SIST EN IEC 61987-41:2025

SLOVENSKI STANDARD
01-oktober-2025
Merjenje in nadzor v industrijskih procesih - Strukture podatkov in elementov v
katalogih procesne opreme - 41. del: Seznami lastnosti (LOP) analizatorjev
procesov za elektronsko izmenjavo podatkov - Generične strukture (IEC 61987-
41:2025)
Industrial-process measurement and control - Data structures and elements in process
equipment catalogues - Part 41: Lists of properties (LOPs) of process analysers for
electronic data exchange - Generic structures (IEC 61987-41:2025)
IEC 61987 – Teil 41: Allgemeine Strukturen der Eigenschaftsliste (LOP) von
Prozessanalysatoren Technologie (PAT) Messgeräten für den elektronischen
Datenaustausch
Mesure et commande dans les processus industriels - Eléments et structures de
données dans les catalogues d'équipements de processus - Partie 41: Listes des
propriétés (LOP) des analyseurs de processus pour l'échange électronique de données -
Structures génériques (IEC 61987-41:2025)
Ta slovenski standard je istoveten z: EN IEC 61987-41:2025
ICS:
25.040.40 Merjenje in krmiljenje Industrial process
industrijskih postopkov measurement and control
35.240.50 Uporabniške rešitve IT v IT applications in industry
industriji
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN IEC 61987-41

NORME EUROPÉENNE
EUROPÄISCHE NORM May 2025
ICS 01.140.30
English Version
Industrial-process measurement and control - Data structures
and elements in process equipment catalogues - Part 41: Lists of
properties (LOPs) of process analysers for electronic data
exchange - Generic structures
(IEC 61987-41:2025)
Mesure et commande dans les processus industriels - IEC 61987 - Teil 41: Allgemeine Strukturen der
Eléments et structures de données dans les catalogues Eigenschaftsliste (LOP) von Prozessanalysatoren
d'équipements de processus - Partie 41: Listes des Technologie (PAT) Messgeräten für den elektronischen
propriétés (LOP) des analyseurs de processus pour Datenaustausch
l'échange électronique de données - Structures génériques (IEC 61987-41:2025)
(IEC 61987-41:2025)
This European Standard was approved by CENELEC on 2025-05-22. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Türkiye and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2025 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 61987-41:2025 E

European foreword
The text of document 65E/1067/CDV, future edition 1 of IEC 61987-41, prepared by SC 65E "Devices
and integration in enterprise systems" of IEC/TC 65 "Industrial-process measurement, control and
automation" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2026-05-31
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2028-05-31
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Any feedback and questions on this document should be directed to the users’ national committee. A
complete listing of these bodies can be found on the CENELEC website.
Endorsement notice
The text of the International Standard IEC 61987-41:2025 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standard indicated:
IEC 61069-5 NOTE Approved as EN 61069-5
IEC 61360-1 NOTE Approved as EN 61360-1
IEC 61360-2 NOTE Approved as EN 61360-2
IEC 61508-6 NOTE Approved as EN 61508-6
IEC 61987 (series) NOTE Approved as EN IEC 61987 (series)
IEC 61987-92 NOTE Approved as EN IEC 61987-92
IEC 62828-1 NOTE Approved as EN IEC 62828-1
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1  Where an International Publication has been modified by common modifications, indicated by (mod),
the relevant EN/HD applies.
NOTE 2  Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cencenelec.eu.
Publication Year Title EN/HD Year
IEC 61987-1 2024 Industrial-process measurement and EN IEC 61987-1 2024
control - Data structures and elements in
process equipment catalogues - Part 1:
Generic structures for measuring
equipment
IEC 61987-10 - Industrial-process measurement and EN 61987-10 -
control - Data structures and elements in
process equipment catalogues - Part 10:
List of Properties (LOPs) for Industrial-
Process Measurement and Control for
Electronic Data Exchange - Fundamentals
IEC 61987-11 2016 Industrial-process measurement and EN 61987-11 2017
control - Data structures and elements in
process equipment catalogues - Part 11:
List of properties (LOPs) of measuring
equipment for electronic data exchange -
Generic structures
IEC 61987-41 ®
Edition 1.0 2025-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Industrial-process measurement and control – Data structures and elements in

process equipment catalogues –

Part 41: Lists of properties (LOPs) of process analysers for electronic data

exchange – Generic structures
Mesure et commande dans les processus industriels – Eléments et structures

de données dans les catalogues d'équipements de processus –

Partie 41: Listes des propriétés (LOP) des analyseurs de processus pour

l'échange électronique de données – Structures génériques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 01.140.30  ISBN 978-2-8327-0369-4

– 2 – IEC 61987-41:2025 © IEC 2025
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 8
4 General . 9
4.1 Characterization scheme . 9
4.2 OLOP, DLOP and LOPD . 10
4.3 Cardinality and polymorphism . 10
5 Operating list of properties (OLOP). 11
5.1 Generic block structure . 11
5.2 Matrix of components/measurands . 11
5.2.1 General. 11
5.2.2 Chemical component/measurand . 11
5.2.3 Process analyser measurands . 12
5.3 Measuring or control point . 12
5.4 Base conditions . 12
5.5 Physical properties at sampling point . 12
5.6 Operating conditions for device design. 12
5.7 Process equipment . 12
5.8 Physical location . 12
5.8.1 General. 12
5.8.2 Available power supply . 12
5.8.3 Auxiliary media . 13
5.8.4 Process criticality classification . 13
5.8.5 Area classification . 13
6 Device list of properties (DLOP) . 13
6.1 Basic structure . 13
6.2 Generic block structure . 13
6.3 Relationship to IEC 61987-1 . 15
7 LOPD with dynamic properties for condition monitoring . 15
7.1 General . 15
7.2 Measurement variables . 16
7.3 General device variables/status . 16
7.4 Specific device variables/status/condition monitoring. 16
7.5 General device parameters and variables . 16
7.6 General functions . 16
8 Additional aspects . 16
Annex A (informative) Device type dictionary – Classification of process analysers . 17
Bibliography . 22

Figure 1 – Characterization of process analysers . 9
Figure 2 – Assignment of OLOP, LOPD and DLOPs for process analysers . 10

Table 1 – Generic block structure of an OLOP for process analysers . 11

IEC 61987-41:2025 © IEC 2025 – 3 –
Table 2 – Generic block structure of a DLOP . 14
Table 3 – Generic block structure of an LOPD for a process analyser . 15
Table A.1 – Classification scheme for process analysers . 17

– 4 – IEC 61987-41:2025 © IEC 2025
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
INDUSTRIAL-PROCESS MEASUREMENT AND CONTROL –
DATA STRUCTURES AND ELEMENTS IN PROCESS
EQUIPMENT CATALOGUES –
Part 41: Lists of properties (LOPs) of process analysers
for electronic data exchange – Generic structures

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as "IEC Publication(s)"). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence between
any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) IEC draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). IEC takes no position concerning the evidence, validity or applicability of any claimed patent rights in
respect thereof. As of the date of publication of this document, IEC had not received notice of (a) patent(s), which
may be required to implement this document. However, implementers are cautioned that this may not represent
the latest information, which may be obtained from the patent database available at https://patents.iec.ch. IEC
shall not be held responsible for identifying any or all such patent rights.
IEC 61987-41 has been prepared by subcommittee 65E: Devices and integration in enterprise
systems, of IEC technical committee 65: Industrial-process measurement, control and
automation. It is an International Standard.

IEC 61987-41:2025 © IEC 2025 – 5 –
The text of this International Standard is based on the following documents:
Draft Report on voting
65E/1067/CDV 65E/1091/RVC
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 61987 series, published under the general title Industrial-process
measurement and control – Data structures and elements in process equipment catalogues,
can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn, or
• revised.
– 6 – IEC 61987-41:2025 © IEC 2025
INTRODUCTION
The exchange of product data between companies, business systems, engineering tools, data
systems within companies and, in the future, control systems (electrical, measuring and control
technology) can run smoothly only when both the information to be exchanged and the use of
this information has been clearly defined.
Prior to this document, requirements on process control devices and systems were specified by
customers in various ways when suppliers or manufacturers were asked to quote for suitable
equipment. The suppliers in their turn described the devices according to their own
documentation schemes, often using different terms, structures and media (paper, databases,
CDs, e-catalogues, etc.). The situation was similar in the planning and development process,
with device information frequently being duplicated in a number of different information
technology (IT) systems.
Any method that is capable of recording all existing information only once during the planning
and ordering process and making it available for further processing, gives all parties involved
an opportunity to concentrate on the essentials. A precondition for this is the standardization of
both the descriptions of the objects and the exchange of information.
The IEC 61987 series proposes a method for standardization which will help both suppliers and
users of process control equipment to optimize workflows both within their own companies and
in their exchanges with other companies. Depending on their role in the process, engineering
firms can be considered here to be either users or suppliers.
The method specifies process control equipment by means of blocks of properties. These blocks
are compiled into lists of properties (LOPs), each of which describes a specific equipment
(device) type. The IEC 61987 series covers both properties that can be used in an inquiry or a
proposal and detailed properties required for integration of the equipment in computer systems
for other tasks.
IEC 61987-10 defines structure elements for constructing lists of properties for electrical and
process control equipment in order to facilitate automatic data exchange between any two
computer systems in any possible workflow, for example, engineering, maintenance or
purchasing workflow and to allow both the customers and the suppliers of the equipment to
optimize their processes and workflows. IEC 61987-10 also provides the data model for
assembling the LOPs.
IEC 61987-11 while specifying a generic structure for measuring equipment provides several
important detail descriptions, such as the handling of composite devices, that are also required
for LOPs describing process analysers.
This document specifies the generic structure for operating and device lists of properties
(OLOPs and DLOPs) for process analysers. Process analysers are installed directly in the
plants of the process industry and in control rooms specially set up for PAT (analyser houses
or analyser shelters). This document provides also generic structures for List of Properties for
Dynamic Data (LOPD) for process analysers. This LOPD can be used, for example, for the
description of dynamic data for condition monitoring.
NOTE Depending upon industry sector, process analysers are also known as Process Analyser Technology (PAT)
devices.
The entire IEC 61987 series provides the semantic of data needed for the area of the Industrial
Internet of Things (IIOT) and Smart Manufacturing. This document lays down the framework for
further parts of the IEC 61987series in which complete LOPs for process analysers of different
construction and functional principle that will be published in the IEC Common Data Dictionary
(IEC CDD).
IEC 61987-41:2025 © IEC 2025 – 7 –
Annex A contains a characterisation of process analysers. This is a tree of relationships
between different device types. Starting at the root "equipment for industrial-process
automation", it lists various types of process analyser. This characterisation is used in the
"Process automation" Domain of the IEC Common Data Dictionary (CDD).

– 8 – IEC 61987-41:2025 © IEC 2025
INDUSTRIAL-PROCESS MEASUREMENT AND CONTROL –
DATA STRUCTURES AND ELEMENTS IN PROCESS
EQUIPMENT CATALOGUES –
Part 41: Lists of properties (LOPs) of process analysers
for electronic data exchange – Generic structures

1 Scope
This part of IEC 61987 provides
• a characterization for the integration of process analysers in the Common Data Dictionary
(CDD),
• generic structures for operating lists of properties (OLOP) and device lists of properties
(DLOP) of measuring equipment in conformance with IEC 61987-10,
• generic structures for Dynamic Data, e.g. for condition monitoring of process analysers.
The generic structures for the OLOP and DLOP contain the most important blocks for process
analysers. Blocks pertaining to a specific equipment type will be described in the corresponding
part of the IEC 61987 standard series. Similarly, equipment properties are not part of this
document. Thus, OLOP, DLOPs and LOPDs for selected process analysers families will be
found in the IEC CDD.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 61987-1:2024, Industrial-process measurement and control – Data structures and elements
in process equipment catalogues – Part 1: Generic structures for measuring equipment
IEC 61987-10, Industrial-process measurement and control – Data structures and elements in
process equipment catalogues – Part 10: List of Properties (LOPs) for Industrial-Process
Measurement and Control for Electronic Data Exchange – Fundamentals
IEC 61987-11:2016, Industrial-process measurement and control – Data structures and
elements in process equipment catalogues – Part 11: List of properties (LOPs) of measuring
equipment for electronic data exchange – Generic structures
3 Terms and definitions
For the purposes of this document, the terms and definitions in IEC 61987-10 and IEC 61987-11
apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
• IEC Electropedia: available at https://www.electropedia.org/
• ISO Online browsing platform: available at https://www.iso.org/obp

IEC 61987-41:2025 © IEC 2025 – 9 –
3.1
dynamic property
property, the value of which can change over time.
3.2
list of properties for dynamic data
LOPD
LOP that contains the dynamic properties (dynamic data) of one or more device types
Note 1 to entry: The LOPD is an aspect of a device.
4 General
4.1 Characterization scheme
IEC 61987-1 describes a general classification scheme for industrial process measuring
equipment based on measured variables based on ISO 3511-1. Under this scheme, process
analysers fall under the category Q (quality) but they are also used for the measurement of
moisture and humidity (M) as well as viscosity (V). The introduction of the LOPs of any area of
technology into the IEC Common Data Dictionary (CDD) requires the creation of a
characterization scheme for the device types of this technology area.
The area of technology considered in this document concerns process analysers. The
characterisation of the area for the CDD is provided in Table A.1 of Annex A.
The enhanced characterization scheme is used for the IEC Common Data Dictionary (CDD).
The area of process analysers belongs to the domain of "Process automation" in the CDD.
The area of process analysers is divided into a range of sub-areas. The names of the sub-areas
are shown in Figure 1.
Figure 1 – Characterization of process analysers

– 10 – IEC 61987-41:2025 © IEC 2025
4.2 OLOP, DLOP and LOPD
An operating list of properties (OLOP) describes an aspect relating to a device type, for
example, the operational environment of the device, the device design requirements as well as
all the boundary conditions applicable to the point of operation. The structure element "aspect"
is described in IEC 61987-11.
The device list of properties (DLOP) is used to describe a given device type, for example an
optical absorption photometer, a chromatograph or a viscometer. The DLOP describes, for
example, the mechanical construction and the electrical construction of a device. Each DLOP
concerns a particular device type.
The list of properties for dynamic data (LOPD) is used to describe dynamic parameters from
various process analysers that are used, for example, in condition monitoring.
Figure 2 shows the relationship between the OLOP and LOPD and the DLOPs for process
analysers. The OLOP and LOPD are valid for the generic DLOP as well as for the DLOPs for
the various device types, for example optical spectrometer, electrochemical sensors, etc.

Figure 2 – Assignment of OLOP, LOPD and DLOPs for process analysers
At higher levels of their construction, OLOPs, LOPDs and DLOPs contain blocks of properties
that are common to all process variables or device types respectively. This document specifies
these generic block structures.
Further parts of the IEC 61987 series specify the block structures and properties of OLOP,
LOPD and DLOPs for process analysers.
4.3 Cardinality and polymorphism
The principles and the description of the cardinality and polymorphic areas applied in this
document are described in IEC 61987-10 and IEC 61987-11. These structural elements
introduce a high degree of flexibility in the description of a device and its surroundings, provided
the block structure in the LOP is used. They can be briefly described as follows:
• cardinality allows an LOP element, for example a property block describing a particular
feature of a device, to be repeated as many times as necessary;
• polymorphism allows the introduction of a complete property block from a selection of
property blocks at a particular structure level of an LOP.
In the case of process analysers, the cardinality can be used for replication of the "Input" block.
For example, an input-module can have two or more different types of input signals.

IEC 61987-41:2025 © IEC 2025 – 11 –
5 Operating list of prope
...