EN 60512-29-100:2015

SLOVENSKI STANDARD
01-december-2015
Konektorji za elektronsko opremo - Preskusi in meritve - 29-100. del: Preskusi
signalne celovitosti do 500 MHz na konektorjih M12 - Preskusi od 29a do 29g
Connectors for electronic equipment - Tests and measurements -- Part 29-100: Signal
integrity tests up to 500 MHz on M12 style connectors - Tests 29a to 29g
Steckverbinder für elektronische Einrichtungen – Mess- und Prüfverfahren – Teil 29-100:
Signalintegritätsprüfungen bis 500 MHz an Steckverbindern M12 – Prüfungen 29a bis
29g
Ta slovenski standard je istoveten z: EN 60512-29-100:2015
ICS:
31.220.10 9WLþLLQYWLþQLFHNRQHNWRUML Plug-and-socket devices.
Connectors
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 60512-29-100

NORME EUROPÉENNE
EUROPÄISCHE NORM
September 2015
ICS 31.220.10
English Version
Connectors for electronic equipment - Tests and measurements
- Part 29-100: Signal integrity tests up to 500 MHz on M12 style
connectors - Tests 29a to 29g
(IEC 60512-29-100:2015)
Connecteurs pour équipements électroniques - Essais et Steckverbinder für elektronische Einrichtungen - Mess- und
mesures - Partie 29-100: Essais d'intégrité des signaux Prüfverfahren - Teil 29-100: Signalintegritätsprüfungen bis
jusqu'à 500 MHz sur les connecteurs de type M12 - Essais 500 MHz an Steckverbindern M12 - Prüfungen 29a bis 29g
29a à 29g (IEC 60512-29-100:2015)
(IEC 60512-29-100:2015)
This European Standard was approved by CENELEC on 2015-04-09. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2015 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 60512-29-100:2015 E

European foreword
The text of document 48B/2410/FDIS, future edition 1 of IEC 60512-29-100, prepared by
SC 48B "Connectors" of IEC/TC 48 "Electromechanical components and mechanical structures for
electronic equipment" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC
as EN 60512-29-100:2015.
The following dates are fixed:
• latest date by which the document has to be (dop) 2016-03-18
implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2018-04-09
• latest date by which the national
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 60512-29-100:2015 was approved by CENELEC as a
European Standard without any modification.
IEC 60512-27-100 NOTE Harmonized as EN 60512-27-100.

Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant

EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year

IEC 60050 series International Electrotechnical Vocabulary - series
IEC 60512-1 -  Connectors for electronic equipment - EN 60512-1 -
Tests and measurements -- Part 1:
General
IEC 60512-26-100 -  Connectors for electronic equipment - EN 60512-26-100 -
Tests and measurements -- Part 26-100:
Measurement setup, test and reference
arrangements and measurements for
connectors according to IEC 60603-7 -
Tests 26a to 26g
IEC 61076-1 -  Connectors for electronic equipment - EN 61076-1 -
Product requirements -- Part 1: Generic
specification
IEC 61076-2-101 -  Connectors for electronic equipment - EN 61076-2-101 -
Product requirements -- Part 2-101:
Circular connectors - Detail specification
for M12 connectors with screw-locking
IEC 61076-2-109 -  Connectors for electronic equipment - EN 61076-2-109 -
Product requirements -- Part 2-109:
Circular connectors - Detail specification
for connectors with m 12 x 1 screw-locking,
for data transmissions with frequencies up
to 500 MHz
IEC 61169-16 -  Radio-frequency connectors -- Part 16: RF EN 61169-16 -
coaxial connectors with inner diameter of
outer conductor 7 mm (0,276 in) with screw
coupling - Characteristic impedance 50
ohms (75 ohms) (Type N)
ISO/IEC 11801 -  Information technology - Generic cabling - -
for customer premises
EN 50289-1-14 -  Communication cables - Specifications for - -
test methods - Part 1-14: Electrical test
methods - Coupling attenuation or
screening attenuation of connecting
hardware
ITU-T -  Transmission aspects of unbalance about - -
Recommendation earth
G.117
ITU-T -  Measuring arrangements to assess the - -
Recommendation degree of unbalance about earth
O.9
IEC 60512-29-100 ®
Edition 1.0 2015-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Connectors for electronic equipment – Tests and measurements –

Part 29-100: Signal integrity tests up to 500 MHz on M12 style connectors –

Tests 29a to 29g
Connecteurs pour équipements électroniques – Essais et mesures –

Partie 29-100: Essais d'intégrité des signaux jusqu'à 500 MHz sur les

connecteurs de type M12 – Essais 29a à 29g

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.220.10 ISBN 978-2-8322-2306-2

– 2 – IEC 60512-29-100:2015 © IEC 2015
CONTENTS
FOREWORD . 6
1 Scope and object . 8
2 Normative references . 8
3 Terms, definitions and abbreviations . 9
3.1 Terms and definitions . 9
3.2 Abbreviations . 9
4 Overall test arrangement . 10
4.1 Test instrumentation . 10
4.2 Coaxial cables and interconnect for network analysers . 11
4.3 Measurement precautions . 11
4.4 Reference components for calibration . 13
4.4.1 Reference loads for calibration . 13
4.5 Termination loads for termination of conductor pairs . 14
4.5.1 Differential mode . 14
4.5.2 Balun terminations . 14
4.5.3 Termination types . 15
4.6 Termination of screens . 15
4.7 Test specimen and reference planes . 15
4.7.1 General . 15
4.7.2 Interconnections between device under test (DUT) and the calibration
plane . 15
4.8 Termination of balun . 17
4.8.1 General requirements . 17
4.8.2 Centre tap connected to ground . 17
4.8.3 Centre tap open . 18
4.9 Sequence for calibration and measurement . 18
5 Connector measurement up to 100 MHz and 500 MHz . 22
5.1 General . 22
5.2 Insertion loss, Test 29a . 22
5.2.1 Object . 22
5.2.2 Connector with male or female contacts for insertion loss . 23
5.2.3 Test method . 23
5.2.4 Test set-up . 23
5.2.5 Procedure . 23
5.2.6 Test report . 24
5.2.7 Accuracy . 24
5.3 Return loss, Test 29b . 24
5.3.1 Object . 24
5.3.2 Connector with male or female contacts for return loss . 24
5.3.3 Test method . 24
5.3.4 Test set-up . 24
5.3.5 Procedure . 25
5.3.6 Test report . 25
5.3.7 Accuracy . 25
5.4 Near-end crosstalk (NEXT), Test 29c . 26
5.4.1 Object . 26

IEC 60512-29-100:2015 © IEC 2015 – 3 –
5.4.2 Connector with male or female contacts for NEXT . 26
5.4.3 Test method . 26
5.4.4 Test set-up . 26
5.4.5 Procedure . 27
5.4.6 Test report . 28
5.4.7 Accuracy . 28
5.5 Far-end crosstalk (FEXT), Test 29d . 28
5.5.1 Object . 28
5.5.2 Connector with male or female contacts for FEXT . 28
5.5.3 Test method . 28
5.5.4 Test set-up . 28
5.5.5 Procedure . 29
5.5.6 Test report . 30
5.5.7 Accuracy . 30
5.6 Transfer impedance (ZT), Test 29e . 30
5.7 Transverse conversion loss (TCL), Test 29f . 30
5.7.1 Object . 30
5.7.2 Connector with male or female contacts for TCL . 30
5.7.3 Test method . 30
5.7.4 Test set-up . 30
5.7.5 Procedure . 31
5.7.6 Test report . 33
5.7.7 Accuracy . 34
5.8 Transverse conversion transfer loss (TCTL), Test 29g . 34
5.8.1 Object . 34
5.8.2 Connector with male or female contacts for TCTL . 34
5.8.3 Test method . 34
5.8.4 Test set-up . 34
5.8.5 Procedure . 35
5.8.6 Test report . 35
5.8.7 Accuracy . 35
5.9 Coupling attenuation . 35
6 Construction and qualification of direct fixtures (DFP and DFJ) . 35
6.1 General . 35
6.2 Direct fixtures for DUT testing . 36
6.2.1 Requirements for direct fixture up to 100 MHz . 36
6.2.2 Requirements for direct fixture up to 500 MHz . 37
Annex A (normative) Impedance controlled measurement fixture . 39
A.1 General . 39
A.2 Load . 40
A.3 Additional components for connection to a network analyzer . 42
A.4 Direct fixture . 44
A.5 Connecting hardware measurement 1 configuration . 47
A.6 DUT connections using header PCB assemblies . 47
Annex B (informative) Reference source . 48
B.1 Test fixture components . 48
Annex C (informative) Related connectors . 49
Annex D (informative) Interface to test fixtures . 50

– 4 – IEC 60512-29-100:2015 © IEC 2015
Bibliography . 52

Figure 1 – Measurement strategies . 10
Figure 2 – 180° hybrid used as a balun . 11
Figure 3 – Measurement configurations for test balun qualification . 13
Figure 4 – Calibration of reference loads . 14
Figure 5 – Resistor termination networks . 14
Figure 6 – Definition of reference planes . 15
Figure 7 – Balanced attenuator for balun centre tap grounded . 17
Figure 8 – Balanced attenuator for balun centre tap open . 18
Figure 9 – Open calibration . 18
Figure 10 – Short calibration . 19
Figure 11 – Load calibration. 19
Figure 12 – Thru calibration . 20
Figure 13 – Measurement of RL and NEXT on the DUT . 21
Figure 14 – Measurement of IL and FEXT on the DUT . 22
Figure 15 – Measuring set-up . 23
Figure 16 – Return loss measurement . 25
Figure 17 – NEXT measurement . 27
Figure 18 – FEXT measurement for differential and common mode terminations . 29
Figure 19 – TCL measurement . 31
Figure 20 – Coaxial lead attenuation calibration . 31
Figure 21 – Back to back balun insertion loss measurement . 32
Figure 22 – Configuration for balun common mode insertion loss calibration . 32
Figure 23 – Schematic for balun common mode insertion loss calibration . 33
Figure 24 – TCTL measurement . 34
Figure 25 – Reference planes . 36
Figure 26 – Direct fixture M12, d-code mating face . 37
Figure 27 – Direct fixture M12, d-code . 37
Figure 28 – Direct fixture M12, x-code mating face . 38
Figure 29 – Direct fixture M12, x-code . 38
Figure A.1 – Test head assembly M12, d-code with baluns attached . 39
Figure A.2 – Test head assembly M12, x-code with baluns attached . 40
Figure A.3 – Test head assembly M12 mated with the load M12 . 41
Figure A.4 – Balun test fixture with the load M12 . 41
Figure A.5 – Load M12, x-code . 42
Figure A.6 – Load M12, d-code . 42
Figure A.7 – Test head showing shielding between baluns . 43
Figure A.8 – Balun test fixture assembly . 44
Figure A.9 – Direct fixture M12, d-code (DFJ) for DUT with male contacts . 45
Figure A.10 – Direct fixture M12, d-code (DFJ) for DUT with male contacts . 45
Figure A.11 – Direct fixture M12, x-code (DFJ) for DUT with male contacts . 46
Figure A.12 – Direct fixture M12, x-code (DFJ) for DUT with male contacts – Cross-cut . 46

IEC 60512-29-100:2015 © IEC 2015 – 5 –
Figure A.13 – Exploded assembly of the direct fixture (DFJ) . 47
Figure A.14 – Example of a connecting hardware measurement configuration . 47
Figure D.1 – Test balun interface pattern . 50
Figure D.2 – Example pin and socket dimension . 51

Table 1 – Test balun performance characteristics up to 500 MHz . 12
Table 2 – Test balun performance characteristics up to 100 MHz . 12
Table 3 – Interconnection return loss . 16
Table 4 – Uncertainty band of return loss measurement at frequencies below 100 MHz . 26
Table 5 – Uncertainty band of return loss measurement at frequencies above 100 MHz . 26
Table 6 – Direct fixture M12, performance up to 100 MHz . 37
Table 7 – Direct fixture M12, performance up to 500 MHz . 38
Table A.1 – Load M12, performance up to 500 MHz . 42
Table A.2 – Load M12, performance up to 100 MHz . 42
Table C.1 – Related connectors . 49

– 6 – IEC 60512-29-100:2015 © IEC 2015
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CONNECTORS FOR ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 29-100: Signal integrity tests up
to 500 MHz on M12 style connectors –
Tests 29a to 29g
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60512-29-100 has been prepared by subcommittee 48B: Electrical
connectors, of IEC technical committee 48: Electrical connectors and mechanical structures
for electrical and electronic equipment.
The text of this standard is based on the following documents:
FDIS Report on voting
48B/2410/FDIS 48B/2424/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.

IEC 60512-29-100:2015 © IEC 2015 – 7 –
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60512 series, published under the general title Connectors for
electronic equipment – Tests and measurements, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
– 8 – IEC 60512-29-100:2015 © IEC 2015
CONNECTORS FOR ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 29-100: Signal integrity tests up
to 500 MHz on M12 style connectors –
Tests 29a to 29g
1 Scope and object
This part of IEC 60512 specifies the test methods for transmission performance for M12-style
connectors up to 500 MHz. It is also suitable for testing lower frequency connectors if they
meet the requirements of the detail specifications and of this standard.
NOTE 1 All figures show equipment for connectors according to IEC 61076-2-109 as an example.
The test methods provided herein are:
– insertion loss, test 29a;
– return loss, test 29b;
– near-end crosstalk (NEXT) test 29c;
– far-end crosstalk (FEXT), test 29d;
– transverse conversion loss (TCL), test 29f;
– transverse conversion transfer loss (TCTL), test 29g.
For the transfer impedance (ZT) test, see IEC 60512-26-100, test 26e.
For the coupling attenuation see ISO/IEC 11801.
All test methods apply for two and four pair connectors.
NOTE 2 All figures show schemes for four pair cabling and are also suitable for two pair cabling.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60050 (all parts): International Electrotechnical Vocabulary (available at
http://www.electropedia.org)
IEC 60512-1, Connectors for electronic equipment – Tests and measurements – Part 1:
General
IEC 60512-26-100, Connectors for electronic equipment – Tests and measurements – Part
26-100: Measurement setup, test and reference arrangements and measurements for
connectors according to IEC 60603-7 – Tests 26a to 26g
IEC 61076-1, Connectors for electronic equipment – Product requirements – Part 1: Generic
specification
IEC 60512-29-100:2015 © IEC 2015 – 9 –
IEC 61076-2-101, Connectors for electronic equipment – Product requirements – Part 2-101:
Circular connectors – Detail specification for M12 connectors with screw-locking
IEC 61076-2-109, Connectors for electronic equipment – Product requirements – Part 2-109:
Circular connectors – Detail specification for connectors with M 12 x 1 screw-locking, for data
transmission frequencies up to 500 MHz
IEC 61169-16, Radio-frequency connectors – Part 16: Sectional specification – RF coaxial
connectors with inner diameter of outer conductor 7 mm (0,276 in) with screw coupling –
Characteristics impedance 50 ohms (75 ohms) (type N)
ISO/IEC 11801, Information technology – Generic cabling for customer premises
EN 50289-1-14, Communication cables – Specification for test methods – Part 1-14: Electrical
test methods − Coupling attenuation or screening attenuation of connecting hardware
ITU-T Recommendation G.117, Transmission aspects of unbalance about earth
ITU-T Recommendation O.9, Measuring arrangements to assess the degree of unbalance
about earth
3 Terms, definitions and abbreviations
3.1 Terms and definitions
For the purposes of this document, the terms and definitions of IEC 60050-581, IEC 61076-1,
IEC 60512-1, as well as the following, apply.
3.1.1
Reference Test Jack
RTJ
connector with female contacts which is constructed such that it is a test artefact
3.1.2
Reference Test Plug
RTP
connector with male contacts which is constructed such that it is a test artefact
3.1.3
Direct Fixture Jack
DFJ
interface with contacts to mate a plug with male contacts
3.1.4
Direct Fixture Plug
DFP
interface with contacts to mate a jack with female contacts
3.2 Abbreviations
CM Common mode
DM Differential mode
DFJ Direct Fixture Jack
DFP Direct Fixture Plug
DMCM Differential mode plus common mode
DUT Device under test
– 10 – IEC 60512-29-100:2015 © IEC 2015
FEXT Far-end crosstalk
IDC Insulation displacement connection
IEC International Electrotechnical Commission
IL Insertion Loss
NEXT Near-end crosstalk
RL Return Loss
RTJ Reference Test jack
RTP Reference Test plug
TCL Transverse conversion loss
TCTL Transverse conversion transfer loss
4 Overall test arrangement
4.1 Test instrumentation
All test instrumentation shall be qualified over the frequency range of 1 MHz to the maximum
specified frequency from the DUT.
These test procedures require the use of a vector network analyzer. The analyser should
have the capability of full 2-port calibrations. The analyser shall cover the frequency range of
1 MHz to the maximum specified frequency from the DUT at least.
When used, at least two test baluns are required in order to perform measurements with
balanced symmetrical signals. The requirements for the baluns are given in 4.3.
Optionally, multi-port network analysers for balun-less test set-up may be used.
Reference loads are needed for the calibration of the set-up. Requirements for the reference
loads are given in 4.5.1.
Termination loads are needed for termination of pairs, used and unused, which are not
terminated by the test baluns. Requirements for the termination loads are given in 4.6.
An absorbing clamp and ferrite absorbers are needed for the coupling attenuation
measurements. The requirements for these items are given in EN 50289-1-14.
The test procedures allow an independent test of the male and female part of the connector.
Both are described in Clause 5. Figure 1 shows the feasible measurement strategies for the
qualification of a DUT.
Clause 5:
1 Start Clause 4 Qualification M12-Female-
Connector
Clause 5:
2 Start Clause 4 Qualification M12-Male-
Connector
IEC
Figure 1 – Measurement strategies

IEC 60512-29-100:2015 © IEC 2015 – 11 –
4.2 Coaxial cables and interconnect for network analysers
Lengths of coaxial cables used to connect the network analyser to the baluns shall be as
short as possible. (It is recommended that they do not exceed 600 mm each.) The baluns
shall be electrically bonded to a common ground plane. For crosstalk measurements, a test
fixture may be used, in order to reduce residual crosstalk (see Annex A). Balanced
interconnect and associated connecting hardware used to connect the test equipment and the
connector under test shall meet the requirements given in 4.8.
4.3 Measurement precautions
To ensure a high degree of reliability for transmission measurements, the following
precautions are required.
a) Consistent and stable balun and resistor loads shall be used for each pair throughout the
test sequence.
b) Cable and adapter discontinuities, as introduced by physical flexing, sharp bends and
restraints shall be avoided before, during and after the tests.
c) Consistent test methodology and terminations (baluns or resistors) shall be used at all
stages of transmission performance qualifications. The relative spacing of conductors in
the pairs shall be preserved throughout the tests to the greatest extent possible.
d) The balance of the cables is maintained to the greatest extent possible by consistent
conductor lengths and pair twisting to the point of load.
e) The sensitivity to set-up variations for these measurements at high frequencies demands
attention to details for both the measurement equipment and the procedures.
Balun requirements
The baluns may be balun transformers or 180° hybrids with attenuators to improve matching if
needed (see Figure 2)
Attenuator
180° hydrid
To network analyzer
Test port
Attenuator
IEC
Figure 2 – 180° hybrid used as a balun
The specifications for the baluns apply for the whole frequency range for which they are used.
Baluns shall be RFI shielded and shall comply with the specifications listed in Table 1 and
Table 2.
– 12 – IEC 60512-29-100:2015 © IEC 2015
Table 1 – Test balun performance characteristics up to 500 MHz
Frequency
Parameter Value
MHz
1)
Impedance, primary
1 ≤ f ≤ 500 50 Ω unbalanced
Impedance, secondary 1 ≤ f ≤ 500
100 Ω balanced
Insertion loss 2,0 dB maximum
1 ≤ f ≤ 500
2)
Return loss, bi-directional 1 ≤ f < 15 12 dB minimum
20 dB minimum
15 ≤ f ≤ 500
2)
Return loss, common mode  15 dB minimum
1 ≤ f < 15
20 dB minimum
15 ≤ f < 400
15 dB minimum
400 ≤ f ≤ 500
Power rating 0,1 W minimum
1 ≤ f ≤ 500
2)
Longitudinal balance 60 dB minimum
1 ≤ f < 100
50 dB minimum
100 ≤ f ≤ 500
2)
Output signal balance 50 dB minimum
1 ≤ f ≤ 500
2)
Common mode rejection  1 ≤ f ≤ 500 50 dB minimum
1)
Primary impedance may differ, if necessary, to accommodate analyzer outputs other than 50 Ω.
2)
Measured per ITU-T Recommendation G.117 with the network analyzer calibrated using a 50 Ω load.

Table 2 – Test balun performance characteristics up to 100 MHz
Frequency
Parameter Value
MHz
Impedance, primary
1 ≤ f ≤ 100 50 Ω unbalanced
Impedance, secondary
1 ≤ f ≤ 100 100 Ω balanced
Insertion loss 1 ≤ f ≤ 100 10,0 dB maximum
Return loss, secondary 14 dB minimum
1 ≤ f < 100
1)
Return loss, common mode with common mode termination 1 ≤ f < 100 10 dB maximum
Power rating 0,1 W minimum
1 ≤ f ≤100
2)
Longitudinal balance  1 ≤ f < 100 50 dB minimum
3)
Output signal balance  50 dB minimum
1 ≤ f ≤ 100
3)
Common mode rejection  1 ≤ f ≤ 100 50 dB minimum
1)
Measured by connecting the balanced output terminals together and measuring the return loss. The nominal
primary impedance shall terminate the primary input terminal. See also Figure 3, part Common Mode Return
Loss.
2)
Applicable for baluns, which are used for balance measurements. Measured from the primary input terminal
to the common mode terminal when the secondary balanced terminal is terminated with 100 Ω.
3)
Measured according to ITU-T Recommendations G.117 and O.9 .

For ease of interfacing to test fixtures, a pin and socket interface with dimensions as shown in
Annex D is recommended. Figure 3 depicts the proper test configurations for qualifying test
baluns to the requirements of Table 2.

IEC 60512-29-100:2015 © IEC 2015 – 13 –
Balun port description Insertion loss (2 units back-to-back)
A A A
D D D
C B C B B C
A-B: 100 Ω balanced
50 50
C: 50 Ω common-mode
D: 50 Ω unbalanced
Return loss (50:100 Ω) Return loss (100:50 Ω)
A A A
D 100 D D
C B C B B C
50 50 50
Calibration plane
Common-mode return loss
Longitudinal balance
A A
D D
C B C B
Output signal balance Common-mode rejection
50 50
A A
50 50
D D
50 50
C B C B
50 50
IEC
Figure 3 – Measurement configurations for test balun qualification
4.4 Reference components for calibration
4.4.1 Reference loads for calibration
To perform a one or two-port calibration of the test equipment, a short circuit, an open circuit
and a reference load are required. These devices shall be used to obtain a calibration.
The reference load shall be calibrated against a calibration reference, which shall be a 50 Ω
load, traceable to an international reference standard. Two 100 Ω reference loads in parallel
shall be calibrated against the calibration reference. The reference loads for calibration shall
be placed in an N-type connector according to IEC 61169-16, meant for panel mounting,
which is machined flat on the back side (see Figure 4). The loads shall be fixed to the flat side
of the connector, distributed evenly around the centre conductor. A network analyser shall be
calibrated, 1-port full calibration, with the calibration reference. Thereafter, the return loss of
the reference loads for calibration shall be measured. The verified return loss shall be >46 dB

– 14 – IEC 60512-29-100:2015 © IEC 2015
at frequencies up to 100 MHz and >40 dB at frequencies above 100 MHz and up to the limit
for which the measurements are to be carried out.
Machined flat
Loads for calibration
N type connector
IEC
Figure 4 – Calibration of reference loads
4.5 Termination loads for termination of conductor pairs
4.5.1 Differential mode
Differential mode plus common mode (DMCM) terminations, as shown in Figure 5 on the left,
shall be used on all active pairs under test, except when measuring return loss, where DM
only resistor terminations are recommended. DMCM resistor terminations shall be used on all
inactive pairs and on the opposite ends of active pairs for NEXT loss and FEXT loss testing.
Inactive pairs for return loss testing may be terminated with DM or DMCM resistor
terminations, or left un-terminated. Balun terminations may be used on the far-end of all
inactive pairs provided that their DM and common mode return loss performance
characteristics meet the minimum performance of the specified resistor networks.
50 Ω ± 0,1 % 50 Ω ± 0,1
...