IEC 60384-26:2010

IEC 60384-26 ®
Edition 1.0 2010-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –
Part 26: Sectional specification – Fixed aluminium electrolytic capacitors with
conductive polymer solid electrolyte

Condensateurs fixes utilisés dans les équipements électroniques –
Partie 26: Spécification intermédiaire – Condensateurs fixes électrolytiques en
aluminium à électrolyte solide en polymère conducteur

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IEC 60384-26 ®
Edition1.0 2010-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –
Part 26: Sectional specification – Fixed aluminium electrolytic capacitors with
conductive polymer solid electrolyte

Condensateurs fixes utilisés dans les équipements électroniques –
Partie 26: Spécification intermédiaire – Condensateurs fixes électrolytiques en
aluminium à électrolyte solide en polymère conducteur

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
V
CODE PRIX
ICS 31.060.50 ISBN 978-2-88912-165-6
– 2 – 60384-26 © IEC:2010
CONTENTS
FOREWORD.5

1 General .7

1.1 Scope.7

1.2 Object .7

1.3 Normative references .7

1.4 Information to be given in a detail specification .8

1.4.1 Outline drawings and dimensions .8

1.4.2 Mounting .8

1.4.3 Rating and characteristics .8
1.4.4 Marking .9
1.5 Terms and definitions .9
1.6 Marking .9
1.6.1 General .9
1.6.2 Marking on capacitor .9
1.6.3 Marking on package .9
1.6.4 Additional markings .9
2 Preferred rating and characteristics .10
2.1 Preferred characteristics .10
2.1.1 Preferred climatic categories .10
2.2 Preferred values of ratings .10
2.2.1 Nominal capacitance (C ) .10
N
2.2.2 Tolerance on nominal capacitance.10
2.2.3 Rated voltage (U ).10
R
2.2.4 Surge voltage .10
2.2.5 Rated temperature.11
3 Quality assessment procedures.11
3.1 Primary stage of manufacture.11
3.2 Structurally similar components.11
3.3 Declaration of conformity (basic requirements) .11
3.4 Test schedule and requirement for initial assessment (mandatory and
optional tests) .11
3.4.1 Qualification approval on the basis of the fixed sample size
procedures sampling .11

3.4.2 Tests .12
3.5 Quality conformance inspection.19
3.5.1 Formation of inspection lots.19
3.5.2 The schedule.20
3.5.3 Delayed delivery.20
3.5.4 Assessment levels.20
4 Test and measurement procedures.22
4.1 Pre-conditioning (if required) .22
4.2 Measuring conditions .22
4.3 Visual examination and check of dimensions.23
4.3.1 Visual examination .23
4.3.2 Requirements .23
4.4 Electrical tests.23
4.4.1 Leakage current .23

60384-26 © IEC:2010 – 3 –
4.4.2 Capacitance .23

4.4.3 Tangent of loss angle (tan δ) .24

4.4.4 Equivalent series resistance (ESR).24

4.5 Robustness of terminations .24

4.5.1 Initial measurement .24

4.6 Resistance to soldering heat .24

4.6.1 Initial measurement .24

4.6.2 Test conditions .24

4.6.3 Final inspection, measurements and requirements .25

4.7 Solderability .25
4.7.1 Test conditions .25
4.7.2 Final inspection, measurements and requirements .25
4.8 Rapid change of temperature .25
4.8.1 Initial measurement .25
4.8.2 Test conditions .25
4.8.3 Final inspection, measurements and requirements .25
4.9 Vibration.25
4.9.1 Test condition.26
4.9.2 Final inspection, measurements and requirements .26
4.10 Shock.26
4.10.1 Test conditions .26
4.10.2 Final inspection, measurements and requirements .26
4.11 Bump .26
4.11.1 Test conditions .26
4.11.2 Final examination, measurements and requirements .26
4.12 Climatic sequence .27
4.12.1 Initial measurement .27
4.12.2 Dry heat .27
4.12.3 Damp heat, cyclic, Test Db, first cycle .27
4.12.4 Cold .27
4.12.5 Damp heat, cyclic, Test Db, remaining cycles .27
4.12.6 Recovery .27
4.12.7 Final inspection, measurements and requirements .27
4.13 Damp heat, steady state.27
4.13.1 Initial measurement .27

4.13.2 Test conditions .27
4.13.3 Final inspection, measurements and requirements .27
4.14 Endurance.27
4.14.1 Initial measurement .28
4.14.2 Test conditions .28
4.14.3 Final inspection, measurements and requirements .28
4.15 Surge .28
4.15.1 Initial measurement .28
4.15.2 Test procedure .28
4.15.3 Final inspection, measurements and requirements .28
4.16 Reverse voltage (if required by the detail specification) .28
4.16.1 Initial measurement .28
4.16.2 Test procedure .28
4.16.3 Final inspection, measurements and requirements .29

– 4 – 60384-26 © IEC:2010
4.17 Component solvent resistance (if required by the detail specification) .29

4.17.1 Test conditions .29

4.18 Solvent resistance of the marking (if required by the detail specification) .29

4.18.1 Test conditions .29

4.19 Storage at high temperature .29

4.19.1 Initial measurement .29

4.19.2 Test conditions .29

4.19.3 Final measurements and requirements .29

4.20 Characteristics at high and low temperature .29

4.20.1 Measurements and requirements.30

4.21 Charge and discharge (if required by the detail specification).30
4.21.1 Initial measurement .30
4.21.2 Test procedure .30
4.21.3 Final inspection, measurements and requirements .30
4.22 High surge current (if required by the detail specification) .30
4.22.1 Initial measurement .30
4.22.2 Final measurements and requirements .30
Bibliography.31

Table 1 − Surge voltage.10
Table 2 − Fixed sample size test plan for qualification approval, assessment level EZ .13
Table 3 – Test schedule for qualification approval.14
Table 4 – Test plan for lot-by-lot inspection (Assessment level EZ).21
Table 5 – Test plan for periodic inspection (Assessment level EZ) .22

60384-26 © IEC:2010 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION

____________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 26: Sectional specification – Fixed aluminium electrolytic

capacitors with conductive polymer solid electrolyte

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
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indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 60384-26 has been prepared by IEC technical committee 40:
Capacitors and resistors for electronic equipment.
The text of this standard is based on the following documents:
FDIS Report on voting
40/2052/FDIS 40/2062/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of the IEC 60384 series can be found, under the general title Fixed
capacitors for use in the electronic equipment, on the IEC website.

– 6 – 60384-26 © IEC:2010
The committee has decided that the contents of this publication will remain unchanged until

the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data

related to the specific publication. At this date, the publication will be

• reconfirmed,
• withdrawn,
• replaced by a revised edition, or

• amended.
60384-26 © IEC:2010 – 7 –
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 26: Sectional specification – Fixed aluminium electrolytic

capacitors with conductive polymer solid electrolyte

1 General
1.1 Scope
This part of IEC 60384 is applicable to aluminium electrolytic capacitors with conductive
polymer solid electrolyte primarily intended for d.c. applications for use in electronic
equipment.
NOTE Aluminium electrolytic capacitors with solid (MnO ) are covered by IEC 60384-4 and IEC 60384-4-2.
Surface mount aluminium electrolytic capacitors with conductive polymer solid electrolyte are covered by
IEC 60384-25 and IEC 60384-25-1.
1.2 Object
The object of this standard is to prescribe preferred ratings and characteristics and to select
from IEC 60384-1, the appropriate quality assessment procedures, tests and measuring
methods and to give general performance requirements for this type of capacitor. Test
severities and requirements prescribed in detail specifications referring to this sectional
specification shall be of equal or higher performance level, lower performance levels are not
permitted.
1.3 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60063:1963, Preferred number series for resistors and capacitors
Amendment 1 (1967)
Amendment 2 (1977)
IEC 60068-1:1988, Environmental testing – Part 1: General and guidance
IEC 60068-2-14:2009, Environmental testing – Part 2-14: Tests – Test N: Change of

temperature
IEC 60068-2-20:2008, Environmental testing – Part 2-20: Tests – Test T – Test methods for
solderability and resistance to soldering heat of devices with leads
IEC 60384-1:2008, Fixed capacitors for use in electronic equipment – Part 1: Generic
specification
IEC 60410:1973, Sampling plans and procedures for inspection by attributes
—————————
For the tests in the IEC 60068 series of publication, the editions referenced in the applicable test clauses of the
generic specification shall be used.

– 8 – 60384-26 © IEC:2010
1.4 Information to be given in a detail specification

Detail specifications shall be derived from the relevant blank detail specification.

Detail specifications shall not specify requirements inferior to those of the generic, sectional

or blank detail specification. When more severe requirements are included, they shall be

listed in 1.9 of the detail specification and indicated in the test schedules, for example by an

asterisk.
NOTE The information given in 1.4.1 may for convenience, be presented in tabular form.

The following information shall be given in each detail specification and the values quoted

shall preferably be selected from those given in the appropriate clause of this sectional
specification.
1.4.1 Outline drawings and dimensions
There shall be an illustration of the capacitor as an aid to easy recognition and for comparison
of the capacitor with others. Dimensions and their associated tolerances, which affect
interchangeability and mounting, shall be given in the detail specification. All dimensions shall
preferably be stated in millimeters.
Normally the numerical values shall be given for cylindrical types, the body diameter, and the
length and diameter, and the spacing of the terminations. When necessary, for example when
a number of items (capacitance values/voltage ranges) are covered by a detail specification,
the dimensions and their associated tolerances shall be placed in a table below the drawing.
When the configuration is other than described above, the detail specification shall state such
dimensional information as will adequately describe the capacitor. When the capacitor is not
designed for use on printed boards, this shall be clearly stated in the detail specification.
1.4.2 Mounting
The detail specification shall specify the method of mounting to be applied for normal use and
for the application of the vibration and the bump or shock tests. The capacitors shall be
mounted by their normal means. The design of the capacitor may be such that special
mounting fixtures are required in its use. In this case, the detail specification shall describe
the mounting fixtures and they shall be used in the application of the vibration and bump or
shock tests.
1.4.3 Rating and characteristics
The ratings and characteristics shall be in accordance with the relevant clauses of this

specification, together with the following:
1.4.3.1 Nominal capacitance range
See 2.2.1.
NOTE When products approved to the detail specification have different ranges, the following statement should
be added:
"The range of values available in each voltage range is given in QPL (qualified products list)."
1.4.3.2 Particular characteristics
Additional characteristics may be listed, when they are considered necessary to specify
adequately the component for design and application purposes.

60384-26 © IEC:2010 – 9 –
1.4.3.3 Soldering
The detail specification shall prescribe the test methods, severities and requirement

applicable for the solderability and the resistance to soldering heat tests.

1.4.4 Marking
The detail specification shall specify the content of the marking on the capacitor and on the
package. Deviations from 1.6 of this sectional specification shall be specifically stated.

1.5 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60384-1, as well as
the following apply.
1.5.1
capacitance of an electrolytic capacitor
capacitance of an equivalent circuit having capacitance and resistance in series measured
with alternating current approximately sinusoidal waveform at a specified frequency
1.6 Marking
IEC 60384-1, 2.4 with the following details:
1.6.1 General
The information given in the marking is normally selected from the following list; the relative
importance of each item is indicated by its position in the list:
a) nominal capacitance;
b) rated voltage (d.c. voltage may be indicated by the symbol (    or      );
c) polarity of the terminations;
d) tolerance on nominal capacitance;
e) year and month (or week) of manufacture;
f) manufacturer’s name or trade mark;
g) climatic category;
h) manufacturer’s type designation;
i) reference to the detail specification.
Any marking shall be legible and not easily smeared or removed by rubbing with the finger.

1.6.2 Marking on capacitor
The capacitor shall be clearly marked with a), b), c), d), e) and f) above with as many as
possible of the remaining items as is considered necessary. Any duplication of information in
the marking on the capacitor shall be avoided.
1.6.3 Marking on package
The package containing the capacitor(s) shall be clearly marked with all the information listed
in 1.6.1
1.6.4 Additional markings
Any additional marking shall be so applied that no confusion can arise.

– 10 – 60384-26 © IEC:2010
2 Preferred rating and characteristics

2.1 Preferred characteristics
The values given in the detail specification shall preferably be selected from the following:

2.1.1 Preferred climatic categories

The capacitors covered by this specification are classified into climatic categories according

to the general rules given in IEC 60068-1, Clause 8.

The lower and upper category temperatures and the duration of the damp heat, steady state
test shall be chosen from the following:
Lower category temperature: −55 °C
Upper category temperature: +105 °C and +125 °C
Duration of the damp heat, steady state test:  21 days
The severities for the cold and dry heat tests are the lower and upper category temperatures
respectively.
2.2 Preferred values of ratings
2.2.1 Nominal capacitance (C )
N
The nominal capacitance shall be expressed in micro Farad (μF).
Preferred values of nominal capacitance are the values from the E6 and E12 series of
n
IEC 60063 and their decimal multiples (×10 , n: integer).
2.2.2 Tolerance on nominal capacitance
Preferred values of tolerance on nominal capacitance are: ± 10 % and ± 20 %.
2.2.3 Rated voltage (U )
R
Preferred values of rated direct voltages taken from R10 and R20 series of ISO 3 are:
From R10: 1,0 - 1,25 - 1,6 - 2,0 - 2,5 - 4,0 - 5,0 - 6,3 - 8,0
From R20: 3,5
n
and their decimal multiples (×10 , n: integer).
2.2.4 Surge voltage
The surge voltage shall be 1,15 times the rated voltage rounded off (significant digit of 2) to
the nearest volt. See Table 1.
Table 1 − Surge voltage
Rated voltage 2,0 2,5 4,0 5,0 6,3 8,0 10 12,5 16 20 25 35
V
Surge voltage 2,3 2,9 4,6 5,8 7,2 9,2 12 14 18 23 29 40
V
60384-26 © IEC:2010 – 11 –
2.2.5 Rated temperature
The value of the rated temperature shall be upper category temperature.

3 Quality assessment procedures

3.1 Primary stage of manufacture

The primary stage of manufacture is the capacitor manufacturer's evaluation of the formed

anode foil.
3.2 Structurally similar components
Capacitors considered as being structurally similar are capacitors produced with similar
processes and materials, though they may be of different case sizes and values.
3.3 Declaration of conformity (basic requirements)
3.4 Test schedule and requirement for initial assessment (mandatory and optional
tests)
The procedures for qualification approval testing are given in IEC 60384-1.
The schedule to be used for Qualification Approval testing on the basis of lot-by-lot and
periodic tests is given in 3.5 of this specification. The procedure using a fixed sample size
schedule is given in 3.4.1 and 3.4.2 below.
3.4.1 Qualification approval on the basis of the fixed sample size procedures
sampling
The fixed sample size procedure is described in Q.5.3, b) of IEC 60384-1. The sample shall
be representative of the range of capacitors for which approval is sought. This may or may not
be the complete range covered by the detail specification.
The sample shall consist of specimens of capacitors of maximum and minimum size and for
each of these sizes the maximum capacitance value for the highest rated voltage and
minimum rated voltage of the voltage ranges for which approval is sought. When there are
more than four rated voltages, an intermediate voltage shall also be tested. Thus for the
approval of a range, testing is required of either four or six values (capacitance/voltage
combinations) for each temperature characteristic. Where the total range consists of less than
four values, the number of specimens to be tested shall be that required for four values.

In case assessment level EZ is used, spare specimens are permitted as follows:
Two (for 6 values) or three (for 4 values) per value which may be used as replacements for
specimens, which are non-conforming because of incidents not attributable to the
manufacturer. The numbers given in Group 0 assume that all groups are applicable. If this is
not so the numbers may be reduced accordingly.
When additional groups are introduced into the qualification approval test schedule, the
number of specimens required for Group 0 shall be increased by the same number as that
required for the additional groups.
Table 2 gives the number of samples to be tested in each group or subgroup together with the
number of permissible non-conformances for qualification approval test.

– 12 – 60384-26 © IEC:2010
3.4.2 Tests
The complete series of tests specified in Table 2 and Table 3 are required for the approval of

capacitors covered by one detail specification. The tests of each group shall be carried out in

the order given.
The whole sample shall be subjected to the tests of Group 0 and then divided for the other

groups.
Non-conforming (Table 2) specimens found during the tests of Group 0 shall not be used for

the other groups.
“One non-conforming item” is counted when a capacitor has not satisfied the whole or a part
of the tests of a group.
The approval is granted when the number or non-conforming items do not exceed the
specified number of permissible non-conforming items for each group or subgroup and the
total number of permissible non-conformances.
NOTE Table 2 and Table 3 together form the fixed sample size test schedule. Table 2 includes the details for the
sampling and permissible non-conforming items for the different tests or groups of tests. Table 3 together with the
details of the test contained in Clause 4 gives a complete summary of test conditions and performance requirements
and indicates where, for example for the test method or conditions of test, a choice has to be made in detail specification.
The conditions of test and performance requirements for the fixed sample size test schedule
shall be identical to those prescribed in the detail specification for quality conformance
inspection.
60384-26 © IEC:2010 – 13 –
Table 2 − Fixed sample size test plan for qualification approval, assessment level EZ

Group Test Subclause of Number of Permissible

No. this publication specimens number of non-

conforming items
b c
n c
a
0 High surge current 4.22
Visual examination 4.3
Dimensions 4.3
Leakage current 4.4.1
120 0
Capacitance 4.4.2
Tangent of loss angle (tan δ) 4.4.3
4.4.4
Equivalent series resistance (ESR)
Spare specimens   12
1A
Robustness of terminations 4.5
Resistance to soldering heat 4.6 12 0
a
Component solvent resistance 4.17
1B
Solderability 4.7
a
Solvent resistance of the marking 4.18
Rapid change of temperature 4.8
24 0
Vibration 4.9
Shock or bump 4.10 or 4.11
(Specify in the detail specification)
1 Climatic sequence 4.12 36 0
2 Damp heat, steady state 4.13 24 0
3 Endurance 4.14 36 0
4 Storage at high temperature 4.19
Surge 4.15 12 0
a
Reverse voltage 4.16
5 Characteristics at high and low temperature 4.20
12 0
a
Charge and discharge 4.21
a
if required in the detail specification.
b
For case size/voltage combinations, see 3.4.1.
c
The permissible number of non-conforming items indicates acceptance criteria. In case non-conforming

item(s) is equal or less than the number, this lot shall be accepted.

– 14 – 60384-26 © IEC:2010
Table 3 – Test schedule for qualification approval

a
Subclause number D Conditions of test  Number of specimens Performance

a a
and test  or (n) and number of requirements
b
ND permissible non-
c
conforming items (c)
Group 0 ND See Table 2
4.22 High surge current
(if required in the
detail specification)
4.3 Visual examination  No visible damage
Legible marking and as
specified in the detail
specification
4.3 Dimension (detail)  See detail specification
4.4.1 Leakage current Protective resistance: As in 4.4.1.2

1 000 Ω
4.4.2 Capacitance As in 4.4.2
Frequency: Hz
4.4.3 Tangent of loss
As in 4.4.3.2
Frequency: Hz
angle (tan δ)
As in 4.4.4
4.4.4 Equivalent series Frequency: 100 kHz
resistance (ESR)
Group 1A D See Table 2
4.5.1 Initial measurement Capacitance
4.5 Robustness of Test method and
terminations severity:
As in IEC 60384-1,
4.13
Test Ua1(tensile)
Test Ub(bending)
Visual examination No visible damage
4.6 Resistance to No pre-drying
soldering heat
4.6.1 Initial measurement Capacitance
4.6.2 Test  Test method and
severity:
As in IEC 60068-2-20,
Test Tb, method 1
4.6.3 Final measurement Visual examination No visible damage

Legible marking and as
specified in the detail
specification
d
Leakage current As in 4.4.1.2

Capacitance See detail specification
Tangent of loss angle As in 4.4.3.2
(tan δ)
See detail specification
Equivalent series
resistance (ESR)
4.17 Component solvent Solvent: 2-propanol See detail specification
resistance
Solvent temperature:
(if required in the
23 °C ± 5 °C
detail specification)
Method 2
Recovery: 1 h to 2 h
60384-26 © IEC:2010 – 15 –
Table 3 (continued)
a
Subclause number D Conditions of test  Number of specimens Performance

a a
and test  or (n) and number of requirements
b
ND permissible non-
c
conforming items (c)
Group 1B D See Table 2
4.7 Solderability No accelerated ageing

Test method and
severity:
As in IEC 60068-2-20,
Test Ta, method 1
4.7.2 Final measurement Visual examination As in 4.7.2
4.18 Solvent resistance Solvent: 2-propanol Legible marking
of the marking Solvent temperature:
(if required in the 23 °C ± 5 °C
detail specification)
Method 1
Rubbing material:
cotton wool
Recovery:
4.8 Rapid change of T : Lower category
A
temperature temperature
T = Upper category
B
temperature
Five cycles
Duration t : 30 min
Recovery: 1 h to 2 h
d
4.8.3 Final measurement Leakage current  As in 4.4.1.2
Capacitance  |ΔC/C| ≤ 10 % of value
measured in 4.8.1
Tangent of loss angle As in 4.4.3
(tan δ)
4.9 Vibration For mounting method
see detail specification
Frequency range:
10 Hz to 55 Hz
Amplitude: 0,75 mm or
acceleration 100 m/s
(whichever is the less
severe)
Total duration: 6 h (2 h
for each of three axis (X,
Y, and Z))
4.9.2 Final measurement Visual examination No visible damage
Legible marking
Capacitance  |ΔC/C| ≤ 10 % of value
measured in 4.8.1
4.10 Shock (or Bump, For mounting method

see 4.11) see detail specification
Number of shocks: 3 for
each 3 ( X,Y and Z) axis
and both directions
Acceleration: 500 m/s
Duration of pulse: 11 ms
– 16 – 60384-26 © IEC:2010
Table 3 (continued)
a
Subclause number D Conditions of test  Number of specimens Performance

a a
and test  or (n) and number of requirements
b
ND permissible non-
c
conforming items (c)
Group 1B (continued) D See Table 2
4.10.2 Final measurements Visual examination No visible damage
Legible marking
Capacitance  |ΔC/C| ≤ 10% of value

measured in 4.8.1
4.11 Bump (or shock, For mounting method

see 4.10) see detail specification
Number of bumps:
1 000.
Acceleration: 400 m/s
Duration of pulse: 6 ms
4.11.2 Final measurements  Visual examination No visible damage
Legible marking
Capacitance
|ΔC/C| ≤ 10 % of value
measured in 4.8.1
Group 1
4.12 Climatic sequence
4.12.1 Initial measurement Capacitance
4.12.2 Dry heat Temperature: upper
category temperature
Duration: 16 h
4.12.3 Damp heat, cyclic,
Test Db, first cycle
4.12.4 Cold Temperature: lower
category temperature
Duration: 2 h
4.12.5 Damp heat, cyclic,
Test Db, remaining
cycles
4.12.7 Final measurements Visual examination
No visible damage
Legible marking
d
Leakage current  As in 4.4.1.2
Capacitance
|ΔC/C| ≤ 20 % of value
measured in 4.12.1
Tangent of loss angle ≤ 1,5 times of the limit in
(tan δ) 4.4.3.2
Group 2 D See Table 2
4.13 Damp heat, steady   Recovery: 1 h to 2 h

state
4.13.1 Initial measurement Capacitance
4.13.2 Test
Temperature: 40 °C
± 2 °C
Relative humidity: (93
± 3) %
Duration: 21 days
4.13.3 Final measurements Visual examination No visible damage

Legible marking
Leakage current
≤ 5 times of the limit
in 4.4.1.2
Capacitance
See detail specification
Tangent of loss angle
≤ 1,5 times of the limit
(tan δ)
in 4.4.3.2.
60384-26 © IEC:2010 – 17 –
Table 3 (continued)
a
Subclause number D Conditions of test  Number of specimens Performance

a a
and test  or (n) and number of requirements
b
ND permissible non-
c
conforming items (c)
Group 3 D See Table 2
4.14 Endurance
4.14.1 Initial measurement Capacitance

4.14.2 Test Duration:
...