IEC 61788-17:2013

IEC 61788-17 ®
Edition 1.0 2013-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Superconductivity –
Part 17: Electronic characteristic measurements – Local critical current density
and its distribution in large-area superconducting films

Supraconductivité –
Partie 17: Mesures de caractéristiques électroniques – Densité de courant
critique local et sa distribution dans les films supraconducteurs de grande
surface
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IEC 61788-17 ®
Edition 1.0 2013-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Superconductivity –
Part 17: Electronic characteristic measurements – Local critical current density

and its distribution in large-area superconducting films

Supraconductivité –
Partie 17: Mesures de caractéristiques électroniques – Densité de courant

critique local et sa distribution dans les films supraconducteurs de grande

surface
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX X
ICS 17.220.20; 29.050 ISBN 978-2-83220-583-9

– 2 – 61788-17 © IEC:2013
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 8
2 Normative reference . 8
3 Terms and definitions . 8
4 Requirements . 9
5 Apparatus . 9
5.1 Measurement equipment . 9
5.2 Components for inductive measurements . 10
5.2.1 Coils . 10
5.2.2 Spacer film . 11
5.2.3 Mechanism for the set-up of the coil . 11
5.2.4 Calibration wafer . 11
6 Measurement procedure . 12
6.1 General . 12
6.2 Determination of the experimental coil coefficient . 12
6.2.1 Calculation of the theoretical coil coefficient k . 12
6.2.2 Transport measurements of bridges in the calibration wafer . 13
6.2.3 U measurements of the calibration wafer . 13
6.2.4 Calculation of the E-J characteristics from frequency-dependent I
th
data . 13
6.2.5 Determination of the k’ from J and J values for an appropriate E . 14
ct c0
6.3 Measurement of J in sample films . 15
c
6.4 Measurement of J with only one frequency . 15
c
6.5 Examples of the theoretical and experimental coil coefficients . 16
7 Uncertainty in the test method . 17
7.1 Major sources of systematic effects that affect the U measurement . 17
7.2 Effect of deviation from the prescribed value in the coil-to-film distance . 18
7.3 Uncertainty of the experimental coil coefficient and the obtained J . 18
c
7.4 Effects of the film edge . 19
7.5 Specimen protection . 19
8 Test report . 19
8.1 Identification of test specimen . 19
8.2 Report of J values . 19
c
8.3 Report of test conditions . 19
Annex A (informative) Additional information relating to Clauses 1 to 8 . 20
Annex B (informative) Optional measurement systems . 26
Annex C (informative) Uncertainty considerations . 32
Annex D (informative) Evaluation of the uncertainty . 37
Bibliography . 43

Figure 1 – Diagram for an electric circuit used for inductive J measurement of HTS
c
films . 10
Figure 2 – Illustration showing techniques to press the sample coil to HTS films . 11
Figure 3 – Example of a calibration wafer used to determine the coil coefficient . 12

61788-17 © IEC:2013 – 3 –
Figure 4 – Illustration for the sample coil and the magnetic field during measurement . 13
Figure 5 – E-J characteristics measured by a transport method and the U inductive
method . 14
Figure 6 –Example of the normalized third-harmonic voltages (U /fI ) measured with
3 0
various frequencies . 15
Figure 7 – Illustration for coils 1 and 3 in Table 1 . 16
Figure 8 – The coil-factor function F(r) = 2H /I calculated for the three coils . 17
0 0
Figure 9 – The coil-to-film distance Z dependence of the theoretical coil coefficient k . 18
Figure A.1 – Illustration for the sample coil and the magnetic field during measurement . 22
Figure A.2 – (a) U and (b) U /I plotted against I in a YBCO thin film measured in
3 3 0 0
applied DC magnetic fields, and the scaling observed when normalized by I (insets) . 23
th
Figure B.1 – Schematic diagram for the variable-RL-cancel circuit . 27
Figure B.2 – Diagram for an electrical circuit used for the 2-coil method . 27
Figure B.3 – Harmonic noises arising from the power source . 28
Figure B.4 – Noise reduction using a cancel coil with a superconducting film . 28
Figure B.5 – Normalized harmonic noises (U /fI ) arising from the power source . 29
3 0
Figure B.6 – Normalized noise voltages after the reduction using a cancel coil with a
superconducting film . 29
Figure B.7 – Normalized noise voltages after the reduction using a cancel coil without
a superconducting film . 30
Figure B.8 – Normalized noise voltages with the 2-coil system shown in Figure B.2 . 30
Figure D.1 – Effect of the coil position against a superconducting thin film on the
measured J values . 41
c
Table 1 – Specifications and coil coefficients of typical sample coils . 16
Table C.1 – Output signals from two nominally identical extensometers . 33
Table C.2 – Mean values of two output signals . 33
Table C.3 – Experimental standard deviations of two output signals . 33
Table C.4 – Standard uncertainties of two output signals . 34
Table C.5 – Coefficient of variations of two output signals . 34
Table D.1 – Uncertainty budget table for the experimental coil coefficient k’ . 37
Table D.2 – Examples of repeated measurements of J and n-values . 40
c
– 4 – 61788-17 © IEC:2013
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SUPERCONDUCTIVITY –
Part 17: Electronic characteristic measurements –
Local critical current density and its distribution
in large-area superconducting films

FOREWORD
1)
...