SIST EN 61967-5:2005
(Main)Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
Describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on a standardised test-board or on a final printed circuit board (PCB). Has a high repeatability and a good relationship to the measured RF emission of final applications with the integrated circuits used.
Integrierte Schaltungen - Messung von elektromagnetischen Aussendungen im Frequenzbereich von 150 kHz bis 1 GHz -- Teil 5: Messung der leitungsgeführten Aussendungen - Verfahren mit Faradayschem Käfig für Messtische
Circuits intégrés - Mesure des émissions électromagnétiques, 150 kHz à 1 GHz -- Partie 5: Mesure des émissions conduites - Méthode de la cage de Faraday sur banc de travail
Décrit une méthode de mesure de l'émission électro-magnétique conduite des circuits intégrés, qu'ils soient utilisés avec une carte électronique de test normalisée ou avec une carte à circuit imprimé finale. Présente une répétabilité élevée et convient à l'émission mesurée RF des applications finales avec ces circuits intégrés.
Integrirana vezja – Meritve elektromagnetnega sevanja, od 150 kHz do 1 GHz – 5. del: Meritve prevajanega sevanja – Metoda z namizno Faradayevo kletko (IEC 61967-5:2003)
General Information
Overview
EN 61967-5:2003 (CLC/CENELEC; IEC 61967-5:2003) defines the Workbench Faraday Cage method for measuring the conducted electromagnetic emissions of integrated circuits (ICs) in the band 150 kHz to 1 GHz. The standard describes how to measure emissions from ICs mounted on a standardized test board or on the final printed circuit board (PCB). It emphasizes high repeatability and a good correlation between component-level results and the RF emissions observed in final applications.
Key topics and requirements
- Scope: Measurement of conducted emissions from ICs (component-level) applicable to test boards and final PCBs in the 150 kHz–1 GHz range.
- Method: Use of a workbench Faraday cage to provide a controlled electromagnetic environment for conducted-emission measurements.
- Repeatability and correlation: Procedures and conditions intended to deliver reproducible results and meaningful correlation to emissions in finished products.
- Normative relationships: Designed to be read in conjunction with EN/IEC 61967-1 (General conditions and definitions) and references other EMC publications (for example IEC 61000-4-6 and IEC 60050 vocabulary entries).
- Standard structure: Contains normative annexes (A and ZA) and informative annexes (B, C, D) addressing supporting details and alignment with European regulations.
- Measurement philosophy: Establishes the rationale for component-level testing to support design verification, comparison of IC variants, and trend analysis without requiring full system tests.
Practical applications
Who uses EN 61967-5 and why:
- IC manufacturers - to characterise and control conducted emissions of semiconductor devices during development and production.
- EMC test laboratories - for standardized, repeatable component-level emission testing and reporting.
- PCB designers and system integrators - to assess how an IC’s conducted emissions will affect a final product and to guide mitigation (filtering, grounding, layout changes).
- Compliance and pre‑compliance engineers - to perform early-stage emission screening that correlates with system-level RF behaviour. Practical benefits include faster iteration in design verification, consistent supplier-to-supplier comparisons, and focused troubleshooting of conducted-emission sources before system-level testing.
Related standards
- EN/IEC 61967-1: General conditions and definitions (required companion document)
- IEC 61967 series (other parts such as Part 4 and Part 6 referenced for related measurement contexts)
- IEC 61000-4-6: Immunity to conducted disturbances induced by RF fields
- IEC 60050: Electrotechnical vocabulary (EMC and circuit theory)
Keywords: EN 61967-5, Workbench Faraday Cage method, conducted emissions, integrated circuits, 150 kHz to 1 GHz, EMC testing, PCB, component-level measurement, CLC.
Standards Content (Sample)
SLOVENSKI SIST EN 61967-5:2005
STANDARD
december 2005
Integrirana vezja – Meritve elektromagnetnega sevanja, od 150 kHz do 1 GHz –
5. del: Meritve prevajanega sevanja – Metoda z namizno Faradayevo kletko
(IEC 61967-5:2003)
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz
– Part 5: Measurement of conducted emissions – Workbench Faraday Cage
method (IEC 61967-5:2003)
ICS 31.200 Referenčna številka
© Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno
EUROPEAN STANDARD EN 61967-5
NORME EUROPÉENNE
EUROPÄISCHE NORM April 2003
ICS 31.200
English version
Integrated circuits –
Measurement of electromagnetic emissions, 150 kHz to 1 GHz
Part 5: Measurement of conducted emissions –
Workbench Faraday Cage method
(IEC 61967-5:2003)
Circuits intégrés - Integrierte Schaltungen –
Mesure des émissions électromagnétiques, Messung von elektromagnetischen
150 kHz à 1 GHz Aussendungen im Frequenzbereich
Partie 5: Mesure des émissions conduites - von 150 kHz bis 1 GHz
Méthode de la cage de Faraday Teil 5: Messung der leitungsgeführten
sur banc de travail Aussendungen –
(CEI 61967-5:2003) Verfahren mit Faradayschem Käfig
für Messtische
(IEC 61967-5:2003)
This European Standard was approved by CENELEC on 2003-04-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta,
Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61967-5:2003 E
Foreword
The text of document 47A/661/FDIS, future edition 1 of IEC 61967-5, prepared by SC 47A, Integrated
circuits, of IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and
was approved by CENELEC as EN 61967-5 on 2003-04-01.
This part of EN 61967 is to be read in conjunction with EN 61967-1:2002.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2004-01-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2006-04-01
Annexes designated "normative" are part of the body of the standard.
Annexes designated "informative" are given for information only.
In this standard, annexes A and ZA are normative and annexes B, C and D are informative.
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61967-5:2003 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 61967-4 NOTE Harmonized as EN 61967-4:2002 (not modified).
IEC 61967-6 NOTE Harmonized as EN 61967-6:2002 (not modified).
__________
- 3 - EN 61967-5:2003
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other
publications. These normative references are cited at the appropriate places in the text and the
publications are listed hereafter. For dated references, subsequent amendments to or revisions of any
of these publications apply to this European Standard only when incorporated in it by amendment or
revision. For undated references the latest edition of the publication referred to applies (including
amendments).
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
IEC 60050-131 2002 International Electrotechnical - -
Vocabulary
Part 131: Circuit theory
IEC 60050-161 1990 Chapter 161: Electromagnetic - -
compatibility
IEC 61967-1 2002 Integrated circuits - Measurement of EN 61967-1 2002
electromagnetic emissions, 150 kHz to
1 GHz
Part 1: General conditions and
definitions
IEC 61000-4-6 1996 Electromagnetic compatibility (EMC) EN 61000-4-6 1996
Part 4-6: Testing and measurement
techniques - Immunity to conducted
disturbances, induced by radio-
frequency fields
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Integrated circuits –
Measurement of electromagnetic emissions,
150 kHz to 1 GHz –
Part 5:
Measurement of conducted emissions –
Workbench Faraday Cage method
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INTEGRATED CIRCUITS –
MEASUREMENT OF ELECTROMAGNETIC EMISSIONS,
150 kHz TO 1 GHz –
Part 5: Measurement of conducted emissions –
Workbench Faraday Cage method
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INTEGRATED CIRCUITS –
MEASUREMENT OF ELECTROMAGNETIC EMISSIONS,
150 kHz TO 1 GHz –
Part 5: Measurement of conducted emissions –
Workbench Faraday Cage method
1 Scope
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2 Normative references
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ment techniques – Immunity to conducted disturbances, induced by radio-frequency fields
3 Definitions
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Figure 1 – Coupling/decoupling network (CDN) measurement method
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Frequently Asked Questions
SIST EN 61967-5:2005 is a standard published by the Slovenian Institute for Standardization (SIST). Its full title is "Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 5: Measurement of conducted emissions - Workbench Faraday Cage method". This standard covers: Describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on a standardised test-board or on a final printed circuit board (PCB). Has a high repeatability and a good relationship to the measured RF emission of final applications with the integrated circuits used.
Describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on a standardised test-board or on a final printed circuit board (PCB). Has a high repeatability and a good relationship to the measured RF emission of final applications with the integrated circuits used.
SIST EN 61967-5:2005 is classified under the following ICS (International Classification for Standards) categories: 31.200 - Integrated circuits. Microelectronics. The ICS classification helps identify the subject area and facilitates finding related standards.
SIST EN 61967-5:2005 is associated with the following European legislation: EU Directives/Regulations: 2004/108/EC, 2014/30/EU, 89/336/EEC. When a standard is cited in the Official Journal of the European Union, products manufactured in conformity with it benefit from a presumption of conformity with the essential requirements of the corresponding EU directive or regulation.
You can purchase SIST EN 61967-5:2005 directly from iTeh Standards. The document is available in PDF format and is delivered instantly after payment. Add the standard to your cart and complete the secure checkout process. iTeh Standards is an authorized distributor of SIST standards.
記事タイトル:SIST EN 61967-5:2005 - 統合回路 - 電磁放射の測定、150 kHzから1 GHzまで - 第5部:伝導放射の測定 - ワークベンチ ファラデイケージ法 記事内容:統合回路の伝導電磁放射を標準化されたテストボードまたは最終的なプリント回路基板(PCB)に適用する方法について説明しています。この方法は高い再現性を持ち、使用された統合回路を使用したアプリケーションの実際のRF放射と強い相関関係があります。
기사 제목: SIST EN 61967-5:2005 - 통합 회로 - 전자기 방출 측정, 150 kHz에서 1 GHz까지 - 제 5부: 동조 방출 측정 - 작업대 파라데이 케이지 방법 기사 내용: 표준화된 테스트 보드나 최종 인쇄 회로 기판(PCB)에 적용된 통합 회로의 동조 전자기 방출을 측정하는 방법을 설명한다. 이 방법은 높은 반복성을 가지고 있으며, 사용된 통합 회로를 사용한 최종 애플리케이션의 실제 RF 방출과 강한 상관 관계가 있다.
The article discusses a standardized method for measuring the electromagnetic emissions of integrated circuits. The method can be applied to both test boards and final printed circuit boards (PCBs), and it has a high level of repeatability and a strong correlation to the actual RF emissions of applications using these integrated circuits.








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