EN 60115-1:2023

SLOVENSKI STANDARD
01-maj-2023
Fiksni upori za elektronsko opremo - 1. del: Splošna specifikacija (IEC 60115-
1:2020, spremenjen)
Fixed resistors for use in electronic equipment - Part 1: Generic specification (IEC 60115
-1:2020 (MOD)
Festwiderstände zur Verwendung in Geräten der Elektronik - Teil 1:
Fachgrundspezifikation (IEC 60115-1:2020 (MOD)
Résistances fixes utilisées dans les équipements électroniques - Partie 1: Spécification
générique (IEC 60115-1:2020 (MOD)
Ta slovenski standard je istoveten z: EN 60115-1:2023
ICS:
31.040.10 Fiksni upor Fixed resistors
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 60115-1
NORME EUROPÉENNE
EUROPÄISCHE NORM March 2023
ICS 31.040.10 Supersedes EN 60115-1:2011;
EN 60115-1:2011/A11:2015
English Version
Fixed resistors for use in electronic equipment - Part 1: Generic
specification
(IEC 60115-1:2020, modified)
Résistances fixes utilisées dans les équipements Festwiderstände zur Verwendung in elektronischen Geräten
électroniques - Partie 1: Spécification générique - Teil 1: Fachgrundspezifikation
(IEC 60115-1:2020, modifiée) (IEC 60115-1:2020, modifiziert)
This European Standard was approved by CENELEC on 2023-02-13. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Türkiye and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2023 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 60115-1:2023 E
Contents Page
1 Modification to the Introduction . 5
2 Modification to Clause 1 . 5
3 Modification to Clause 2 . 5
4 Modification to Clause 5 . 5
5 Modification to Clause 9 . 5
6 Modification to Annex B . 5
7 Modification to Annex C . 7
8 Modification to Annex Q . 9
9 Modification to Annex R . 9
10 Modification to Annex X . 10
11 Addition of Annex ZA . 11
12 Addition of a new Annex ZX. 14
13 Modification of the Bibliography . 18
European foreword
This document (EN 60115-1:2023) consists of the text of IEC 60115-1:2020 prepared by IEC/TC 40,
“Capacitors and resistors for electronic equipment”, together with the common modifications prepared by the
CLC TC/40XB, “Resistors”.
The following dates are fixed:
• latest date by which this document has to be (dop) 2024-02-13
implemented at national level by publication of an
identical national standard or by endorsement
• latest date by which the national standards (dow) 2026-02-13
conflicting with this document have to be withdrawn
This document supersedes EN 60115-1:2011 + EN 60115-1:2011/A11:2015.
This edition contains the following significant technical changes with respect to the previous edition:
a) this edition employs a new document structure, where the tests of prior Clause 4 are given in
Clauses 6 to 12 now, with an informative Annex ZX providing cross-references for references to the
prior revision of this standard;
b) the terms and definitions have been revised and amended, supplemented by a new section on resistor
technologies and a new section on product classification levels;
c) a new Subclause 4.7 on recommendations for permissible substitutions has been added;
d) the provisions for packaging, storage and transportation in Subclauses 4.8, 4.9 and 4.10 have been
completely revised;
e) a new Subclause 5.3 on default tolerances for the most common test parameters has been added;
f) the generic method of measuring resistance, now Sublause 5.6, has been separated from the test for
compliance with a prescribed resistance value in 6.1, as a revision of the prior 4.5;
g) the test for the temperature coefficient of resistance of Subclause 6.2 is a revision of the prior test 4.8,
variation of resistance with temperature, where the special concessions for resistors below 10 Ω have
been waived;
h) the single-pulse high-voltage overload test of Subclause 8.2 (prior 4.27) has been completely revised;
i) the periodic-pulse high-voltage overload test of Subclause 8.3 (prior 4.28) has been revised and a
corrected table of severities provided;
j) the period-pulse overload test of Subclause 8.4 (prior 4.39) has been deprecated and streamlined to
only offer the severity historically applied in subordinate specifications;
k) the Subclauses 9.1 on visual inspection, 9.2 on the gauging of dimensions, and 9.3 on the assessment
of detail dimensions (all parts of prior 4.4) have been completely revised;
l) the tests for robustness of terminations (prior 4.16) have been revised and separated into tests for the
robustness of solderable terminations, Subclause 9.5, and tests for the robustness of threaded stud or
screw terminations, Subclause 9.6;
m) the bump test of Subclause 9.9 (prior 4.20) and the shock test of Subclause 9.10 (prior 4.21) have been
revised to reflect the merged relevant test standard EN 60068-2-29;
n) the accelerated damp heat, steady-state test of Subclause 10.5 (prior 4.37) has been amended with an
option for a reduced number of bias voltages;
o) the corrosion test of Subclause 10.6 has been completely revised in order to employ the better suitable
test method of EN 60068-2-52 instead of the prior used EN 60068-2-11;
p) the whisker growth test of 10.7 has been revised to reflect the changes of the new revision of the test
methods of EN IEC 60068-2-82;
q) the test methods for solderability of Subclause 11.1 (prior 4.17) and for resistance to soldering heat of
Subclause 11.2 (prior 4.18) have been completely revised to incorporate the necessary option for the
variety of lead-bearing and lead-free solder alloys and respective process conditions;
r) the solvent resistance test of 11.3 combines the prior tests 4.29, component solvent resistance, and
4.30, solvent resistance of marking, in one test;
s) the accidental overload test of Subclause 12.3 (prior 4.26) has been completely revised.
Preceding documents on the subject covered by this specification have been:
— EN 60115-1:2001 + EN 60115-1:2001/A1:2001 + EN 60115-1:2001/A11:2007
— EN 140000:1993-12
— CECC 40 000:1973-00, 1979-00.
Clauses, subclauses, annexes, notes, tables and figures which are additional to those in IEC 60115-1:2020 are
prefixed “Z”.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Any feedback and questions on this document should be directed to the users’ national committee. A complete
listing of these bodies can be found on the CENELEC website.
1 Modification to the Introduction
Add the following new paragraph after the existing first paragraph:
“The explanation given in this introduction uses IEC documents as examples. Anyhow, the same principles
apply in unison to respective documents with EN or EN IEC prefix.”
2 Modification to Clause 1
Replace the first paragraph with the following:
“This part of EN 60115 is a generic specification and is applicable to fixed resistors for use in electronic
equipment.”
3 Modification to Clause 2
3.1 Modify the normative reference to IECQ 03-1:2018 as follows:
IECQ 03-1:2020, IEC Quality Assessment System for Electronic Components (IECQ System) – Rules of
procedure — Part 1: General Requirements for all IECQ Schemes
3.2 Add the following two entries:
IECQ 03-3:2018, IEC Quality Assessment System for Electronic Components (IECQ System) – Rules of
Procedure – Part 3: IECQ Approved Component Products, Related Materials and Assemblies Scheme
IECQ 03-3-1:2018, IEC Quality Assessment System for Electronic Components (IECQ System) – Rules of
Procedure – Part 3-1: IECQ Approved Component Products, Related Materials and Assemblies Scheme, IECQ
Approved Component – Technology Certification (IECQ AC-TC)
4 Modification to Clause 5
In 5.1, replace the 4th paragraph with the following:
“The performance requirements prescribed by any relevant specification are absolute limits. The policy on
uncertainty of measurements and inset limits, as given in IECQ 03-1:2020, Annex C, shall be applied.”
5 Modification to Clause 9
Replace the 1st paragraph in 9.2.2.1, as well as the 1st paragraph in 9.3.2.1, with the following:
“The limiting dimensions are generally prescribed as absolute limits. The policy on inset limits in accordance
with IECQ 03-1:2020, Annex C, shall be applied to the preparation of gauges or other representations of the
required acceptance windows.”
6 Modification to Annex B
Replace Annex B with the following:
“
Annex B
(normative)
Rules for the preparation of detail specifications for resistors and
capacitors for electronic equipment for use within the IECQ system
B.1 The drafting of a complete detail specification, in line with the CEN/CENELEC Internal Regulations, shall
begin only when all the following conditions have been met:
a) the generic specification has been approved;
b) the sectional specification, if appropriate, has been circulated for approval according to the relevant system
rules (e.g. FDIS, or unanimously approved CDV, at IEC);
c) the associated blank detail specification has been circulated for approval according to the relevant system
rules (e.g. FDIS, or unanimously approved CDV, at IEC);
B.2 Detail specifications shall use the standard or preferred values, ratings and characteristics, and severities
for environmental tests, etc. which are given in the appropriate generic or sectional specifications.
An exception to this rule may only be granted for a specified detail specification, if agreed by the technical
committee.
B.3 The detail specification should not be circulated for approval according to the relevant system rules (e.g.
FDIS, or unanimously approved CDV, at IEC) until the sectional and blank detail specifications have been
approved for publication.”
7 Modification to Annex C
Replace Annex C with the following:
“
Annex C
(informative)
Example of a certified test record
Component manufacturer Veriohm Ltd.
Place of manufacture Amper Lane 8, Voltville
Detail specification and issue EN 140401-808:2021
Fixed low power film surface mount (SMD) resistors,
Description of component
Rectangular
Current three months period 2021-01-01 – 2021-03-31
This Certified Test Record is a completed and accurate record of the tests carried out in accordance with the
specified procedures.
Manufacturer
Designated Management Representative (T. Rustworthy)
IECQ Certification Body
Supervising Inspector (S. Crutiny)
“
8 Modification to Annex Q
8.1 Modify the indication of Annex Q from informative to normative, as follows:
“Annex Q
(normative)
Quality assessment procedures”
8.2 In Q.1.4, replace the 1st paragraph as follows:
“Rework is the rectification of a processing error, prior to the release of the component, by means not differing
from those used in the current process, or by an explicitly permitted rework process.”
8.3 In Q.1.9, replace the 1st paragraph as follows:
“Repair is the making good of an approved component which has been damaged or has become defective after
its release, and is not permitted under the Rules of Procedure.”
8.4 In Q.1.11, replace the paragraph as follows:
“An organisation may be covered by one certification for more than one location (site) (see IECQ 03-1:2020,
Clause 5 and Annex D, and IECQ 03-3:2018, Clause 5).”
8.5 In Q.2.1, replace the 1st paragraph as follows:
“An IECQ Approved Component certification may be granted to a manufacturer meeting t
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