IEC 62431:2008
(Main)Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measurement methods
Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measurement methods
IEC 62431:2008 specifies the measurement methods for the reflectivity of electromagnetic wave absorbers (EMA) for the normal incident, oblique incident and each polarized wave in the millimetre-wave range. In addition, these methods are also equally effective for the reflectivity measurement of other materials:
- measurement frequency range: 30 GHz to 300 GHz;
- reflectivity: 0 dB to -50 dB;
- incident angle: 0° to 80°. It replaces and cancels IEC/PAS 62431. This bilingual version published in 2011-11, corresponds to the English version published in 2008-07.
Reflectivité des absorbeurs d'ondes électromagnétiques dans la plage des fréquences des ondes millimétriques - Méthodes de mesure
La CEI 62431:2008 spécifie les méthodes de mesure de la réflectivité des absorbeurs d'ondes électromagnétiques (EMA: Electromagnetic Wave Absorber) pour une onde incidente normale, une onde incidente oblique et toute onde polarisée dans la plage des ondes millimétriques. En outre, ces méthodes sont aussi valables pour la mesure de réflectivité d'autres matériaux:
- plage des fréquences de mesure: 30 GHz à 300 GHz;
- réflectivité: 0 dB à -50 dB;
- angle d'incidence: 0° à 80°. La norme CEI 62431 annule et remplace le IEC/PAS. La présente version bilingue correspond à la version anglaise monolingue publiée en 2008-07.
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IEC 62431
Edition 1.0 2008-07
INTERNATIONAL
STANDARD
Reflectivity of electromagnetic wave absorbers in millimetre wave frequency –
Measurement methods
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
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International Standards for all electrical, electronic and related technologies.
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IEC 62431
Edition 1.0 2008-07
INTERNATIONAL
STANDARD
Reflectivity of electromagnetic wave absorbers in millimetre wave frequency –
Measurement methods
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
XA
ICS 19.080; 17.120; 29.120.10 ISBN 2-8318-9895-1
– 2 – 62431 © IEC:2008(E)
CONTENTS
FOREWORD.5
1 Scope.7
2 Normative references .7
3 Terms, definitions and acronyms .7
3.1 Terms and definitions .7
3.2 Acronyms and symbols.10
4 Specimen .12
4.1 Specimen specification.12
4.2 Reference metal plate .12
4.2.1 Material and thickness.12
4.2.2 Surface roughness .12
4.2.3 Flatness .12
4.2.4 Size and shape.12
4.3 Reference specimen for calibration .12
5 Specimen holder .13
6 Measurement equipment .13
6.1 Type of network analyzer .13
6.2 Antenna .13
6.2.1 Horn antenna.13
6.2.2 Lens antenna.13
6.3 Amplifier.13
6.4 Cable .14
7 Measurement condition .14
7.1 Temperature and environment.14
7.2 Warming up of measurement equipment.14
7.3 Electromagnetic environment .14
8 Calibration of measurement system and measurement conditions .14
8.1 Calibration of measurement system.14
8.2 Measurement conditions.14
8.2.1 Dynamic range .14
8.2.2 Setting up of the network analyzer for keeping adequate dynamic
range.14
9 Horn antenna method .15
9.1 Measurement system .15
9.1.1 Configuration of the measurement system .15
9.1.2 Horn antenna.16
9.1.3 Specimen holder.16
9.1.4 Mounting of the specimen.18
9.1.5 Antenna stand .18
9.2 Measurement conditions.18
9.2.1 Measurement environment .18
9.2.2 Measuring distance .18
9.2.3 Size of specimen .18
9.3 Measurement procedures .19
10 Dielectric lens antenna method – focused beam method .20
10.1 Outline .20
62431 © IEC:2008(E) – 3 –
10.2 Measurement system .20
10.2.1 Transmitting and receiving antennas .20
10.2.2 Focused beam horn antenna .21
10.2.3 Specimen size .22
10.2.4 Reference metal plate size .22
10.2.5 Specimen holder.22
10.2.6 Method of fixing the specimen and the reference metal plate.23
10.3 Measurement procedures .23
11 Dielectric lens antenna method – parallel beam method .25
11.1 Principle.25
11.1.1 Outline .25
11.1.2 Parallel EM wave beam formed using a EM wave lens.25
11.2 Measurement system .26
11.2.1 Composition of measurement system .26
11.2.2 Dielectric lens antenna .29
11.3 Specimen .29
11.3.1 General .29
11.3.2 Reference metal plate .29
11.3.3 Size of specimen .30
11.4 Measurement procedures .30
11.4.1 Normal incidence.30
11.4.2 Oblique Incidence.30
12 Test report.31
Annex A (informative) Reflection and scattering from metal plate – Horn antenna
method .33
Annex B (informative) Reflectivity of reference specimens using horn antenna method.38
Annex C (informative) Specifications of commercially available antennas .39
Annex D (normative) Calibration using VNA.42
Annex E (informative) Dynamic range and measurement errors .51
Annex F (informative) Enlargement of dynamic range – Calibration by isolation .53
Annex G (informative) Relative permittivity of styrofoam and foamed polyethylene
based on foam ratio .54
Annex H (informative) Calculation of Fraunhofer region – Horn antenna method.55
Figure 1 – Definition of reflectivity.10
Figure 2 – Configuration of the measurement system normal incidence (S ).15
Figure 3 – Configuration of the measurement system oblique incidence (S ) .16
Figure 4 – Mounting method of specimen.17
Figure 5 – The mechanism of adjusting azimuth and elevation.17
Figure 6 – Measurement system for normal incidence (side view) .20
Figure 7 – Measurement system for oblique incidence (top view).21
Figure 8 – Structure of a dielectric lens antenna .22
Figure 9 – Structure of specimen holder.23
Figure 10 – EM wave propagation using a horn antenna and a dielectric lens .26
Figure 11 – Block diagram of the measurement system .27
Figure 12 – A measurement system for normal incidence .28
– 4 – 62431 © IEC:2008(E)
Figure 13 – Measurement system for oblique incidence .28
Figure 14 – Position of a shielding plate .29
Figure 15 – Items to be mentioned in a test report .32
Figure A.1 – Reflection from the reference metal plate versus measurement distance
between the antenna and the metal plate.33
Figure A.2 – Reflectivity of reference metal plate versus size.34
Figure A.3 – Reflectivity of reference metal plate at 40 GHz .35
Figure A.4 – Reflectivity of reference metal plate with cross section of 200 mm ×
200 mm at 40 GHz.35
Figure A.5 – Analysis of reflection from a metal plate.37
Figure B.1 – Reflectivity of a 200 mm × 200 mm silica-glass plate in millimetre wave
frequency.38
Figure C.1 – Representative specifications of a horn antenna.
...
IEC 62431 ®
Edition 1.0 2008-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Reflectivity of electromagnetic wave absorbers in millimetre wave frequency –
Measurement methods
Réflectivité des absorbeurs d’ondes électromagnétiques dans la plage des
fréquences des ondes millimétriques – Méthodes de mesure
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by
any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or
IEC's member National Committee in the country of the requester.
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please contact the address below or your local IEC member National Committee for further information.
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CH-1211 Geneva 20
Switzerland
Email: inmail@iec.ch
Web: www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
Catalogue of IEC publications: www.iec.ch/searchpub
The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,…).
It also gives information on projects, withdrawn and replaced publications.
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Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available
on-line and also by email.
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The world's leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions
in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical
Vocabulary online.
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IEC 62431 ®
Edition 1.0 2008-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Reflectivity of electromagnetic wave absorbers in millimetre wave frequency –
Measurement methods
Réflectivité des absorbeurs d’ondes électromagnétiques dans la plage des
fréquences des ondes millimétriques – Méthodes de mesure
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX XA
ICS 17.120; 19.080; 29.120.10 ISBN 978-2-88912-802-0
– 2 – 62431 IEC:2008
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Terms, definitions and acronyms . 7
3.1 Terms and definitions . 7
3.2 Acronyms and symbols . 10
4 Specimen . 12
4.1 Specimen specification . 12
4.2 Reference metal plate . 12
4.2.1 Material and thickness . 12
4.2.2 Surface roughness . 12
4.2.3 Flatness . 12
4.2.4 Size and shape . 12
4.3 Reference specimen for calibration . 12
5 Specimen holder . 13
6 Measurement equipment . 13
6.1 Type of network analyzer . 13
6.2 Antenna . 13
6.2.1 Horn antenna . 13
6.2.2 Lens antenna . 13
6.3 Amplifier . 13
6.4 Cable . 14
7 Measurement condition . 14
7.1 Temperature and environment . 14
7.2 Warming up of measurement equipment . 14
7.3 Electromagnetic environment . 14
8 Calibration of measurement system and measurement conditions . 14
8.1 Calibration of measurement system . 14
8.2 Measurement conditions . 14
8.2.1 Dynamic range . 14
8.2.2 Setting up of the network analyzer for keeping adequate dynamic
range . 14
9 Horn antenna method . 15
9.1 Measurement system . 15
9.1.1 Configuration of the measurement system . 15
9.1.2 Horn antenna . 16
9.1.3 Specimen holder . 16
9.1.4 Mounting of the specimen . 18
9.1.5 Antenna stand . 18
9.2 Measurement conditions . 18
9.2.1 Measurement environment . 18
9.2.2 Measuring distance . 18
9.2.3 Size of specimen . 18
9.3 Measurement procedures . 19
10 Dielectric lens antenna method – focused beam method . 20
10.1 Outline . 20
62431 IEC:2008 – 3 –
10.2 Measurement system . 20
10.2.1 Transmitting and receiving antennas . 20
10.2.2 Focused beam horn antenna . 21
10.2.3 Specimen size . 22
10.2.4 Reference metal plate size . 22
10.2.5 Specimen holder . 22
10.2.6 Method of fixing the specimen and the reference metal plate . 23
10.3 Measurement procedures . 23
11 Dielectric lens antenna method – parallel beam method . 25
11.1 Principle . 25
11.1.1 Outline . 25
11.1.2 Parallel EM wave beam formed using a EM wave lens . 25
11.2 Measurement system . 26
11.2.1 Composition of measurement system . 26
11.2.2 Dielectric lens antenna . 29
11.3 Specimen . 29
11.3.1 General . 29
11.3.2 Reference metal plate . 29
11.3.3 Size of specimen . 30
11.4 Measurement procedures . 30
11.4.1 Normal incidence . 30
11.4.2 Oblique Incidence . 30
12 Test report. 31
Annex A (informative) Reflection and scattering from metal plate – Horn antenna
method . 33
Annex B (informative) Reflectivity of reference specimens using horn antenna method . 38
Annex C (informative) Specifications of commercially available antennas . 39
Annex D (normative) Calibration using VNA . 42
Annex E (informative) Dynamic range and measurement errors . 50
Annex F (informative) Enlargement of dynamic range – Calibration by isolation . 52
Annex G (informative) Relative permittivity of styrofoam and foamed polyethylene
based on foam ratio . 53
Annex H (informative) Calculation of Fraunhofer region – Horn antenna method . 54
Figure 1 – Definition of reflectivity .
...
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