IEC TR 63378-1:2021
(Main)Thermal standardization on semiconductor packages - Part 1: Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
Thermal standardization on semiconductor packages - Part 1: Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
IEC TR 63378-1:2021(E) specifies the terms and definitions that are commonly used for thermal characteristics of BGA and QFP type semiconductor packages, and guidelines to use these thermal characteristics.
General Information
- Status
- Published
- Publication Date
- 13-Dec-2021
- Technical Committee
- SC 47D - Semiconductor devices packaging
- Drafting Committee
- WG 2 - TC 47/SC 47D/WG 2
- Current Stage
- PPUB - Publication issued
- Start Date
- 12-Jan-2022
- Completion Date
- 14-Dec-2021
Overview
IEC TR 63378-1:2021 - Thermal standardization on semiconductor packages, Part 1 - defines common terminology and usage guidelines for thermal resistance and thermal characterization parameters of BGA and QFP semiconductor packages. The Technical Report standardizes how thermal metrics are described (temperatures, resistances and characterization parameters) and provides guidance on measurement variability, simulation practices and thermal design considerations relevant to package- and board-level thermal assessment.
Key topics and technical requirements
- Scope and definitions: Precise definitions of temperature points such as ambient air temperature (T_A), junction temperature (T_J), case/top temperature (T_C / T_T) and board temperature (T_B).
- Thermal resistance: Formalization of thermal resistance concepts including junction-to-ambient (θ_JA), junction-to-case/top (θ_JC / θ_JCTOP) and junction-to-board (θ_JB). Example equation given:
θ_JA = (T_J − T_A) / P (where P is steady‑state power dissipation). - Thermal characterization parameters: Clarifies Ψ-parameters (for example Ψ_JT, Ψ_JB) which relate a temperature difference to total device power and are distinct from pure thermal resistance.
- Accuracy and variability of θ_JA: Analysis of factors that influence θ values - board copper distribution, ambient conditions, power dissipation and measurement/simulation setup. The report includes simulation models (examples: a 35 mm × 35 mm BGA 544-pin package and a 20 mm × 20 mm LQFP 144-pin package) to illustrate variation and discrepancy of θ.
- Guidelines for thermal design: Practical advice for using thermal characteristics in device and system-level thermal assessments; outlines evaluation items and simulation conditions to improve comparability.
- Normative reference: Links to IEC 60191-4 for package outline coding and classification.
Practical applications and intended users
IEC TR 63378-1 is designed for professionals involved in thermal management and semiconductor packaging:
- Package designers and semiconductor manufacturers - to standardize datasheet thermal terms and reporting.
- Thermal engineers and system architects - for accurate thermal modeling (θ and Ψ use) and component selection.
- PCB designers - to understand board copper effects and placement impact on package thermal resistance.
- Reliability / test laboratories - to harmonize measurement setups and compare θ results across vendors. Practical uses include defining thermal specifications on datasheets, creating simulation boundary conditions, performing junction-temperature calculations, and guiding system-level cooling strategies.
Related standards
- IEC 60191-4 (mechanical standardization and package coding)
- Other parts of the IEC 63378 series (see IEC webstore for the full series)
Keywords: IEC TR 63378-1, thermal resistance, thermal characterization parameter, θ_JA, Ψ_JT, BGA thermal, QFP thermal, semiconductor package thermal design.
Frequently Asked Questions
IEC TR 63378-1:2021 is a technical report published by the International Electrotechnical Commission (IEC). Its full title is "Thermal standardization on semiconductor packages - Part 1: Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages". This standard covers: IEC TR 63378-1:2021(E) specifies the terms and definitions that are commonly used for thermal characteristics of BGA and QFP type semiconductor packages, and guidelines to use these thermal characteristics.
IEC TR 63378-1:2021(E) specifies the terms and definitions that are commonly used for thermal characteristics of BGA and QFP type semiconductor packages, and guidelines to use these thermal characteristics.
IEC TR 63378-1:2021 is classified under the following ICS (International Classification for Standards) categories: 31.080.01 - Semiconductor devices in general. The ICS classification helps identify the subject area and facilitates finding related standards.
You can purchase IEC TR 63378-1:2021 directly from iTeh Standards. The document is available in PDF format and is delivered instantly after payment. Add the standard to your cart and complete the secure checkout process. iTeh Standards is an authorized distributor of IEC standards.
Standards Content (Sample)
IEC TR 63378-1 ®
Edition 1.0 2021-12
TECHNICAL
REPORT
colour
inside
Thermal standardization on semiconductor packages –
Part 1: Thermal resistance and thermal parameter of BGA, QFP type
semiconductor packages
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IEC TR 63378-1 ®
Edition 1.0 2021-12
TECHNICAL
REPORT
colour
inside
Thermal standardization on semiconductor packages –
Part 1: Thermal resistance and thermal parameter of BGA, QFP type
semiconductor packages
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.01 ISBN 978-2-8322-1062-3
– 2 – IEC TR 63378-1:2021 © IEC 2021
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
3.1 Terms and letter symbols related to temperature (unit [°C or K]) . 5
3.2 Terms and letter symbols related to thermal characteristics . 6
4 Accuracy of θ . 10
JA
4.1 Variation of θ . 10
JA
4.1.1 General . 10
4.1.2 Analysis model . 10
4.1.3 Simulation conditions (typical values) . 11
4.1.4 Evaluation items and standards . 11
4.1.5 Evaluation results . 12
4.1.6 Summary . 17
4.2 Discrepancy of θ . 18
JA
5 Guideline for thermal design . 19
Bibliography . 20
Figure 1 – Definition of temperature . 6
Figure 2 – Definition of thermal resistance . 7
Figure 3 – Thermal resistance. 8
Figure 4 – Thermal resistance and thermal characterization parameter . 9
Figure 5 – Thermal characterization parameter . 10
Figure 6 – Simulation conditions . 11
Figure 7 – θ
dependence on board remaining copper rate (BGA) . 12
JA
Figure 8 – θ dependence on remaining copper rate (LQFP) . 13
JA
Figure 9 – θ dependence on ambient air temperature T (BGA) . 14
JA A
Figure 10 – θ dependence on ambient air temperature T (LQFP) . 15
JA A
Figure 11 – θ dependence on power dissipation (BGA). 16
JA
Figure 12 – θ dependence on power dissipation (LQFP) . 17
JA
Figure 13 – Influence items and their impact on θ . 17
JA
Figure 14 – The gap of θ by the difference of the environment . 19
JA
Table 1 – Evaluation items and evaluation parameters . 11
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
THERMAL STANDARDIZATION ON SEMICONDUCTOR PACKAGES –
Part 1: Thermal resistance and thermal parameter of BGA,
QFP type semiconductor packages
FOREWORD
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IEC TR 63378-1 has been prepared by subcommittee 47D: Semiconductor devices packaging,
of IEC technical committee 47: Semiconductor devices. It is a Technical Report.
The text of this Technical Report is based on the following documents:
Draft Report on voting
47D/928/DTR 47D/935/RVDTR
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Technical Report is English.
– 4 – IEC TR 63378-1:2021 © IEC 2021
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/standardsdev/publications.
A list of all parts in the IEC 63378 series, published under the general title Thermal
standardization on semiconductor packages, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
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THERMAL STANDARDIZATION ON SEMICONDUCTOR PACKAGES –
Part 1: Thermal resistance and thermal parameter of BGA,
QFP type semiconductor packages
1 Scope
This part of IEC 63378 specifies the terms and definitions that are commonly used for thermal
characteristics of BGA and QFP type semiconductor packages, and guidelines to use these
thermal characteristics.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60191-4, Mechanical standardization of semiconductor devices – Part 4: Coding system
and classification into forms o
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