IEC 63145-20-20:2019
(Main)Eyewear display - Part 20-20: Fundamental measurement methods - Image quality
Eyewear display - Part 20-20: Fundamental measurement methods - Image quality
IEC 63145-20-20:2019 (E) specifies the standard measurement conditions and measurement methods for determining the image quality of eyewear displays. This document is applicable to non-see-through type (virtual reality “VR” goggle) and see-through type (augmented reality “AR” glasses) eyewear displays using virtual image optics.
Contact-lens type displays and retina direct projection displays are out of the scope of this document.
General Information
Standards Content (Sample)
IEC 63145-20-20 ®
Edition 1.0 2019-09
INTERNATIONAL
STANDARD
Eyewear display –
Part 20-20: Fundamental measurement methods – Image quality
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.
IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.
IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org
The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,
variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English
committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.
and withdrawn publications. Also known as the International Electrotechnical Vocabulary
(IEV) online.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Glossary - std.iec.ch/glossary
details all new publications released. Available online and 67 000 electrotechnical terminology entries in English and
once a month by email. French extracted from the Terms and Definitions clause of
IEC publications issued since 2002. Some entries have been
IEC Customer Service Centre - webstore.iec.ch/csc collected from earlier publications of IEC TC 37, 77, 86 and
If you wish to give us your feedback on this publication or CISPR.
need further assistance, please contact the Customer Service
Centre: sales@iec.ch.
IEC 63145-20-20 ®
Edition 1.0 2019-09
INTERNATIONAL
STANDARD
Eyewear display –
Part 20-20: Fundamental measurement methods – Image quality
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 17.180.99; 31.120 ISBN 978-2-8322-7352-4
– 2 – IEC 63145-20-20:2019 © IEC 2019
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms, definitions, abbreviated terms and letter symbols . 6
3.1 Terms and definitions . 6
3.2 Abbreviated terms . 7
3.3 Letter symbols (quantity symbols/unit symbols) . 7
4 Standard measurement conditions . 7
4.1 Standard environmental conditions . 7
4.2 Power supply . 7
4.3 Warm-up time . 8
4.4 Dark room conditions . 8
5 Measurement systems . 8
5.1 Standard coordinate system . 8
5.2 Measurement equipment . 9
5.2.1 Light measuring device (LMD) . 9
5.2.2 Stage conditions . 11
5.2.3 Setup conditions . 11
5.3 Test patterns. 13
5.3.1 General . 13
5.3.2 Checkerboard pattern . 13
5.3.3 Solid colour patterns . 13
5.3.4 Test patterns for Michelson contrast . 13
5.4 Measurement points . 14
6 Measurement methods for image quality . 15
6.1 General . 15
6.2 Preparation . 15
6.3 Distortion . 15
6.3.1 General . 15
6.3.2 Procedure . 16
6.3.3 Calculation . 17
6.3.4 Report . 18
6.4 Colour registration error . 18
6.4.1 General . 18
6.4.2 Procedure . 18
6.4.3 Calculation . 19
6.4.4 Report . 19
6.5 Michelson contrast . 19
6.5.1 General . 19
6.5.2 Procedure . 19
6.5.3 Calculation . 20
6.5.4 Report . 20
6.6 Focal distance (dioptre) . 20
6.6.1 General . 20
6.6.2 Procedure . 21
6.6.3 Calculation . 22
6.6.4 Report . 22
6.7 FOV based on Michelson contrast . 22
6.7.1 General . 22
6.7.2 Procedure . 22
6.7.3 Calculation . 23
6.7.4 Report . 23
6.8 Eye-box based on Michelson contrast . 23
6.8.1 General . 23
6.8.2 Procedure . 23
6.8.3 Calculation . 24
6.8.4 Report . 25
Bibliography . 26
Figure 1 – Spherical coordinate system . 9
Figure 2 – Three-dimensional Cartesian coordinate system . 9
Figure 3 – Example of LMD structure . 10
Figure 4 – Examples of measurement setup. 12
Figure 5 – Example of 5 x 5 checkerboard pattern . 13
Figure 6 – Example of Michelson contrast test pattern . 14
Figure 7 – Measuring points for the centre- and multi-point measurement . 14
Table 1 – Letter symbols (symbols for quantities, and units) . 7
– 4 – IEC 63145-20-20:2019 © IEC 2019
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
EYEWEAR DISPLAY –
Part 20-20: Fundamental measurement methods –
Image quality
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such paten
...
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.