IEC 60191-6-10:2003
(Main)Mechanical standardization of semiconductor devices - Part 6-10: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Dimensions of P-VSON
Mechanical standardization of semiconductor devices - Part 6-10: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Dimensions of P-VSON
IEC 60191-6-10:2003 provides the common outline drawings and dimensions for all types of structures and composed materials of plastic very thin small outline non-lead package (hereinafter called P-VSON).
Normalisation mécanique des dispositifs à semiconducteurs - Partie 6-10: Règles générales pour la préparation des dessins d'encombrement des dispositifs à semiconducteurs pour montage en surface - Dimensions des boîtiers P-VSON
La CEI 60191-6-10:2003 fournit les dessins d'encombrement et les dimensions courantes pour tous les types de structures et de matériaux composés de boîtiers en plastique sans sortie, très faible encombrement (appelés ci-après P-VSON).
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INTERNATIONAL IEC
STANDARD
60191-6-10
First edition
2003-11
Mechanical standardization of semiconductor devices –
Part 6-10:
General rules for the preparation of outline drawings of
surface mounted semiconductor device packages –
Dimensions of P-VSON
Normalisation mécanique des dispositifs à semiconducteurs –
Partie 6-10:
Règles générales pour la préparation des dessins
d'encombrement des dispositifs à semiconducteurs
pour montage en surface –
Dimensions des boîtiers P-VSON
Reference number
Publication numbering
As from 1 January 1997 all IEC publications are issued with a designation in the
60000 series. For example, IEC 34-1 is now referred to as IEC 60034-1.
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INTERNATIONAL IEC
STANDARD
60191-6-10
First edition
2003-11
Mechanical standardization of semiconductor devices –
Part 6-10:
General rules for the preparation of outline drawings of
surface mounted semiconductor device packages –
Dimensions of P-VSON
Normalisation mécanique des dispositifs à semiconducteurs –
Partie 6-10:
Règles générales pour la préparation des dessins
d'encombrement des dispositifs à semiconducteurs
pour montage en surface –
Dimensions des boîtiers P-VSON
IEC 2003 Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
PRICE CODE
Commission Electrotechnique Internationale M
International Electrotechnical Commission
МеждународнаяЭлектротехническаяКомиссия
For price, see current catalogue
– 2 – 60191-6-10 © IEC:2003(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
MECHANICAL STANDARDIZATION
OF SEMICONDUCTOR DEVICES –
Part 6-10: General rules for the preparation of outline drawings of
surface mounted semiconductor device packages –
Dimensions of P-VSON
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all
national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in
addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence between
any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment
declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses
arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60191-6-10 has been prepared by subcommittee 47D: Mechanical
standardization of semiconductor devices, of IEC technical committee 47: Semiconductor
devices.
The text of this standard is based on the following documents:
FDIS Report on voting
47D/551/FDIS 47D565/RVD
Full information on the voting for the approval of this standard can be found in the report on voting
indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
60191-6-10 © IEC:2003(E) – 3 –
The committee has decided that the contents of this publication will remain unchanged until 2005.
At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.
---------------
...
IEC 60191-6-10 ®
Edition 1.0 2003-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Mechanical standardization of semiconductor devices –
Part 6-10: General rules for the preparation of outline drawings of surface
mounted semiconductor device packages – Dimensions of P-VSON
Normalisation mécanique des dispositifs à semiconducteurs –
Partie 6-10: Règles générales pour la préparation des dessins d'encombrement
des dispositifs à semiconducteurs pour montage en surface – Dimensions des
boîtiers P-VSON
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester.
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IEC 60191-6-10 ®
Edition 1.0 2003-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Mechanical standardization of semiconductor devices –
Part 6-10: General rules for the preparation of outline drawings of surface
mounted semiconductor device packages – Dimensions of P-VSON
Normalisation mécanique des dispositifs à semiconducteurs –
Partie 6-10: Règles générales pour la préparation des dessins d'encombrement
des dispositifs à semiconducteurs pour montage en surface – Dimensions des
boîtiers P-VSON
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
M
CODE PRIX
ICS 31.080.01 ISBN 978-2-83220-520-4
– 2 – 60191-6-10 IEC:2003
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
MECHANICAL STANDARDIZATION
OF SEMICONDUCTOR DEVICES –
Part 6-10: General rules for the preparation of outline drawings of
surface mounted semiconductor device packages –
Dimensions of P-VSON
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all
national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in
addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence between
any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment
declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses
arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60191-6-10 has been prepared by subcommittee 47D: Mechanical
standardization of semiconductor devices, of IEC technical committee 47: Semiconductor
devices.
This bilingual version (2012-12) corresponds to the monolingual English version, published in
2003-11.
The text of this standard is based on the following documents:
FDIS Report on voting
47D/551/FDIS 47D565/RVD
Full information on the voting for the approval of this standard can be found in the report on voting
indicated in the above table.
The French version of this standard has not been voted upon.
60191-6-10 IEC:2003 – 3 –
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of this publication will remain unchanged until 2005.
At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
– 4 – 60191-6-10 IEC:2003
MECHANICAL STANDARDIZATION
OF SEMICONDUCTOR DEVICES –
Part 6-10: General rules for the preparation of outline drawings of
surface mounted semiconductor device packages –
Dimensions of P-VSON
1 Scope
This part of IEC 60191 provides the common outline drawings and dimensions for all types of
structures and composed materials of plastic very thin small outline non-lead package
(hereinafter called P-VSON).
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of the
referenced document (including any amendments) applies.
IEC 60191(all parts), Mechanical standardization of semiconductor devices
ISO/DIS 2692: Geometrical Product Specification (GPS) – Geometrical tolerancing – Maximum
material requirement (MMR) and least material requirement (LMR)
3 Terms and definitions
For the purposes of this document, the following definition, as well as those given in other parts
of the IEC 60191 series, apply.
3.1
P-VSON
plastic very thin-profile small outline, flat package with no leads
NOTE The package leads (terminals) are on opposite sides of the bottom of the package body and do not extend
beyond the package body.
60191-6-10 © IEC:2003 – 5 –
Drawing of Plastic non-lead packages with two parallel rows of terminals
GENERAL RULES
P-VSON Date: 2003
– 6 – 60191-6-10 IEC:2003
Drawing of Plastic non-lead packages with two parallel rows of terminals
GENERAL RULES
P-VSON Date: 2003
c
c
60191-6-10 IEC:2003 – 7 –
Drawing of Plastic non-lead packages with two parallel rows of terminals
GENERAL RULES
P-VSON Date: 2003
– 8 – 60191-6-10 IEC:2003
Table 1 – Dimensions to be specified for Group 1
Group 1 – Group 1 includes dimensions and numerals associated with mounting of packages and
different kinds of packages. The dimensions and numerals belonging to the group mean values is
guaranteed to users and imply that mechanical compatibility of mounting of packages can be recognized.
Limits to be observed Recommended values for the dimension
Name Ref. Note
mm
Min. Nom. Max.
– –
Standard n X See Table 3 9
number of
terminals
– –
Seated A X A = 1,0
max
height
–
Stand-off A X X 7
A A
1 min. 1 max.
height
0,00 0,05
– –
Body height A X A = 0,75
2 2 nom.
–
Terminal b X X 7
e b b
min. max.
width plated
1,25 0,55 0,70
1,00 0,55 0,70
0,80 0,35 0,50
0,65 0,30 0,45
0,50 0,25 0,40
0,40 0,15 0,25
–
Terminal c X X
c c
min. max.
thickness
0,09 0,25
plated
Package D X X X From 7,00 to 26,00 increment 1,00
length D = D + 0,20
max. nom.
D = D – 0,20
min. nom.
Package E X X X E From 5,00 to 13,00 increment 1,00
nom.
width E = E + 0,20
max. nom.
E = E – 0,20
min. nom.
*
– –
Terminal X( ) 4
e e =1,25;1,00; 0,80; 0,65; 0,50; 0,40
nom.
pitch
Overall H X X X H = E + 2L
E E 1 nom.
width
60191-6-10 IEC:2003 – 9 –
Table 1 (continued)
Limits to be observed
Recommended values for the dimension
Name Ref. Note
Min. Nom. Max.
mm
–
Length of L X X
e L L
min. max.
solder part
1,25 0,70 1,30
1,00 0,70 1,20
0,80 0,50 0,90
0,65 0,40 0,80
0,50 0,35 0,75
0,40 0,35 0,75
– –
Terminal x X X = 0,05 3
max.
position
tolerance
– –
Coplanarity y X y = 0,05 5
max.
– –
Flatness y X y = 0,10
1 1 max.
.
– 10 – 60191-6-10 IEC:2003
Table 2 – Dimensions to be specified for Group 2
Group 2 – Group 2 includes dimensions that do not belong to Group 1, but are associated with fabrication
of packages and dimensions of terminal position areas. The group is to achieve its own original purpose
as an industry standard. The group belongs to the dimensions and numerals of external shapes of
packages useful for designers and manufacturers and the dimensio
...
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