CLC/SR 49 - Piezoelectric and dielectric devices for frequency control and selection

IEC 62604-2:2022 is available as IEC 62604-2:2022 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 62604-2:2022 applies to duplexers which can separate receiving signals from transmitting signals and are key components for two-way radio communications, and which are generally used in mobile phone systems compliant with CDMA systems such as N-CDMA in second generation mobile telecommunication systems (2G), W-CDMA / UMTS (3G) or LTE (4G). These guidelines draw attention to some fundamental questions about the theory of SAW and BAW duplexers and how to use them, which will be considered by the user before he places an order for SAW and BAW duplexers for a new application. Such a procedure will be the user’s insurance against unsatisfactory performance. Because SAW and BAW duplexers have very similar performance for the usage, it is useful and convenient for users that both duplexers are described in one standard. This edition includes the following significant technical changes with respect to the previous edition: - the term "cross-isolation" has been added to Clause 3; - multiplexers are described. NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner, especially in mobile phone systems and have the same requirements of characteristics, test method and so on.

IEC 62604-1:2022 is available as IEC 62604-1:2022 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 62604-1:2022 specifies the methods of test and general requirements for SAW and BAW duplexers of assessed quality using either capability approval or qualification approval procedures. This edition includes the following significant technical changes with respect to the previous edition: - the term "multiplexer" has been added to Clause 3. NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner especially in mobile phones and have the same requirements of characteristics, test method and so on.

IEC 62884-4:2019 describes the methods for the measurement and evaluation of the short-term frequency stability tests of piezoelectric, dielectric and electrostatic oscillators. Its purpose is to unify the test and evaluation methods for short-term frequency stability.

This part of IEC 60122 is applicable to crystal units with thermistors mainly used in the field of mobile communication that requires high frequency stability such as local reference signal generator for the mobile phone base station or GPS. This document provides users with technical guidelines of crystal units with thermistors as well as basic knowledge of common crystal units with thermistors.

This part of IEC 63041 applies to piezoelectric sensors of resonator, delay-line and non acoustic types, which are used in physical and engineering sciences, chemistry and biochemistry, medical and environmental sciences, etc. The purpose of this document is to specify the terms and definitions for the piezoelectric sensors, and to make sure from a technological perspective that users understand the state-of-art piezoelectric sensors and how to use them correctly.

This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based on the π-network according to IEC 60444-5, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the π-network or reflection method according to IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions. NOTE The measurement methods specified in this document are not only applicable to AT-cut, but also to other crystal cuts and vibration modes, such as doubly rotated cuts (IT,SC) and to tuning fork crystal units (by using a high impedance test fixture).

IEC 61837-2:2018(E) deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is based on IEC 61240:2016. This edition includes the following significant technical changes with respect to the previous edition: a. revision of the figures to match the notation of the drawings of IEC 61240:2016; b. addition of 7 enclosures as follows: DCC-6/5032A, DCC-6/3225A, DCC-4/3215C, DCC-6/2016A, DCC-2/2012C, DCC-2/1610C, DCC-4/1210C. As a result, this third edition contains a total of 45 enclosure types, which are listed in Table 1.

IEC 62884-3:2018(E) describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"). The purpose of those tests is to provide statistical data supporting aging predictions. This document was developed from the works related to IEC 60679-1:2007 (third edition), the measurement techniques of which were restructured into different parts under a new project reference. This document describes the measurement method for frequency aging only.

IEC 63041-2:2017(E) is applicable to piezoelectric chemical sensors mainly used in the field of biological, medical, gas and environmental sciences. It provides users with technical guidelines on biochemical sensors as well as basic knowledge of common chemical sensors.

This part of IEC 62604 concerns duplexers which can separate receiving signals from transmitting signals and are key components for two-way radio communications, and which are generally used in mobile phone systems compliant with CDMA systems such as N-CDMA in second generation mobile telecommunication systems (2G), W-CDMA / UMTS (3G) or LTE (4G). While in 2G systems mainly dielectric duplexers have been used, the ongoing miniaturization in 3G and 4G mobile communication systems promoted the development and application of acoustic wave duplexers due to their small size, light weight and good electrical performance. While standard surface acoustic wave (SAW) duplexers have been employed for applications with moderate requirements regarding the steepness of individual filters, applications with narrow duplex gap (e.g. Bands 2, 3, 8, 25), i.e. the frequency gap between receiving and transmitting bands, require the application of temperature-compensated (TC) SAW or bulk acoustic wave (BAW) technology, because of their better temperature characteristics and resonator Q-factors. It is neither the aim of these guidelines to explain theory, nor to attempt to cover all the eventualities which may arise in practical circumstances. These guidelines draw attention to some of the more fundamental questions, which should be considered by the user before he places an order for SAW and BAW duplexers for a new application. Such a procedure will be the user’s insurance against unsatisfactory performance. Because SAW and BAW duplexers have very similar performance for the usage, it is useful and convenient for users that both duplexers are described in one standard. Standard specifications, such as those of IEC, of which these guidelines form a part, and national specifications or detail specifications issued by manufacturers will define the available combinations of centre frequency, pass bandwidth and insertion attenuation for each sort of transmitting and receiving filters and the isolation level between transmitter and receiver ports, etc. These specifications are compiled to include a wide range of SAW and BAW duplexers with standardized performances. It cannot be over-emphasized that the user should, wherever possible, select his duplexers from these specifications, when available, even if it may lead to making small modifications to his circuit to enable the use of standard duplexers. This applies particularly to the selection of the nominal frequency band.

IEC 62884-2:2017(E) specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used. NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.

IEC 63041-3:2020 is applicable to piezoelectric physical sensors mainly used in the field of process control, wireless monitoring, dynamics, thermodynamics, vacuum engineering, and environmental sciences. This document provides users with technical guidelines as well as basic knowledge of common physical sensors. Piezoelectric sensors covered herein are those applied to the detection and measurement of physical quantities such as force, pressure, torque, viscosity, temperature, film thickness, acceleration, vibration, and tilt angle.

IEC 60679-1:2017(E) specifies general requirements for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"), of assessed quality using either capability approval or qualification approval procedures. NOTE Dielectric Resonator Oscillators (DRO) and oscillators using FBAR are under consideration. This edition includes the following significant technical changes with respect to the previous edition: a) the title has been changed; b) additional matters related to oscillator using SAW or MEMS resonator in "Terms, definitions and general information" have been included; c) measurement methods of IEC 60679-1:2007 have been removed (they will be moved to IEC 62884 series); d) the content of Annex A has been extended; e) a new term and definition DIXO (Digital interfaced Crystal Oscillator) has been added; f) a new term and definition SSXO (Spread Spectrum Crystal Oscillator) has been added; g) Annex D has been added.

IEC 62884-1:2017(E) specifies the measurement techniques for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DROs) and oscillators using FBAR (hereinafter referred to as "Oscillator")

IEC 63155:2020 defines the measurement method for the determination of the durability of radio frequency (RF) surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices, such as filters and duplexers, with respect to high power RF signals, which are used in telecommunications, measuring equipment, radar systems and consumer products. RF BAW devices include two types: those based on the film bulk acoustic resonator (FBAR) technology and those based on the solidly mounted resonator (SMR) technology. This document includes basic properties of failure of RF SAW/BAW devices, and guidelines to set up the measurement system and to establish the procedure to estimate the time to failure (TF). Since TF is mainly governed by the RF power applied in the devices, discussions are focused on the power durability. It is not the aim of this document to explain the theory, or to attempt to cover all the eventualities which can arise in practical circumstances. This document draws attention to some of the more fundamental questions which will need to be considered by the user before he/she places an order for an RF SAW/BAW device for a new application. Such a procedure will be the user's means of preventing unsatisfactory performance related to premature device failure resulting from high-power exposure of RF SAW/BAW devices.

IEC 60444-8:2016(E) describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of (series) resonance frequency, (series) resonance resistance, and equivalent electrical circuit parameters L1, C1 and C0 using the measurement techniques specified in IEC 60444-5 and for the determination of load resonance frequency and load resonance resistance according to IEC TR 60444-4 and IEC 60444-11. Two test fixtures are described in this document: 1) A fixture using the p-network circuit with electrical values as described in IEC 60444-1 for measurements in transmission mode up to 500 MHz. This fixture includes optional means to add physical load capacitors for the measurement of load resonance parameters up to 30 MHz in accordance with IEC 60444-4. The range of load capacitance is 10 pF or more. Calibration of the measurement system and CL adapter board is explained hereinafter. 2) A fixture based on the reflection method, suitable for a frequency range up to 1 200 MHz. No provisions for adding a physical load capacitance are anticipated. Load resonance parameters can be measured by using the method of IEC 60444-11. This edition includes the following significant technical changes with respect to the previous edition: a) modification of Clause 1; b) modification of 5.2; c) modification of 5.3; d) modification of 5.4; e) 6.3 Calibration of the reflection measurement system.

IEC 61240:2016(E) sets out general rules for drawing all dimensional and geometrical characteristics of a surface-mounted piezoelectric device package (referred to in this document as SMD) in order to ensure mechanical inter-changeability of all outline drawings of the SMDs for frequency control and selection. This edition includes the following significant technical changes with respect to the previous edition: - outline drawings have been changed from three views (top, front and bottom) to that based on ISO layout in the third-angle projection, in which the view from the right has been added to the top, front and bottom views; - reference line and geometrical dimensions of the package for enclosures have been changed for practical use; - information on miniaturized leadless ceramic enclosures of piezoelectric devices (SMD) for frequency control and selection has been included in an annex.

IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition: - terms and definitions are rearranged in accordance with the alphabetical order; - 'reduced LN' is appended to terms and definitions; - 'reduced LT' is appended to terms and definitions; - reduction process is appended to terms and definitions.

IEC 60758:2008(E) applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control and selection. This fourth edition cancels and replaces the third edition, published in 2004. This edition constitutes a technical revision. It includes the following significant technical changes with respect to the previous edition: preparation of AT-cut slice sample for etching is changed to make it easier; etch channel grade classification is changed considering request of the user and explanation of quartz axes difference between IEEE and IEC is added as Annex F.

IEC 62575-1:2015 specifies the methods of test and general requirements for RF BAW filters of assessed quality using either capability approval or qualification approval procedures. Conventional crystal filters standardized in the IEC 60368 series are not covered by this standard.

IEC 60862-1:2015 specifies the methods of test and general requirements for SAW filters of assessed quality using either capability approval or qualification approval procedures. This edition includes the following significant technical changes with respect to the previous edition: - the terms and definitions from IEC 60862-2:2002 are included; - the measurement method for the balanced type filter is described; - the electrostatic discharge (ESD) sensitivity test procedure is considered.

IEC 62604-1:2015 specifies the methods of test and general requirements for SAW and BAW duplexers of assessed quality using either capability approval or qualification approval procedures.

IEC 61338-1-5:2015 describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity. This first edition cancels and replaces IEC PAS 61338-1-5 published in 2010. This edition includes the following significant technical changes with respect to the previous edition: a) description of technical content related to patents (Japanese patent numbers JP3634966, JP3735501) in the Introduction; b) changes to normative references; c)addition to bibliography.

IEC 61837-3:2015 deals with standard outlines and terminal lead connections as they apply to SMDs for frequency control and selection in metal enclosures and is based on IEC 61240 which standardized layout rules of outline drawings of the surface-mounted devices. This edition includes the following significant technical changes with respect to the previous edition: - The outline drawing is defined as one set of drawings consisting of four views, which are the view from above, the front view, the view from the right, and the view from below; the view from the right was drawn optionally in the previous edition. - The height of package (G1) is eliminated, instead total height is expressed by the symbol letter G or with a subscript number. - The dimensions of terminal lead spacing are shown by the centre position of the terminal leads and its basic value e is 2.54 x n mm (n is an integer) and 1,27 x n mm for package dimensions smaller than 6 mm (See IEC 61240:2012, 5.5). If the terminal lead spacing is not a multiple of the basic value, a subscript number such as e1, e2 is attached, e.g. e1, e2, etc. If there are plural spacing values, the subscript number is followed by a hyphen and numbers such as e1-1, e1-2 , etc. - In terminal land areas, the lengths of each terminal pad are now expressed with maximum values for consumer's convenience. They were expressed as minimum values in the previous edition of IEC 61837-3. - If there are plural identical enclosures with different height, each enclosure was expressed by a dash (/) and a two-digit number after the basic type name. The identity references are given in the table of the sheet. - The configurations of the enclosures were revised as shown in Table 1.

IEC 61837-4:2015 specifies the outline drawings and terminal lead connections for surface piezoelectric devices with hybrid enclosure outlines and is based on IEC 61240:2012 which standardized layout rules of outline drawings of surface-mounted device. This edition includes the following significant technical changes with respect to the previous edition: - Outline drawing is defined as one set of drawings consisting of four views, which are the view from above, the front view, the view from the right, and the view from below, instead of one set consisting of three views as provided in the previous edition. - The configurations of the enclosures were revised as shown in Table 1.

IEC 62761:2014-02(en-fr) gives the measurement method for nonlinear signals generated in the radio frequency (RF) surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices such as filters and duplexers, which are used in telecommunications, measuring equipment, radar systems and consumer products. It includes basic properties of non-linearity, and guidelines to setup the measurement system and to establish the measurement procedure of nonlinear signals generated in SAW/BAW devices.

IEC 60679-3:2012 specifies the outline dimensions and lead connections for quartz crystal controlled oscillators with lead enclosures. This edition includes the following significant technical changes with respect to the previous edition: - CO 01, CO 07, CO 10, CO 17 and CO 18 were deleted; - The current pin layout of CO 06 was deleted. And new pin layout of CO 06 was added as CO 40; - New layout of CO 15 was added as CO 41; - Two new enclosures, CO 42 and CO 43 were added. Therefore revised edition includes 15 types of enclosures as in Table 1 of Clause 5.

IEC 62575-2:2012 gives practical guidance on the use of RF BAW filters which are used in telecommunications, measuring equipment, radar systems and consumer products. General information, standard values and test conditions will be provided in a future IEC standard. This part of IEC 62575 includes various kinds of filter configurations, of which the operating frequency range is from approximately 500 MHz to 10 GHz and the relative bandwidth is about 1 % to 5 % of the centre frequency.

IEC 60862-2:2012 gives practical guidance on the use of SAW filters which are used in telecommunications, measuring equipment, radar systems and consumer products. IEC 60862-1 should be referred to for general information, standard values and test conditions. This part of IEC 60862 includes various kinds of filter configuration, of which the operating frequency range is from approximately 10 MHz to 3 GHz and the relative bandwidth is about 0,02 % to 50 % of the centre frequency. It is not the aim of this standard to explain theory, nor to attempt to cover all the eventualities which may arise in practical circumstances. This standard draws attention to some of the more fundamental questions, which should be considered by the user before he places an order for a SAW filter for a new application. Such a procedure will be the user's insurance against unsatisfactory performance. This edition includes the following significant technical changes with respect to the previous edition: - Clause 3 'Terms and definitions' has been deleted to be included in the next edition of IEC 60862-1; - the tapered IDT filter and the RSPUDT filter have been added to the clause of SAW transversal filters. Also DART, DWSF and EWC have been added as variations of SPUDT; - the balanced connection has been added to the subclause of coupled resonator filters; - recent substrate materials have been described; - a subclause about packaging of SAW filters has been added.

IEC 61837-1:2012 deals with standard outlines and terminal lead connections as they apply to SMDs for frequency control and selection in plastic moulded enclosures and is based on IEC 61240.

IEC 60122-3:2010 specifies the outline drawing for quartz crystal units with lead enclosures. The main changes with respect to the previous edition are as follows: 12 of the 48 enclosure types contained in the previous edition have been deleted.

IEC 60368-3:2010 specifies the outline drawing for piezoelectric filters with lead enclosures. This edition includes the following significant technical changes with respect to the previous edition: a) four enclosure types (CF05, CF06, CF07 and CF09) have been deleted from previous edition, IEC 60368-3 Ed. 3.0; b) now standardized enclosures are totally 16 types. These are listed in Table.1.

IEC 60444-11:2010 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.

IEC 60689:2008(E) applies to measurements and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values for frequency control and selection. This second edition cancels and replaces the first edition published in 1980. This edition constitutes a technical revision. It includes the following significant technical changes with respect to the previous edition: a) The title of the first edition is Measurements and test methods for 32 kHz quartz crystal units for wrist watches and standard values. The title is modified and the frequency range of this second edition is extended to the range from 10 kHz to 200 kHz. b) The Lissajous method is defined in the first edition as the standard measurement method. The PI network and bridge method are used in this second edition. c) The PI network has a transformer for impedance matching. This composition differs from that of IEC 60444-1.

IEC 60679-4-1:1998 is a supplementary document to the sectional specification and contains requirements for the minimum content of detail specifications. Applies to quartz crystal controlled oscillators as custom built products or as standard catalogue items and whose quality is assessed on the basis of capability approval.

IEC 60679-4:1997 applies to quartz crystal controlled oscillators as custom built products or as standard catalogue items and whose quality is assessed on the basis of capability approval. It prescribes the preferred ratings and characteristics, with appropriate tests and measuring methods contained in the generic specification, IEC 60679-1, and gives the general performance requirements to be used in detail specifications for quartz crystal controlled oscillators.

Describes two methods for determining the spurious (unwanted) modes of piezoelectric crystal resonators: method A (the full parameter determination) and method B (the resistance determination). Extends the capabilities and improves the reproducibility and accuracy with respect to previous methods.

Describes the measurement method of dielectric properties for dielectric resonator materials at millimetre-wave frequency. Proposes two measurement methods: a) the dielectric rod resonator method and b) the cut-off waveguide method.

Gives practical guidance to the use of surface acoustic wave (SAW) resonators which are used in telecommunications, radio equipments and consumer products. Is to be used in conjunction with EN 61019-1. The features of SAW resonators are small size, light weight, adjustment-free and high stability. operating frequencies extend to the VHF and UHF ranges.

Applies to waveguide type dielectric resonators as custom built products or as standard catalogue items whose quality is assessed on the basis of capability approval. Prescribes the preferred ratings and characteristics with the appropriate tests and measuring methods contained in EN 61338-1, and gives the general performance requirements to be used in detail specifications for waveguide type dielectric resonators.

Is a blank detail specification and as such a supplementary document to the sectional specification EN 61338-4. Contains requirements for the minimum content of detail specifications.

Lists the test and measurement procedures which may be selected for use in detail specifications for waveguide type dielectric resonators.

Specifies the methods of test and general requirements for SAW resonators.

Lists the test and measurement procedures which may be selected for use in detail specifications for filters using waveguide type dielectric resonators.

Draws attention to some of the more fundamental questions which should be considered by the user before he places an order for dielectric filters for a new application. Is limited to filters using waveguide type dielectric resonators that are used for microwave applications such as portable phones, cellular base stations and radio links.

Contains guidelines for use of waveguide type dielectric resonators that are used for oscillator and filter applications. The applications are oscillators for direct broadcasting or communication satellite systems, oscillators for radio links, voltage-controlled oscillators for mobile communication systems and so on.

Describes the procedure for measuring and evaluating activity and frequency dips for quartz crystal units over a temperature range.