EN 60122-1:2002/A1:2018

SLOVENSKI STANDARD
01-junij-2018
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Quartz crystal units of assessed quality - Part 1: Generic specification
Schwingquarze mit bewerteter Qualität - Teil 1: Fachgrundspezifikation
Résonateurs à quartz sous assurance de la qualité - Partie 1: Spécification générique
Ta slovenski standard je istoveten z: EN 60122-1:2002/A1:2018
ICS:
31.140 3LH]RHOHNWULþQHQDSUDYH Piezoelectric devices
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 60122-1:2002/A1

NORME EUROPÉENNE
EUROPÄISCHE NORM
March 2018
ICS 31.140
English Version
Quartz crystal units of assessed quality - Part 1: Generic
specification
(IEC 60122-1:2002/A1:2017)
Résonateurs à quartz sous assurance de la qualité - Partie Schwingquarze mit bewerteter Qualität - Teil 1:
1: Spécification générique Fachgrundspezifikation
(IEC 60122-1:2002/A1:2017) (IEC 60122-1:2002/A1:2017)
This amendment A1 modifies the European Standard EN 60122-1:2002; it was approved by CENELEC on 2018-01-12. CENELEC
members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this amendment the
status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This amendment exists in three official versions (English, French, German). A version in any other language made by translation under the
responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as
the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2018 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 60122-1:2002/A1:2018 E

European foreword
The text of document 49/1254/FDIS, future edition 1 of IEC 60122-1:2002/A1, prepared by IEC/TC 49
"Piezoelectric and dielectric devices for frequency control and selection" was submitted to the IEC-
CENELEC parallel vote and approved by CENELEC as EN 60122-1:2002/A1:2018.

The following dates are fixed:
(dop) 2018-10-12
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2021-01-12
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice
The text of the International Standard IEC 60122-1:2002/A1:2017 was approved by CENELEC as a
European Standard without any modification.
Replace Annex ZA of EN 60122-1:2002 by the following one:
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1  Where an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
NOTE 2  Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60027 series Letter symbols to be used in electrical 60027 series
technology - Part 1: General
IEC 60050-561 1991 International Electrotechnical Vocabulary - -
(IEV) - Chapter 561: Piezoelectric devices
for frequency control and selection
IEC 60068-1 1988 Environmental testing - Part 1: General - -
and guidance
IEC 60068-2-1 1990 Environmental testing - Part 2: Tests - - -
Tests A: Cold
IEC 60068-2-2 1974 Environmental testing - Part 2: Tests - - -
Tests B: Dry heat
IEC 60068-2-3 1969 Basic environmental testing procedures - - -
Part 2: Tests - Test Ca: Damp heat, steady
state
IEC 60068-2-6 1995 Environmental testing -- Part 2: Tests - - -
Test Fc: Vibration (sinusoidal)
IEC 60068-2-7 1983 Basic environmental testing procedures - EN 60068-2-7 1993
Part 2-7: Tests - Test Ga and guidance:
Acceleration, steady state
IEC 60068-2-13 1983 Basic environmental testing procedures - EN 60068-2-13 1999
Part 2-13: Tests - Test M: Low air pressure
IEC 60068-2-14 1984 Environmental testing - Part 2: Tests - Test - -
N: Change of temperature
IEC 60068-2-17 1994 Basic environmental testing procedures - EN 60068-2-17 1994
Part 2-17: Tests - Test Q: Sealing
IEC 60068-2-20 1979 Environmental testing - Part 2: Tests - Test - -
T: Soldering
IEC 60068-2-21 1999 Environmental testing - Part 2-21: Tests - - -
Test U: Robustness of terminations and
integral mounting devices
IEC 60068-2-27 1987 Basic environmental testing procedures - - -
Part 2: Tests - Test Ea and guidance:
Shock
Publication Year Title EN/HD Year
IEC 60068-2-29 1987 Environmental testing - Part 2: Tests - Test - -
Eb and guidance: Bump
IEC 60068-2-30 1980 Basic environmental testing procedures. - -
Part 2: Tests. Test Db and guidance:
Damp heat, cyclic (12 + 12-hour cycle)
IEC 60068-2-32 1975 Basic environmental testing procedures - - -
Part 2: Tests - Test Ed: Free fall
IEC 60068-2-45 1980 Basic environmental testing procedures - EN 60068-2-45 1992
Part 2-45: Tests - Test XA and guidance:
Immersion in cleaning solvents
IEC 60122-3 2001 Quartz crystal units of assessed quality - - -
Part 3: Standard outlines and lead
connections
IEC 60444-1 1986 Measurement of quartz crystal unit EN 60444-1 1997
parameters by zero phase technique in a
pi-network - Part 1: Basic method for the
measurement of resonance frequency and
resonance resistance of quartz crystal
units by zero phase technique in a pi-
network
IEC 60444-2 1980 Measurement of quartz crystal unit EN 60444-2 1997
parameters by zero phase technique in a
pi-network - Part 2: Phase offset method
for measurement of motional capacitance
of quartz crystal units
IEC/TR 60444-4 1988 Measurement of quartz crystal unit EN 60444-4 1997
parameters by zero phase technique in a
pi-network - Part 4: Method for the
measurement of the load resonance
frequency fL, load resonance resistance
RL and the calculation of other derived
values of quartz crystal units, up to 30 MHz
IEC 60444-5 1995 Measurement of quartz crystal unit EN 60444-5 1997
parameters - Part 5: Methods for the
determination of equivalent electrical
parameters using automatic network
analyzer techniques and error correction
IEC 60444-6 1995 Measurement of quartz crystal unit - -
parameters - Part 6: Measurement of drive
level dependence (DLD)
IEC 60617 series Graphical symbols for diagrams - Part 1: EN 60617 series
General information, general index, Cross-
reference tables
IEC 61178-2 1993 Quartz crystal units - A specification in the - -
IEC Quality Assessment System for
electronic Components (IECQ) - Part 2:
Sectional specification - Capability
approval
Publication Year Title EN/HD Year
IEC 61178-3 1993 Quartz crystal units - A specification in the - -
IEC Quality Assessment System for
electronic Components (IECQ) - Part 3:
Sectional specification - Qualification
approval
IEC 61760-1 2006 Surface mounting technology - Part 1: EN 61760-1 2006
Standard method for the specification of
surface mounting components (SMDs)
IEC QC 001001 2000 IEC Quality Assessment System for - -
Electronic Components (IECQ) - Basic
rules
IEC QC 001002-2 1998 IEC Quality Assessment System for - -
Electronic Components (IECQ) - Rules of
Procedure -- Part 2: Documentation
IEC QC 001002-3 1998 IEC Quality Assessment System for - -
Electronic Components (IECQ) - Rules of
Procedure - Part 3: Approval procedures
IEC QC 001005 2000 Register of firms, products and services - -
approved under the IECQ system,
including ISO 9000
ISO 1000 1992 SI units and recommendations for the use - -
of their multiples and of certain other units

IEC 60122-1 ®
Edition 3.0 2017-12
INTERNATIONAL
STANDARD
AMENDMENT 1
Quartz crystal units of assessed quality –

Part 1: Generic specification
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.140 ISBN 978-2-8322-5094-5

– 2 – IEC 60122-1:2002/AMD1:2017
© IEC 2017
FOREWORD
This amendment has been prepared by IEC technical committee 49: Piezoelectric, dielectric
and electrostatic devices and associated materials for frequency control, selection and
detection.
The text of this amendment is based on the following documents:
FDIS Report on voting
49/1254/FDIS 49/1259/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.

_____________
1.2 Normative references
Add the following reference to the existing list of normative references:
IEC 61760-1:2006, Surface mounting technology – Part 1: Standard method for the
specification of surface mounting components (SMDs)

4.9 Endurance test procedure
Replace Subclause 4.9 with the following new content:
4.9 Endurance test procedure
4.9.1 Standard aging test for production verification
4.9.1.1 Purpose
This test is usable for the statistical verification of aging performance in the production
process.
IEC 60122-1:2002/AMD1:2017 – 3 –
© IEC 2017
4.9.1.2 Procedure
– Take sample from the production lot.
– Initial measurement of f and R at (25 ± 2) °C.
s 1
– Store in oven at T = (+85 ± 3) °C.
oven
– Take and record additional measurements after 1 day and at least three more times at
time intervals recommended in Annex A.
– For the measurement, remove the crystals from oven, and store at room temperature for
1 h, avoiding temperature shocks. Measurement of f and R at (25 ± 2) °C in accordance
s 1
with IEC 60444-5 or equivalent.
– Final measurement of f and R at (25 ± 2) °C after 30 days.
s 1
4.9.1.3 Evaluation
The difference between the highest and lowest frequency measurement shall not exceed the
specified value. The resistance R shall never exceed the specified maximum values.
4.9.2 Accelerated aging
4.9.2.1 Purpose
For special applications, an accelerated aging procedure at higher temperatures is applied to
shorten the verification time and/or to gain performance data at higher operating temperatures.
4.9.2.2 Procedure
The procedure is as in 4.9.1, except that the preferred oven temperature is T = +105 °C,
oven
+125 °C or +150 °C. This temperature has to be lower or equal to the specified maximum
storage temperature.
The ratio between the storage time at 25 °C and the storage time at an elevated temperature
T to achieve the same amount of frequency aging is called "time acceleration factor"
oven
(TAF). This factor depends on the design of the crystal unit and on the production process. It
can be determined experimentally as described in Annex A, or taken from experience with
structurally similar crystals, or can be mutually agreed between the manufacturer and the user.
If the time acceleration factor TAF is not otherwise specified, the following approach is
recommended.
Applying Arrhenius’s law, the time acceleration factor TAF is related to the activation energy
E (in eV) by the following equation:
a
 1 1 
E ⋅ − 
a
 
T T
 ref oven
k
TAF= e
where
−5
k is Boltzmann’s constant (k ≈ 8,617 × 10 eV/K), and the temperatures are given in K.
Published experimental results (see [6] and [7]) show that the activation energy E is
a
decreasing over time, i.e. the acceleration factor becomes lower with the aging time.
Furthermore, E varies between the different crystals and oscillators, depending on frequency,
a
package size, resonator design and production processes. The observed values of E were
a
between > 0,1 eV and < 1 eV.
– 4 – IEC 60122-1:2002/AMD1:2017
© IEC 2017
A common assumption is TAF = 12 for T = +85 °C, i.e. 30 days (1 month) aging at 85 °C
oven
are considered to be equivalent t
...