IEC 60034-3:1988
(Main)Rotating electrical machines - Part 3: Specific requirements for turbine-type synchronous machines
Rotating electrical machines - Part 3: Specific requirements for turbine-type synchronous machines
Applies to three-phase turbine-type machines, with rated outputs of 10 MVA and above, used as generators. The contents of the corrigendum of December 1997 have been included in this copy.
Machines électriques tournantes - Troisième partie: Règles spécifiques pour les turbomachines synchrones
S'applique aux turbomachines triphasées de puissance assignée supérieure ou égale à 10 MVA, utilisées en alternateurs. Le contenu du corrigendum de décembre 1997 a été pris en considération dans cet exemplaire.
General Information
Relations
Standards Content (Sample)
Publication 60034-3 de la CEI IEC Publication 60034-3
(Quatrième édition) (Fourth edition)
Machines électriques tournantes – Rotating electrical machines –
Troisième partie: Règles spécifiques pour les Part 3: Specific requirements for turbine-type
turbomachines synchrones synchronous machines
CORRIGENDUM 1
Page 18 Page 19
Article 14: Clause 14:
Au lieu de
...
This May Also Interest You
IEC 62541-100:2025 defines the information model associated with Devices. This document describes three models which build upon each other as follows:
• The (base) Device Model is intended to provide a unified view of devices and their hardware and software parts irrespective of the underlying device protocols.
• The Device Communication Model adds Network and Connection information elements so that communication topologies can be created.
• The Device Integration Host Model finally adds additional elements and rules required for host systems to manage integration for a complete system. It enables reflecting the topology of the automation system with the devices as well as the connecting communication networks.
This document also defines AddIns that can be used for the models in this document but also for models in other information models. They are:
• Locking model – a generic AddIn to control concurrent access,
• Software update model – an AddIn to manage software in a Device.
This second edition cancels and replaces the first edition published in 2015. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a a ComponentType that can be used to model any HW or SW element of a device has been defined and a SoftwareType has been added as subtype of ComponentType;
b the new OPC UA interface concept and defined interfaces for Nameplate, DeviceHealth, and SupportInfo has been added.
c) a new model for Software Update (Firmware Update) has been added;
d) a new entry point for documents where each document is represented by a FileType instance has been specified;
e) a model that provides information about the lifetime, related limits and semantic of the lifetime of things like tools, material or machines has been added.
- Standard152 pagesEnglish languagesale 15% off
- Standard158 pagesFrench languagesale 15% off
- Standard310 pagesEnglish and French languagesale 15% off
IEC TR 61169-1-8:2025 provides a test method for voltage standing wave ratio (VSWR, hereinafter) of single RF connector by double-connector method. This document is applicable to single RF cable connectors and single microstrip RF connectors as well as single adapters if an estimation of the VSWR of a single completely installed RF-connector is used and a time domain feature is not available on the vector network analyzer.
- Technical report18 pagesEnglish languagesale 15% off
IEC 61757-1-4:2025 defines the terminology, structure, and measurement methods of distributed fibre optic sensors for absolute strain measurements based on spectral correlation analysis of Rayleigh backscattering signatures in single-mode fibres, where the fibre is the distributed strain measurement element in a measurement range from about 10 m to tens of km. This document also applies to hybrid sensor systems that combine the advantages of Brillouin and Rayleigh backscattering effects to obtain optimal measurement quality. This document also specifies the most important features and performance parameters of these distributed fibre optic strain sensors defines procedures for measuring these features and parameters. This part of IEC 61757 does not apply to point measurements or to dynamic strain measurements. Distributed strain measurements using Brillouin scattering in single-mode fibres are covered in IEC 61757-1-2. The most relevant applications of this strain measurement technique are listed in Annex A, while Annex B provides a short description of the underlying measurement principle.
- Standard27 pagesEnglish languagesale 15% off
- Standard29 pagesFrench languagesale 15% off
- Standard56 pagesEnglish and French languagesale 15% off
IEC 62541-13:2025 is available as IEC 62541-13:2025 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 62541-13:2025 defines the information model associated with Aggregates. Programmatically produced aggregate examples are listed in Annex A. This third edition cancels and replaces the second edition published in 2020. This edition constitutes a technical revision.
This edition includes the following technical changes with respect to the previous edition:
a) Multiple fixes for the computation of aggregates
• The Raw status bit is always set for non-bad StatusCodes for the Start and End aggregates.
• Entries in the Interpolative examples Tables A2.2 Historian1, Historian2, and Historian3 have been changed from Good to Good, Raw status codes when the timestamp matches with the timestamp of the data source.
• Missing tables have been added for DurationInStateZero and DurationInStateNonZero.
• The value of zero has been removed for results with a StatusCode of bad.
• Data Type was listed as "Status Code" when it is "Double" for both Standard Deviation and both Variance Aggregates.
• Rounding Error in TimeAverage and TimeAverage2 have been corrected.
• The status codes have been corrected for the last two intervals and the value has been corrected in the last interval.
• The wording has been changed to be more consistent with the certification testing tool.
• UsedSlopedExtrapolation set to true for Historian2 and all examples locations needed new values or status' are modified.
• Values affected by percent good and percent bad have been updated.
• PercentGood/PercentBad are now accounted for in the calculation.
• TimeAverage uses SlopedInterpolation but the Time aggregate is incorrectly allowed to used Stepped Interpolation.
• Partial bit is now correctly calculated.
• Unclear sentence was removed.
• Examples have been moved to a CSV.
• The value and status code for Historian 3 have been updated.
• TimeAverage2 Historian1 now takes uncertain regions into account when calculating StatusCodes.
• TimeAverage2 Historian2 now takes uncertain regions into account when calculating StatusCodes.
• Total2 Historian1 now takes uncertain regions into account when calculating StatusCodes
• Total2 Historian2 now takes uncertain regions into account when calculating StatusCodes
• Maximum2 Historian1 now takes uncertain regions into account when calculating StatusCodes
• MaximumActualTime2 Historian1 now takes uncertain regions into account when calculating StatusCodes
• Minimum2 Historian1 now takes uncertain regions into account when calculating StatusCodes
• MinimumActualTime2 Historian1 now has the StatusCodes calculated while using the TreatUncertainAsBad flag.
• Range2 Historian1 now looks at TreatUncertainAsBad in the calculation of the StatusCodes.
• Clarifications have been made to the text defining how PercentGood/PercentBad are used. The table values and StatusCodes of the TimeAverage2 and Total2 aggregates have been corrected.
- Standard64 pagesEnglish languagesale 15% off
- Standard64 pagesFrench languagesale 15% off
- Standard128 pagesEnglish and French languagesale 15% off
IEC 62541-7: 2025 specifies value and structure of Profiles in the OPC Unified Architecture.
OPC UA Profiles are used to segregate features with regard to testing of OPC UA products and the nature of the testing. The scope of this document includes defining functionality that can only be tested. The definition of actual TestCases is not within the scope of this document, but the general categories of TestCases are covered by this document.
Most OPC UA applications will conform to several, but not all of the Profiles.
This fourth edition cancels and replaces the third edition published in 2020. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) Profiles and ConformanceUnits are not part of this document, but are solely managed in a public database as described in Clause 1.
- Standard160 pagesEnglish languagesale 15% off
- Standard173 pagesFrench languagesale 15% off
- Standard333 pagesEnglish and French languagesale 15% off
IEC TS 62607-6-27:2025, which is a Technical Specification, establishes a standardized method to determine the key control characteristic
• field-effect mobility
for semiconducting two-dimensional (2D) materials by the
• field-effect transistor (FET) method.
For two-dimensional semiconducting materials, the field-effect mobility is determined by fabricating a FET test structure and measuring the transconductance in a four-terminal configuration.
- This method can be applied to layers of semiconducting two-dimensional materials, such as graphene, black phosphorus (BP), molybdenum disulfide (MoS₂), molybdenum ditelluride (MoTe₂), tungsten disulfide (WS₂), and tungsten diselenide (WSe₂).
- The four-terminal configuration improves accuracy by eliminating parasitic effects from the probe contacts and cables
- Technical specification19 pagesEnglish languagesale 15% off
IEC TS 62876-3-4:2025, which is a Technical Specification, establishes a standardized guideline to assess
• reliability of metallic interfaces
of Ohmic-contacted field-effect transistors (FETs) using 2D nano-materials by quantifying
• linearity of current-voltage (I-V) output curves
for devices with various materials combinations of van der Waals (vdW) interfaces.
For metallic interfaces with 2D materials (eg. graphene, MoS2, MoTe2, WS2, WSe2, etc) and metals (eg. Ti, Cr, Au, Pd, In, Sb, etc), the reliability of Ohmic contact is quantified.
For FETs consisting of 2D materials-based channels (eg. MoS2, MoTe2, WS2, WSe2, etc), the reliability of Ohmic contact when varying contacting metal, channel length, channel thickness, applied voltage, and surface treatment condition is quantified.
The reliability of the metallic contacts is quantified from the linearity of I-V characteristics measured over extended time periods.
- Technical specification24 pagesEnglish languagesale 15% off
IEC TS 63414:2025 is applicable for the determination of the AC and DC pollution flashover and withstand voltage characteristics of insulators with polymeric housing, to be used outdoors in HV applications and exposed to polluted environments. This is also applicable for insulators with hydrophobic coatings. This document refers to AC systems with a rated voltage greater than 1 000 V and DC systems with a rated voltage greater than 1 500 V.
The object of this technical specification is to prescribe standardized test methods, requirements and procedures for artificial pollution tests applicable to polymeric insulators for overhead lines including traction lines, station post and hollow insulators of equipment. Available test experience with polymeric station post and hollow insulators, especially for DC applications, is limited.
The proposed tests are not applicable to ceramic and glass insulators without polymeric housing, to greased insulators or to special types of insulators (e.g., insulators with semiconducting glaze).
Differently to ceramic and glass insulators without polymeric housing:
- The pollution performance of insulators with polymeric housing varies with the hydrophobicity condition of the surface. The specific conditions simulated by standardized tests might not represent the actual dynamic field conditions.
- The determination of the flashover and/or withstand voltage under pollution conditions is not enough for dimensioning. Additional constraints related to possible ageing are also to be considered.
- If the Hydrophobicity Transfer Material (HTM) test according to IEC TR 62039 confirms that an insulator is non-HTM, it can be tested according to IEC 60507 or IEC TS 61245.
- Technical specification39 pagesEnglish languagesale 15% off
IEC 63522-4:2025 is used for testing along with the appropriate severities and conditions for measurements and tests designed to assess the ability of DUTs to perform under expected conditions of transportation, storage and all aspects of operational use.
The object of this test is to define a standard test method for the dielectric strength test.
- Standard10 pagesEnglish languagesale 15% off
- Standard10 pagesFrench languagesale 15% off
- Standard20 pagesEnglish and French languagesale 15% off
IEC 62541-10:2025 is available as IEC 62541-10:2025 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 62541-10:2025 defines the Information Model associated with Programs in OPC Unified Architecture (OPC UA). This includes the description of the NodeClasses, standard Properties, Methods and Events and associated behaviour and information for Programs. The complete AddressSpace model including all NodeClasses and Attributes is specified in IEC 62541-3. The Services such as those used to invoke the Methods used to manage Programs are specified in IEC 62541-4. An example for a DomainDownload Program is defined in Annex A. This fourth edition cancels and replaces the third edition published in 2020. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
- StateMachine table format has been aligned.
- Standard42 pagesEnglish languagesale 15% off
- Standard45 pagesFrench languagesale 15% off
- Standard87 pagesEnglish and French languagesale 15% off
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.
Loading comments...