31.140 - Piezoelectric devices
ICS 31.140 Details
Piezoelectric devices
Piezoelektrische Bauelemente
Dispositifs piezo-electriques
Piezoelektrične naprave
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IEC 60122-2:2025 has been compiled in response to a generally expressed desire on the part of both users and manufacturers for guidelines to the use of quartz crystal units for filters and oscillators so that the crystal units may be used to their best advantage.
It draws attention to some of the more fundamental questions which will be considered by the user before it places its order for a unit for a new application, and in so doing will, it is hoped, help ensure against unsatisfactory performance, unfavourable cost and non-availability. It is not the function of this document to explain theory, nor to attempt to cover all the eventualities that can arise in practical circumstances. Lastly, it it is not considered as a substitute for close liaison between manufacturer and user.
Standard specifications, such as those of the IEC of which these guidelines form a part, and national specifications or detail specifications issued by manufacturers, will define the available combinations of the resonant characteristics and the temperature characteristic. These specifications are compiled to include a wide range of quartz crystal units with standardized performances. It cannot be over-emphasized that it is the responsibility of the user , wherever possible, to select the quartz crystal units from these specifications, when available, even if it can lead to making small modifications to the circuit to enable the use of standard resonators. This applies particularly to the selection of the nominal frequency.
This edition includes the following significant technical changes with respect to the previous edition:
a) addition of SC cut type and related requirements;
b) addition of ageing calculation and low level of drive requirements according to the general specification,
c) update of the frequency temperature curve according to the common cut requirements;
d) removal of infrequently used product types.
- Standard40 pagesEnglish languagesale 10% offe-Library read for1 day
IEC 60122-2:2025 has been compiled in response to a generally expressed desire on the part of both users and manufacturers for guidelines to the use of quartz crystal units for filters and oscillators so that the crystal units may be used to their best advantage. It draws attention to some of the more fundamental questions which will be considered by the user before it places its order for a unit for a new application, and in so doing will, it is hoped, help ensure against unsatisfactory performance, unfavourable cost and non-availability. It is not the function of this document to explain theory, nor to attempt to cover all the eventualities that can arise in practical circumstances. Lastly, it it is not considered as a substitute for close liaison between manufacturer and user. Standard specifications, such as those of the IEC of which these guidelines form a part, and national specifications or detail specifications issued by manufacturers, will define the available combinations of the resonant characteristics and the temperature characteristic. These specifications are compiled to include a wide range of quartz crystal units with standardized performances. It cannot be over-emphasized that it is the responsibility of the user , wherever possible, to select the quartz crystal units from these specifications, when available, even if it can lead to making small modifications to the circuit to enable the use of standard resonators. This applies particularly to the selection of the nominal frequency. This edition includes the following significant technical changes with respect to the previous edition: a) addition of SC cut type and related requirements; b) addition of ageing calculation and low level of drive requirements according to the general specification, c) update of the frequency temperature curve according to the common cut requirements; d) removal of infrequently used product types.
- Standard40 pagesEnglish languagesale 10% offe-Library read for1 day
IEC 60122-2:2025 has been compiled in response to a generally expressed desire on the part of both users and manufacturers for guidelines to the use of quartz crystal units for filters and oscillators so that the crystal units may be used to their best advantage.
It draws attention to some of the more fundamental questions which will be considered by the user before it places its order for a unit for a new application, and in so doing will, it is hoped, help ensure against unsatisfactory performance, unfavourable cost and non-availability. It is not the function of this document to explain theory, nor to attempt to cover all the eventualities that can arise in practical circumstances. Lastly, it it is not considered as a substitute for close liaison between manufacturer and user.
Standard specifications, such as those of the IEC of which these guidelines form a part, and national specifications or detail specifications issued by manufacturers, will define the available combinations of the resonant characteristics and the temperature characteristic. These specifications are compiled to include a wide range of quartz crystal units with standardized performances. It cannot be over-emphasized that it is the responsibility of the user , wherever possible, to select the quartz crystal units from these specifications, when available, even if it can lead to making small modifications to the circuit to enable the use of standard resonators. This applies particularly to the selection of the nominal frequency.
This edition includes the following significant technical changes with respect to the previous edition:
a) addition of SC cut type and related requirements;
b) addition of ageing calculation and low level of drive requirements according to the general specification,
c) update of the frequency temperature curve according to the common cut requirements;
d) removal of infrequently used product types.
- Standard73 pagesEnglish and French languagesale 15% off
IEC 62276:2025 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.
This edition includes the following significant technical changes with respect to the previous edition:
a) The terms and definitions, the technical requirements, sampling frequency, test methods and measurement of transmittance, lightness, colour difference for LN and LT have been added in order to meet the needs of industry development;
b) The term “inclusion” (mentioned in 4.13 and 6.10) and its definition have been added because there was no definition for it in Clause 3;
c) The specification of LTV and PLTV, and the corresponding description of sampling frequency for LN and LT have been added, because they are the key performance parameters for the wafers;
d) The tolerance of Curie temperature specification for LN and LT have been added in order to meet the development requirements of the industry;
e) Measurement of thickness, TV5, TTV, LTV and PLTV have been completed, including measurement principle and method of thickness, TV5, TTV, LTV and PLTV.
- Standard44 pagesEnglish languagesale 10% offe-Library read for1 day
IEC 62276:2025 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition: a) The terms and definitions, the technical requirements, sampling frequency, test methods and measurement of transmittance, lightness, colour difference for LN and LT have been added in order to meet the needs of industry development; b) The term “inclusion” (mentioned in 4.13 and 6.10) and its definition have been added because there was no definition for it in Clause 3; c) The specification of LTV and PLTV, and the corresponding description of sampling frequency for LN and LT have been added, because they are the key performance parameters for the wafers; d) The tolerance of Curie temperature specification for LN and LT have been added in order to meet the development requirements of the industry; e) Measurement of thickness, TV5, TTV, LTV and PLTV have been completed, including measurement principle and method of thickness, TV5, TTV, LTV and PLTV.
- Standard44 pagesEnglish languagesale 10% offe-Library read for1 day
IEC 62276:2025 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.
This edition includes the following significant technical changes with respect to the previous edition:
a) The terms and definitions, the technical requirements, sampling frequency, test methods and measurement of transmittance, lightness, colour difference for LN and LT have been added in order to meet the needs of industry development;
b) The term “inclusion” (mentioned in 4.13 and 6.10) and its definition have been added because there was no definition for it in Clause 3;
c) The specification of LTV and PLTV, and the corresponding description of sampling frequency for LN and LT have been added, because they are the key performance parameters for the wafers;
d) The tolerance of Curie temperature specification for LN and LT have been added in order to meet the development requirements of the industry;
e) Measurement of thickness, TV5, TTV, LTV and PLTV have been completed, including measurement principle and method of thickness, TV5, TTV, LTV and PLTV.
- Standard82 pagesEnglish and French languagesale 15% off
IEC TS 61994-5:2023 gives the terms and definitions for sensors representing the state of the art, which are intended for manufacturing piezoelectric elements, cells, modules and the systems. This edition includes the following significant technical changes with respect to the previous edition: New terms and definitions have been added from IEC 63041-1:2021 and IEC 63041-3:2020.
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- Technical specification22 pagesEnglish languagesale 15% off
IEC 62604-2:2022 is available as IEC 62604-2:2022 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 62604-2:2022 applies to duplexers which can separate receiving signals from transmitting signals and are key components for two-way radio communications, and which are generally used in mobile phone systems compliant with CDMA systems such as N-CDMA in second generation mobile telecommunication systems (2G), W-CDMA / UMTS (3G) or LTE (4G). These guidelines draw attention to some fundamental questions about the theory of SAW and BAW duplexers and how to use them, which will be considered by the user before he places an order for SAW and BAW duplexers for a new application. Such a procedure will be the user’s insurance against unsatisfactory performance. Because SAW and BAW duplexers have very similar performance for the usage, it is useful and convenient for users that both duplexers are described in one standard. This edition includes the following significant technical changes with respect to the previous edition:
- the term "cross-isolation" has been added to Clause 3;
- multiplexers are described.
NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner, especially in mobile phone systems and have the same requirements of characteristics, test method and so on.
- Standard29 pagesEnglish languagesale 10% offe-Library read for1 day
IEC 62604-2:2022 is available as IEC 62604-2:2022 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 62604-2:2022 applies to duplexers which can separate receiving signals from transmitting signals and are key components for two-way radio communications, and which are generally used in mobile phone systems compliant with CDMA systems such as N-CDMA in second generation mobile telecommunication systems (2G), W-CDMA / UMTS (3G) or LTE (4G). These guidelines draw attention to some fundamental questions about the theory of SAW and BAW duplexers and how to use them, which will be considered by the user before he places an order for SAW and BAW duplexers for a new application. Such a procedure will be the user’s insurance against unsatisfactory performance. Because SAW and BAW duplexers have very similar performance for the usage, it is useful and convenient for users that both duplexers are described in one standard. This edition includes the following significant technical changes with respect to the previous edition: - the term "cross-isolation" has been added to Clause 3; - multiplexers are described. NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner, especially in mobile phone systems and have the same requirements of characteristics, test method and so on.
- Standard29 pagesEnglish languagesale 10% offe-Library read for1 day
IEC 62604-1:2022 is available as IEC 62604-1:2022 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 62604-1:2022 specifies the methods of test and general requirements for SAW and BAW duplexers of assessed quality using either capability approval or qualification approval procedures. This edition includes the following significant technical changes with respect to the previous edition:
- the term "multiplexer" has been added to Clause 3.
NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner especially in mobile phones and have the same requirements of characteristics, test method and so on.
- Standard37 pagesEnglish languagesale 10% offe-Library read for1 day
IEC 62604-1:2022 is available as IEC 62604-1:2022 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 62604-1:2022 specifies the methods of test and general requirements for SAW and BAW duplexers of assessed quality using either capability approval or qualification approval procedures. This edition includes the following significant technical changes with respect to the previous edition: - the term "multiplexer" has been added to Clause 3. NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner especially in mobile phones and have the same requirements of characteristics, test method and so on.
- Standard37 pagesEnglish languagesale 10% offe-Library read for1 day
IEC 62604-2:2022 applies to duplexers which can separate receiving signals from transmitting signals and are key components for two-way radio communications, and which are generally used in mobile phone systems compliant with CDMA systems such as N-CDMA in second generation mobile telecommunication systems (2G), W-CDMA / UMTS (3G) or LTE (4G). These guidelines draw attention to some fundamental questions about the theory of SAW and BAW duplexers and how to use them, which will be considered by the user before he places an order for SAW and BAW duplexers for a new application. Such a procedure will be the user’s insurance against unsatisfactory performance. Because SAW and BAW duplexers have very similar performance for the usage, it is useful and convenient for users that both duplexers are described in one standard. This edition includes the following significant technical changes with respect to the previous edition:
- the term "cross-isolation" has been added to Clause 3;
- multiplexers are described.
NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner, especially in mobile phone systems and have the same requirements of characteristics, test method and so on.
- Standard83 pagesEnglish languagesale 15% off
- Standard53 pagesEnglish and French languagesale 15% off
IEC 62604-1:2022 specifies the methods of test and general requirements for SAW and BAW duplexers of assessed quality using either capability approval or qualification approval procedures. This edition includes the following significant technical changes with respect to the previous edition:
- the term "multiplexer" has been added to Clause 3.
NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner especially in mobile phones and have the same requirements of characteristics, test method and so on.
- Standard97 pagesEnglish languagesale 15% off
- Standard64 pagesEnglish and French languagesale 15% off
IEC 62884-4:2019 describes the methods for the measurement and evaluation of the short-term frequency stability tests of piezoelectric, dielectric and electrostatic oscillators. Its purpose is to unify the test and evaluation methods for short-term frequency stability.
- Standard23 pagesEnglish languagesale 10% offe-Library read for1 day
This part of IEC 60122 is applicable to crystal units with thermistors mainly used in the field of mobile communication that requires high frequency stability such as local reference signal generator for the mobile phone base station or GPS. This document provides users with technical guidelines of crystal units with thermistors as well as basic knowledge of common crystal units with thermistors.
- Standard17 pagesEnglish languagesale 10% offe-Library read for1 day
This part of IEC 63041 applies to piezoelectric sensors of resonator, delay-line and non acoustic types, which are used in physical and engineering sciences, chemistry and biochemistry, medical and environmental sciences, etc.
The purpose of this document is to specify the terms and definitions for the piezoelectric sensors, and to make sure from a technological perspective that users understand the state-of-art piezoelectric sensors and how to use them correctly.
- Standard33 pagesEnglish languagesale 10% offe-Library read for1 day
This part of IEC 63041 applies to piezoelectric sensors of resonator, delay-line and non acoustic types, which are used in physical and engineering sciences, chemistry and biochemistry, medical and environmental sciences, etc. The purpose of this document is to specify the terms and definitions for the piezoelectric sensors, and to make sure from a technological perspective that users understand the state-of-art piezoelectric sensors and how to use them correctly.
- Standard33 pagesEnglish languagesale 10% offe-Library read for1 day
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based on the π-network according to IEC 60444-5, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the π-network or reflection method according to IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions.
NOTE The measurement methods specified in this document are not only applicable to AT-cut, but also to other crystal cuts and vibration modes, such as doubly rotated cuts (IT,SC) and to tuning fork crystal units (by using a high impedance test fixture).
- Standard23 pagesEnglish languagesale 10% offe-Library read for1 day
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based on the π-network according to IEC 60444-5, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the π-network or reflection method according to IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions. NOTE The measurement methods specified in this document are not only applicable to AT-cut, but also to other crystal cuts and vibration modes, such as doubly rotated cuts (IT,SC) and to tuning fork crystal units (by using a high impedance test fixture).
- Standard23 pagesEnglish languagesale 10% offe-Library read for1 day
IEC 63041-1:2021 applies to piezoelectric sensors of resonator, delay-line and non-acoustic types, which are used in physical and engineering sciences, chemistry and biochemistry, medical and environmental sciences, etc. The purpose of this document is to specify the terms and definitions for piezoelectric sensors, and to make sure from a technological perspective that users understand the state-of-art piezoelectric sensors and how to use them correctly. This edition includes the following significant technical changes with respect to the previous edition:
- the new terms "piezoelectric sensor system" and "wireless SAW sensor system" and their definitions have been added;
- new types of sensor modules and sensor system have been added;
- some symbols of sensor elements are added in Clause 4;
- a new Figure B.3 has been added in Annex B;
- Annex C has been added.
- Standard90 pagesEnglish languagesale 15% off
- Standard60 pagesEnglish and French languagesale 15% off
IEC 60444-6:2021 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. “Method A”, based on the p-network according to IEC 60444-5, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the p-network or reflection method according to IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions.
NOTE The measurement methods specified in this document are not only applicable to AT-cut, but also to other crystal cuts and vibration modes, such as doubly rotated cuts (IT,SC) and to tuning fork crystal units (by using a high impedance test fixture). This edition includes the following significant technical changes with respect to the previous edition:
- some equations have been removed and corrected;
- it has been specified in the note of the Scope that the measurement methods specified in this document are not only applicable to AT-cut but also to other crystal cuts and vibration modes.
- Standard63 pagesEnglish languagesale 15% off
- Standard41 pagesEnglish and French languagesale 15% off
IEC 61837-2:2018(E) deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is based on IEC 61240:2016. This edition includes the following significant technical changes with respect to the previous edition: a. revision of the figures to match the notation of the drawings of IEC 61240:2016; b. addition of 7 enclosures as follows: DCC-6/5032A, DCC-6/3225A, DCC-4/3215C, DCC-6/2016A, DCC-2/2012C, DCC-2/1610C, DCC-4/1210C. As a result, this third edition contains a total of 45 enclosure types, which are listed in Table 1.
- Standard102 pagesEnglish languagesale 10% offe-Library read for1 day
IEC 62884-3:2018(E) describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"). The purpose of those tests is to provide statistical data supporting aging predictions. This document was developed from the works related to IEC 60679-1:2007 (third edition), the measurement techniques of which were restructured into different parts under a new project reference. This document describes the measurement method for frequency aging only.
- Standard16 pagesEnglish languagesale 10% offe-Library read for1 day
IEC TS 61994-3:2021(E) gives the terms and definitions for piezoelectric, dielectric and electrostatic oscillators representing the state of the art, which are intended for use in the standards and documents of IEC TC 49.
The main changes with respect to the previous edition are as listed below:
- some definitions have been updated;
- the terminology given in IEC 60679-1:2017 has been taken into account;
- new terminologies are added.
- Technical specification19 pagesEnglish languagesale 15% off
IEC 63041-2:2017(E) is applicable to piezoelectric chemical sensors mainly used in the field of biological, medical, gas and environmental sciences. It provides users with technical guidelines on biochemical sensors as well as basic knowledge of common chemical sensors.
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- Amendment26 pagesEnglish languagesale 10% offe-Library read for1 day
IEC 63041-3:2020 is applicable to piezoelectric physical sensors mainly used in the field of process control, wireless monitoring, dynamics, thermodynamics, vacuum engineering, and environmental sciences. This document provides users with technical guidelines as well as basic knowledge of common physical sensors.
Piezoelectric sensors covered herein are those applied to the detection and measurement of physical quantities such as force, pressure, torque, viscosity, temperature, film thickness, acceleration, vibration, and tilt angle.
- Standard16 pagesEnglish languagesale 10% offe-Library read for1 day
IEC 62884-2:2017(E) specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used. NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.
- Standard27 pagesEnglish languagesale 10% offe-Library read for1 day
IEC 63041-3:2020 is applicable to piezoelectric physical sensors mainly used in the field of process control, wireless monitoring, dynamics, thermodynamics, vacuum engineering, and environmental sciences. This document provides users with technical guidelines as well as basic knowledge of common physical sensors. Piezoelectric sensors covered herein are those applied to the detection and measurement of physical quantities such as force, pressure, torque, viscosity, temperature, film thickness, acceleration, vibration, and tilt angle.
- Standard16 pagesEnglish languagesale 10% offe-Library read for1 day
- Standard24 pagesEnglish languagesale 15% off
- Standard48 pagesEnglish and French languagesale 15% off
IEC 61837-2:2018 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is based on IEC 61240:2016.
This edition includes the following significant technical changes with respect to the previous edition:
a. revision of the figures to match the notation of the drawings of IEC 61240:2016;
b. addition of 7 enclosures as follows: DCC-6/5032A, DCC-6/3225A, DCC-4/3215C, DCC-6/2016A, DCC-2/2012C, DCC-2/1610C, DCC-4/1210C.
As a result, this third edition contains a total of 45 enclosure types, which are listed in Table 1.
- Standard99 pagesEnglish languagesale 15% off
- Standard240 pagesEnglish languagesale 15% off
- Standard198 pagesEnglish and French languagesale 15% off
- Standard447 pagesEnglish and French languagesale 15% off
IEC 60679-1:2017(E) specifies general requirements for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"), of assessed quality using either capability approval or qualification approval procedures. NOTE Dielectric Resonator Oscillators (DRO) and oscillators using FBAR are under consideration. This edition includes the following significant technical changes with respect to the previous edition: a) the title has been changed; b) additional matters related to oscillator using SAW or MEMS resonator in "Terms, definitions and general information" have been included; c) measurement methods of IEC 60679-1:2007 have been removed (they will be moved to IEC 62884 series); d) the content of Annex A has been extended; e) a new term and definition DIXO (Digital interfaced Crystal Oscillator) has been added; f) a new term and definition SSXO (Spread Spectrum Crystal Oscillator) has been added; g) Annex D has been added.
- Standard39 pagesEnglish languagesale 10% offe-Library read for1 day
IEC 63041-3:2020 is applicable to piezoelectric physical sensors mainly used in the field of process control, wireless monitoring, dynamics, thermodynamics, vacuum engineering, and environmental sciences. This document provides users with technical guidelines as well as basic knowledge of common physical sensors.
Piezoelectric sensors covered herein are those applied to the detection and measurement of physical quantities such as force, pressure, torque, viscosity, temperature, film thickness, acceleration, vibration, and tilt angle.
- Standard25 pagesEnglish and French languagesale 15% off
IEC 63155:2020 defines the measurement method for the determination of the durability of radio frequency (RF) surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices, such as filters and duplexers, with respect to high power RF signals, which are used in telecommunications, measuring equipment, radar systems and consumer products. RF BAW devices include two types: those based on the film bulk acoustic resonator (FBAR) technology and those based on the solidly mounted resonator (SMR) technology.
This document includes basic properties of failure of RF SAW/BAW devices, and guidelines to set up the measurement system and to establish the procedure to estimate the time to failure (TF). Since TF is mainly governed by the RF power applied in the devices, discussions are focused on the power durability.
It is not the aim of this document to explain the theory, or to attempt to cover all the eventualities which can arise in practical circumstances. This document draws attention to some of the more fundamental questions which will need to be considered by the user before he/she places an order for an RF SAW/BAW device for a new application. Such a procedure will be the user's means of preventing unsatisfactory performance related to premature device failure resulting from high-power exposure of RF SAW/BAW devices.
- Standard23 pagesEnglish languagesale 10% offe-Library read for1 day
IEC 62884-1:2017(E) specifies the measurement techniques for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DROs) and oscillators using FBAR (hereinafter referred to as "Oscillator")
- Standard65 pagesEnglish languagesale 10% offe-Library read for1 day
IEC 63155:2020 defines the measurement method for the determination of the durability of radio frequency (RF) surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices, such as filters and duplexers, with respect to high power RF signals, which are used in telecommunications, measuring equipment, radar systems and consumer products. RF BAW devices include two types: those based on the film bulk acoustic resonator (FBAR) technology and those based on the solidly mounted resonator (SMR) technology. This document includes basic properties of failure of RF SAW/BAW devices, and guidelines to set up the measurement system and to establish the procedure to estimate the time to failure (TF). Since TF is mainly governed by the RF power applied in the devices, discussions are focused on the power durability. It is not the aim of this document to explain the theory, or to attempt to cover all the eventualities which can arise in practical circumstances. This document draws attention to some of the more fundamental questions which will need to be considered by the user before he/she places an order for an RF SAW/BAW device for a new application. Such a procedure will be the user's means of preventing unsatisfactory performance related to premature device failure resulting from high-power exposure of RF SAW/BAW devices.
- Standard23 pagesEnglish languagesale 10% offe-Library read for1 day
IEC 62047-37:2020 specifies test methods for evaluating the durability of MEMS piezoelectric thin film materials under the environmental stress of temperature and humidity and under mechanical stress and strain, and test conditions for appropriate quality assessment. Specifically, this document specifies test methods and test conditions for measuring the durability of a DUT under temperature and humidity conditions and applied voltages. It further applies to evaluations of direct piezoelectric properties in piezoelectric thin films formed primarily on silicon substrates, i.e. piezoelectric thin films used as acoustic sensors, or as cantilever-type sensors.
This document does not cover reliability assessments, such as methods of predicting the lifetime of a piezoelectric thin film based on a Weibull distribution.
- Standard34 pagesEnglish and French languagesale 15% off
IEC 63155:2020 defines the measurement method for the determination of the durability of radio frequency (RF) surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices, such as filters and duplexers, with respect to high power RF signals, which are used in telecommunications, measuring equipment, radar systems and consumer products. RF BAW devices include two types: those based on the film bulk acoustic resonator (FBAR) technology and those based on the solidly mounted resonator (SMR) technology.
This document includes basic properties of failure of RF SAW/BAW devices, and guidelines to set up the measurement system and to establish the procedure to estimate the time to failure (TF). Since TF is mainly governed by the RF power applied in the devices, discussions are focused on the power durability.
It is not the aim of this document to explain the theory, or to attempt to cover all the eventualities which can arise in practical circumstances. This document draws attention to some of the more fundamental questions which will need to be considered by the user before he/she places an order for an RF SAW/BAW device for a new application. Such a procedure will be the user's means of preventing unsatisfactory performance related to premature device failure resulting from high-power exposure of RF SAW/BAW devices.
- Standard42 pagesEnglish and French languagesale 15% off
IEC 60444-8:2016(E) describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of (series) resonance frequency, (series) resonance resistance, and equivalent electrical circuit parameters L1, C1 and C0 using the measurement techniques specified in IEC 60444-5 and for the determination of load resonance frequency and load resonance resistance according to IEC TR 60444-4 and IEC 60444-11. Two test fixtures are described in this document: 1) A fixture using the p-network circuit with electrical values as described in IEC 60444-1 for measurements in transmission mode up to 500 MHz. This fixture includes optional means to add physical load capacitors for the measurement of load resonance parameters up to 30 MHz in accordance with IEC 60444-4. The range of load capacitance is 10 pF or more. Calibration of the measurement system and CL adapter board is explained hereinafter. 2) A fixture based on the reflection method, suitable for a frequency range up to 1 200 MHz. No provisions for adding a physical load capacitance are anticipated. Load resonance parameters can be measured by using the method of IEC 60444-11. This edition includes the following significant technical changes with respect to the previous edition: a) modification of Clause 1; b) modification of 5.2; c) modification of 5.3; d) modification of 5.4; e) 6.3 Calibration of the reflection measurement system.
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IEC 61240:2016(E) sets out general rules for drawing all dimensional and geometrical characteristics of a surface-mounted piezoelectric device package (referred to in this document as SMD) in order to ensure mechanical inter-changeability of all outline drawings of the SMDs for frequency control and selection. This edition includes the following significant technical changes with respect to the previous edition: - outline drawings have been changed from three views (top, front and bottom) to that based on ISO layout in the third-angle projection, in which the view from the right has been added to the top, front and bottom views; - reference line and geometrical dimensions of the package for enclosures have been changed for practical use; - information on miniaturized leadless ceramic enclosures of piezoelectric devices (SMD) for frequency control and selection has been included in an annex.
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IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition: - terms and definitions are rearranged in accordance with the alphabetical order; - 'reduced LN' is appended to terms and definitions; - 'reduced LT' is appended to terms and definitions; - reduction process is appended to terms and definitions.
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IEC 60758:2008(E) applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control and selection. This fourth edition cancels and replaces the third edition, published in 2004. This edition constitutes a technical revision. It includes the following significant technical changes with respect to the previous edition: preparation of AT-cut slice sample for etching is changed to make it easier; etch channel grade classification is changed considering request of the user and explanation of quartz axes difference between IEEE and IEC is added as Annex F.
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IEC 62884-4:2019 describes the methods for the measurement and evaluation of the short-term frequency stability tests of piezoelectric, dielectric and electrostatic oscillators. Its purpose is to unify the test and evaluation methods for short-term frequency stability.
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IEC TS 61994-5:2019(E) gives the terms and definition for sensors representing the state of the art, which are intended for manufacturing piezoelectric elements, cells and the modules.
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IEC 62884-4:2019 describes the methods for the measurement and evaluation of the short-term frequency stability tests of piezoelectric, dielectric and electrostatic oscillators. Its purpose is to unify the test and evaluation methods for short-term frequency stability.
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