EN 60512-27-100:2012

SLOVENSKI STANDARD
01-maj-2012
Konektorji za elektronsko opremo - Preskusi in meritve - 27-100. del: Preskušanje
neokrnjenosti signalov do 500 MHz na konektorjih serije IEC 60603-7 - Preskusi od
27a do 27g
Connectors for electronic equipment - Tests and measurements - Part 27-100: Signal
integrity tests up to 500 MHz on IEC 60603-7 series connectors - Tests 27a to 27g
Steckverbinder für elektronische Einrichtungen - Mess- und Prüfverfahren - Teil 27-100:
Signalintegritätsprüfungen bis 500 MHz an Steckverbindern der Reihe IEC 60603-7 -
Prüfungen 27a bis 27g
Connecteurs pour équipements électroniques - Essais et mesures - Partie 27-100:
Essais d'intégrité des signaux jusqu'à 500 MHz sur les connecteurs de la série CEI
60603-7 - Essais 27a à 27g
Ta slovenski standard je istoveten z: EN 60512-27-100:2012
ICS:
31.220.10 9WLþLLQYWLþQLFHNRQHNWRUML Plug-and-socket devices.
Connectors
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN 60512-27-100
NORME EUROPÉENNE
February 2012
EUROPÄISCHE NORM
ICS 31.220.10
English version
Connectors for electronic equipment -
Tests and measurements -
Part 27-100: Signal integrity tests up to 500 MHz on IEC 60603-7 series
connectors -
Tests 27a to 27g
(IEC 60512-27-100:2011)
Connecteurs pour équipements Steckverbinder für elektronische
électroniques - Einrichtungen -
Essais et mesures - Mess- und Prüfverfahren -
Partie 27-100: Essais d'intégrité des Teil 27-100: Signalintegritätsprüfungen bis
signaux jusqu'à 500 MHz sur les 500 MHz an Steckverbindern der Reihe
connecteurs de la série CEI 60603-7 - IEC 60603-7 -
Essais 27a à 27g Prüfungen 27a bis 27g
(CEI 60512-27-100:2011) (IEC 60512-27-100:2011)

This European Standard was approved by CENELEC on 2012-01-11. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the CEN-CENELEC Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the CEN-CENELEC Management Centre has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia,
Spain, Sweden, Switzerland, Turkey and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Management Centre: Avenue Marnix 17, B - 1000 Brussels

© 2012 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60512-27-100:2012 E

Foreword
The text of document 48B/2262/FDIS, future edition 1 of IEC 60512-27-100, prepared by SC 48B,
"Connectors", of IEC TC 48, "Electromechanical components and mechanical structures for electronic
equipment" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as
The following dates are fixed:
(dop) 2012-10-11
• latest date by which the document has
to be implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2015-01-11

standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent
rights.
Endorsement notice
The text of the International Standard IEC 60512-27-100:2011 was approved by CENELEC as a
European Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60603-7-4 NOTE  Harmonized as EN 60603-7-4.
IEC 60603-7-5 NOTE  Harmonized as EN 60603-7-5.

- 3 - EN 60512-27-100:2012
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year

IEC 60050-581 - International Electrotechnical Vocabulary - - -
Part 581: Electromechanical components for
electronic equipment
IEC 60512-1 - Connectors for electronic equipment - Tests EN 60512-1 -
and measurements -
Part 1: General
IEC 60512-1-100 - Connectors for electronic equipment - Tests EN 60512-1-100 -
and measurements -
Part 1-100: General - Applicable publications

IEC 60512-26-100 - Connectors for electronic equipment - Tests EN 60512-26-100 -
and measurements -
Part 26-100: Measurement setup, test and
reference arrangements and measurements
for connectors according to IEC 60603-7 -
Tests 26a to 26g
IEC 60603-7 Series Connectors for electronic equipment EN 60603-7 Series

IEC 60603-7 2008 Connectors for electronic equipment - EN 60603-7 2009
Part 7: Detail specification for 8-way,
unshielded, free and fixed connectors

IEC 61076-1 - Connectors for electronic equipment - Product EN 61076-1 -
requirements -
Part 1: Generic specification
IEC 61156 Series Multicore and symmetrical pair/quad cables - -
for digital communications -
Part 1: Generic specification
IEC 61169-16 - Radio-frequency connectors - EN 61169-16 -
Part 16: Sectional specification - RF coaxial
connectors with inner diameter of outer
conductor 7 mm (0,276 in) with screw
coupling - Characteristics impedance 50 ohms
(75 ohms) (type N)
IEC 62153-4-12 - Metallic communication cable test methods - - -
Part 4-12: Electromagnetic compatibility
(EMC) - Coupling attenuation or screening
attenuation of connecting hardware -
Absorbing clamp method
IEC 60512-27-100 ®
Edition 1.0 2011-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Connectors for electronic equipment – Tests and measurements –
Part 27-100: Signal integrity tests up to 500 MHz on 60603-7 series connectors –
Tests 27a to 27g
Connecteurs pour équipements électroniques – Essais et mesures –
Partie 27-100: Essais d’intégrité des signaux jusqu’à 500 MHz sur les
connecteurs de la série CEI 60603-7 – Essais 27a à 27g

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX XB
ICS 31.220.10 ISBN 978-2-88912-823-5

– 2 – 60512-27-100 © IEC:2011
CONTENTS
FOREWORD . 6
1 Scope and object . 8
2 Normative references . 8
3 Terms, definitions, acronyms and symbols . 9
3.1 Terms and definitions . 9
3.1.1 Test Free Connector (TFC) . 9
3.2 Acronyms . 9
3.3 Symbols . 10
4 Overall test arrangement . 10
4.1 Test instrumentation . 10
4.2 Coaxial cables and interconnect for network analysers . 11
4.3 Measurement precautions . 11
4.4 Balun requirements . 11
4.5 Interfacing . 12
4.6 Reference components for calibration . 13
4.6.1 Reference loads for calibration . 13
4.6.2 Reference cables for calibration . 14
4.7 Termination loads for termination of conductor pairs . 14
4.7.1 General . 14
4.7.2 Resistor terminations . 14
4.7.3 Balun terminations . 15
4.7.4 Termination types . 15
4.8 Termination of screens . 15
4.9 Test specimen and reference planes . 15
4.9.1 General . 15
4.9.2 Interconnections between device under test (DUT) and the
calibration plane . 16
5 Connector measurement up to 500 MHz . 17
5.1 General . 17
5.2 Insertion loss, Test 27a . 17
5.2.1 Object . 17
5.2.2 Free connector for insertion loss. 17
5.2.3 Test method . 17
5.2.4 Test set-up . 17
5.2.5 Procedure . 18
5.2.6 Test report . 18
5.2.7 Accuracy . 19
5.3 Return loss, Test 27b . 19
5.3.1 Object . 19
5.3.2 Free connector for return loss . 19
5.3.3 Test method . 19
5.3.4 Test set-up . 19
5.3.5 Procedure . 19
5.3.6 Test report . 19
5.3.7 Accuracy . 19
5.4 Near-end crosstalk (NEXT), Test 27c . 20

60512-27-100 © IEC:2011 – 3 –
5.4.1 Object . 20
5.4.2 Free connector for NEXT . 20
5.4.3 Test method . 20
5.4.4 Test set-up . 20
5.4.5 Procedure . 21
5.4.6 Test report . 24
5.4.7 Accuracy . 24
5.5 Far-end crosstalk (FEXT), Test 27d . 24
5.5.1 Object . 24
5.5.2 Free connector for FEXT . 24
5.5.3 Test method . 24
5.5.4 Test set-up . 24
5.5.5 Procedure . 25
5.5.6 Test report . 25
5.5.7 Accuracy . 26
5.6 Transfer impedance (Zt) . 26
5.7 Transverse conversion loss (TCL), Test 27f . 26
5.7.1 Object . 26
5.7.2 Free connector for TCL . 26
5.7.3 Test method . 26
5.7.4 Test set-up . 26
5.7.5 Procedure . 27
5.7.6 Test report . 30
5.7.7 Accuracy . 30
5.8 Transverse conversion transfer loss (TCTL), Test 27g . 30
5.8.1 Object . 30
5.8.2 Free connector for TCTL . 30
5.8.3 Test method . 30
5.8.4 Test set-up . 30
5.8.5 Procedure . 31
5.8.6 Test report . 32
5.8.7 Accuracy . 32
5.9 Coupling attenuation . 32
6 Construction and qualification of TFCs for NEXT, FEXT and return loss
measurements . 32
6.1 General . 32
6.1.1 Introductory remarks . 32
6.1.2 Delay measurements . 33
6.2 TFC near-end crosstalk (NEXT). 36
6.2.1 General . 36
6.2.2 Procedure for mating a TFC to the direct fixture . 36
6.2.3 TFC NEXT loss measurement . 37
6.2.4 TFC NEXT loss requirements . 38
6.3 TFC far-end crosstalk (FEXT) . 39
6.3.1 TFC FEXT loss measurement . 39
6.3.2 TFC FEXT loss requirements . 39
6.4 TFC return loss . 40
6.4.1 General . 40
6.4.2 TFC return loss reverse direction qualification procedure . 40

– 4 – 60512-27-100 © IEC:2011
6.4.3 Test plug return loss forward direction qualification procedure . 40
6.4.4 TFC return loss requirements . 46
6.5 Test fixtures for TFC testing . 47
6.5.1 Requirements for TFC direct fixtures . 47
Annex A (informative) Impedance controlled measurement fixture . 49
Annex B (normative) Termination of balun . 63
Bibliography . 65

Figure 1 – 180° hybrid used as a balun . 11
Figure 2 – Measurement configurations for test balun qualification . 13
Figure 3 – Calibration of reference loads . 14
Figure 4 – Resistor termination networks . 14
Figure 5 – Definition of reference planes. 16
Figure 6 – Measuring set-up . 18
Figure 7 – Example for NEXT measurements . 21
Figure 8 – Example for FEXT measurements for DM and CM terminations . 25
Figure 9 – Example of TCL measurement . 27
Figure 10 – Coaxial lead attenuation calibration. . 28
Figure 11 – Back-to-back balun insertion loss measurement . 28
Figure 12 – Configuration for balun CM insertion loss calibration . 29
Figure 13 – Schematic for balun CM insertion loss calibration . 29
Figure 14 – Example of TCTL measurement . 31
Figure 15 – Calibration and interface planes and port extensions . 33
Figure 16 – Examples of direct fixture short, open, load, and through artefacts . 35
Figure 17 – Modular free connector placed into the free connector clamp . 36
Figure 18 – Guiding the free connector into position . 37
Figure 19 – TFC direct fixture . 37
Figure 20 – illustration of TFC NEXT measurement in the forward direction . 38
Figure 21 – Example of suitable return loss de-embedding reference socket. 42
Figure 22 – Flow chart for determination of reference fixed connector S-parameters . 43
Figure 23 – Representation of a mated connection by two cascaded networks . 43
Figure 24 – Return loss de-embedding reference plug terminated with LOAD resistors . 44
Figure 25 – Return loss test plug calibration and interface planes . 44
Figure 26 – Flow chart of determination of return loss test plug properties . 46
Figure 27 – Direct fixture mating dimensions A . 47
Figure 28 – Direct fixture mating dimensions B . 48
Figure 29 – Direct fixture mating dimension C . 48
Figure A.1 – Test head assembly with baluns attached . 49
Figure A.2 – Test balun interface pattern . 50
Figure A.4 – Test head assembly showing shielding between baluns . 51
Figure A.5 – Balun test 2 fixture assembly . 52
Figure A.6 – Free connector direct fixture, DPMF-2 view 1 . 53
Figure A.7 – Free connector direct fixture, DPMF-2 view 2 . 53
Figure A.8 – Exploded assembly of the direct fixture . 54

60512-27-100 © IEC:2011 – 5 –
Figure A.9 – PCB based free connector . 55
Figure A.10 – TP6A PCB based free connector assembly with adapter . 55
Figure A.11 – An example of a connecting hardware measurement configuration. 56
Figure A.12 – Test fixture interface . 57
Figure A.13 – Open calibration standard applied to test interface . 57
Figure A.14 – Short calibration standard applied to test interface . 58
Figure A.15 – Load calibration standard applied to test interface . 58
Figure A.16 – Back-to-back through standard applied to test interface . 59
Figure A.17 – TFC attached to the test interface . 59
Figure A.18 – Direct fixture mounted to the test head interface . 60
Figure A.19 – Calibration plane . 60
Figure A.20 – Through calibration . 61
Figure A.21 – Test setup for twisted-pair return 2 loss measurement . 61
Figure A.22 – Method to minimize distance between planes. 62
Figure B.1 – Balanced attenuator for balun centre tap grounded . 63
Figure B.2 – Balanced attenuator for balun centre tap open . 64

Table 1 – Test balun performance characteristics . 12
Table 2 – Interconnection return loss . 17
Table 3 – Uncertainty band of return loss measurement at frequencies below 100 MHz . 20
Table 4 – Uncertainty band of return loss measurement at frequencies above 100 MHz. 20
Table 5a – Free connector TFC NEXT loss limit vectors for connectors specified up to
100 MHz . 23
Table 5b – Free connector TFC NEXT loss limit vectors for connectors specified from
1-250 MHz and from 1 MHz to 500 MHz . 23
Table 6 – connecting hardware NEXT loss for Case 1 and Case 4 . 24
Table 7 – TFC NEXT loss ranges . 39
Table 8 – TFC FEXT loss ranges . 40
Table 9 – De-embedding return loss reference fixed connector assembly standard
vectors . 42
Table 10 – Return loss requirements for TFCs . 47
Table 11 – Direct fixture performance . 48

– 6 – 60512-27-100 © IEC:2011
INTERNATIONAL ELECTROTECHNICAL COMMISSION
______________
CONNECTORS FOR ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 27-100: Signal integrity tests up to 500 MHz
on 60603-7 series connectors –
Tests 27a to 27g
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60512-27-100 has been prepared by subcommittee 48B:
Connectors, of IEC technical committee 48: Electromechanical components and mechanical
structures for electronic equipment.
The text of this standard is based on the following documents:
FDIS Report on voting
4B/2262/FDIS 48B/2275/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

60512-27-100 © IEC:2011 – 7 –
A list of all parts of IEC 60512 series, under the general title Connectors for electrical
equipment – Tests and measurements can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
– 8 – 60512-27-100 © IEC:2011
CONNECTORS FOR ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 27-100: Signal integrity tests up to 500 MHz
on 60603-7 series connectors –
Tests 27a to 27g
1 Scope and object
This part of IEC 60512 specifies the test methods for transmission performance for
IEC 60603-7 series connectors up to 500 MHz. It is also suitable for testing lower frequency
connectors if they meet the requirements of the detail specifications and of this standard.
The test methods provided here are:
– insertion loss, test 27a;
– return loss, test 27b;
– near-end crosstalk (NEXT) test 27c;
– far-end crosstalk (FEXT), test 27d;
– transverse conversion loss (TCL), test 27f;
– transverse conversion transfer loss (TCTL), test 27g;
For the transfer impedance (Zt) test, see IEC 60512-26-100, test 26e.
For the coupling attenuation, see IEC 62153-4-12.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60050–581, International Electrotechnical Vocabulary (IEV) – Part 581:
Electromechanical components for electronic equipment
IEC 60512-1, Connectors for electronic equipment – Tests and measurements –
Part 1: General
IEC 60512-1-100, Connectors for electronic equipment – Tests and measurements –
Part 1-100: General - Applicable publications
IEC 60512-26-100, Connectors for electronic equipment – Tests and measurements –
Part 26-100: Measurement setup, test and reference arrangements and measurements for
connectors according to IEC 60603-7 – Tests 26a to 26g
IEC 60603-7 (all parts), Connectors for electronic equipment
IEC 60603-7, 2008: Connectors for electronic equipment – Part 7: Detail specification for
8-way, unshielded, free and fixed connectors

60512-27-100 © IEC:2011 – 9 –
IEC 61076-1, Connectors for electronic equipment – Product requirements – Part 1: Generic
specification
IEC 61156 (all parts), Multicore and symmetrical pair/quad cables for digital communications
IEC 61169-16, Radio-frequency connectors – Part 16: Sectional specification – RF coaxial
connectors with inner diameter of outer conductor 7 mm (0,276 in) with screw coupling –
Characteristic impedance 50 ohms (75 ohms) (Type N)
IEC 62153-4-12, Metallic communication cable test methods – Part 4-12: Electromagnetic
compatibility (EMC) – Coupling attenuation or screening attenuation of connecting hardware –
Absorbing clamp method
3 Terms, definitions, acronyms and symbols
NOTE It should be noted that this document, although having a close relationship with corresponding documents,
which use different terminology to that used in those documents.
3.1 Terms and definitions
For the purposes of this document, the terms and definitions of IEC 60050(581), IEC 61076-1,
IEC 60512-1, IEC 60603-7 as well as the following, apply.
3.1.1 Test Free Connector (TFC)
free connector, which is constructed such that it is a test artefact, is known as a
Test Free Connector (TFC)
3.2 Acronyms
For ease of reference, acronyms used in this standard are given below.
ACRF Attenuation to crosstalk ratio, far-end
CM Common mode
CMR Common mode rejection
DM Differential mode
DMCM Differential mode plus common mode
DUT Device under test
EIA Electronic Industries Alliance
ELTCTL Equal level transverse conversion transfer loss
FEXT Far-end crosstalk
F/UTP Foil (surrounding) unscreened twisted-pairs
ICEA Insulated Cable Engineers Association
IDC Insulation displacement connection
IPC Insulation piercing connection
NEXT Near-end crosstalk
OSB Output signal balance
PSAACRF Power sum attenuation to alien crosstalk ratio, far-end
PSACRF Power sum attenuation to crosstalk ratio, far-end
PSANEXT Power sum alien near-end crosstalk
PSFEXT Power sum far-end crosstalk

– 10 – 60512-27-100 © IEC:2011
PSNEXT Power sum near-end crosstalk
RL Return Loss
TCTL Transverse conversion transfer loss
TFC Test free connector
TIA Telecommunications Industry Association
U/UTP Unshielded twisted-pair
Zt Transfer impedance
3.3 Symbols
A terminal of balun
a insertion loss; equation coefficient
B terminal of balun
b equation coefficient
C terminal of balun
D terminal of balun
f frequency
J fixed connector; socket
k equation coefficient
P free connector
R resistor
x
S normalized S-parameter
xy
T T-parameter
xy
TD time delay
Zt transfer impedance
Ω Ohms
% percent
° degree
4 Overall test arrangement
4.1 Test instrumentation
All test instrumentation shall be qualified for use over the frequency range of 1 MHz to
500 MHz.
These test procedures require the use of a vector network analyser. The analyser should
have the capability of full 2-port calibrations. The analyser shall cover the frequency range of
1 MHz to 500 MHz at least.
When used, at least two test baluns are required in order to perform measurements with
balanced symmetrical signals. The requirements for the baluns are given in 4.4.
Optionally; multi-port network analyzers for balun-less test set-up may be used.
Reference loads and cables are needed for the calibration of the set-up. Requirements for the
reference loads, and cables are given in 4.6.1 and 4.6.2 respectively.

60512-27-100 © IEC:2011 – 11 –
Termination loads are needed for termination of pairs, used and unused, which are not
terminated by the test baluns. Requirements for the termination loads are given in 4.7.
An absorbing clamp and ferrite absorbers are needed for the coupling attenuation
measurements. The requirements for these items are given in IEC 62153-4-12.
4.2 Coaxial cables and interconnect for network analysers
Lengths of coaxial cables used to connect the network analyser to the baluns shall be as
short as possible. (It is recommended that they do not exceed 600 mm each.)
The baluns shall be electrically bonded to a common ground plane. For crosstalk
measurements, a test fixture may be used, in order to reduce residual crosstalk (see
Annex A).
Balanced interconnect and associated connecting hardware used to connect between the test
equipment and the connector under test shall meet the requirements given in 4.9.2.
4.3 Measurement precautions
To ensure a high degree of reliability for transmission measurements, the following
precautions are required.
a) Any measurement that is to be used in a de-embedding or re-embedding process, whether
vector or matrix, shall have its phase adjusted to the free connector phase reference
plane. Methods to do this are provided.
b) Consistent and stable balun and resistor loads shall be used for each pair throughout the
test sequence.
c) Cable and adapter discontinuities, as introduced by physical flexing, sharp bends and
restraints shall be avoided before, during and after the tests.
d) Consistent test methodology and terminations (baluns or resistors) shall be used at all
stages of transmission performance qualifications.
The relative spacing of conductors in the pairs shall be preserved throughout the tests to
the greatest extent possible.
e) The balance of the cables is maintained to the greatest extent possible by consistent
conductor lengths and pair twisting to the point of load.
f) The sensitivity to set-up variations for these measurements at high frequencies demands
attention to details for both the measurement equipment and the procedures.
4.4 Balun requirements
The baluns may be balun transformers or 180° hybrids with attenuators to improve matching if
needed. Figure 1 show s such an arrangement .

Attenuator
180° hybrid
Test port
To network analyzer
Attenuator
IEC  117/05
Figure 1 – Optional 180° hybrid used as a balun

– 12 – 60512-27-100 © IEC:2011
The specifications for the baluns apply for the whole frequency range for which they are used.
Baluns shall be RFI shielded and shall comply with the specifications listed in Table 1.
Table 1 – Test balun performance characteristics
Parameter Frequency (MHz) Value
a
Impedance, primary
1 ≤ f ≤ 500 50 Ω unbalanced
Impedance, secondary 1 ≤ f ≤ 500 100 Ω balanced
Insertion loss 1 ≤ f ≤ 500 2,0 dB maximum
1 ≤ f < 15 12 dB minimum
b
Return loss, bi-directional
15 ≤ f ≤ 500 20 dB minimum
1 ≤ f < 15 15 dB minimum
b
Return loss, CM 15 ≤ f < 400 20 dB minimum
15 dB minimum
400 ≤ f ≤ 500
Power rating 1 ≤ f ≤ 500 0,1 watt minimum
1 ≤ f < 100 60 dB minimum
b
Longitudinal balance
100 ≤ f ≤ 500 50 dB minimum
b
Output signal balance 50 dB minimum
1 ≤ f ≤ 500
b
CM rejection 1 ≤ f ≤ 500 50 dB minimum
a
Primary impedance may differ, if necessary, to accommodate analyzer outputs other than 50 Ω.
b
Measured per ITU-T (formerly CCITT) Recommendation G.117 with the network analyzer calibrated using a
50 Ω load.
4.5 Interfacing
For ease of interfacing to test fixtures, a pin and socket interface with dimensions as shown in
informative Clause A.2 is recommended.
Figure 2 depicts the proper test configurations for qualifying test baluns to the requirements of
this Standard.
60512-27-100 © IEC:2011 – 13 –

Balun Port Description Insertion Loss (2 Units Back-to-Back)

A A A
D D D
C B C B B C
A-B: 100 Ω Balanced
50 Ω 50 Ω
C:  50 Ω Common-Mode
D:  50 Ω Unbalanced
Return Loss (50:100 ohm) Return Loss (100:50 ohm)

A A A
50 Ω
D 100 Ω D D
C B C B B C
50 Ω 50 Ω 50 Ω
Calibration Plane
Common-Mode Return Loss
Longitudinal Balance
50 Ω
50 Ω
A A
50 Ω 25 Ω
25 Ω
D D
C B C B
50 Ω
50 Ω
Output Signal Balance
Common-Mode Rejection
50 Ω 50 Ω
A A
50 Ω 50 Ω
D D
C B C B
50 Ω 50 Ω
50 Ω 50 Ω
IEC  2584/11
Figure 2 – Measurement configurations for test balun qualification
4.6 Reference components for calibration
4.6.1 Reference loads for calibration
To perform a one or two-port calibration of the test equipment, a short circuit, an open circuit
and a reference load are required. These devices shall be used to obtain a calibration.
The reference load shall be calibrated against a calibration reference, which shall be a 50 Ω
load, traceable to an international reference standard. Two 100 Ω reference loads in parallel
shall be calibrated against the calibration reference. The reference loads for calibration shall
be placed in an N-type connector according to IEC 60169-16, meant for panel mounting,

– 14 – 60512-27-100 © IEC:2011
which is machined flat on the back side (see Figure 3). The loads shall be fixed to the flat side
of the connector, distributed evenly around the centre conductor. A network analyser shall be
calibrated, 1-port full calibration, with the calibration reference. Thereafter, the return loss of
the reference loads for calibration shall be measured. The verified return loss shall be >46 dB
at frequencies up to 100 MHz and >40 dB at frequencies above 100 MHz and up to the limit
for which the measurements are to be carried out.

Machined flat
Loads for calibration
N type connector
...