IEC 63364-1:2022

IEC 63364-1 ®
Edition 1.0 2022-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Semiconductor devices for IoT system –
Part 1: Test method of sound variation detection

Dispositifs à semiconducteurs – Dispositifs à semiconducteurs pour système
IDO –
Partie 1: Méthode d’essai de détection de variation acoustique

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IEC 63364-1 ®
Edition 1.0 2022-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Semiconductor devices for IoT system –

Part 1: Test method of sound variation detection

Dispositifs à semiconducteurs – Dispositifs à semiconducteurs pour système

IDO –
Partie 1: Méthode d’essai de détection de variation acoustique

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.080.99 ISBN 978-2-8322-6214-6

– 2 – IEC 63364-1:2022 © IEC 2022
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 Evaluation method and test setup . 6
4.1 General . 6
4.2 Equipment and tools . 7
4.3 Block diagram and semiconductor components . 7
4.3.1 General . 7
4.3.2 Microphone sensor . 8
4.3.3 Speaker . 8
4.3.4 Micro controller . 8
4.3.5 Transmitting module . 8
4.4 Test methods . 8
4.4.1 Cubic box . 8
4.4.2 Measurement and data analysis . 10
4.4.3 Evaluation method for the parts of sound variation detection system for
IoT-based sound field detection . 11
4.5 Test report . 12

Figure 1 – Sound field space with boundary conditions and governing equation . 6
Figure 2 – Variation of transfer function due to obstacles in security area . 7
Figure 3 – Block diagram of the sound variation detection system for IoT-based event
detection . 8
Figure 4 – Cubic box for experiment for sound field variation detection system . 9
Figure 5 – Inner configuration within a cubic box . 9
Figure 6 – Experimental SPL spectra in the 3 744 Hz – 4 256 Hz range with 4 Hz steps
in the cube . 10
Figure 7 – FEM simulation of SPL spectra in the 3 744 Hz – 4 256 Hz range with 4 Hz
steps in the cube . 11

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
SEMICONDUCTOR DEVICES FOR IOT SYSTEM –

Part 1: Test method of sound variation detection

FOREWORD
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IEC 63364-1 has been prepared by IEC technical committee 47: Semiconductor devices. It is
an International Standard.
The text of this International Standard is based on the following documents:
Draft Report on voting
47/2782/FDIS 47/2792/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.

– 4 – IEC 63364-1:2022 © IEC 2022
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 63364 series, published under the general title Semiconductor
devices – Semiconductor devices for IoT system, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
SEMICONDUCTOR DEVICES –
SEMICONDUCTOR DEVICES FOR IOT SYSTEM –

Part 1: Test method of sound variation detection

1 Scope
This part of IEC 63364 specifies terms, the test method, and the report of sound variation
detection system based on IoT. It provides the evaluation method for each part of the sound
variation detection system based on IoT in the block diagram, the characterization
...