IEC 60122-1:2002/AMD1:2017

IEC 60122-1 ®
Edition 3.0 2017-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 1
AM ENDEMENT 1
Quartz crystal units of assessed quality –
Part 1: Generic specification
Résonateurs à quartz sous assurance de la qualité –
Partie 1: Spécification générique

IEC 60122-1:2002-08/AMD1:2017-12 (en-fr)

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IEC 60122-1 ®
Edition 3.0 2017-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 1
AM ENDEMENT 1
Quartz crystal units of assessed quality –

Part 1: Generic specification
Résonateurs à quartz sous assurance de la qualité –

Partie 1: Spécification générique

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.140 ISBN 978-2-8322-7377-7

– 2 – IEC 60122-1:2002/AMD1:2017
© IEC 2017
FOREWORD
This amendment has been prepared by IEC technical committee 49: Piezoelectric, dielectric
and electrostatic devices and associated materials for frequency control, selection and
detection.
This bilingual version (2019-11) corresponds to the monolingual English version, published in
2017-12.
The text of this amendment is based on the following documents:
FDIS Report on voting
49/1254/FDIS 49/1259/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The French version of this amendment has not been voted upon.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
1.2 Normative references
Add the following reference to the existing list of normative references:
IEC 61760-1:2006, Surface mounting technology – Part 1: Standard method for the
specification of surface mounting components (SMDs)

4.9 Endurance test procedure
Replace Subclause 4.9 with the following new content:
4.9 Endurance test procedure
4.9.1 Standard aging test for production verification
4.9.1.1 Purpose
This test is usable for the statistical verification of aging performance in the production
process.
© IEC 2017
4.9.1.2 Procedure
– Take sample from the production lot.
– Initial measurement of f and R at (25 ± 2) °C.
s 1
– Store in oven at T = (+85 ± 3) °C.
oven
– Take and record additional measurements after 1 day and at least three more times at
time intervals recommended in Annex A.
– For the measurement, remove the crystals from oven, and store at room temperature for
and R at (25 ± 2) °C in accordance
1 h, avoiding temperature shocks. Measurement of f
s 1
with IEC 60444-5 or equivalent.
– Final measurement of f and R at (25 ± 2) °C after 30 days.
s 1
4.9.1.3 Evaluation
The difference between the highest and lowest frequency measurement shall not exceed the
specified value. The resistance R shall never exceed the specified maximum values.
4.9.2 Accelerated aging
4.9.2.1 Purpose
For special applications, an accelerated aging procedure at higher temperatures is applied to
shorten the verification time and/or to gain performance data at higher operating temperatures.
4.9.2.2 Procedure
The procedure is as in 4.9.1, except that the preferred oven temperature is T = +105 °C,
oven
+125 °C or +150 °C. This temperature has to be lower or equal to the specified maximum
storage temperature.
The ratio between the storage time at 25 °C and the storage time at an elevated temperature
T to achieve the same amount of frequency aging is called "time acceleration factor"
oven
(TAF). This factor depends on the design of the crystal unit and on the production process. It
can be determined experimentally as described in Annex A, or taken from experience with
structurally similar crystals, or can be mutually agreed between the manufacturer and the user.
If the time acceleration factor TAF is not otherwise specified, the following approach is
recommended.
Applying Arrhenius’s law, the time acceleration factor TAF is related to the activation energy
E (in eV) by the following equation:
a
 1 1 
E ⋅ − 
a
 
T T
 ref oven
k
TAF= e
where
−5
k is Boltzmann’s constant (k ≈ 8,617 × 10 eV/K), and the temperatures are given in K.
Published experimental results (see [6] and [7]) show that the activation energy E is
a
decreasing over time, i.e. the acceleration factor becomes lower with the aging time.
Furthermore, E varies between the different crystals and oscillators, depending on frequency,
a
package size, resonator design and production processes. The observed values of E were
a
between > 0,1 eV and < 1 eV.
– 4 – IEC 60122-1:2002/AMD1:2017
© IEC 2017
A common assumption is TAF = 12 for T = +85 °C, i.e. 30 days (1 month) aging at 85 °C
oven
are considered to be equivalent to 365 days (12 months) aging at 25 °C, which corresponds to
an activation energy E of 0,38 eV.
a
With this value of E , the time acceleration factor for other aging temperatures can be
a
calculated. Table 5 below shows the time acceleration factor TAF and the number of days N
d
equivalent to 365 days at 25 °C.
Table 5 – Time acceleration factors for E = 0,38 eV
a
T TAF N
oven d
°C days
+25 1 365
+85 12 30
+105 23 16
+125 41 9
+150 79 5
Other time acceleration factors may be agreed between the manufacturer and the user based
on their own reliability calculations.
4.9.2.3 Evaluation
The evaluation is as in 4.9.1.
4.9.3 Reference aging test
4.9.3.1 Purpose
This procedure is used for higher confidence level. This method should be used for high-
precision crystals and as reference method in case of dispute.
4.9.3.2 Procedure
See Annex A.
4.9.3.3 Evaluation
is subjected to the data fitting procedure.
The test data of the series resonance frequency f
s
The frequency measurement data f (t) shall be fitted using the method of least squares of the
i
following function (logarithmic fit):
 
Δf (t)
= a +a ×ln(a ×t+1)
  0 1 2
f
 init 
where
∆f(t) is the frequency difference of the crystal t days after the start of the aging cycle and the
initial frequency f measured after the stabilization time t (the time origin for
init stab
measurements analysis shall be the beginning of the stabilization period).
The coefficients a , a and a are constants to be determined from the least squares fit.
0 1 2
© IEC 2017
The default fitting algorithm is the logarithmic fit. In some cases, namely when the aging
response has a very small curvature, the logarithmic fit may not yield reasonable results. In
this case, the following polynomial fit is recommended to be calculated additionally:
1 1
 
∆f (t)
2 3
= a + a ×t+ a ×t + a ×t
 
0 1 2 3
f
init
 
This approach should only be used if the square root of the least square fit variance (SLQ) of
the measurements from the polynomial fit is at least five times smaller than that of the
logarithmic fit.
The total frequency change and the aging rate at the end of the specified aging period (t = T )
a
shall be determined from the fitting equation using the constants determined from the least
squares fit. The square root of the least squares fit variance of the measurements from the
curve-fit function shall not exceed 5 % of the total aging change allowed during the test period.
For the logarithmic fitting (default), the aging rate (in ppm or ppb per day) at t = T is:
a
 
 
Δf (t)
 
d
 
 
f
a ×a f (T +1)− f (T )
init
   a a
1 2
= ≈
 
dt a ×T +1 f
2 a init
 
 
 
t=T
a
If the polynomial fitting was used, the aging rate at t = T (T > 0) is:
a a
 
 
Δf (t)
 
d
 
 
1 2
f
a a
init − −
   2 3
= a + ×T + ×T
2 3
1 a a
 
dt 2 3
 
 
 
t=T
a
The projected total frequency change for a time period shall be calculated with the following
formulas:
f (T + 30)− f (T )
a a
Aging per month ≈
f
init
f (T + 365)− f (T )
a a
st
Aging per (1 ) year ≈
f
init
f (T + N× 365)− f (T )
a a
Aging over N years ≈
f
init
The resistance R shall never exceed the specified maximum values.
___________
ppm = parts per million; ppb = parts per billion.

– 6 – IEC 60122-1:2002/AMD1:2017
© IEC 2017
4.9.4 Extended aging
4.9.4.1 Purpose
The purpose is to evaluate the reliability and long-term performance.
4.9.4.2 Procedure
This test shall be carried out in accordance with 4.9.1, except that the continuous periods
shall be 1 000 h, 2 000 h or 8 000 h, as prescribed in the detail specification and shall be used
for information purposes only.
The measurements shall be carried out at (25 ± 2) °C or any other specified reference
temperature in accordance with IEC 60444-5 or equivalent.
The measurement intervals can be extended to two weeks or longer. For the intermediate and
the final measurement, the crystals can be removed from the oven, and stored at room
temperature for 1 h. Thermal shocks should be avoided.
4.9.4.3 Evaluation
The difference between the highest and lowest frequency measurement shall not exceed the
specified value (if applicable). The resistance R shall never exceed the specified maximum
values.
T
...