IEC TS 63144-1:2020
(Main)Industrial process control devices - Thermographic cameras - Part 1: Metrological characterization
Industrial process control devices - Thermographic cameras - Part 1: Metrological characterization
IEC 63144-1:2020(E) applies, in the field of metrology, to the statement and testing of technical data in datasheets and instruction manuals for thermographic cameras that are used to measure the temperature of surfaces. This includes, unless otherwise stated, both two-dimensional and one-dimensional (line cameras or line scanners) temperature measuring instruments, independently of the scanning principle (fixed multi-element detector or scanning camera system).
This document describes standard test methods to determine relevant metrological data of thermographic cameras. Manufacturers and sellers can choose relevant data and can state that the data shall be compliant with this Technical Specification.
General Information
Standards Content (Sample)
IEC TS 63144-1 ®
Edition 1.0 2020-04
TECHNICAL
SPECIFICATION
Industrial process control devices – Thermographic cameras –
Part 1: Metrological characterization
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IEC TS 63144-1 ®
Edition 1.0 2020-04
TECHNICAL
SPECIFICATION
Industrial process control devices – Thermographic cameras –
Part 1: Metrological characterization
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 17.200, 25.040.40 ISBN 978-2-8322-7969-4
– 2 – IEC TS 63144-1:2020 © IEC 2020
CONTENTS
FOREWORD . 6
INTRODUCTION . 8
1 Scope . 9
2 Normative references . 9
3 Terms and definitions . 9
4 Symbols . 14
5 Abbreviated terms . 14
6 Determination of technical data . 15
6.1 General . 15
6.2 Measuring temperature range . 15
6.2.1 General . 15
6.2.2 Required parameters . 16
6.2.3 Examples of indications . 16
6.2.4 Test condition, method and procedure for measuring temperature range . 16
6.3 Noise equivalent temperature difference (NETD) . 16
6.3.1 General . 16
6.3.2 Required parameters . 16
6.3.3 Examples of indications . 16
6.3.4 Test condition, method and procedure for noise equivalent temperature
difference . 17
6.4 Measuring distance (d) . 18
6.4.1 General . 18
6.4.2 Required parameters . 18
6.4.3 Examples of indications . 18
6.4.4 Test condition, method and procedure for measuring distance . 18
6.5 Field of view (FOV) . 18
6.5.1 General . 18
6.5.2 Required parameters . 19
6.5.3 Examples of indications . 19
6.5.4 Test condition, method and procedure for field of view . 19
6.6 Number of image elements . 19
6.7 Detector format used (number of detector elements used) . 19
6.8 Instantaneous field of view (IFOV) . 20
6.8.1 General . 20
6.8.2 Required parameters . 20
6.8.3 Example of indications . 20
6.8.4 Test condition, method and procedure for instantaneous field of view . 20
6.9 Slit response function (SRF) . 20
6.9.1 General . 20
6.9.2 Required parameters . 21
6.9.3 Examples of indications . 21
6.9.4 Test condition, method and procedure for slit response function . 21
6.10 Minimum field of view for temperature measurement (MFOV ) . 22
T
6.10.1 General . 22
6.10.2 Required parameters . 23
6.10.3 Example of indications . 23
6.10.4 Test condition, method and procedure for minimum field of view for
temperature measurement . 23
6.11 Spectral range . 24
6.11.1 General . 24
6.11.2 Examples of indications . 24
6.11.3 Test condition, method and procedure for spectral range . 24
6.12 Emissivity setting . 24
6.12.1 General . 24
6.12.2 Examples of indications . 24
6.12.3 Test condition, method and procedure for emissivity setting . 24
6.13 Influence of the internal instrument temperature . 24
6.13.1 General . 24
6.13.2 Required parameters . 25
6.13.3 Examples of indications . 25
6.13.4 Test condition, method and procedure for influence of the internal
instrument temperature . 25
6.14 Influence of the humidity . 26
6.14.1 General . 26
6.14.2 Required parameters . 26
6.14.3 Example of indications . 26
6.14.4 Test condition, method and procedure for influence of the humidity . 26
6.15 Long-term stability . 26
6.15.1 General . 26
6.15.2 Required parameters . 26
6.15.3 Example of indication . 26
6.15.4 Test condition, method and procedure for long-term stability . 27
6.16 Short-term stability . 27
6.16.1 General . 27
6.16.2 Required parameters . 27
6.16.3 Example of indication . 28
6.16.4 Test condition, method and procedure for short-term stability . 28
6.17 Repeatability . 28
6.17.1 General . 28
6.17.2 Required parameters . 28
6.17.3 Example of indication . 29
6.17.4 Test condition, method and procedure for repeatability . 29
6.18 Interchangeability (spread of production) . 29
6.18.1 General . 29
6.18.2 Required parameters . 29
6.18.3 Example of indication . 30
6.18.4 Test condition, method and procedure for interchangeability (spread of
production) . 30
6.19 Response time . 30
6.19.1 General . 30
6.19.2 Required parameters . 34
6.19.3 Example of indication . 34
6.19.4 Test condition, method and procedure for response time . 34
6.20 Exposure time . 35
6.20.1 General . 35
6.20.2 Required parameters . 36
– 4 – IEC TS 63144-1:2020 © IEC 2020
6.20.3 Example of indication . 36
6.20.4 Test condition, method and procedure for exposure time . 36
6.21 Warm-up time .
...
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