SIST EN IEC 61788-4:2020

SLOVENSKI STANDARD
SIST EN IEC 61788-4:2020
01-julij-2020
Nadomešča:
SIST EN 61788-4:2016
Superprevodnost - 4. del: Meritve razmerja preostale upornosti - Preostala
upornost za superprevodnike iz kompozita Nb-Ti in Nb3Sn (IEC 61788-4:2020)
Superconductivity - Part 4: Residual resistance ratio measurement - Residual resistance
ratio of Nb-Ti and Nb3Sn composite superconductors (IEC 61788-4:2020)
Supraleitfähigkeit - Teil 4: Messung des Restwiderstandsverhältnisses -
Restwiderstandsverhältnis von Nb-Ti und Nb3Sn Verbundsupraleitern (IEC 61788-
4:2020)
Supraconductivité - Partie 4: Mesurage du rapport de résistance résiduelle - Rapport de
résistance résiduelle des composites supraconducteurs de Nb-Ti et de Nb3Sn (IEC
61788-4:2020)
Ta slovenski standard je istoveten z: EN IEC 61788-4:2020
ICS:
17.200.20 Instrumenti za merjenje Temperature-measuring
temperature instruments
29.050 Superprevodnost in prevodni Superconductivity and
materiali conducting materials
SIST EN IEC 61788-4:2020 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN IEC 61788-4:2020

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SIST EN IEC 61788-4:2020


EUROPEAN STANDARD EN IEC 61788-4

NORME EUROPÉENNE

EUROPÄISCHE NORM
May 2020
ICS 17.220.20; 29.050 Supersedes EN 61788-4:2016 and all of its amendments
and corrigenda (if any)
English Version
Superconductivity - Part 4: Residual resistance ratio
measurement - Residual resistance ratio of Nb-Ti and Nb3Sn
composite superconductors
(IEC 61788-4:2020)
Supraconductivité - Partie 4: Mesurage du rapport de Supraleitfähigkeit - Teil 4: Messung des
résistance résiduelle - Rapport de résistance résiduelle des Restwiderstandsverhältnisses - Restwiderstandsverhältnis
composites supraconducteurs de Nb-Ti et de Nb3Sn von Nb-Ti und Nb3Sn Verbundsupraleitern
(IEC 61788-4:2020) (IEC 61788-4:2020)
This European Standard was approved by CENELEC on 2020-04-24. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.


European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2020 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
 Ref. No. EN IEC 61788-4:2020 E

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SIST EN IEC 61788-4:2020
EN IEC 61788-4:2020 (E)
European foreword
The text of document 90/448/FDIS, future edition 5 of IEC 61788-4, prepared by IEC/TC 90
"Superconductivity" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as
EN IEC 61788-4:2020.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2021-01-24
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2023-04-24
document have to be withdrawn

This document supersedes EN 61788-4:2016 and all of its amendments and corrigenda (if any).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice
The text of the International Standard IEC 61788-4:2020 was approved by CENELEC as a European
Standard without any modification.


2

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SIST EN IEC 61788-4:2020
EN IEC 61788-4:2020 (E)
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1  Where an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
NOTE 2  Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60050-815 - International Electrotechnical Vocabulary - - -
Part 815: Superconductivity


3

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SIST EN IEC 61788-4:2020




IEC 61788-4

®


Edition 5.0 2020-03




INTERNATIONAL



STANDARD




NORME



INTERNATIONALE
colour

inside










Superconductivity –

Part 4: Residual resistance ratio measurement – Residual resistance ratio of

Nb‑Ti and Nb Sn composite superconductors

3



Supraconductivité –

Partie 4: Mesurage du rapport de résistance résiduelle – Rapport de résistance


résiduelle des composites supraconducteurs de Nb-Ti et de Nb Sn
3













INTERNATIONAL

ELECTROTECHNICAL

COMMISSION


COMMISSION

ELECTROTECHNIQUE


INTERNATIONALE




ICS 17.220.20; 29.050 ISBN 978-2-8322-7916-8




Warning! Make sure that you obtained this publication from an authorized distributor.

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® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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SIST EN IEC 61788-4:2020
– 2 – IEC 61788-4:2020 © IEC 2020
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Principle . 8
5 Apparatus . 8
5.1 Material of measurement mandrel or of measurement base plate . 8
5.2 Diameter of the measurement mandrel and length of the measurement base
plate . 9
5.3 Cryostat for the resistance ( ) measurement . 9
R
2
6 Specimen preparation . 9
7 Data acquisition and analysis . 9
7.1 Resistance ( R ) at room temperature . 9
1
*
7.2 Resistance ( R or R ) just above the superconducting transition . 10
2 2
7.2.1 Correction of strain effect . 10
7.2.2 Data acquisition of cryogenic resistance . 10
7.2.3 Optional acquisition methods . 12
*
7.3 Correction on measured R of Nb-Ti composite superconductor for bending
2
strain . 12
7.4 Residual resistance ratio (RRR) . 12
8 Uncertainty and stability of the test method . 13
8.1 Temperature . 13
8.2 Voltage . 13
8.3 Current . 13
8.4 Dimension . 13
9 Test report . 13
9.1 RRR value . 13
9.2 Specimen . 14
9.3 Test conditions . 14
9.3.1 Measurements of R and R . 14
1 2
9.3.2 Measurement of R . 15
1
9.3.3 Measurement of R . 15
2
Annex A (informative) Additional information relating to the measurement of RRR . 16
A.1 Recommendation on specimen mounting orientation . 16
A.2 Alternative methods for increasing temperature of specimen above
superconducting transition temperature . 16
*
A.3 Alternative measurement methods of R or R . 16
2 2
A.4 Bending strain dependency of RRR for Nb-Ti composite superconductor . 19
A.5 Procedure of correction of bending strain effect . 22
Annex B (informative) Uncertainty considerations . 24
B.1 Overview. 24
B.2 Definitions. 24

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IEC 61788-4:2020 © IEC 2020 – 3 –
B.3 Consideration of the uncertainty concept . 24
B.4 Uncertainty evaluation example for IEC TC 90 standards . 26
Annex C (informative) Uncertainty evaluation in test method of RRR for Nb-Ti and
Nb Sn composite superconductors . 28
3
C.1 Evaluation of uncertainty . 28
C.2 Summary of round robin test of RRR of a Nb-Ti composite superconductor . 31
C.3 Reason for large COV value in the intercomparison test on Nb Sn composite
3
superconductor . 32
Bibliography . 34

Figure 1 – Relationship between temperature and resistance. 8
Figure 2 – Voltage versus temperature curves and definitions of each voltage . 11
Figure A.1 – Definition of voltages . 18
Figure A.2 – Bending strain dependency of RRR value for pure Cu matrix of Nb-Ti
composite superconductors (comparison between measured values and calculated
values) . 20
Figure A.3 – Bending strain dependency of RRR value for round Cu wires . 20
Figure A.4 – Bending strain dependency of normalized RRR value for round Cu wires . 21
Figure A.5 – Bending strain dependency of RRR value for rectangular Cu wires . 21
Figure A.6 – Bending strain dependency of normalized RRR value for rectangular Cu
wires . 22
Figure C.1 – Distribution of observed r of Cu/Nb-Ti composite superconductor . 32
RRR

Table A.1 – Minimum diameter of the measurement mandrel for round wires . 22
Table A.2 – Minimum diameter of the measurement mandrel for rectangular wires. 22
Table B.1 – Output signals from two nominally identical extensometers . 25
Table B.2 – Mean values of two output signals . 25
Table B.3 – Experimental standard deviations of two output signals . 25
Table B.4 – Standard uncertainties of two output signals . 26
Table B.5 – COV values of two output signals . 26
Table C.1 – Uncertainty of each measurement . 31
Table C.2 – Obtained values of RRR for six Nb Sn specimens . 32
3
Table C.3 – Average, standard deviation and coefficient of variation for six specimens . 33

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INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

SUPERCONDUCTIVITY –

Part 4: Residual resistance ratio measurement –
Residual resistance ratio of Nb-Ti and Nb Sn
3
composite superconductors

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence between
any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61788-4 has been prepared by IEC technical committee 90:
Superconductivity.
This fifth edition cancels and replaces the fourth edition published in 2016. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) change in the suitable distance of voltage taps on the specimen for reliable measurement,
Sn
b) new report on the result of the round robin test of the residual resistance ratio of Nb
3
superconductors that proves the validity of the measurement method in this standard,
c) revision of the confusing definitions of the copper ratio and copper fraction.

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SIST EN IEC 61788-4:2020
IEC 61788-4:2020 © IEC 2020 – 5 –
The text of this standard is based on the following documents:
FDIS Report on voting
90/448/FDIS 90/451/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of the IEC 61788 series, published under the general title Superconductivity,
can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this document using a colour printer.

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SIST EN IEC 61788-4:2020
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INTRODUCTION
Copper, Cu/Cu-Ni or aluminium is used as matrix material in Ni-Ti and Nb Sn composite
3
superconductors and works as an electrical shunt when the superconductivity is interrupted. It
also contributes to recovery of the superconductivity by conducting heat generated in the
superconductor to the surrounding coolant. The cryogenic-temperature resistivity of copper is
an important quantity, which influences the stability and AC losses of the superconductor. The
residual resistance ratio is defined as a ratio of the resistance of the superconductor at room
temperature to that just above the superconducting transition.
This document specifies the test method for residual resistance ratio of Nb-Ti and Nb Sn
3
composite superconductors. The curve method is employed for the measurement of the
resistance just above the superconducting transition. Other methods are described in
Clause A.3.

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IEC 61788-4:2020 © IEC 2020 – 7 –
SUPERCONDUCTIVITY –

Part 4: Residual resistance ratio measurement –
Residual resistance ratio of Nb-Ti and Nb Sn
3
composite superconductors



1 Scope
This part of IEC 61788 specifies a test method for the determination of the residual resistance
ratio (RRR) of Nb-Ti and Nb Sn composite superconductors with Cu, Cu-Ni, Cu/Cu-Ni and Al
3
matrix in a strain-free condition and zero external magnetic field. This method is intended for
use with superconductor specimens that have a monolithic structure with rectangular or round
2
cross-section, RRR value less than 350, and cross-sectional area less than 3 mm . In the case
of Nb Sn, the specimens have received a reaction heat-treatment.
3
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60050-815, International Electrotechnical Vocabulary (IEV) – Part 815: Superconductivity
(available at: www.electropedia.org)
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60050-815 and the
following apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1
residual resistance ratio
RRR
ratio of resistance at room temperature to the resistance just above the superconducting
transition
Note 1 to entry: This note applies to the French language only.
Note 2 to entry: In this document for Nb-Ti and Nb Sn composite superconductors, the room temperature is defined
3
as 293 K (20 °C), and the residual resistance ratio is obtained in Formula (1), where the resistance ( R ) at 293 K is
1
divided by the resistance ( R ) just above the superconducting transition.
2
R
1
r = (1)
RRR
R
2

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Here r is a value of the residual resistance ratio, R is a value of the resistance measured in a strain-free
2
RRR
condition and zero external magnetic field.
Figure 1 shows schematically a resistance versus temperature curve acquired on a specimen while measuring the
cryogenic resistance.

The cryogenic resistance, R , is determined by the intersection, A, of two straight lines (a) and (b) at
2
temperature T* .
c
Figure 1 – Relationship between temperature and resistance
4 Principle
The resistance measurement both at room and cryogenic temperatures shall be performed with
the four-terminal technique. All measurements are done without an applied magnetic field.
The target relative combined standard uncertainty of this method is defined as an expanded
uncertainty ( k= 2 ) not to exceed 5 %.
The maximum bending strain induced during mounting and cooling the Nb-Ti specimen shall
not exceed 2 %. The measurement shall be conducted in a strain-free condition or in a condition
with allowable thermal strain for the Nb Sn specimen.
3
5 Apparatus
5.1 Material of measurement mandrel or of measurement base plate
Material of the measurement mandrel for a coiled Nb-Ti specimen or of the measurement base
plate for a straight Nb-Ti or Nb Sn specimen shall be copper, aluminium, silver, or the like
3
whose thermal conductivity is equal to or better than 100 W/(m·K) at liquid helium temperature
(4,2 K). The surface of the material shall be covered with an insulating layer (tape or a layer
made of polyethylene terephthalate, polyester, polytetrafluoroethylene, etc.) whose thickness
is 0,1 mm or less.

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IEC 61788-4:2020 © IEC 2020 – 9 –
5.2 Diameter of the measurement mandrel and length of the measurement base plate
The diameter of the measurement mandrel shall be large enough to keep the bending strain of
the specimen less than or equal to 2 % for the Nb-Ti specimen. The Nb Sn specimen on a base
3
plate shall be measured in a strain-free condition or a condition with allowable thermal strain.
The measurement base plate shall be at least 30 mm long in one dimension.
5.3 Cryostat for the resistance ( R ) measurement
2
The cryostat shall include a specimen support structure and a liquid helium reservoir for
measurement of the resistance R . The specimen support structure shall allow the specimen,
2
which is mounted on a measurement mandrel or a measurement base plate, to be lowered into
and raised out of a liquid helium bath. In addition, the specimen support structure shall be made
so that a current can flow through the specimen and the resulting voltage generated along the
specimen can be measured.
6 Specimen preparation
The test specimen shall have no joints or splices with a length of 30 mm or longer. The specimen
shall be instrumented with current contacts near each of its ends and a pair of voltage contacts
over its central portion. The distance between two voltage taps ( L ) shall be 15 mm or longer.
A thermometer for measuring cryogenic temperature shall be attached near the specimen.
Some mechanical method shall be used to hold the specimen against the insulated layer of the
measurement mandrel or base plate. Special care should be taken during instrumentation and
installation of the specimen on the measurement mandrel or base plate so that no excessive
force, which may cause undesired bending strain or tensile strain, would be applied to the
specimen. Ideally, the Nb Sn specimen is intended to be as straight as possible; however, this
3
is not always the case, thus care should be taken to measure the specimen in its as received
condition.
The specimen shall be mounted on a measurement mandrel or on a measurement base plate
for these measurements. Both resistance measurements, R and R , shall be made on the
1 2
same specimen and the same mounting.
7 Data acquisition and analysis
7.1 Resistance ( R ) at room temperature
1
The mounted specimen shall be measured at room temperature ( T (K)), where T satisfies
m m
the following condition: 273 K ≤ T ≤ 308 K. A specimen current ( I (A)) shall be applied so that

m 1
2 2
the current density is in the range of 0,1 A/mm to 2 A/mm based on the total wire cross-
(V)), and shall be recorded. Formula (2)
sectional area, and the resulting voltage ( U I T
1 1 m
below shall be used to calculate the resistance ( R ) at room temperature. The resistance ( R )
m 1
at 293 K (20 °C ) shall be calculated using Formula (3) for a wire with Cu matrix. For wires that
do not contain a pure Cu component, the value of R shall be set equal to R , without any
1 m
temperature correction.
U
1
R = (2)
m
I
1

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R
m
R = (3)
1
1+ 0,00393×−T 293
( )
m
 
*
7.2 Resistance ( R or R ) just above the superconducting transition
2 2
7.2.1 Correction of strain effect
*
Under a strained condition of the Nb-Ti specimen, the measured cryogenic resistance, R , is
2
not a correct value for R . The corresponding correction of the strain effect is described in 7.3.
2
7.2.2 Data acquisition of cryogenic resistance
The specimen, which is still mounted as it was for the room temperature measurement, shall
be placed in the cryostat for electrical measurement specified in 5.3. Horizontal mounting of the
specimen is recommended in Clause A.1. Alternative cryostats that employ a heating element
to sweep the specimen temperature are described in Clause A.2. The specimen shall be slowly
lowered into the liquid helium bath and cooled to liquid helium temperature over a time period
of
...