Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

IEC 60191-6-16:2007 gives a glossary of semiconductor sockets for BGA, LGA, FBGA and FLGA. This standard intends to establish definitions and unification of terminology relating to tests and burn-in sockets for BGA, LGA, FBGA and FLGA.

Normalisation mécanique des dispositifs à semiconducteurs - Partie 6-16: Glossaire des supports de test et de déverminage pour les BGA, LGA, FBGA et FLGA

La CEI 60191-6-16:2007 fournit un glossaire relatif aux supports pour boîtiers à semiconducteurs de type BGA, LGA, FBGA et FLGA. Cette norme est destinée à établir des définitions et une unification de la terminologie relatives aux supports de test et de déverminage pour les BGA, LGA, FBGA et FLGA.

General Information

Status
Published
Publication Date
25-Apr-2007
Current Stage
PPUB - Publication issued
Start Date
15-Sep-2007
Completion Date
26-Apr-2007
Ref Project

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IEC 60191-6-16:2007 - Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA Released:4/26/2007 Isbn:2831891310
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Standard
IEC 60191-6-16:2007 - Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA
English and French language
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INTERNATIONAL IEC
STANDARD 60191-6-16
First edition
2007-04
Mechanical standardization
of semiconductor devices –
Part 6-16:
Glossary of semiconductor tests and burn-in
sockets for BGA, LGA, FBGA and FLGA

Reference number
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.

IEC Central Office
3, rue de Varembé
CH-1211 Geneva 20
Switzerland
Email: inmail@iec.ch
Web: www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

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INTERNATIONAL IEC
STANDARD 60191-6-16
First edition
2007-04
Mechanical standardization
of semiconductor devices –
Part 6-16:
Glossary of semiconductor tests and burn-in
sockets for BGA, LGA, FBGA and FLGA

PRICE CODE
Commission Electrotechnique Internationale L
International Electrotechnical Commission
МеждународнаяЭлектротехническаяКомиссия
For price, see current catalogue

– 2 – 60191-6-16 © IEC:2007(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
______________
MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES –

Part 6-16: Glossary of semiconductor tests and burn-in sockets
for BGA, LGA, FBGA and FLGA
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60191-6-16 has been prepared by subcommittee 47D: Mechanical
standardization of semiconductor devices, of IEC technical committee 47: Semiconductor
devices.
The text of this standard is based on the following documents:
FDIS Report on voting
47D/679/FDIS 47D/683/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directive, Part 2.

60191-6-16 © IEC:2007(E) – 3 –
A list of all the parts of the IEC 60191 series, under the general title Mechanical
standardization of semiconductor devices, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.

– 4 – 60191-6-16 © IEC:2007(E)
MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES –

Part 6-16: Glossary of semiconductor tests and burn-in sockets
for BGA, LGA, FBGA and FLGA
1 Scope
This part of IEC 60191 gives a glossary of semiconductor sockets for BGA, LGA, FBGA and
FLGA. This standard intends to establish definitions and unification of terminology relating to
tests and burn-in sockets for BGA, LGA, FBGA and FLGA.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60191-1:1966, Mechanical standardization of semiconductor devices – Part 1: Preparation of
outline drawings of semiconductor devices
IEC 60191-2:1966, Mechanical standardization of semiconductor devices – Part 2: Dimensions
IEC 60191-3:1999, Mechanical s
...


IEC 60191-6-16 ®
Edition 1.0 2007-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Mechanical standardization of semiconductor devices –
Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA,
FBGA and FLGA
Normalisation mécanique des dispositifs à semiconducteurs –
Partie 6-16: Glossaire des supports de test et de déverminage pour les BGA,
LGA, FBGA et FLGA
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite ni
utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie et les
microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur.
Si vous avez des questions sur le copyright de la CEI ou si vous désirez obtenir des droits supplémentaires sur cette
publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.

IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé Fax: +41 22 919 03 00
CH-1211 Geneva 20 info@iec.ch
Switzerland www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.

Useful links:
IEC publications search - www.iec.ch/searchpub Electropedia - www.electropedia.org
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IEC 60191-6-16 ®
Edition 1.0 2007-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Mechanical standardization of semiconductor devices –

Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA,

FBGA and FLGA
Normalisation mécanique des dispositifs à semiconducteurs –

Partie 6-16: Glossaire des supports de test et de déverminage pour les BGA,

LGA, FBGA et FLGA
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX L
ICS 31.080.01 ISBN 978-2-83220-233-3

– 2 – 60191-6-16  IEC:2007
INTERNATIONAL ELECTROTECHNICAL COMMISSION
______________
MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES –

Part 6-16: Glossary of semiconductor tests and burn-in sockets
for BGA, LGA, FBGA and FLGA
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60191-6-16 has been prepared by subcommittee 47D: Mechanical
standardization of semiconductor devices, of IEC technical committee 47: Semiconductor
devices.
This bilingual version (2012-07) corresponds to the monolingual English version, published in
2007-04. The text of this standard is based on the following documents:
FDIS Report on voting
47D/679/FDIS 47D/683/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
The French version of this standard has not been voted upon.
This publication has been drafted in accordance with the ISO/IEC Directive, Part 2.

60191-6-16  IEC:2007 – 3 –
A list of all the parts of the IEC 60191 series, under the general title Mechanical
standardization of semiconductor devices, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
– 4 – 60191-6-16  IEC:2007
MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES –

Part 6-16: Glossary of semiconductor tests and burn-in sockets
for BGA, LGA, FBGA and FLGA
1 Scope
This part of IEC 60191 gives a glossary of semiconductor sockets for BGA, LGA, FBGA and
FLGA. This standard intends to establish definitions and unification of terminology relating to
tests and burn-in sockets for BGA, LGA, FBGA and FLGA.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60191-1:1966, Mechanical standardization of semiconductor devices – Part 1:
Preparation of outline drawings of semiconductor devices
IEC 60191-2:1966, Mechanical standardization of semiconductor devices – Part 2:
Dimensions
IEC 60191-3:1999, Mechanical standardization of semiconductor devices – Part 3: General
rules for the preparation of outline drawings of integrated circuits
IEC 60191-4:1999, Mechanical standardization of semiconductor devices – Part 4: Coding
system and classification into forms of package outlines for semiconductor devices
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
NOTE 1 Long terms are indicated in two lines.
NOTE 2 A symbol indicates the dimensional symbol in drawing.
NOTE 3 A dash (-) in the columns of “Drawing part” and “Symbol” indicates no correspondence to symbols or
drawing parts.
60191-6-16  IEC:2007 – 5 –
3.1 General
Table 1 – General
No. Term Definition Symbol Drawing part
101 IC socket connector to electrically connect and mechanically hold IC - -
package
102 production socket socket used in the production of PCB assemblies for - -
electrical equipment to facilitate package replacement
103 test and burn-in socket socket mainly used for electrical characteristics test, burn-in - -
and reliability test of package with its production process.
Designed for reliable contact, durable actuation and high
environmental operating temperature
104 clamshell type socket socket having a style that surrounds the package with hinged - Figure 1
base and lid
105 open-top type socket socket having a style to load/unload package from the top - Figure 2
opening of socket by pressing down the cover mechanism
3.2 Clamshell type
Table 2 – Clamshell type
No. Term Definition Symbol Drawing part
201 base base part to hold contacts and other socket parts and to be - Figure 1(1)
assembled on PCB
202 lid part making a pair with base whose function is to hold the - Figure 1(2)
package
203 latch latch to fix the cover with base at closed position - Figure 1(3)
204 hinge hinge to join base and lid - Figure 1(4)
205 alignment plate supporting part to align terminals with through holes on PCB - Figure 1(5)
for ease of socket terminal insertion
206 alignment pin pin mounted on socket to define relative position of socket - Figure 1(6)
with PCB
207 contact electrically connecting part of socket consisting of contact - Figure 1(7)
point with package lead and terminal portion to be soldered
on PCB
208 contact point section of the contact making connection with package - Figure 1,(8)
209 terminal electrical connector protruding from socket base in order to - Figure 1(9)
solder on PCB. Part of the contact
210 platform part to hold package - Figure 1(10)
211 pusher part to hold package and to maintain stable contact of - Figure 1(11)
package leads with socket contacts
212 package guide guide for package established in socket to align package - Figure 1(12)
leads with socket contact
213 mounting flange flange to mount socket on PCB - Figure 1(13)
214 socket width socket width excluding mounting flange W Figure 1
215 maximum socket width maximum socket width including mounting flange W Figure 1
216 socket length socket length excluding protrusion of the latch at its closed L Figure 1
position
217 maximum socket length maximum socket length including protrusion of the latch at its L Figure 1
closed position
218 latch moving distance distance of the latch movement beyond socket length Figure 1
L
...

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