IEC 60444-8:2016

IEC 60444-8 ®
Edition 2.0 2016-12
INTERNATIONAL
STANDARD
colour
inside
Measurement of quartz crystal unit parameters –
Part 8: Test fixture for surface mounted quartz crystal units
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé Fax: +41 22 919 03 00
CH-1211 Geneva 20 info@iec.ch
Switzerland www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.

IEC Catalogue - webstore.iec.ch/catalogue Electropedia - www.electropedia.org
The stand-alone application for consulting the entire The world's leading online dictionary of electronic and
bibliographical information on IEC International Standards, electrical terms containing 20 000 terms and definitions in
Technical Specifications, Technical Reports and other English and French, with equivalent terms in 15 additional
documents. Available for PC, Mac OS, Android Tablets and languages. Also known as the International Electrotechnical
iPad. Vocabulary (IEV) online.

IEC publications search - www.iec.ch/searchpub IEC Glossary - std.iec.ch/glossary
The advanced search enables to find IEC publications by a 65 000 electrotechnical terminology entries in English and
variety of criteria (reference number, text, technical French extracted from the Terms and Definitions clause of
committee,…). It also gives information on projects, replaced IEC publications issued since 2002. Some entries have been
and withdrawn publications. collected from earlier publications of IEC TC 37, 77, 86 and

CISPR.
IEC Just Published - webstore.iec.ch/justpublished

Stay up to date on all new IEC publications. Just Published IEC Customer Service Centre - webstore.iec.ch/csc
details all new publications released. Available online and If you wish to give us your feedback on this publication or
also once a month by email. need further assistance, please contact the Customer Service
Centre: csc@iec.ch.
IEC 60444-8 ®
Edition 2.0 2016-12
INTERNATIONAL
STANDARD
colour
inside
Measurement of quartz crystal unit parameters –

Part 8: Test fixture for surface mounted quartz crystal units

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.140 ISBN 978-2-8322-3718-2

– 2 – IEC 60444-8:2016 © IEC 2016
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Specifications . 6
4 Leadless surface mounted quartz crystal units . 6
4.1 Enclosure . 6
4.2 Overtone and frequency range . 7
5 Specifications of measurement method, test fixture . 7
5.1 Specifications of measurement method . 7
5.2 Specifications of transmission test fixture . 7
5.3 Specifications of reflection test fixture . 10
5.4 Measuring equipment . 13
6 Calibration . 13
6.1 Calibration of the transmission test system . 13
6.2 Additional calibration of the transmission test system with C adapter board . 13
L
6.3 Calibration of the reflection measurement system . 13
Bibliography . 15

Figure 1 – Transmission π-network test fixture: Simplified equivalent circuit diagram,
frequency range from 1 MHz to 500 MHz . 7
Figure 2 – Transmission π-network test Fixture with physical load capacitors: simplified
equivalent circuit, frequency range from 1 MHz to 30 MHz . 7
Figure 3 – Transmission π-network test fixture: Three-dimensional projection for the test
fixture . 8
Figure 4 – Transmission π-network test fixture: Mechanical design of the test fixture . 9
Figure 5 – Transmission π-network test fixture with physical load capacitors: Structure
of the test fixture . 10
Figure 6 – Design of the reflection test fixture . 11
Figure 7 – Mechanical details of the reflection test fixture . 13
Figure 8 – Calibration technique for the reflection test fixture . 14

INTERNATIONAL ELECTROTECHNICAL COMMISSION
______________
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS –

Part 8: Test fixture for surface mounted quartz crystal units

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60444-8 has been prepared by IEC technical committee 49:
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and detection.
This second edition cancels and replaces the first edition published in 2003. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) modification of Clause 1;
b) modification of 5.2;
c) modification of 5.3;
d) modification of 5.4;
– 4 – IEC 60444-8:2016 © IEC 2016
e) 6.3 Calibration of the reflection measurement system.
The text of this standard is based on the following documents:
CDV Report on voting
49/1126/CDV 49/1175/RVC
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60444 series, published under the general title Measurement of
quartz crystal unit parameters, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until the
stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to
the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
INTRODUCTION
This document focuses on test fixtures applied to leadless surface mounted quartz crystal units.
The document is the specification for fixtures [1][2] that allow the measurement of (series)
resonance frequency, (series) resonance resistance, and equivalent electrical circuit
parameters of leadless surface mounted quartz crystal units. The measurement method using
an automatic network analyzer with error correction is described in IEC 60444-5, which also
contains proposals for test fixtures for quartz crystal units in through-hole packages.
The measuring frequency range is from 1 MHz to 1 200 MHz, and is limited to 1 MHz to
30 MHz, if a physical load capacitance is used. The use of the test fixtures in connection with
−6
error correction measurement techniques yields measurement accuracy of about 10 over of
the frequency range, and the accuracy of the resonance resistance is ±2 Ω or ±10 %.
This document forms Part 8 of a series of publications dealing with measurements of quartz
crystal unit parameters.
The IEC 60444 series consists of the following parts under the general title Measurement of
quartz crystal unit parameters:
Part 1: Basic method for the measurement of resonance frequency and resonance resistance
of quartz crystal units by zero phase technique in a π-network
Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Part 4: Method for the measurement of the load resonance frequency f , load resonance
L
resistance R and the calculation of other derived values of quartz crystal units, up to
L
30 MHz
Part 5: Methods for the determination of equivalent electrical parameters using automatic
network analyzer techniques and error correction
Part 6: Measurement of drive level dependence (DLD)
Part 7: Measurement of activity and frequency dips of quartz crystal units
Part 8 Text fixture for surface mounted quartz crystal units
Part 11 Standard method for the determination of the load resonance frequency f and the
L
effective load capacitance C using automatic network analyzer techniques and
Leff
error correction.
___________
Numbers in square brackets refer to the Bibliography.
...