IEC 60747-4:2007/AMD1:2017
(Amendment)Amendment 1 - Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
Amendment 1 - Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
Amendement 1 - Dispositifs à semiconducteurs - Dispositifs discrets - Partie 4: Diodes et transistors hyperfréquences
General Information
- Status
- Published
- Publication Date
- 29-Jan-2017
- Technical Committee
- SC 47E - Discrete semiconductor devices
- Drafting Committee
- WG 2 - TC 47/SC 47E/WG 2
- Current Stage
- PPUB - Publication issued
- Start Date
- 30-Jan-2017
- Completion Date
- 27-Feb-2017
Relations
- Effective Date
- 05-Sep-2023
Overview
The IEC 60747-4:2007/AMD1:2017 amendment pertains to the international standard for semiconductor devices, specifically focusing on discrete microwave diodes and transistors. Developed by the International Electrotechnical Commission (IEC), this amendment updates critical definitions, measurement methods, and testing procedures related to microwave semiconductor components. It aims to ensure global harmonization in the characterization and performance evaluation of microwave diodes and transistors used in RF and microwave applications.
This standard amendment is essential for manufacturers, designers, and testers of semiconductor microwave devices, providing updated terminologies and test methods that improve precision, reliability, and consistency in device performance assessments.
Key Topics
Definitions and Terminology Updates
The amendment revises key definitions such as RF power measured at the output port and clarifies terms like maximum stable gain (MSG) and intermodulation distortion (IMD). IMD is specified for nth order intermodulation distortion, an important parameter in microwave device performance.Intermodulation Distortion Measurement
Detailed updates to two-tone intermodulation distortion testing (P_n/P_1) are provided, including measurement principles, test procedures, terminology, and associated equations to accurately quantify nonlinear distortion products in microwave devices.Test Procedures Enhancements
Continuous sweeping of the phase angle by varying the length of the line stretcher during device testing is emphasized to obtain accurate RF characteristic data. This procedural refinement applies to several test scenarios outlined in the standard.Revised Reference Documents
The amendment replaces and updates normative references such as IEC 60050-702 (International Electrotechnical Vocabulary for oscillations and signals) and IEC 60747-1 (General semiconductor device standards) ensuring alignment with the latest terminological frameworks and testing methodologies.Parameter Tables and Operating Conditions
Updated RF characteristic tables include refined parameters for input/output power at intercept points and intermodulation distortion metrics, enhancing clarity and applicability in device specification sheets.
Applications
Microwave Communication Devices
Ensures the standardized testing and measurement of microwave diodes and transistors used in RF amplifiers, oscillators, and mixers within wireless communication systems.Circuit Design Validation
Provides engineers with precise measurement techniques and definitions to validate high-frequency discrete semiconductor components used in radar, satellite, and wireless infrastructure designs.Quality and Compliance Testing
Supports semiconductor manufacturers and third-party labs in quality assurance and compliance verification to meet international performance criteria.Performance Optimization
Enables device designers to understand nonlinear effects (such as intermodulation distortion) in microwave components, facilitating the optimization of device performance in complex RF circuits.
Related Standards
IEC 60747-1: Semiconductor Devices – Part 1: General
Foundational standard covering general semiconductor device definitions and test methods referenced and updated in this amendment.IEC 60050-702: International Electrotechnical Vocabulary (Oscillations, Signals, and Related Devices)
Provides terminology and definitions related to oscillations and signals, ensuring consistent language usage across semiconductor device standards.IEC 60747-16-1: Microwave Integrated Circuits – Amplifiers
Though deleted in this amendment, this related standard addresses microwave integrated circuits and amplifiers and may complement understanding of discrete semiconductor device behavior.Other IEC 60747 Parts: Discrete Semiconductor Devices
Additional parts under the IEC 60747 series cover other types of discrete devices and integrated components, useful for comprehensive semiconductor standardization.
By adhering to the updated IEC 60747-4:2007/AMD1:2017 amendment, industry professionals can ensure precise characterization of microwave diodes and transistors, helping to advance high-frequency semiconductor device innovation and interoperability on a global scale.
Keywords: IEC 60747-4 amendment, microwave diodes standards, microwave transistor testing, intermodulation distortion measurement, RF semiconductor devices, IEC semiconductor standards, discrete semiconductor devices, microwave device test procedures, RF power output definition, maximum stable gain (MSG).
Frequently Asked Questions
IEC 60747-4:2007/AMD1:2017 is a standard published by the International Electrotechnical Commission (IEC). Its full title is "Amendment 1 - Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors". This standard covers: Amendment 1 - Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
Amendment 1 - Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
IEC 60747-4:2007/AMD1:2017 is classified under the following ICS (International Classification for Standards) categories: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION; 31.080.10 - Diodes; 31.080.30 - Transistors. The ICS classification helps identify the subject area and facilitates finding related standards.
IEC 60747-4:2007/AMD1:2017 has the following relationships with other standards: It is inter standard links to IEC 60747-4:2007. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
IEC 60747-4:2007/AMD1:2017 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
IEC 60747-4 ®
Edition 2.0 2017-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 1
AM ENDEMENT 1
Semiconductor devices – Discrete devices –
Part 4: Microwave diodes and transistors
Dispositifs à semiconducteurs – Dispositifs discrets –
Partie 4: Diodes et transistors hyperfréquences
IEC 60747-4:2007-08/AMD1:2017-01(en-fr)
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.
Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de l'IEC ou du Comité national de l'IEC du pays du demandeur. Si vous avez des
questions sur le copyright de l'IEC ou si vous désirez obtenir des droits supplémentaires sur cette publication, utilisez
les coordonnées ci-après ou contactez le Comité national de l'IEC de votre pays de résidence.
IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé Fax: +41 22 919 03 00
CH-1211 Geneva 20 info@iec.ch
Switzerland www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
IEC Catalogue - webstore.iec.ch/catalogue Electropedia - www.electropedia.org
The stand-alone application for consulting the entire The world's leading online dictionary of electronic and
bibliographical information on IEC International Standards, electrical terms containing 20 000 terms and definitions in
Technical Specifications, Technical Reports and other English and French, with equivalent terms in 16 additional
documents. Available for PC, Mac OS, Android Tablets and languages. Also known as the International Electrotechnical
iPad. Vocabulary (IEV) online.
IEC publications search - www.iec.ch/searchpub IEC Glossary - std.iec.ch/glossary
The advanced search enables to find IEC publications by a 65 000 electrotechnical terminology entries in English and
variety of criteria (reference number, text, technical French extracted from the Terms and Definitions clause of
committee,…). It also gives information on projects, replaced IEC publications issued since 2002. Some entries have been
and withdrawn publications. collected from earlier publications of IEC TC 37, 77, 86 and
CISPR.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Customer Service Centre - webstore.iec.ch/csc
details all new publications released. Available online and If you wish to give us your feedback on this publication or
also once a month by email. need further assistance, please contact the Customer Service
Centre: csc@iec.ch.
A propos de l'IEC
La Commission Electrotechnique Internationale (IEC) est la première organisation mondiale qui élabore et publie des
Normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.
A propos des publications IEC
Le contenu technique des publications IEC est constamment revu. Veuillez vous assurer que vous possédez l’édition la
plus récente, un corrigendum ou amendement peut avoir été publié.
Catalogue IEC - webstore.iec.ch/catalogue Electropedia - www.electropedia.org
Application autonome pour consulter tous les renseignements Le premier dictionnaire en ligne de termes électroniques et
bibliographiques sur les Normes internationales, électriques. Il contient 20 000 termes et définitions en anglais
Spécifications techniques, Rapports techniques et autres et en français, ainsi que les termes équivalents dans 16
documents de l'IEC. Disponible pour PC, Mac OS, tablettes langues additionnelles. Egalement appelé Vocabulaire
Android et iPad. Electrotechnique International (IEV) en ligne.
Recherche de publications IEC - www.iec.ch/searchpub Glossaire IEC - std.iec.ch/glossary
La recherche avancée permet de trouver des publications IEC 65 000 entrées terminologiques électrotechniques, en anglais
en utilisant différents critères (numéro de référence, texte, et en français, extraites des articles Termes et Définitions des
comité d’études,…). Elle donne aussi des informations sur les publications IEC parues depuis 2002. Plus certaines entrées
projets et les publications remplacées ou retirées. antérieures extraites des publications des CE 37, 77, 86 et
CISPR de l'IEC.
IEC Just Published - webstore.iec.ch/justpublished
Restez informé sur les nouvelles publications IEC. Just Service Clients - webstore.iec.ch/csc
Published détaille les nouvelles publications parues. Si vous désirez nous donner des commentaires sur cette
Disponible en ligne et aussi une fois par mois par email. publication ou si vous avez des questions contactez-nous:
csc@iec.ch.
IEC 60747-4 ®
Edition 2.0 2017-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 1
AM ENDEMENT 1
Semiconductor devices – Discrete devices –
Part 4: Microwave diodes and transistors
Dispositifs à semiconducteurs – Dispositifs discrets –
Partie 4: Diodes et transistors hyperfréquences
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.080.10; 31.080.30 ISBN 978-2-8322-3895-0
– 2 – IEC 60747-4:2007/AMD1:2017
© IEC 2017
FOREWORD
This amendment has been prepared by subcommittee 47E: Discrete semiconductor devices,
of IEC technical committee 47: Semiconductor devices.
The text of this amendment is based on the following documents:
CDV Report on voting
47E/499/CDV 47E/517/RVC
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
_____________
2 Normative references
Replace the existing references IEC 60050-702 and IEC 60747-1 as follows:
IEC 60050-702, International Electrotechnical Vocabulary – Chapter 702: Oscillations, signals
and related devices (available at: )
IEC 60747-1:2006, Semiconductor devices – Part 1: General
IEC 60747-1/AMD 1:2010
Delete the existing reference IEC 60747-16-1:
IEC 60747-16-1:2001, Semiconductor devices – Part 16-1: Microwave integrated circuits –
Amplifiers
Amendment 1(2007)
7.2.2
Replace the existing definition with the following new definition:
RF power measured at the output port
7.2.15
Replace the existing note with the following new note:
NOTE The abbreviation “MSG” is in common use for the maximum stable gain.
7.2.19
Replace the existing entry with the following new entry:
© IEC 2017
7.2.19
intermodulation distortion
P /P
n 1
ratio of the nth order component of the output power to the fundamental component of the
output power
Note 1 to entry: The abbreviation “IMD ” is in common use for the nth order intermodulation distortion.
n
Table 3 – RF characteristics
Replace parameters 7.3.2.2.2.17 with the following new parameters:
Categories
Subclause Parameters Min. Typ. Max.
A B
7.3.2.2.2.17 Either + +
Inpu
...
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.
Loading comments...