IEC 61788-7:2020
(Main)Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of high-temperature superconductors at microwave frequencies
Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of high-temperature superconductors at microwave frequencies
IEC 61788-7:2020 describes measurement of the surface resistance (Rs) of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of Rs at the resonant frequency. The applicable measurement range of Rs for this method is as follows:
- Frequency: 8 GHz - Measurement resolution: 0,01 m Ω at 10 GHz
The Rs data at the measured frequency, and that scaled to 10 GHz, assuming the f 2 rule for comparison, is reported. This third edition cancels and replaces the second edition, published in 2006. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) informative Annex B, relative combined standard uncertainty for surface resistance measurement has been added;
b) precision and accuracy statements have been converted to uncertainty;
c) reproducibility in surface resistant measurement has been added.
Supraconductivité - Partie 7: Mesurages des caractéristiques électroniques - Résistance de surface des supraconducteurs haute température critique aux hyperfréquences
IEC 61788-7:2020 décrit le mesurage de la résistance de surface (Rs) des supraconducteurs aux hyperfréquences par la méthode normalisée à deux résonateurs. L'objet du mesurage est la dépendance de la résistance de surface Rs vis-à-vis de la température à la fréquence de résonance. La plage de mesures applicable des résistances de surface Rs pour cette méthode est la suivante:
- Fréquence: 8 GHz - Résolution de mesure: 0,01 m Ω à 10 GHz
Les données de Rs à la fréquence mesurée, et celles mises à l'échelle à 10 GHz, en prenant pour hypothèse la règle de comparaison f 2, doivent être consignées. Cette troisième édition annule et remplace la deuxième édition parue en 2006. Cette édition constitue une révision technique. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
a) l’ajout de l’Annexe B informative, incertitude type composée relative pour le mesurage de la résistance de surface;
b) les déclarations de fidélité et d'exactitude ont été converties en incertitude;
c) l'ajout de la reproductibilité du mesurage de résistance de surface.
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IEC 61788-7 ®
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Superconductivity –
Part 7: Electronic characteristic measurements – Surface resistance of
high‑temperature superconductors at microwave frequencies
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International Standards for all electrical, electronic and related technologies.
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IEC 61788-7 ®
Edition 3.0 2020-03
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
Superconductivity –
Part 7: Electronic characteristic measurements – Surface resistance of
high‑temperature superconductors at microwave frequencies
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 17.220.20; 29.050 ISBN 978-2-8322-7917-5
– 2 – IEC 61788-7:2020 RLV © IEC 2020
CONTENTS
FOREWORD . 5
INTRODUCTION . 7
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 8
4 Requirements . 9
5 Apparatus . 9
5.1 Measurement system . 9
5.2 Measurement apparatus for R . 10
s
5.3 Dielectric rods . 12
6 Measurement procedure . 13
6.1 Specimen preparation . 13
6.2 Set-up . 13
6.3 Measurement of reference level . 14
6.4 Measurement of the frequency response of resonators . 14
6.5 Determination of surface resistance of the superconductor and ε′ and tan δ
of the standard sapphire rods. 16
7 Precision and accuracy Uncertainty of the test method . 17
7.1 Surface resistance . 17
7.2 Temperature . 18
7.3 Specimen and holder support structure . 19
7.4 Specimen protection . 19
7.5 Uncertainty of surface resistance measured by standard two-resonator
method . 19
8 Test report . 19
8.1 Identification of test specimen . 19
8.2 Report of R values . 19
s
8.3 Report of test conditions . 20
Annex A (informative) Additional information relating to Clauses 1 to 8 . 21
A.1 Scope . 21
A.1.1 General . 21
A.1.2 Cylindrical cavity method [10] [17] . 21
A.1.3 Parallel-plates resonator method [18] [19] . 21
A.1.4 Microstrip-line resonance method [20] [21] . 21
A.1.5 Dielectric resonator method [22] [23] [24] [25] . 21
A.1.6 Image-type dielectric resonator method [26] [27] . 22
A.1.7 Two-resonator method [28] [29] . 23
A.2 Requirements . 23
A.3 Theory and calculation equations . 23
A.4 Apparatus . 27
A.5 Dimensions of the standard sapphire rods . 27
A.6 Dimension of the closed type resonator . 29
A.7 Precision and accuracy of the test method .
A.7 Sapphire rod reproducibility . 31
A.8 Test results . 32
A.9 Reproducibility of measurement method . 32
A.10 tan δ deviation effect of sapphire rods on surface resistance . 33
Annex B (informative) Evaluation of relative combined standard uncertainty for surface
resistance measurement . 36
B.1 Practical surface resistance measurement . 36
B.2 Determination of surface resistance of the superconductor . 37
B.3 Combined standard uncertainty . 38
B.3.1 General . 38
B.3.2 Calculation of c to c (12 GHz resonance at 20 K) . 38
2 5
B.3.3 Determination of u to u . 39
1 5
B.3.4 Combined relative standard uncertainty . 41
Bibliography . 43
Figure 1 – Schematic diagram of measurement system for temperature dependence of
R using a cryocooler . 10
s
Figure 2 – Typical measurement apparatus for R . 11
s
Figure 3 – Insertion attenuation, IA, resonant frequency, f , and half power bandwidth,
∆f, measured at T kelvin . 14
Figure 4 – Reflection scattering parameters (S and S ) . 16
11 22
Figure 5 – Term definitions in Table 4 . 18
Figure A.1 – Schematic configuration of several measurement methods for the surface
resistance . 22
Figure A.2 – Configuration of a cylindrical dielectric rod resonator short-circuited at
both ends by two parallel superconductor films deposited on dielectric substrates . 24
Figure A.3 – Computed results of the u-v and W-v relations for TE mode . 25
01p
Figure A.4 – Configuration of standard dielectric rods for measurement of R and tan δ . 26
s
Figure A.5 – Three types of dielectric resonators . 27
Figure A.6 – Mode chart to design TE resonator short-circuited at both ends by
parallel superconductor films [28] . 28
Figure A.7 – Mode chart to design TE resonator short-circuited at both ends by
parallel superconductor films [28] . 29
Figure A.8 – Mode chart for TE closed-type resonator [28] . 30
Figure A.9 – Mode chart for TE closed-type resonator [28] . 31
Figure A.10 – Temperature-dependent R of YBCO film with a thickness of 500 nm
s
and size of 25 mm square . 32
Figure A.11 – Temperature dependent R of YBCO film when R was measured three
s s
times. 33
Figure B.1 – Schematic diagram of TE and TE mode resonance . 36
011 013
Figure B.2 – Typical frequency characteristics of TE mode resonance . 37
Figure B.3 – Frequency characteristics of a resonator approximated by a Lorentz
distribution . 41
Table 1 – Typical dimensions of pairs of standard single-crystal sapphire rods for
12 GHz, 18 GHz and 22 GHz . 12
Table 2 – Dimensions of superconductor film for 12 GHz, 18 GHz, and 22 GHz . 13
– 4 – IEC 61788-7:2020 RLV © IEC 2020
Table 3 – Specifications for vector network analyzer . 17
Table 4 – Specifications for sapphire rods . 18
Table A.1 – Standard deviation of the surface resistance calculated from the results of
Figure A.11 . 33
Table A.2 – Relationship between x, defined by Equation (A.12), and y, defined by
Equation (A.13) . 34
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SUPERCONDUCTIVITY –
Part 7: Electronic characteristic measurements –
Surface resistance of high-temperature
superconductors at microwave frequencies
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardiz
...
IEC 61788-7 ®
Edition 3.0 2020-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Superconductivity –
Part 7: Electronic characteristic measurements – Surface resistance of
high‑temperature superconductors at microwave frequencies
Supraconductivité –
Partie 7: Mesurages des caractéristiques électronique – Résistance de surface
des supraconducteurs haute température critique aux hyperfréquences
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
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About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.
IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org
The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,
variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English
committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.
and withdrawn publications. Also known as the International Electrotechnical Vocabulary
(IEV) online.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Glossary - std.iec.ch/glossary
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once a month by email. French extracted from the Terms and Definitions clause of
IEC publications issued since 2002. Some entries have been
IEC Customer Service Centre - webstore.iec.ch/csc collected from earlier publications of IEC TC 37, 77, 86 and
If you wish to give us your feedback on this publication or CISPR.
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IEC 61788-7 ®
Edition 3.0 2020-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Superconductivity –
Part 7: Electronic characteristic measurements – Surface resistance of
high‑temperature superconductors at microwave frequencies
Supraconductivité –
Partie 7: Mesurages des caractéristiques électronique – Résistance de surface
des supraconducteurs haute température critique aux hyperfréquences
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 17.220.20; 29.050 ISBN 978-2-8322-7917-5
– 2 – IEC 61788-7:2020 © IEC 2020
CONTENTS
FOREWORD . 5
INTRODUCTION . 7
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 8
4 Requirements . 8
5 Apparatus . 9
5.1 Measurement system . 9
5.2 Measurement apparatus for R . 10
s
5.3 Dielectric rods . 12
6 Measurement procedure . 12
6.1 Specimen preparation . 12
6.2 Set-up . 13
6.3 Measurement of reference level . 13
6.4 Measurement of the frequency response of resonators . 14
6.5 Determination of surface resistance of the superconductor and ε′ and tan δ
of the standard sapphire rods. 16
7 Uncertainty of the test method . 17
7.1 Surface resistance . 17
7.2 Temperature . 18
7.3 Specimen and holder support structure . 18
7.4 Specimen protection . 19
7.5 Uncertainty of surface resistance measured by standard two-resonator
method . 19
8 Test report . 19
8.1 Identification of test specimen . 19
8.2 Report of R values . 19
s
8.3 Report of test conditions . 19
Annex A (informative) Additional information relating to Clauses 1 to 8 . 20
A.1 Scope . 20
A.1.1 General . 20
A.1.2 Cylindrical cavity method [10] [17] . 20
A.1.3 Parallel-plates resonator method [18] [19] . 20
A.1.4 Microstrip-line resonance method [20] [21] . 20
A.1.5 Dielectric resonator method [22] [23] [24] [25] . 20
A.1.6 Image-type dielectric resonator method [26] [27] . 21
A.1.7 Two-resonator method [28] [29] . 22
A.2 Requirements . 22
A.3 Theory and calculation equations . 22
A.4 Apparatus . 25
A.5 Dimensions of the standard sapphire rods . 26
A.6 Dimension of the closed type resonator . 28
A.7 Sapphire rod reproducibility . 30
A.8 Test results . 30
A.9 Reproducibility of measurement method . 31
A.10 tan δ deviation effect of sapphire rods on surface resistance . 32
Annex B (informative) Evaluation of relative combined standard uncertainty for surface
resistance measurement . 34
B.1 Practical surface resistance measurement . 34
B.2 Determination of surface resistance of the superconductor . 35
B.3 Combined standard uncertainty . 36
B.3.1 General . 36
B.3.2 Calculation of c to c (12 GHz resonance at 20 K) . 36
2 5
B.3.3 Determination of u to u . 37
1 5
B.3.4 Combined relative standard uncertainty . 39
Bibliography . 41
Figure 1 – Schematic diagram of measurement system for temperature dependence of
R using a cryocooler . 9
s
Figure 2 – Typical measurement apparatus for R . 11
s
Figure 3 – Insertion attenuation, IA, resonant frequency, f , and half power bandwidth,
∆f, measured at T kelvin . 14
Figure 4 – Reflection scattering parameters (S and S ) . 16
11 22
Figure 5 – Term definitions in Table 4 . 18
Figure A.1 – Schematic configuration of several measurement methods for the surface
resistance . 21
Figure A.2 – Configuration of a cylindrical dielectric rod resonator short-circuited at
both ends by two parallel superconductor films deposited on dielectric substrates . 23
Figure A.3 – Computed results of the u-v and W-v relations for TE mode . 24
01p
Figure A.4 – Configuration of standard dielectric rods for measurement of R and tan δ . 25
s
Figure A.5 – Three types of dielectric resonators . 26
Figure A.6 – Mode chart to design TE resonator short-circuited at both ends by
parallel superconductor films [28] . 27
Figure A.7 – Mode chart to des
...
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