SIST EN IEC 63541:2026

SLOVENSKI STANDARD
01-april-2026
Kristali litijevega tantalata in litijevega niobata za površinske zvočnovalovne
naprave (SAW) - Specifikacije in merilne metode (IEC 63541:2025)
Lithium tantalate and lithium niobate crystals for surface acoustic wave (SAW) device
applications - Specifications and measuring methods (IEC 63541:2025)
Lithiumtantalat- und Lithiumniobat-Kristalle für Oberflächenwellen-Bauelemente (SAW) -
Spezifikationen und Messverfahren (IEC 63541:2025)
Cristaux de tantalate et de niobate de lithium pour applications utilisant des dispositifs à
ondes acoustiques de surface (OAS) - Spécifications et méthodes de mesure (IEC
63541:2025)
Ta slovenski standard je istoveten z: EN IEC 63541:2026
ICS:
31.140 Piezoelektrične naprave Piezoelectric devices
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN IEC 63541

NORME EUROPÉENNE
EUROPÄISCHE NORM February 2026
ICS 31.140
English Version
Lithium tantalate and lithium niobate crystals for surface acoustic
wave (SAW) device applications - Specifications and measuring
methods
(IEC 63541:2025)
Cristaux de tantalate de lithium et de niobate de lithium Lithiumtantalat- und Lithiumniobat-Kristalle für
pour applications utilisant des dispositifs à ondes Oberflächenwellen-Bauelemente (SAW) – Spezifikationen
acoustiques de surface (OAS) - Spécifications et méthodes und Messverfahren
de mesure (IEC 63541:2025)
(IEC 63541:2025)
This European Standard was approved by CENELEC on 2026-01-23. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
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European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2026 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 63541:2026 E
European foreword
The text of document 49/1496/CDV, future edition 1 of IEC 63541, prepared by TC 49 "Piezoelectric,
dielectric and electrostatic devices and associated materials for frequency control, selection and
detection" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2027-02-28
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2029-02-28
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Any feedback and questions on this document should be directed to the users’ national committee. A
complete listing of these bodies can be found on the CENELEC website.
Endorsement notice
The text of the International Standard IEC 63541:2025 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following note has to be added for the standard indicated:
IEC 62276:2025 NOTE Approved as EN IEC 62276:2025 (not modified)

IEC 63541 ®
Edition 1.0 2025-12
INTERNATIONAL
STANDARD
Lithium tantalate and lithium niobate crystals for surface acoustic wave (SAW)
device applications - Specifications and measuring methods

ICS 31.140  ISBN 978-2-8327-0946-7

IEC 63541:2025-12(en)
IEC 63541:2025 © IEC 2025
CONTENTS
FOREWORD. 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 Requirements . 7
4.1 Material specification . 7
4.1.1 LN . 7
4.1.2 LT . 7
4.2 Requirements for as-grown crystal . 7
4.2.1 Specifications . 7
4.2.2 Macroscopic quality . 8
4.2.3 Single domain . 8
4.2.4 Curie temperature and tolerance . 8
4.2.5 Lattice parameter . 8
4.3 Requirements for lumbered crystal . 8
4.3.1 As-grown crystal for lumbered crystal . 8
4.3.2 Specifications . 8
5 Sampling and inspection . 9
5.1 General . 9
5.2 Sampling and inspection plan . 9
5.3 Determination of inspection results . 10
6 Test methods. 10
6.1 Test methods for as-grown crystal . 10
6.1.1 Diameter and cylinder length . 10
6.1.2 Macroscopic quality . 10
6.1.3 Single domain . 10
6.1.4 Curie temperature . 10
6.1.5 Lattice parameter . 10
6.2 Test methods for lumbered crystal . 11
6.2.1 Surface orientation . 11
6.2.2 Diameter . 11
6.2.3 Orientation of orientation flat . 11
6.2.4 Width of orientation flat . 11
6.2.5 Effective length . 11
6.2.6 Cylindricity . 11
6.2.7 Verticality . 11
7 Identification, labelling, packaging, delivery condition . 11
7.1 Packaging . 11
7.2 Labelling and identification . 11
7.3 Terms of delivery . 11
Annex A (normative) Measurement of single domain for LT and LN crystals . 12
A.1 General . 12
A.2 Measurement principle . 12
A.3 Measurement . 12
A.3.1 Scattered light path method . 12
A.3.2 Etching method . 13
IEC 63541:2025 © IEC 2025
A.3.3 Electromotive voltage method . 15
Annex B (normative) Measurement of Curie temperature . 17
B.1 General . 17
B.2 DTA method . 17
B.3 DSC method . 18
B.4 Dielectric constant method . 18
Annex C (normative) Measurement of lattice parameter (Bond method). 20
Annex D (normative) Measurement of cylindricity for LT and LN crystals . 22
D.1 General . 22
D.2 Measurement . 22
D.2.1 Equipment . 22
D.2.2 Measuring procedure . 22
D.2.3 Other instructions . 23
Annex E (normative) Measurement of verticality for LT and LN crystals . 24
E.1 General . 24
E.2 Measurement . 24
E.2.1 Equipment . 24
E.2.2 Measuring procedure . 24
Bibliography . 25

Figure 1 – Schematic diagram of lumbered crystal . 6
Figure 2 – Schematic diagram of verticality for lumbered crystal . 7
Figure A.1 – Schematic diagram of sample position . 14
Figure A.2 – Schematic diagram of measurement points . 14
Figure A.3 – Examples of 42°Y-X LT after etching . 14
Figure A.4 – Examples of 128°Y-X LN after etching . 15
Figure A.5 – Schematic diagram of waveform for single-domain crystals . 15
Figure A.6 – Schematic diagram of waveform for non-single-domain crystals . 16
Figure B.1 – Schematic of a DTA system . 17
Figure B.2 – Schematic of a DSC system . 18
Figure B.3 – Schematic of a dielectric constant measurement system . 19
Figure C.1 – The Bond method. 21
Figure D.1 – Measurement schematic diagram of cylindricity . 22
Figure E.1 – Measurement schematic diagram of verticality . 24

Table 1 – Typical specifications of as-grown crystal . 8
Table 2 – The centre value and tolerance of Curie temperature specification. 8
Table 3 – Typical specifications of lumbered crystal . 9
Table 4 – Sampling and inspection plan . 10

IEC 63541:2025 © IEC 2025
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
Lithium tantalate and lithium niobate crystals
for surface acoustic wave (SAW) device applications -
Specifications and measuring methods

FOREWORD
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all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
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9) IEC draws attention to the possibility that the implementation of this document may involve the use of (a)
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shall not be held responsible for identifying any or all such patent rights.
IEC 63541 has been prepared by IEC technical committee 49: Piezoelectric, dielectric and
electrostatic devices and associated materials for frequency control, selection and detection. It
is an International Standard.
The text of this International Standard is based on the following documents:
Draft Report on voting
49/1496/CDV 49/1517/RVC
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.
IEC 63541:2025 © IEC 2025
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
– reconfirmed,
– withdrawn, or
– revised.
IEC 63541:2025 © IEC 2025
1 Scope
This document applies to lithium tantalate (LT) and lithium niobate (LN) crystals for surface
acoustic wave devices, including the as-grown crystals and lumbered crystals.
2 Normative references
There are no normative references in this document.
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
– IEC Electropedia: available at https://www.electropedia.org/
– ISO Online browsing platform: available at https://www.iso.org/obp
3.1
as-grown crystal
synthetic crystal without any processing
3.2
crystal orientation
crystallization direction of the crystal
3.3
Curie temperature
T
c
temperature at which a ferroelectric material undergoes a structural phase transition to a state
where spontaneous polarization vanishes
Note 1 to entry: The Curie temperature is measured by differential thermal analysis (DTA), differential scanning
calorimetry (DSC), or dielectric measurement.
3.4
cylinder length
continuous geometric length which is greater than the minimum diameter of the corresponding
specification in as-grown crystal
3.5
cylindricity
difference between the maximum and minimum dimensions of any vertical section of lumbered
crystal
3.6
effective length
geometric length after the removal of internal defects and processing defects in the actual
length of lumbered crystal
IEC 63541:2025 © IEC 2025
3.7
lattice parameter
lattice constant
length of one unit cell along the major crystallographic axis
Note 1 to entry: The lattice parameter is measured by X-ray diffraction using the Bond method.
3.8
lithium niobate
LN
single crystal approximately described by the chemical formula LiNbO , grown by the
Czochralski (crystal pulling from melt) or other methods
3.9
lithium tantalate
LT
single crystal approximately described by the chemical formula LiTaO , grown by the
Czochralski (crystal pulling from melt) or other methods
3.10
lumbered crystal
synthetic crystal that has been processed flat by sawing, grinding, lapping, etc., to meet
specified dimensions and orientation as shown in Figure 1

Figure 1 – Schematic diagram of lumbered crystal
3.11
polarization process
electrical process used to establish a single domain crystal
3.12
single domain
ferroelectric crystal with uniform electric polarization throughout
3.13
surface orientation
crystallographic orientation of the axis perpendicular to the surface of the lumbered crystal
...