This document specifies the mathematical processing of digitized transverse profile measurements to produce indices in the transverse direction for unevenness, other defects and crossfall. The document describes the calculation methods of the indices, such as irregularities, (1) rut depth, (2) ridge height, (3) water depth and area, (4) crossfall, and how to evaluate and report the indices. It also describes possibilities to do further analysis to examine defects and problems on the road that can be seen in the transverse profile. The latter is described in Annex E.

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This document specifies the method for non-destructive thickness measurement via the magnetic type of electrodeposited nickel coatings, also called “e-nickel”, on magnetic or non-magnetic substrates.
It is possible that the method is not applicable to autocatalytic (electroless) nickel coatings, since these coatings are often non-magnetic due to their chemical composition.
For the purposes of this document, two types of substrates are distinguished:
a)       nickel coatings on magnetic substrates (type A coatings);
b)       nickel coatings on non-magnetic substrates (type B coatings).
Not all instruments are applicable to both types of coating.
The effective measuring ranges of instruments using the principle of magnetic attraction are up to 50 µm for type A coatings and up to 25 µm for type B coatings.
For instruments using the principle of reluctance, the effective ranges are much greater, up to 1 mm or even more. This method is applicable to both types of coatings.

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This document defines the terminology and develops concepts for profile morphological segmentation. In particular it specifies the watershed segmentation method, the Wolf pruning method and the crossing-the-line method. This document assumes a continuous surface.

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This document specifies the design and metrological characteristics of phase shifting interferometry (PSI) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies the design and metrological characteristics of point autofocus probe (PAP) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies the design, metrological characteristics and nominal characteristics of contact stylus instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies the design and metrological characteristics of coherence scanning interferometry (CSI) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies the design and metrological characteristics of a particular non-contact instrument for measuring surface texture using a confocal chromatic probe based on axial chromatic aberration of white light. Additional metrological characteristics can be found in ISO 25178-600. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies robust Gaussian regression filters for the filtration of surface profiles. It defines, in particular, how to separate large- and small-scale lateral components of surface profiles with protruding dales and hills.
The concept presented for closed profiles are applicable to the case of roundness filtering. Where appropriate, these concept can be extended to generalized closed profiles, especially for surface profiles with re-entrant features.

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This document defines the terminology and develops concepts for profile morphological segmentation. In particular it specifies the watershed segmentation method, the Wolf pruning method and the crossing-the-line method. This document assumes a continuous surface.

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This document specifies linear Gaussian filters for the filtration of surface profiles. It defines, in particular, how to separate large- and small-scale lateral components of surface profiles.
The concept presented for closed profiles are applicable to the case of roundness filtration. Where appropriate, these concept can be extended to generalized closed profiles, especially for surface profiles with re-entrant features.
Implementation details are given in Annex A for open profiles and Annex B for closed profiles.

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This document defines the terminology and develops concepts for profile morphological segmentation. In particular it specifies the watershed segmentation method, the Wolf pruning method and the crossing-the-line method. This document assumes a continuous surface.

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This document specifies the design and metrological characteristics of a particular non-contact instrument for measuring surface texture using a confocal chromatic probe based on axial chromatic aberration of white light. Additional metrological characteristics can be found in ISO 25178-600. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies the design and metrological characteristics of phase shifting interferometry (PSI) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies the design and metrological characteristics of coherence scanning interferometry (CSI) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies the design and metrological characteristics of point autofocus probe (PAP) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies the design, metrological characteristics and nominal characteristics of contact stylus instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies robust Gaussian regression filters for the filtration of surface profiles. It defines, in particular, how to separate large- and small-scale lateral components of surface profiles with protruding dales and hills.
The concept presented for closed profiles are applicable to the case of roundness filtering. Where appropriate, these concept can be extended to generalized closed profiles, especially for surface profiles with re-entrant features.

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This document specifies the design, metrological characteristics and nominal characteristics of contact stylus instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies the design and metrological characteristics of phase shifting interferometry (PSI) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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    19 pages
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This document specifies the design and metrological characteristics of point autofocus probe (PAP) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies the design and metrological characteristics of coherence scanning interferometry (CSI) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from surface topography data, the methods described in this document are also applicable to profiling measurements.

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    24 pages
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This document specifies the design and metrological characteristics of a particular non-contact instrument for measuring surface texture using a confocal chromatic probe based on axial chromatic aberration of white light. Additional metrological characteristics can be found in ISO 25178-600. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies linear Gaussian filters for the filtration of surface profiles. It defines, in particular, how to separate large- and small-scale lateral components of surface profiles.
The concept presented for closed profiles are applicable to the case of roundness filtration. Where appropriate, these concept can be extended to generalized closed profiles, especially for surface profiles with re-entrant features.
Implementation details are given in Annex A for open profiles and Annex B for closed profiles.

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This document specifies robust Gaussian regression filters for the filtration of surface profiles. It defines, in particular, how to separate large- and small-scale lateral components of surface profiles with protruding dales and hills. The concept presented for closed profiles are applicable to the case of roundness filtering. Where appropriate, these concept can be extended to generalized closed profiles, especially for surface profiles with re-entrant features.

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This document specifies linear Gaussian filters for the filtration of surface profiles. It defines, in particular, how to separate large- and small-scale lateral components of surface profiles. The concept presented for closed profiles are applicable to the case of roundness filtration. Where appropriate, these concept can be extended to generalized closed profiles, especially for surface profiles with re-entrant features. Implementation details are given in Annex A for open profiles and Annex B for closed profiles.

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This part of the EN 13523 series specifies the procedure for evaluating the behaviour of an organic coating on a metallic substrate during and after outdoor exposure. Panel design, preparation and the procedure for outdoor exposure are performed in accordance with EN 13523 19.
After washing of the panel, some dirt can remain on the panel. This remaining dirt can influence the accuracy and precision of readings of gloss and colour, performed on exposed panels, although carried out in accordance with the standards. Unlike other precise measurements, the objective of this European Standard is to report on trends in the corrosion and/or paint degradation behaviour of coil coated panels.

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This part of The EN 13523 series specifies the procedures for determining the resistance to salt spray (fog) of an organic coating on a metallic substrate (coil coating).
For steel, neutral salt spray (fog) is usually used, and for aluminium, acetic acid salt spray (fog).

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This document specifies the procedure for determining the resistance of an organic coating on a metallic substrate to penetration by scratching with a needle.
It is possible that with some aluminium alloys and thin gauge steel substrate below 0,4 mm, that rather than scratching, the needle will deform the substrate. Under these conditions, this test method is not applicable.
Soft coatings such as poly vinyl chloride (PVC) and structured coatings will not give a precise result due to the soft nature of the coating and/or the potential for the needle to snag.
The method is not applicable to conductive coatings.

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This document specifies the procedures for determining the dry-film thickness of an organic coating on a metallic substrate (coil coating).
Five appropriate methods are given in this document:
a)   magnetic induction;
b)   eddy current;
c)   micrometer;
d)   optical;
e)   ruggedized optical interference.
The methods are applicable only to products with smooth and flat substrates, but the coating itself can be textured. In that case, for methods a) and b), the average of a series of readings will represent an average of the thickness of the organic coating, while method c) will give the maximum thickness, method d) can provide the minimum, maximum and average thickness, and e) will give the total thickness.
Non-destructive continuous-web methods on measurement of dry-film thickness are only applicable on method a).

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This document specifies the procedures for determining the dry-film thickness of an organic coating on a metallic substrate (coil coating).
Five appropriate methods are given in this document:
a)   magnetic induction;
b)   eddy current;
c)   micrometer;
d)   optical;
e)   ruggedized optical interference.
The methods are applicable only to products with smooth and flat substrates, but the coating itself can be textured. In that case, for methods a) and b), the average of a series of readings will represent an average of the thickness of the organic coating, while method c) will give the maximum thickness, method d) can provide the minimum, maximum and average thickness, and e) will give the total thickness.
Non-destructive continuous-web methods on measurement of dry-film thickness are only applicable on method a).

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This document reviews methods for measuring the thickness of metallic and other inorganic coatings on both metallic and non-metallic substrates (see Tables 1, A.1 and A.2). It is limited to tests already specified, or to be specified, in International Standards and excludes certain tests that are used for special applications.

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This document reviews methods for measuring the thickness of metallic and other inorganic coatings on both metallic and non-metallic substrates (see Tables 1, A.1 and A.2). It is limited to tests already specified, or to be specified, in International Standards and excludes certain tests that are used for special applications.

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This document provides information on a generalized version of the linear spline filter for uniform and non-uniform sampling and the robust spline filters for surface profiles. It supplements ISO 16610-22, ISO 16610-30 and ISO 16610-31. This document provides information on how to apply the robust estimation to the spline filter as specified in ISO 16610-22, as well as its generalized form for non-uniform sampling. The weight function chosen for the M-estimator is the Tukey biweight influence function as specified in ISO 16610-31.

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This document specifies the characteristics of a linear areal spline filter with a global shape retainment.

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This document describes the procedure for determining objectively the chalking resulting from natural or artificial weathering of an organic coating on a metallic substrate.
The advantage of this procedure for measuring chalking of an organic coating is that the result can be read off immediately on an instrument. Subjective judgement by visual comparison of test specimens with reference specimens is not necessary.
Reproducible results can only be obtained by careful execution of the test. Special attention is paid to the adhesive tape and its application to the test surface.
The test method is not applicable to embossed coatings. In the case of textured coatings, the degree of texture will influence readings. Also, dirt collection can influence readings on outdoor weathered specimens.
NOTE   Different methods for assessing chalking are in use. The results of these different methods are not comparable.

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This document specifies the characteristics of a linear areal spline filter with a global shape retainment.

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This document specifies the characteristics of a linear areal spline filter with a global shape retainment.

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This document specifies generic procedures for the calibration, adjustment and verification of metrological characteristics that areal topography measuring instruments have in common, as stated in ISO 25178-600.
Because surface profiles can be extracted from surface topography images, most of the methods described in this document can be adapted to profiling instruments.
Instrument-specific issues are not covered by this document. For example, for instruments based on mechanical probing where the probe follows an additional arcuate motion, additional measures are specified in ISO 25178-701.
This document does not include procedures for area-integrating methods, although those are also stated in ISO 25178-6. For example, light scattering belongs to a class of techniques known as area-integrating methods for measuring surface topography.

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This document specifies generic procedures for the calibration, adjustment and verification of metrological characteristics that areal topography measuring instruments have in common, as stated in ISO 25178-600.
Because surface profiles can be extracted from surface topography images, most of the methods described in this document can be adapted to profiling instruments.
Instrument-specific issues are not covered by this document. For example, for instruments based on mechanical probing where the probe follows an additional arcuate motion, additional measures are specified in ISO 25178-701.
This document does not include procedures for area-integrating methods, although those are also stated in ISO 25178-6. For example, light scattering belongs to a class of techniques known as area-integrating methods for measuring surface topography.

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This document specifies generic procedures for the calibration, adjustment and verification of metrological characteristics that areal topography measuring instruments have in common, as stated in ISO 25178-600. Because surface profiles can be extracted from surface topography images, most of the methods described in this document can be adapted to profiling instruments. Instrument-specific issues are not covered by this document. For example, for instruments based on mechanical probing where the probe follows an additional arcuate motion, additional measures are specified in ISO 25178-701. This document does not include procedures for area-integrating methods, although those are also stated in ISO 25178-6. For example, light scattering belongs to a class of techniques known as area-integrating methods for measuring surface topography.

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This document specifies a method for non-destructive measurements of the thickness of conductive coatings on non-conductive base materials. This method is based on the principle of the sheet resistivity measurement and is applicable to any conductive coatings and layers of metal and semiconductor materials. In general, the probe has to be adjusted to the conductivity and the thickness of the respective application. However, this document focuses on metallic coatings on non-conductive base materials (e.g. copper on plastic substrates, printed circuit boards).
This method is also applicable to thickness measurements of conductive coatings on conductive base materials, if the resistivity of the coating and the base material is significantly different. However, this case is not considered in this document.

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This document specifies a method for non-destructive measurements of the thickness of conductive coatings on non-conductive base materials. This method is based on the principle of the sheet resistivity measurement and is applicable to any conductive coatings and layers of metal and semiconductor materials. In general, the probe has to be adjusted to the conductivity and the thickness of the respective application. However, this document focuses on metallic coatings on non-conductive base materials (e.g. copper on plastic substrates, printed circuit boards).
This method is also applicable to thickness measurements of conductive coatings on conductive base materials, if the resistivity of the coating and the base material is significantly different. However, this case is not considered in this document.

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This document specifies a procedure for evaluating the resistance to continuous condensation of an organic coating on a metallic substrate, by means of exposure in a humidity cabinet under controlled conditions.

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This document specifies the procedure for determining the resistance to water immersion of an organic coating on a metallic substrate.
The test is applicable to all kinds of organic coatings, including metallics and embossed, textured, pearlescent and printed coatings. The results of the test give an indication of the resistance of the coil coated metal to water.
The method is not intended to reproduce any particular condition of condensation.

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This document specifies a procedure for evaluating the resistance to humidity of an organic coating on a metallic substrate, by means of exposure in a humidity cabinet under controlled conditions.

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This document specifies parameters for the determination of surface texture by areal methods.

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This document specifies test methods for determining the slip resistance of surfaces used by pedestrians.
NOTE   It is also possible to use this document for measurements where persons might walk on trafficked areas.

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This document establishes definitions and evaluation methods for wheel-rail contact geometry parameters influencing the vehicle running dynamic behaviour:
-   the rolling radius difference between the two wheels of a wheelset (Δr-function) which serves as a basis for all further calculations;
-   the equivalent conicity function from which are derived:
-   a single equivalent conicity value for a specified amplitude which is relevant for the assessment of vehicle running stability on straight track and in very large radius curves according to EN 14363;
-   the nonlinearity parameter which characterizes the shape of this function and is related to the vehicle behaviour particularly in the speed range close to the running stability limit;
-   the rolling radii coefficient which is used to describe the theoretical radial steering capability of a wheelset in a curved track.
Additional information is given about the relationship between the contact angles of the two wheels of a wheelset (Δtanγ-function) and about the roll angle parameter.
NOTE   Out of the presented parameters only those related to the contact angle are relevant for independently rotating wheels of wheel pairs.
Descriptions of possible calculation methods are included in this document. Test case calculations are provided to achieve comparable results and to check the proper implementation of the described algorithms.
To validate alternative methods not described in this document acceptance criteria are given for the equivalent conicity function. This includes reference profiles, profile combinations, tolerances and reference results with tolerance limits.
This document also includes minimum requirements for the measurement of wheel and rail profiles as well as of the parameters needed for the transformation into a common coordinate system of right- and left-hand profiles.
This document does not define limits for the wheel-rail contact geometry parameters and gives no tolerances for the rail profile and the wheel profile to achieve acceptable results.
For the application of this document some general recommendations are given.

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