IEC 60747-17:2020
(Main)Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
IEC 60747-17:2020 specifies the terminology, essential ratings, characteristics, safety test and the measuring methods of magnetic coupler and capacitive coupler.
It specifies the principles and requirements of insulation and isolation characteristics for magnetic and capacitive couplers for basic insulation and reinforced insulation.
This first edition cancels and replaces IEC PAS 60747-17:2011. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to IEC PAS 60747-17:2011:
a) introduced lifetime safety factors for improved life time consideration, to comply with widely recognized aging mechanisms of silicone dioxide (TDDB) and thin film polymer isolation layers;
b) significantly improved "end of life testing" paragraph and statistical life time consideration by adding detailed description on process, safety factors, methods of generating data points and respective lifetime interpolations as well as being specific on minimum amount of samples required;
c) introduced concept of certification by similarity, including Annex A, giving guidance on qualification considerations and required certification process;
d) alternative pulse shape allowed for surge pulse testing, to avoid issues due to surge tester availability;
e) various improvements throughout the standard: definitions, for example type of coupler have been improved, introduction of surge impulse VIMP rating, usage of glass transition temperature, pre-conditioning have been redefined for improved usability and better compatibility with today’s design and functionality of couplers, available mold compounds, etc.
The contents of the corrigendum of January 2021 have been included in this copy.
Dispositifs à semiconducteurs - Partie 17 : Coupleur magnétique et capacitif pour l’isolation principale et renforcée
L'IEC 60747-17:2020 spécifie la terminologie, les valeurs assignées essentielles, les caractéristiques, l’essai de sécurité et les méthodes de mesure des coupleurs magnétiques et des coupleurs capacitifs.
Elle spécifie les principes et exigences de l’isolation et les caractéristiques d’isolement des coupleurs magnétiques et capacitifs pour l’isolation principale et l’isolation renforcée.
Cette première édition annule et remplace l’IEC PAS 60747-17:2011. Cette édition constitue une révision technique.
Cette édition inclut les modifications techniques majeures suivantes par rapport à l’IEC PAS 60747‑17:2011:
a) introduction des facteurs de sécurité de durée de vie pour la prise en considération de la durée de vie améliorée, conformément aux mécanismes de vieillissement du dioxyde de silicium (TDDB) largement reconnus, et couches d’isolement en polymère à couches minces;
b) prise en considération de l’alinéa et de la durée de vie statistique de l’"essai de fin de vie" considérablement améliorée par l’ajout d’une description détaillée du processus, des facteurs de sécurité, des méthodes de génération de points de données et des interpolations de la durée de vie respective, ainsi que par la spécification de la quantité minimale d'échantillons exigés;
c) introduction du concept de certification par similarité, comprenant l’Annexe A, qui donne des recommandations relatives aux considérations de qualification et au processus de certification exigé;
d) forme d'impulsion alternative admise pour l’essai d’impulsion de choc afin d'éviter les problèmes de disponibilité de l’appareil d’essai aux ondes de choc;
e) plusieurs améliorations tout au long de la norme: amélioration des définitions, par exemple des types de coupleurs; introduction de la valeur assignée de l’impulsion de choc VIMP, utilisation d’une température de transition vitreuse, redéfinition du préconditionnement pour une utilisation améliorée et une meilleure compatibilité avec la conception et les fonctionnalités actuelles des coupleurs, les composants moulés disponibles, etc.
Le contenu du corrigendum de janvier 2021 a été pris en considération dans cet exemplaire.
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IEC 60747-17 ®
Edition 1.0 2020-09
INTERNATIONAL
STANDARD
Semiconductor devices –
Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
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About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
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IEC 60747-17 ®
Edition 1.0 2020-09
INTERNATIONAL
STANDARD
Semiconductor devices –
Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.99 ISBN 978-2-8322-8801-6
– 2 – IEC 60747-17:2020 © IEC 2020
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 8
4 Electrical characteristics – Coupler logic and timing definitions . 19
5 Coupler for protection against electrical shock . 20
5.1 General . 20
5.2 Type . 20
5.3 Ratings . 20
5.3.1 General . 20
5.3.2 Safety limiting values . 20
5.3.3 Functional ratings . 20
5.3.4 Rated isolation voltages. 20
5.4 Electrical safety requirements . 20
5.5 Electrical, environmental and/or endurance test information . 21
5.5.1 General . 21
5.5.2 Routine test . 23
5.5.3 Sample test . 23
5.5.4 Maximum surge isolation voltage . 23
5.5.5 Type test . 24
6 Measuring methods for couplers . 35
6.1 General . 35
6.2 Isolation capacitance (C ) . 35
lO
6.2.1 Purpose . 35
6.2.2 Circuit diagram . 35
6.2.3 Measurement procedure . 36
6.2.4 Precautions to be observed . 36
6.2.5 Special conditions . 36
6.3 Isolation resistance between input and output, R . 36
lO
6.3.1 Purpose . 36
6.3.2 Circuit diagram . 36
6.3.3 Precautions to be observed . 37
6.3.4 Measurement procedure . 37
6.3.5 Special conditions . 37
6.4 Isolation test . 37
6.4.1 Purpose . 37
6.4.2 Circuit diagram . 37
6.4.3 Test procedure . 38
6.4.4 Requirements . 38
6.5 Partial discharges of coupler . 39
6.5.1 Purpose . 39
6.5.2 Circuit diagram . 39
6.5.3 Description of Figure 9 test circuit and requirements . 39
6.5.4 Test procedure . 40
6.5.5 Description of calibration circuit (see Figure 10) . 40
6.5.6 Test methods . 41
6.5.7 Specified conditions . 41
6.5.8 Test voltage conditions . 42
6.6 Switching times of couplers . 42
6.6.1 Purpose . 42
6.6.2 Circuit diagram . 42
6.6.3 Measurement procedure . 43
6.6.4 Specified conditions . 44
6.7 Measuring methods of common-mode transient immunity (CMTI) for
magnetic and capacitive couplers . 44
6.7.1 Purpose . 44
6.7.2 Circuit diagram . 44
6.7.3 Precautions to be observed . 45
6.7.4 Static CMTI measuring procedure . 46
6.7.5 Specified conditions . 47
6.7.6 Dynamic CMTI measuring procedure . 47
Annex A (informative) Qualification guidance . 48
Bibliography . 51
Figure 1 – Time intervals for methods a and b of the test voltage . 15
Figure 2 –1,2/50 µs surge pulse according 61000-4-5:2014 allowed as equivalent
impulse for isolation testing . 24
Figure 3 – Determination of time to failure (referring to method in 5.5.5.8) . 31
Figure 4 – Determination of working voltage (referring to method in 5.5.5.8 for
exponential model) . 32
Figure 5 – Determination of working voltage (referring to method in 5.5.5.8 for non-
linear model) . 33
Figure 6 – Isolation capacitance measurement circuit . 36
Figure 7 – Isolation resistance measurement circuit . 37
Figure 8 – Isolation voltage measurement circuit . 38
Figure 9 – Partial discharge test circuit . 39
Figure 10 – Connections for the calibration of the complete test arrangement . 40
Figure 11 – Switching time test circuit . 43
Figure 12 – Transition time waveform measurement . 43
Figure 13 – Propagation delay time waveform measurement . 44
Figure 14 – Static versus dynamic data source signal VI . 45
Figure 15 – Common-mode transient immunity (CMTI) test setup for both static and
dynamic testing . 45
Figure 16 – Static common-mode transient immunity (CMTI) and V and low to high
CM
data transition waveform . 47
Figure A.1 – Lifetime verification . 49
Table 1 – Overview on characteristics and symbols . 19
Table 2 – Datasheet characteristics . 21
Table 3 – Tests and test sequence for coupler providing basic insulation and reinforced
insulation for protection against electrical shock . 22
Table 4 – Test conditions . 23
– 4 – IEC 60747-17:2020 © IEC 2020
Table 5 – Safety factor F. 41
Table 6 – Specified conditions for method a and method b. 42
Table A.1 – Front end process changes within component . 49
Table A.2 – Front End Process Changes within SiO/SiN/imide-passivation . 50
Table A.3 – Layout changes . 50
Table A.4 – Backend changes . 50
IEC 60747-17:
...
IEC 60747-17 ®
Edition 1.0 2020-09
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices –
Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Dispositifs à semiconducteurs –
Partie 17: Coupleur magnétique et capacitif pour l’isolation principale et
renforcée
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.
Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
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IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.
IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org
The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,
variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English
committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.
and withdrawn publications. Also known as the International Electrotechnical Vocabulary
(IEV) online.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Glossary - std.iec.ch/glossary
details all new publications released. Available online and 67 000 electrotechnical terminology entries in English and
once a month by email. French extracted from the Terms and Definitions clause of
IEC publications issued since 2002. Some entries have been
IEC Customer Service Centre - webstore.iec.ch/csc collected from earlier publications of IEC TC 37, 77, 86 and
If you wish to give us your feedback on this publication or CISPR.
need further assistance, please contact the Customer Service
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IEC 60747-17 ®
Edition 1.0 2020-09
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices –
Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Dispositifs à semiconducteurs –
Partie 17: Coupleur magnétique et capacitif pour l’isolation principale et
renforcée
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.080.99 ISBN 978-2-8322-8924-2
– 2 – IEC 60747-17:2020 © IEC 2020
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 8
4 Electrical characteristics – Coupler logic and timing definitions . 19
5 Coupler for protection against electrical shock . 20
5.1 General . 20
5.2 Type . 20
5.3 Ratings . 20
5.3.1 General . 20
5.3.2 Safety limiting values . 20
5.3.3 Functional ratings . 20
5.3.4 Rated isolation voltages. 20
5.4 Electrical safety requirements . 20
5.5 Electrical, environmental and/or endurance test information . 21
5.5.1 General . 21
5.5.2 Routine test . 23
5.5.3 Sample test . 23
5.5.4 Maximum surge isolation voltage . 23
5.5.5 Type test . 24
6 Measuring methods for couplers . 35
6.1 General . 35
6.2 Isolation capacitance (C ) . 35
lO
6.2.1 Purpose . 35
6.2.2 Circuit diagram . 35
6.2.3 Measurement procedure . 36
6.2.4 Precautions to be observed . 36
6.2.5 Special conditions . 36
6.3 Isolation resistance between input and output, R . 36
lO
6.3.1 Purpose . 36
6.3.2 Circuit diagram . 36
6.3.3 Precautions to be observed . 37
6.3.4 Measurement procedure . 37
6.3.5 Special conditions . 37
6.4 Isolation test . 37
6.4.1 Purpose . 37
6.4.2 Circuit diagram . 37
6.4.3 Test procedure . 38
6.4.4 Requirements . 38
6.5 Partial discharges of coupler . 39
6.5.1 Purpose . 39
6.5.2 Circuit diagram . 39
6.5.3 Description of Figure 9 test circuit and requirements . 39
6.5.4 Test procedure . 40
6.5.5 Description of calibration circuit (see Figure 10) . 40
6.5.6 Test methods . 41
6.5.7 Specified conditions . 41
6.5.8 Test voltage conditions . 42
6.6 Switching times of couplers . 42
6.6.1 Purpose . 42
6.6.2 Circuit diagram . 42
6.6.3 Measurement procedure . 43
6.6.4 Specified conditions . 44
6.7 Measuring methods of common-mode transient immunity (CMTI) for
magnetic and capacitive couplers . 44
6.7.1 Purpose . 44
6.7.2 Circuit diagram . 44
6.7.3 Precautions to be observed . 45
6.7.4 Static CMTI measuring procedure . 46
6.7.5 Specified conditions . 47
6.7.6 Dynamic CMTI measuring procedure . 47
Annex A (informative) Qualification guidance . 48
Bibliography . 51
Figure 1 – Time intervals for methods a and b of the test voltage . 15
Figure 2 –1,2/50 µs surge pulse according 61000-4-5:2014 allowed as equivalent
impulse for isolation testing . 24
Figure 3 – Determination of time to failure (referring to method in 5.5.5.8) . 31
Figure 4 – Determination of working voltage (referring to method in 5.5.5.8 for
exponential model) . 32
Figure 5 – Determination of working voltage (referring to method in 5.5.5.8 for non-
linear model) . 33
Figure 6 – Isolation capacitance measurement circuit . 36
Figure 7 – Isolation resistance measurement circuit . 37
Figure 8 –
...
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