (key angular error);
– Any deviation from this method;
– Measurement uncertainty.
– 14 – IEC 61300-3-47:2014 © IEC 2014
Annex A
(normative)
Calibration for the interferometer
A.1 XY calibration
An XY calibration is required when the requirements of Clause 4 cannot be met.
The interferometer shall be calibrated in XY directions (if a Z calibration has already been
performed beforehand), by measuring an artifact with a spherical surface – previously
measured with a mechanical method. Example: contact gauge.
Alternatively an etched wafer with a calibrated grid pattern for the XY calibration can be used.
A.2 Z calibration
If the interferometer is based on the monochromatic phase-shifting method: use a step height
artifact with a nominal step height less than one-quarter of the wavelength of the light source
used in the interferometer.
If the interferometer uses the white-light interferometry method, use step height artifact with a
nominal step height of approximately one-quarter to three-quarters of the Z scanning range of
the interferometer.
A.3 Alignment of the ferule axis with the optical axis of the interferometer
(“apex offset calibration”)
The calibration for non-angled PC connectors is to measure the apex offset positions while
rotating the ferrule by (for example) 60° steps and calculating the centre made by the 6 apex
offset measurements by fitting a circle using the least-square fit method. Once calculated,
translate this point to the centre of the fibre by aligning the ferrule/connector holder or the
reference mirror of the interferometer. For angled connectors, see Clause A.4.
A.4 Tilt and key angle
Tilt and key angle calibration is required when angled connectors are measured and the
requirements of 4.4 cannot be met.
Two methods are used (reference procedure is b):
a) Calibrate the instrument as per Clause A.3 then rotate the connector holder or the optical
system by a calibrated nominal angle (e.g. 8°).
b) Calibrate the holder or mirror orientation with an artifact measured with a mechanical
method. Example: contact gauge. This artifact should simulate a connector with its
orientation key and compose of a flat tilted surface. For the key error compensation, a
software based compensation may be used.
Annex B
(informative)
Measurement procedure for end face “angle error”
of angled convex polished ferrules
For a convex polished ferrule, the radius of curvature, B, and the apex offset component in
the direction of the angle K are calculated from the analysis of the interferometric fringes (see
Figure B.1). The value of the angle error is calculated from the value of B and K (Equation
x
[B.1]). The value of the key error is calculated from the values of B and K (Equation [B.2]).
y
When measuring angled convex polished ferrules, in addition to tilting the connector with
respect to the interferometer, an adapter or keying mechanism should also be installed on the
interferometer. This keying mechanism is designed to constrain the rotational orientation of
the ferrule with respect to its k
...








Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.
Loading comments...