IEC 62528:2007

IEC 62528
Edition 1.0 2007-11
™
IEEE 1500
INTERNATIONAL
STANDARD
Standard Testability Method for Embedded Core-based Integrated Circuits

All rights reserved. IEEE is a registered trademark in the U.S. Patent & Trademark Office, owned by the Institute of
Electrical and Electronics Engineers, Inc.
Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means,
electronic or mechanical, including photocopying and microfilm, without permission in writing from the IEC Central Office.
Any questions about IEEE copyright should be addressed to the IEEE. Enquiries about obtaining additional rights
to this publication and other information requests should be addressed to the IEC or your local IEC member National
Committee.
IEC Central Office The Institute of Electrical and Electronics Engineers, Inc
3, rue de Varembé 3 Park Avenue
CH-1211 Geneva 20 US-New York, NY10016-5997
Switzerland USA
Email: inmail@iec.ch Email: stds-info@ieee.org
Web: www.iec.ch Web: www.ieee.org

About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
ƒ Catalogue of IEC publications: www.iec.ch/searchpub
The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,…).
It also gives information on projects, withdrawn and replaced publications.
ƒ IEC Just Published: www.iec.ch/online_news/justpub
Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available
on-line and also by email.
ƒ Electropedia: www.electropedia.org
The world's leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions
in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical
Vocabulary online.
ƒ Customer Service Centre: www.iec.ch/webstore/custserv
If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service
Centre FAQ or contact us:
Email: csc@iec.ch
Tel.: +41 22 919 02 11
Fax: +41 22 919 03 00
IEC 62528
Edition 1.0 2007-11
™
IEEE 1500
INTERNATIONAL
STANDARD
Standard testability method for embedded core-based integrated circuits

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
XF
ICS 31.220 ISBN 2-8318-9481-6
– 2 – IEC 62528:2007(E)
IEEE 1500-2005(E)
CONTENTS
FOREWORD . 4
IEE Introduction . 7
1. Overview.9
1.1 Scope.10
1.2 Purpose.10
2. Normative references.10
3. Definitions, acronyms, and abbreviations.11
3.1 Definitions .11
3.2 Acronyms and abbreviations .16
4. Structure of this standard .17
4.1 Specifications.17
4.2 Descriptions . 18
5. Introduction and motivations of two compliance levels. 18
6. Overview of the IEEE 1500 scalable hardware architecture . 19
6.1 Wrapper serial port (WSP) . 19
6.2 Wrapper parallel port (WPP) . 19
6.3 Wrapper instruction register (WIR).20
6.4 Wrapper bypass register (WBY).20
6.5 Wrapper boundary register (WBR).20
7. WIR instructions .21
7.1 Introduction.21
7.2 Response of the wrapper circuitry to instructions .13
7.3 Wrapper instruction rules and naming convention .23
7.4 WS_BYPASS Instruction .24
7.5 WS_EXTEST instruction .25
7.6 WP_EXTEST instruction .27
7.7 Wx_EXTEST instruction. 29
7.8 WS_SAFE instruction.30
7.9 WS_PRELOAD instruction.32
7.10 WP_PRELOAD instruction.32
7.11 WS_CLAMP instruction.34
7.12 WS_INTEST_RING instruction.36
7.13 WS_INTEST_SCAN instruction.37
7.14 Wx_INTEST instruction.40
8. Wrapper serial port (WSP) .41
8.1 WSP terminals .42
9. Wrapper parallel port (WPP) .43
9.1 WPP terminals .43
10. Wrapper instruction register (WIR).43
10.1 WIR configuration and DR selection.43
10.2 WIR design .44
10.3 WIR operation.47
11. Wrapper bypass register (WBY). 49
11.1 WBY register configuration and selection. 49
Published by IEC under licence from IEEE. © 2005 IEEE. All rights reserved.

IEEE 1500-2005(E)
11.2 WBY design. 50
11.3 WBY operation .51
12. Wrapper boundary register (WBR).52
12.1 WBR structure and operation .54
12.2 WBR cell structure and operation.55
12.3 WBR operation events .56
12.4 WBR operation modes. 59
12.5 Parallel access to the WBR.61
12.6 WBR cell naming.63
12.7 WBR cell examples .64
12.8 IEEE 1500 WBR example . 68
13. Wrapper states.71
13.1 Wrapper Disabled and Wrapper Enabled states .71
14. WSP timing diagram.72
14.1 Specifications.72
14.2 Description.73
14.3 Synchronous reset timing.77
15. WSP configurations for IEEE 1500 system chips . 78
15.1 Connecting multiple WSPs. 78
16. Plug-and-play (PnP).81
16.1 Background and definition.81
16.2 PnP aspects of standard instructions.82
16.3 PnP limitations on protocols .83
16.4 Non-PnP in IEEE Std 1500.83
17. Compliance definitions common to wrapped and unwrapped cores .83
17.1 General rules .83
17.2 Per-terminal rules.85
17.3 Test pattern information rules.86
18. Compliance definitions specific to unwrapped cores .89
18.1 General rules . 89
18.2 Per-terminal rules.90
18.3 Additional test information rules .90
19. Compliance definitions specific to wrapped cores .91
19.1 General rules .91
19.2 Per-terminal rules.92
19.3 Wrapper protocol information rules .92
20. IEEE 1500 application .93
20.1 CTL (IEEE P1450.6) overview .93
20.2 IEEE 1500 examples.
...