IEC 62860:2013

IEC 62860
Edition 1.0 2013-08
™
IEEE Std 1620
INTERNATIONAL
STANDARD
Test methods for the characterization of organic transistors and materials

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IEC 62860
Edition 1.0 2013-08
IEEE Std 1620™
INTERNATIONAL
STANDARD
Test methods for the characterization of organic transistors and materials

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
T
ICS 07.030 ISBN 978-2-8322-1014-7

– ii – IEC 62860:2013(E)
IEEE Std 1620-2008
Contents
1. Overview . 1
1.1 Scope . 1
1.2 Purpose . 1
1.3 Electrical characterization overview . 2
2. Definitions, acronyms, and abbreviations . 3
2.1 Definitions . 3
2.2 Acronyms and abbreviations . 6
3. Standard OFET characterization procedures . 6
3.1 Device structures . 6
3.2 Guidelines for the OFET characterization process . 7
3.3 Electrical standards . 8
3.4 Reporting data.11
3.5 Environmental control and standards .13
Annex A (informative) Bibliography .14
Annex B (informative) IEEE List of Participants . 15

Published by IEC under license from IEEE. © 2008 IEEE. All rights reserved.

IEEE Std 1620-2008
TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC
TRANSISTORS AND MATERIALS
FOREWORD
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promote international co-operation on all questions concerning standardization in the electrical and
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this preparation.
IEEE Standards documents are developed within IEEE Societies and Standards Coordinating Committees
of the IEEE Standards Association (IEEE-SA) Standards Board. IEEE develops its standards through a
consensus development process, which brings together volunteers representing varied viewpoints and
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compensation. While IEEE administers the process and establishes rules to promote fairness in the
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Published by IEC under license from IEEE. © 2008 IEEE. All rights reserved.

– iv – IEC 62860:2013(E)
IEEE Std 1620-2008
determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely
their own responsibility.
International Standard IEC 62860/IEEE Std 1620™-2008 has been processed through
IEC technical committee 113: Nanotechnology standardization for electrical and
electronic products and systems, under the IEC/IEEE Dual Logo Agreement.
The text of this standard is based on the following documents:
IEEE Std FDIS Report on voting
1620™-2008 113/184/FDIS 113/194/RVD
Full information on the voting for the approval of this standard can be found in the report
on voting indicated in the above table.
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A bilingual version of this standard may be issued at a later date.

Published by IEC under license from IEEE. © 2008 IEEE. All rights reserved.

IEEE Std 1620-2008
IEEE Standard for Test Methods for
the Characterization of Organic
Transistors and Materials
Sponsor
Microprocessor Standards Committee
of the
IEEE Computer Society
Approved 26 September 2008
IEEE-SA Standards Board
Published by IEC under license from IEEE. © 2008 IEEE. All rights reserved.

– vi – IEC 62860:2013(E)
IEEE Std 1620-2008
Abstract: Recommended methods and standardized reporting practices for electrical
characterization of printed and organic transistors are covered. Due to the nature of printed and
organic electronics, significant measurement errors can be introduced if the electrical
characterization design-of-experiment is not properly addressed. This standard describes the
most common sources of measurement error, particularly for high-impedance electrical
measurements commonly required for printed and organic transistors. This standard also gives
recommended practices in order to minimize and/or characterize the effect of measurement
artifacts and other sources of error encountered while measuring printed and organic transistors.
Keywords: electrical characterization, FET, flexible electronics, high impedance, nanocomposite,
nanotechnology, OFET, organic electronics, organic transistor, printed electronics, printing,
transistor
Published by IEC under license from IEEE. © 2008 IEEE. All rights reserved.

IEEE Std 1620-2008
IEEE Introduction
This introduction is not part of IEEE Std 1620-2008, IEEE Standard for Test Methods for the Characterization of
Organic Transistors and Materials.
This standard covers recommended methods and standardized reporting practices for electrical
characterization of organic transistors. Due to the nature of organic transistors, significant measurement
errors can be introduced if not properly addressed. This standard describes the most common sources of
measurement error and gives recommended practices in order to minimize and/or characterize the effect of
each.
Standard reporting practices are included in order to minimize confusion in analyzing reported data.
Disclosure of environmental conditions and sample size are included so that results can be appropriately
assessed by the research community. These reporting practices also support repeatability of results so that
new discoveries may be confirmed more efficiently.
The pra
...