This document specifies requirements for indicating linear sizes.
This document establishes the default specification operator (see ISO 17450-2) and defines a special specification operator for linear sizes.
This document is applicable to the following features of linear size (see ISO 17450-1):
—     cylinders;
—     spheres;
—     two parallel opposite planes.
This document provides a set of tools to express several types of linear size characteristics. It does not present any information on the relationship between a function or a use and a linear size characteristic.

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This document specifies requirements for indicating linear sizes.
This document establishes the default specification operator (see ISO 17450-2) and defines a special specification operator for linear sizes.
This document is applicable to the following features of linear size (see ISO 17450-1):
—     cylinders;
—     spheres;
—     two parallel opposite planes.
This document provides a set of tools to express several types of linear size characteristics. It does not present any information on the relationship between a function or a use and a linear size characteristic.

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This document specifies the mathematical processing of digitized transverse profile measurements to produce indices in the transverse direction for unevenness, other defects and crossfall. The document describes the calculation methods of the indices, such as irregularities, (1) rut depth, (2) ridge height, (3) water depth and area, (4) crossfall, and how to evaluate and report the indices. It also describes possibilities to do further analysis to examine defects and problems on the road that can be seen in the transverse profile. The latter is described in Annex E.

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This document specifies the method for non-destructive thickness measurement via the magnetic type of electrodeposited nickel coatings, also called “e-nickel”, on magnetic or non-magnetic substrates.
It is possible that the method is not applicable to autocatalytic (electroless) nickel coatings, since these coatings are often non-magnetic due to their chemical composition.
For the purposes of this document, two types of substrates are distinguished:
a)       nickel coatings on magnetic substrates (type A coatings);
b)       nickel coatings on non-magnetic substrates (type B coatings).
Not all instruments are applicable to both types of coating.
The effective measuring ranges of instruments using the principle of magnetic attraction are up to 50 µm for type A coatings and up to 25 µm for type B coatings.
For instruments using the principle of reluctance, the effective ranges are much greater, up to 1 mm or even more. This method is applicable to both types of coatings.

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This document specifies requirements for indicating linear sizes. This document establishes the default specification operator (see ISO 17450-2) and defines a special specification operator for linear sizes. This document is applicable to the following features of linear size (see ISO 17450-1): - cylinders; - spheres; - two parallel opposite planes. This document provides a set of tools to express several types of linear size characteristics. It does not present any information on the relationship between a function or a use and a linear size characteristic.

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This document specifies the limits of sizes for major, pitch and minor diameters of ISO metric trapezoidal screw threads (Tr) conforming to ISO 2902 and having basic and design profiles in accordance with ISO 2901. This document is applicable to the metric trapezoidal screw threads with the seven tolerance classes (7H, 8H, 9H, 7e, 8e, 8c and 9c) recommended in ISO 2903.

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This document specifies the most important design and metrological characteristics of two-point inside micrometers:
—    with a scale interval or digital step of 0,001 mm and 0,01 mm;
—    with analogue or digital indication.
This document is applicable to two-point inside micrometers with and without interchangeable extensions.
This document does not apply to micrometers fitted with a dial gauge, or to jaw micrometers.

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This document specifies the most important design and metrological characteristics of two-point inside micrometers:
—    with a scale interval or digital step of 0,001 mm and 0,01 mm;
—    with analogue or digital indication.
This document is applicable to two-point inside micrometers with and without interchangeable extensions.
This document does not apply to micrometers fitted with a dial gauge, or to jaw micrometers.

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This document specifies the most important design and metrological characteristics of two-point inside micrometers: - with a scale interval or digital step of 0,001 mm and 0,01 mm; - with analogue or digital indication. This document is applicable to two-point inside micrometers with and without interchangeable extensions. This document does not apply to micrometers fitted with a dial gauge, or to jaw micrometers.

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This document defines the terminology and develops concepts for profile morphological segmentation. In particular it specifies the watershed segmentation method, the Wolf pruning method and the crossing-the-line method. This document assumes a continuous surface.

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This document specifies the design, metrological characteristics and nominal characteristics of contact stylus instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies the design and metrological characteristics of coherence scanning interferometry (CSI) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies the design and metrological characteristics of a particular non-contact instrument for measuring surface texture using a confocal chromatic probe based on axial chromatic aberration of white light. Additional metrological characteristics can be found in ISO 25178-600. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies the design and metrological characteristics of phase shifting interferometry (PSI) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies the design and metrological characteristics of point autofocus probe (PAP) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies robust Gaussian regression filters for the filtration of surface profiles. It defines, in particular, how to separate large- and small-scale lateral components of surface profiles with protruding dales and hills.
The concept presented for closed profiles are applicable to the case of roundness filtering. Where appropriate, these concept can be extended to generalized closed profiles, especially for surface profiles with re-entrant features.

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This document defines the terminology and develops concepts for profile morphological segmentation. In particular it specifies the watershed segmentation method, the Wolf pruning method and the crossing-the-line method. This document assumes a continuous surface.

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    37 pages
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This document specifies linear Gaussian filters for the filtration of surface profiles. It defines, in particular, how to separate large- and small-scale lateral components of surface profiles.
The concept presented for closed profiles are applicable to the case of roundness filtration. Where appropriate, these concept can be extended to generalized closed profiles, especially for surface profiles with re-entrant features.
Implementation details are given in Annex A for open profiles and Annex B for closed profiles.

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This document defines the terminology and develops concepts for profile morphological segmentation. In particular it specifies the watershed segmentation method, the Wolf pruning method and the crossing-the-line method. This document assumes a continuous surface.

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This document specifies the design and metrological characteristics of coherence scanning interferometry (CSI) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from surface topography data, the methods described in this document are also applicable to profiling measurements.

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    31 pages
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This document specifies the design and metrological characteristics of a particular non-contact instrument for measuring surface texture using a confocal chromatic probe based on axial chromatic aberration of white light. Additional metrological characteristics can be found in ISO 25178-600. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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    23 pages
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This document specifies the design and metrological characteristics of phase shifting interferometry (PSI) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies the design, metrological characteristics and nominal characteristics of contact stylus instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies the design and metrological characteristics of point autofocus probe (PAP) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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    24 pages
    English language
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This document specifies robust Gaussian regression filters for the filtration of surface profiles. It defines, in particular, how to separate large- and small-scale lateral components of surface profiles with protruding dales and hills.
The concept presented for closed profiles are applicable to the case of roundness filtering. Where appropriate, these concept can be extended to generalized closed profiles, especially for surface profiles with re-entrant features.

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    30 pages
    English language
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This document specifies the design and metrological characteristics of a particular non-contact instrument for measuring surface texture using a confocal chromatic probe based on axial chromatic aberration of white light. Additional metrological characteristics can be found in ISO 25178-600. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies the design, metrological characteristics and nominal characteristics of contact stylus instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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    18 pages
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This document specifies the design and metrological characteristics of point autofocus probe (PAP) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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This document specifies the design and metrological characteristics of phase shifting interferometry (PSI) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.

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    19 pages
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This document specifies the design and metrological characteristics of coherence scanning interferometry (CSI) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from surface topography data, the methods described in this document are also applicable to profiling measurements.

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    24 pages
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This document specifies linear Gaussian filters for the filtration of surface profiles. It defines, in particular, how to separate large- and small-scale lateral components of surface profiles.
The concept presented for closed profiles are applicable to the case of roundness filtration. Where appropriate, these concept can be extended to generalized closed profiles, especially for surface profiles with re-entrant features.
Implementation details are given in Annex A for open profiles and Annex B for closed profiles.

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    37 pages
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    e-Library read for
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This document specifies robust Gaussian regression filters for the filtration of surface profiles. It defines, in particular, how to separate large- and small-scale lateral components of surface profiles with protruding dales and hills. The concept presented for closed profiles are applicable to the case of roundness filtering. Where appropriate, these concept can be extended to generalized closed profiles, especially for surface profiles with re-entrant features.

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    22 pages
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This document specifies linear Gaussian filters for the filtration of surface profiles. It defines, in particular, how to separate large- and small-scale lateral components of surface profiles. The concept presented for closed profiles are applicable to the case of roundness filtration. Where appropriate, these concept can be extended to generalized closed profiles, especially for surface profiles with re-entrant features. Implementation details are given in Annex A for open profiles and Annex B for closed profiles.

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This document specifies terminology, rules and methodology for the indication and understanding of datums and datum systems in technical product documentation. This document also provides explanations to assist the user in understanding the concepts involved.
This document defines the specification operator (see ISO 17450-2) used to establish a datum or datum system. The verification operator (see ISO 17450-2) can take different forms (physically or mathematically) and is not the subject of this document.
NOTE            The detailed rules for maximum and least material requirements for datums are given in ISO 2692.

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This document specifies terminology, rules and methodology for the indication and understanding of datums and datum systems in technical product documentation. This document also provides explanations to assist the user in understanding the concepts involved.
This document defines the specification operator (see ISO 17450-2) used to establish a datum or datum system. The verification operator (see ISO 17450-2) can take different forms (physically or mathematically) and is not the subject of this document.
NOTE            The detailed rules for maximum and least material requirements for datums are given in ISO 2692.

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This document specifies the most important design and metrological characteristics of rotary axis form-measuring instruments.
It is not applicable to coordinate measurement systems as defined by the ISO 10360 series, whether the systems are fitted with a rotary axis or not, except by special agreement.

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This document specifies terminology, rules and methodology for the indication and understanding of datums and datum systems in technical product documentation. This document also provides explanations to assist the user in understanding the concepts involved. This document defines the specification operator (see ISO 17450-2) used to establish a datum or datum system. The verification operator (see ISO 17450-2) can take different forms (physically or mathematically) and is not the subject of this document. NOTE The detailed rules for maximum and least material requirements for datums are given in ISO 2692.

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This document specifies the most important design and metrological characteristics of rotary axis form-measuring instruments.
It is not applicable to coordinate measurement systems as defined by the ISO 10360 series, whether the systems are fitted with a rotary axis or not, except by special agreement.

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This document specifies the most important design and metrological characteristics of rotary axis form-measuring instruments. It is not applicable to coordinate measurement systems as defined by the ISO 10360 series, whether the systems are fitted with a rotary axis or not, except by special agreement.

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This part of The EN 13523 series specifies the procedures for determining the resistance to salt spray (fog) of an organic coating on a metallic substrate (coil coating).
For steel, neutral salt spray (fog) is usually used, and for aluminium, acetic acid salt spray (fog).

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This document specifies the procedures for determining the dry-film thickness of an organic coating on a metallic substrate (coil coating).
Five appropriate methods are given in this document:
a)   magnetic induction;
b)   eddy current;
c)   micrometer;
d)   optical;
e)   ruggedized optical interference.
The methods are applicable only to products with smooth and flat substrates, but the coating itself can be textured. In that case, for methods a) and b), the average of a series of readings will represent an average of the thickness of the organic coating, while method c) will give the maximum thickness, method d) can provide the minimum, maximum and average thickness, and e) will give the total thickness.
Non-destructive continuous-web methods on measurement of dry-film thickness are only applicable on method a).

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This document specifies the procedure for determining the resistance of an organic coating on a metallic substrate to penetration by scratching with a needle.
It is possible that with some aluminium alloys and thin gauge steel substrate below 0,4 mm, that rather than scratching, the needle will deform the substrate. Under these conditions, this test method is not applicable.
Soft coatings such as poly vinyl chloride (PVC) and structured coatings will not give a precise result due to the soft nature of the coating and/or the potential for the needle to snag.
The method is not applicable to conductive coatings.

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This part of the EN 13523 series specifies the procedure for evaluating the behaviour of an organic coating on a metallic substrate during and after outdoor exposure. Panel design, preparation and the procedure for outdoor exposure are performed in accordance with EN 13523 19.
After washing of the panel, some dirt can remain on the panel. This remaining dirt can influence the accuracy and precision of readings of gloss and colour, performed on exposed panels, although carried out in accordance with the standards. Unlike other precise measurements, the objective of this European Standard is to report on trends in the corrosion and/or paint degradation behaviour of coil coated panels.

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This document specifies the procedures for determining the dry-film thickness of an organic coating on a metallic substrate (coil coating).
Five appropriate methods are given in this document:
a)   magnetic induction;
b)   eddy current;
c)   micrometer;
d)   optical;
e)   ruggedized optical interference.
The methods are applicable only to products with smooth and flat substrates, but the coating itself can be textured. In that case, for methods a) and b), the average of a series of readings will represent an average of the thickness of the organic coating, while method c) will give the maximum thickness, method d) can provide the minimum, maximum and average thickness, and e) will give the total thickness.
Non-destructive continuous-web methods on measurement of dry-film thickness are only applicable on method a).

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This document defines the basic terms for partitioned features and establishes a framework for the fundamental procedures used in partition.

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This document defines the basic terms for partitioned features and establishes a framework for the fundamental procedures used in partition.

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This document defines the basic terms for partitioned features and establishes a framework for the fundamental procedures used in partition.

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SIGNIFICANCE AND USE
4.1 The term “surface texture” is used to describe the local deviations of a surface from an ideal shape. Surface texture usually consists of long wavelength repetitive features that occur as results of chatter, vibration, or heat treatments during the manufacture of implants. Short wavelength features superimposed on the long wavelength features of the surface, which may arise from polishing or etching of the implant, are referred to as roughness.  
4.2 This guide provides an overview of techniques that are available for measuring the surface in terms of Cartesian coordinates and the parameters used to describe surface texture. It is important to appreciate that it is not possible to measure surface texture per se, but to derive values for parameters that can be used to describe it. ISO has published a series of standards on surface texture measurements that may be consulted for more information (ISO 3274, ISO 4287, ISO 4288, ISO 5436-2, ISO 10993-19, ISO 12179, ISO 13565-1, ISO 19606, ISO 21920-1, ISO 21920-2, ISO 21920-3, ISO 25178-1, ISO 25178-2, ISO 25178-3, ISO 25178-6, ISO 25178-70, ISO 25178-71, ISO 25178-72, ISO 25178-73, ISO 25178-600, ISO 25178-601, ISO 25178-602, ISO 25178-603, ISO 25178-604, ISO 25178-605, ISO 25178-606, ISO 25178-607, ISO 25178-700, ISO 25178-701).
SCOPE
1.1 This guide describes some of the more common methods that are available for measuring the topographical features of a surface and provides an overview of the parameters that are used to quantify them. Being able to reliably derive a set of parameters that describe the texture of biomaterial surfaces is a key aspect in the manufacture of safe and effective implantable medical devices that have the potential to trigger an adverse biological reaction in situ.  
1.2 This guide is not intended to apply to porous structures with average pore dimensions in excess of approximately 50 nm (0.05 μm).  
1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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