EN 60115-2:2015

SLOVENSKI STANDARD
01-september-2015
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SIST EN 140100:2008
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Fixed resistors for use in electronic equipment - Part 2: Sectional specification : Fixed
low-power non-wirewound resistors
Festwiderstände zur Verwendung in Geräten der Elektronik - Teil 2: Rahmenspezifikation
- Verbleite niedrig belastbare Schichtwiderstände
Résistances fixes utilisées dans les équipements électroniques - Partie 2: Spécification
intermédiaire: Résistances fixes à broche à couches, à faible dissipation
Ta slovenski standard je istoveten z: EN 60115-2:2015
ICS:
31.040.10 Fiksni upor Fixed resistors
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN 60115-2
NORME EUROPÉENNE
EUROPÄISCHE NORM
January 2015
ICS 31.040.10 Supersedes EN 140100:2008
English Version
Fixed resistors for use in electronic equipment - Part 2:
Sectional specification: Leaded fixed low power film resistors
(IEC 60115-2:2014 , modified)
Résistances fixes utilisées dans les équipements Festwiderstände zur Verwendung in Geräten der Elektronik
électroniques - Partie 2: Spécification intermédiaire: - Teil 2: Rahmenspezifikation - Verbleite niedrig belastbare
Résistances fixes à broches à couches, à faible dissipation Schichtwiderstände
(IEC 60115-2:2014 , modifiée) (IEC 60115-2:2014 , modifiziert)
This European Standard was approved by CENELEC on 2014-12-15. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any
alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2015 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 60115-2:2015 E
Contents Page
Foreword . 3
1 Modification to Clause 2 . 4
2 Modification to 3.1 . 4
3 Modifications to 3.3 . 4
4 Modification to 4.6 . 4
5 Modification to 5.2.10 . 5
6 Modification to 5.2.12.5 . 5
7 Modification to 5.2.14 . 5
8 Modification to 5.2.17 . 5
9 Modification to 5.2.18 . 5
10 Modification to 5.2.19 . 5
11 Modifications to 5.2.21 . 5
12 Modification to 5.2.22 . 6
13 Modification to 6.2 . 6
14 Modification to 6.5 . 6
15 Modifications to 9.4 . 6
16 Modification to 9.5 . 6
17 Modification to 9.6 . 7
18 Modification to 9.7 . 7
19 Modification to 9.8 . 7
20 Modification to 9.9 . 7
21 Modifications to Table 5 . 7
22 Modifications to Table 6 . 8
23 Modifications to Clause D.1. 8
24 Modifications to Annex X . 8
25 New Annex ZA . 8
26 New Annex ZX . 9
27 Modifications to the Bibliography . 9
Annex ZA (normative) Normative references to international publications with their
corresponding European publications. 10
Annex ZX (informative) Cross reference for references to the predecessor of this specification . 11
Bibliography . 13

– 3 – EN 60115-2:2015
Foreword
This document (EN 60115-2:2015) has been prepared by CLC/TC 40XB “Resistors”.
The following dates are fixed:
(dop) 2015-12-15
• latest date by which this document has to be implemented at
national level by publication of an identical national standard or
by endorsement
(dow) 2017-12-15
• latest date by which the national standards conflicting with this
document have to be withdrawn
This document supersedes EN 140100:2008.
Clauses, subclauses, notes, tables, figures and annexes which are additional to those in IEC 60115-2:2014
are prefixed “Z”.
1 Modification to Clause 2
st
After the 1 paragraph, add the following note:
NOTE The readers of this European Standard are advised of the corresponding European documents listed in the
normative Annex ZA, which take precedence over the International Standards listed in this clause. The precedence also
applies to all normative references made within this document.
2 Modification to 3.1
At the end, add the following:
3.1.Z1
nominal resistance
R
n
resistance value for which the resistor has been designed, and which is generally used for denomination of
the resistor
Note 1 to entry: The definition of nominal resistance, R , is identical to the definition of rated resistance, R, in
n r
EN 60115-1:2011. Therefore nominal resistance, R , may be applied wherever rated resistance, R , is required, e.g. in a
n r
quality assessment scheme.
3 Modifications to 3.3
nd
At the beginning of the 2 paragraph, replace “Two general end product levels” by “Three general end
product levels”.
th
After the 5 paragraph (Examples for Level P … ), add the following:
NOTE Z1  Product classification level P adopts and succeeds the former Version A.
th
Replace the 6 paragraph (Level P is the suitable basis …) by
Level R – High-performance and high-reliability electronic equipment, where the requirement for established
reliability and for an approved failure rate level applies in addition to the criteria of Level P.
Examples for Level R include military & defence equipment, avionics and aerospace applications.
NOTE Z2  Product classification level R adopts and succeeds the former Version E.
th
Replace the 7 paragraph (Each level shall be used …) by
Each level shall be used in individual detail specifications, except for Level P and Level R, which may be used
in combined detail specifications.
4 Modification to 4.6
th
Replace the 4 paragraph by
The upper category temperature (UCT), which is used for test procedures, shall be the same as the
maximum element temperature (MET).

– 5 – EN 60115-2:2015
5 Modification to 5.2.10
Replace the last paragraph by
This test is mandatory only for resistors categorized as Level P or as Level R.
6 Modification to 5.2.12.5
nd
Replace the 2 entry for air pressure (1 kPa … ) by
p = 1 kPa, for resistors categorized as Level P or as Level R.
amb
7 Modification to 5.2.14
Replace the last paragraph by
The extended endurance of this test is mandatory only for resistors categorized as Level P or as Level R.
8 Modification to 5.2.17
Replace the last paragraph by
This test is mandatory only for resistors categorized as Level P or as Level R.
9 Modification to 5.2.18
Replace the entry for the solvent temperature by
ϑ = (50 ) °C
bath
−5
10 Modification to 5.2.19
Replace the entry for solvent temperature by
ϑ = (50 ) °C
bath −5
11 Modifications to 5.2.21
nd
Replace the 2 list entry for positive discharges (n = 3 … ) by
pos
n = 3 for resistors categorized as Level P or as Level R
pos
nd
Replace the 2 list entry for negative discharges (n = 3 … ) by
neg
n = 3 for resistors categorized as Level P or as Level R
neg
12 Modification to 5.2.22
Replace the last paragraph by
This test is mandatory only for resistors categorized as Level P or as Level R.
13 Modification to 6.2
a
Replace Footnote in Table 3 by
a
Test is mandatory only for resistors categorized as Level P or as Level R.
14 Modification to 6.5
Replace the explanation for MET by
MET is the maximum element temperature, MET = UCT.
15 Modifications to 9.4
st
Replace the 1 paragraph by
9.4.Z1 General
The procedures for Qualification Approval testing are given in EN 60115-1:2011, Clause Q.2, with the test
procedures described in EN 60115-1:2011, Q.2.4.
Replace the last paragraph by
9.4.Z2 Granting the approval for products classified to Level G or to Level P
The qualification approval for classification level G or P shall be granted after successful completion of
1 000 h of the test endurance at 70 °C and all other tests of Table 5.
9.4.Z3 Granting the approval for products classified to Level R
The qualification approval for classification level R, failure rate level E5 shall be granted after successful
completion of 1 000 h of the test Endurance at 70 °C and all other tests of Table 5.
Thereafter, the qualification approval for classification level R, failure rate level E6 shall be granted after
successful completion of 8 000 h of the test Endurance at 70 °C.
The qualification approval for classification level R shall be withdrawn if the 8 000 h test is not completed
successfully.
16 Modification to 9.5
st st
Replace the 1 sentence of the 1 paragraph by
The schedule for the lot-by-lot and periodic tests for Quality Conformance Inspection of resistors categorized
as level G, P or R are given in Table 6.

– 7 – EN 60115-2:2015
17 Modification to 9.6
st
Replace the 1 paragraph by
This sectional specification does not support the capability approval as described in EN 60115-1:2011, Q.3.
18 Modification to 9.7
st
Replace the 1 paragraph by
The provisions of EN 60115-1:2011, Q.4 shall apply, and the test schedules of Table 5 and Table 6 shall be
used.
19 Modification to 9.8
st
Replace the 1 paragraph by
The provisions of EN 60115-1:2011, Q.1.7 shall apply, except that the inspection level shall be reduced to
S-2.
20 Modification to 9.9
st
Replace the 1 paragraph by
Certified test records according to EN 60115-1:2011, Q.1.5 can be supplied, if agreed upon between the
manufacturer and the customer.
21 Modifications to Table 5
st
In Group 7, Test 4.25.1.8, replace the bracketed term of the entry in the 1 column by
(applicable only to resistors categorized as Level P or as Level R)
st
In Group 12, Test 4.39, replace the bracketed term of the entry in the 1 column by
(applicable only to resistors categorized as Level P or as Level R)
st
In Group 13, Test 4.19, replace the bracketed term of the entry in the 1 column by
(applicable only to resistors categorized as Level P or as Level R)
st
In Group 14, Test 4.27, replace the bracketed term of the entry in the 1 column by
(applicable only to resistors categorized as Level P or as Level R)

22 Modifications to Table 6
st
In Group C2, Test 4.25.1.8, replace the bracketed term of the entry in the 1 column by
(applicable only to resistors categorized as Level P or as Level R)
st
In Group F, Test 4.19, replace the bracketed term of the entry in the 1 column by
(applicable only to resistors categorized as Level P or as Level R)
st
In Group G, Test 4.27, replace the bracketed term of the entry in the 1 column by
(applicable only to resistors categorized as Level P or as Level R)
23 Modifications to Clause D.1
In the list of letter symbol explanations, add the new entry after the entry for R :
n
R Rated resistance, R = R Ω
r r n
In the list of letter symbol explanations, replace the respective entries for temperature T to ∆T by
max
°C
Temperature, e.g. as an atmospheric condition for testing (also written as T)
ϑ
°C
ϑ Low temperature of a change of temperature test (also written as T )
A A
°C
ϑ High temperature of a change of temperature test (also written as T )
B B
°C
ϑ Ambient temperature (also written as T )
amb amb
Bath temperature, e.g. in solvent resistance or solder bath tests (also written as T ) °C
ϑ
bath
bath
°C
Maximum temperature, maximum element temperature (also written as T )
ϑ
max
max
°C
Rated temperature (also written as T )
ϑ
r
r
°C
Upper temperature, e.g. in a respective temperature sequence (also written as T )
ϑ
sup
sup
K
∆ϑ Temperature rise (also written as ∆T)
K
∆ϑ Maximum permissible temperature rise (also written as ∆T )
max max
24 Modifications to Annex X
Delete Annex X (Cross reference for references to the prior revision of this standard).
25 New Annex ZA
Add the new normative Annex ZA (see attached Annex ZA) on correspondences for normative references.

– 9 – EN 60115-2:2015
26 New Annex ZX
Add the new informative Annex ZX (see attached Annex ZX) providing cross references for references to the
predecessor of this specification.
27 Modifications to the Bibliography
Replace the Bibliography by the Bibliography providing references to European Standards (see attached
Bibliography).
————————————————————
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated references,
the latest edition of the referenced document (including any amendments) applies.
NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the
relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60062 2004 Marking codes for resistors and capacitors EN 60062 2005
+ corrigendum Jan. 2007
IEC 60068-1 2013 Environmental testing - EN 60068-1 2014
Part 1: General and guidance
IEC 60068-2-1 - Environmental testing - EN 60068-2-1 -
Part 2-1: Tests - Test A: Cold
IEC 60068-2-2 - Environmental testing - EN 60068-2-2 -
Part 2-2: Tests - Tests B: Dry heat
IEC 60068-2-6 2007 Environmental testing - EN 60068-2-6 2008
Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
IEC 60068-2-20 2008 Environmental testing - EN 60068-2-20 2008
Part 2-20: Tests – Test T – Test methods for
solderability and resistance to soldering heat of
leaded devices
IEC 60115-1 (mod.) 2008 Fixed resistors for use in electronic equipment EN 60115-1 2011
- Part 1: Generic specification
IEC 60286-1 - Packaging of components for automatic EN 60286-1 -
handling -
Part 1: Tape packaging of components with
axial leads on continuous tapes
IEC 60294 2012 Measurement of the dimensions of a cylindrical EN 60294 2012
component having two axial terminations
IEC 60301 - Preferred diameters of wire terminations of EN 60301 -
capacitors and resistors
IEC 61193-2 2007 Quality assessment systems – EN 61193-2 2007
Part 2: Selection and use of sampling plans for
inspection of electronic components and
packages
IEC 61760-1 2006 Surface mounting technology – EN 61760-1 2006
Part 1: Standard method for the specification of
surface mounting components (SMDs)

– 11 – EN 60115-2:2015
Annex ZX
(informative)
Cross reference for references to the predecessor of this specification
This sectional specification is presented in a new structure compared to the preceding document. The
following table provides a cross reference for all references to specific elements of the predecessor of this
Sectional Specification.
EN 140100:2008 EN 60115-2:2015
Notes
Clause/Subclause Clause/Subclause
1 — The subject is covered by Clauses 1 and 8.
1.1 1 —
1.2 8 —
2 — The subject is covered by Clauses 4, 5 and 6.
2.1 — The subject is covered by Clauses 4 and 6.
2.1.1 4.1 The prior Table 1 is succeeded by Table 1.
2.1.2 4.2 The prior Table 2 is succeeded by Table 4.
2.1.3 6.4 —
The prior Tables 3a and 3b are succeeded by
2.1.4 6.2
Tables 3a and 3b, respectively.
2.2 4 —
2.2.1 4.4 —
2.2.2 4.5 —
2.2.3 4.6 —
2.2.4 4.7 —
2.2.5 4.9 —
2.2.6 4.8 —
The subject is left to the ruling of the detail
2.2.7 —
specification.
2.3 5.2 —
2.3.1 5.2.13 —
2.3.2 5.2.11 —
2.3.3 5.2.12.5 —
5.2.9
2.3.4 —
5.2.10
2.3.5 5.2.7 —
2.3.6 5.2.8 —
2.3.7 5.2.4 —
2.3.8 5.2.17 —
2.3.9 5.2.22 —
2.3.10 5.2.21 —
2.3.11 5.2.20 —
2.4 5.1 —
2.4.1 5.1.1 —
2.4.2 5.1.2 —
2.4.3 5.1.3 —
3 9 —
3.1 9.1 —
3.1.1 9.2.2 —
3.1.2 9.3 —
The information of the prior Table A.1 concerning
3.2 9.4
Qualification Approval is implemented in Table 5.
The information of the prior Table A.1 concerning
Quality Conformance Inspection is implemented in
3.3 9.5
Table 6a, for lot-by-lot tests, and in Table 6b, for
periodic tests.
3.4 9.7 —
3.5 — —
3.6 9.8 —
A — The subject is covered by 9.4 and 9.5.
B D —
B.1 D.1 —
B.2 D.2 —
Bibliography Bibliography —
– 13 – EN 60115-2:2015
Bibliography
EN 60027-1, Letter symbols to be used in electrical technology – Part 1: General (IEC 60027-1)
EN 60060-1, High-voltage test techniques – Part 1: General definitions and test requirements (IEC 60060-1)
1)
EN 60068-2-1:1993 , Environmental testing – Part 2-1: Tests – Test A: Cold (IEC 60068-2-1:1990)
2)
EN 60068-2-2:1993 , Basic environmental testing procedures – Part 2-2: Tests – Tests B: Dry heat
(IEC 60068-2-2:1974)
EN 60068-2-13, Environmental testing – Part 2-13: Tests – Test M: Low air pressure (IEC 60068-2-13)
EN 60068-2-14, Environmental testing – Part 2-14: Tests – Test N: Change of temperature (IEC 60068-2-14)
EN 60068-2-21, Environmental testing – Part 2-21: Tests – Test U: Robustness of terminations and integral
mounting devices (IEC 60068-2-21)
EN 60068-2-30, Environmental testing – Part 2-30: Tests – Test Db: Damp heat, cyclic (12 h + 12 h cycle)
(IEC 60068-2-30)
EN 60068-2-45, Environmental testing – Part 2-45: Tests – Test Xa and guidance: Immersion in cleaning
solvents (IEC 60068-2-45)
EN 60068-2-78, Environmental testing – Part 2-78: Tests – Test Cab: Damp heat, steady state
(IEC 60068-2-78)
EN 60286-2, Packaging of components for automatic handling – Part 2: Packing of components with
unidirectional leads on continuous tapes (IEC 60286-2)
EN 60440, Method of measurement of non-linearity in resistors (IEC 60440)
EN 60695-11-5, Fire hazard testing – Part 11-5: Test flames – Needle-flame test method – Apparatus,
confirmatory test arrangement and guidance (IEC 60695-11-5)
EN 60717, Method for the determination of the space required by capacitors and resistors with unidirectional
terminations (IEC 60717)
EN 61192-3, Workmanship requirements for soldered electronic assemblies – Part 3: Through-hole mount
assemblies (IEC 61192-3)
EN 61340-3-1, Electrostatics – Part 3-1: Methods for simulation of electrostatic effects – Human body model
(HBM) electrostatic discharge test waveforms (IEC 61340-3-1)
EN 80000 (all parts), Quantities and units (IEC 80000 (all parts))
EN ISO 80000 (all parts), Quantities and units (ISO 80000 (all parts))
IEC 60063, Preferred number series for resistors and capacitors
IEC 60195, Method of measurement of current noise generated in fixed resistors
IECQ 03-3, IEC Quality Assessment System for Electronic Components (IECQ) – Rules of Procedure –
Part 3: IECQ Approved Component Products, Related Materials & Assemblies Scheme
IECQ 03-3-1, IEC Quality Assessment System for Electronic Components (IECQ) – Rules of Procedure –
Part 3-1: IECQ Approved Component Products, Related Materials & Assemblies Scheme, IECQ Approved
Component – Technology Certification (IECQ AC-TC)

1)
EN 60068-2-1:1993 is replaced by EN 60068-2-1:2007, Environmental testing – Part 2-1: Tests – Test A: Cold
(IEC 60068-2-1:2007).
2)
EN 60068-2-2:1993 is replaced by EN 60068-2-2:2007, Environmental testing – Part 2-1: Tests – Test B: Dry heat
(IEC 60068-2-2:2007).
IEC 60115-2 ®
Edition 3.0 2014-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed resistors for use in electronic equipment –

Part 2: Sectional specification: Leaded fixed low power film resistors

Résistances fixes utilisées dans les équipements électroniques –

Partie 2: Spécification intermédiaire: Résistances fixes à broches à couches, à

faible dissipation
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX XB
ICS 31.040.10 ISBN 978-2-8322-1584-5

– 2 – IEC 60115-2:2014 © IEC 2014
CONTENTS
FOREWORD . 6
1 Scope . 8
2 Normative references . 8
3 Terms, definitions, product technologies and product classification . 9
3.1 Terms and definitions . 9
3.2 Product technologies . 9
3.2.1 Metal film technology . 9
3.2.2 Metal glaze technology . 9
3.2.3 Metal oxide technology . 10
3.2.4 Carbon film technology . 10
3.3 Product classification . 10
4 Preferred characteristics . 11
4.1 General . 11
4.2 Style and dimensions . 11
4.3 Preferred climatic categories . 12
4.4 Resistance . 13
4.5 Tolerances on resistance . 13
4.6 Rated dissipation P . 13
4.7 Limiting element voltage U . 14
max
4.8 Insulation voltage U . 14
ins
4.9 Insulation resistance R . 14
ins
5 Tests and test severities . 14
5.1 Preparation of specimen . 14
5.1.1 Drying . 14
5.1.2 Mounting of components on a test rack . 14
5.1.3 Specification of test boards . 14
5.1.4 Mounting of components on test boards . 16
5.2 Tests . 17
5.2.1 Dimensions . 17
5.2.2 Insulation resistance . 17
5.2.3 Voltage proof . 17
5.2.4 Short time overload . 18
5.2.5 Temperature rise . 18
5.2.6 Robustness of terminations . 18
5.2.7 Solderability. 18
5.2.8 Resistance to soldering heat . 19
5.2.9 Rapid change of temperature . 19
5.2.10 Rapid change of temperature, ≥100 cycles . 20
5.2.11 Vibration . 20
5.2.12 Climatic sequence . 20
5.2.13 Damp heat, steady state . 21
5.2.14 Endurance at 70 °C . 21
5.2.15 Endurance at room temperature . 22
5.2.16 Endurance at the upper category temperature . 22
5.2.17 Single pulse high voltage overload test . 23

IEC 60115-2:2014 © IEC 2014 – 3 –
5.2.18 Component solvent resistance . 23
5.2.19 Solvent resistance of marking . 23
5.2.20 Flammability test . 24
5.2.21 Electrostatic discharge (ESD) test . 24
5.2.22 Periodic pulse overload test . 24
6 Performance requirements . 25
6.1 General . 25
6.2 Limits for change of resistance . 25
6.3 Insulation resistance . 27
6.4 Variation of resistance with temperature . 27
6.5 Temperature rise . 28
6.6 Solderability . 28
6.7 Flammability . 28
7 Marking, packaging and ordering information . 28
7.1 Marking of the component . 28
7.2 Packaging . 28
7.3 Marking of the packaging . 28
7.4 Ordering information . 28
8 Detail specifications. 29
8.1 General . 29
8.2 Information to be specified in a detail specification . 29
8.2.1 Outline drawing or illustration . 29
8.2.2 Style and dimensions . 29
8.2.3 Climatic category . 29
8.2.4 Resistance range . 29
8.2.5 Tolerances on resistance . 30
8.2.6 Rated dissipation P . 30
8.2.7 Limiting element voltage U . 30
max
8.2.8 Insulation voltage U . 30
ins
8.2.9 Insulation resistance R . 30
ins
8.2.10 Test severities . 30
8.2.11 Limits of resistance change after testing . 30
8.2.12 Temperature coefficient of resistance . 30
8.2.13 Marking . 30
8.2.14 Ordering information . 30
8.2.15 Mounting . 31
8.2.16 Storage. 31
8.2.17 Additional information . 31
8.2.18 Quality assessment procedures . 31
8.2.19 0 Ω resistors . 31
9 Quality assessment procedures . 31
9.1 General . 31
9.2 Definitions. 31
9.2.1 Primary stage of manufacture . 31
9.2.2 Structurally similar components . 31
9.2.3 Assessment level EZ . 32
9.3 Formation of inspection lots . 32
9.4 Qualification approval (QA) procedures . 33

– 4 – IEC 60115-2:2014 © IEC 2014
9.5 Quality conformance inspection . 33
9.6 Capability approval (CA) procedures . 33
9.7 Technology approval (TA) procedures . 34
9.8 Delayed delivery . 34
9.9 Certified test records. 34
9.10 Certificate of conformity (CoC) . 34
Annex A (normative) 0 Ω Resistors (Jumper) . 45
A.1 General . 45
A.2 Preferred characteristics . 45
A.3 Tests and test severities . 45
A.4 Performance requirements . 46
A.5 Marking, packaging and ordering information . 46
A.6 Detail specification . 46
A.7 Quality assessment procedures . 46
Annex B (informative) Radial formed styles . 48
B.1 General . 48
B.1.1 Scope of this annex . 48
B.1.2 Denomination of radial formed styles . 48
B.1.3 Coated lead wires . 49
B.1.4 Means for support of mounting height . 49
B.1.5 Means for retention . 49
B.2 Radial formed styles . 50
B.2.1 Radial formed style with lateral body position . 50
B.2.2 Radial formed style with upright body position . 51
B.3 Packaging . 54
B.4 Quality assessment . 55
B.4.1 General . 55
B.4.2 Quality assessment of formed resistors . 55
B.4.3 Forming of finished resistors of assessed quality . 55
B.4.4 Special inspection requirements . 55
Annex C (normative) Endurance at room temperature . 57
C.1 Remark on the temporary relevance of this annex . 57
C.2 General . 57
C.3 Test chamber and mounting of specimen . 57
C.4 Initial measurement . 58
C.5 Temperature and load . 58
C.6 Duration . 60
C.7 Intermediate measurements . 60
C.8 Final inspection, measurements and requirements . 60
Annex D (informative) Letter symbols and abbreviations . 62
D.1 Letter symbols . 62
D.2 Abbreviations . 64
Annex X (informative) Cross reference for references to the prior revision of this
standard . 66
Bibliography . 68

Figure 1 – Shape and dimensions of axial leaded resistors . 11

IEC 60115-2:2014 © IEC 2014 – 5 –
Figure 2 – Alternative methods for specification of the length of excessive protective
coating on axial leaded resistors . 12
Figure 3 – Lead-wire spacing of axial leaded resistors with bent leads . 12
Figure 4 – Derating curve . 13
Figure 5 – Basic layout for mechanical, environmental and electrical tests,
Kelvin (4 point) connections . 15
Figure 6 – Basic layout for mechanical, environmental and electrical tests,
standard connections . 16
Figure 7 – Assembly of specimen to the test board . 17
Figure B.1 – Shape and dimensions of radial formed resistor for lateral body position . 50
Figure B.2 – Shape and dimensions of radial formed resistor for lateral body position
with kinked lead wires . 50
Figure B.3 – Shape and dimensions of a radial formed resistor for upright body position . 52
Figure B.4 – Shape and dimensions of a radial formed resistor for upright body position
and wide spacing . 52
Figure B.5 – Shape and dimensions of a radial formed resistor for upright body position
and wide spacing, with kinked lead wire . 53
Figure C.1 – Derating curve with specification of a suitable test dissipation . 59
Figure C.2 – Derating curve without specification of a suitable test dissipation . 59

Table 1 – Preferred styles of axial leaded resistors . 11
Table 2 – Test board dimensions . 15
Table 3 – Limits for change of resistance at tests . 26
Table 4 – Permitted change of resistance due to variation of temperature . 27
Table 5 – Test schedule for qualification approval. 35
Table 6 – Test schedule for quality conformance inspection . 40
Table B.1 – Feasible lead-wire spacing of radial formed resistor for
lateral body position .
...