ISO/IEC TR 18047-6:2011

TECHNICAL ISO/IEC
REPORT TR
18047-6
Third edition
2011-01-15
Information technology — Radio
frequency identification device
conformance test methods —
Part 6:
Test methods for air interface
communications at 860 MHz to 960 MHz
Technologies de l'information — Méthodes d'essai de conformité du
dispositif d'identification de radiofréquence —
Partie 6: Méthodes d'essai pour des communications d'une interface
d'air à 860 MHz et jusqu'à 960 MHz

Reference number
©
ISO/IEC 2011
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©  ISO/IEC 2011
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ii © ISO/IEC 2011 – All rights reserved

Contents Page
Foreword .vi
Introduction.vii
1 Scope.1
2 Normative references.2
3 Terms, definitions, symbols and abbreviated terms .2
3.1 Terms and definitions .2
3.2 Symbols.2
3.3 Abbreviated terms.3
3.4 Default conditions applicable to the test methods .3
3.4.1 Test environment.3
3.4.2 Pre-conditioning.3
3.4.3 Default tolerance .3
3.4.4 Noise floor at test location .3
3.4.5 Total measurement uncertainty.3
4 Setup of test equipment.4
4.1 Setup of test equipment for interrogator tests.4
4.1.1 General .4
4.1.2 Sense antenna .4
4.1.3 Test apparatus and test circuits for ISO/IEC 18000-6 Type A and B interrogator .4
4.1.4 Test apparatus and test circuits for ISO/IEC 18000-6 Type C interrogator .5
4.2 Setup of test equipment for tag tests.5
4.2.1 General .5
4.2.2 Test apparatus and test circuits for ISO/IEC 18000-6 Type A, B and D tags.6
4.2.3 Test apparatus and test circuits for ISO/IEC 18000-6 Type C tags .7
5 Conformance tests for ISO/IEC 18000-6 Type A .8
5.1 Functional tests of interrogator .8
5.1.1 Interrogator modulation test .8
5.1.2 Interrogator demodulation and turn around time .8
5.2 Functional tests of tag .9
5.2.1 Tag demodulation and turn around time .9
5.2.2 Tag backscatter .10
5.2.3 Tag response time.11
5.2.4 Tag bit rate .12
5.2.5 Tag state storage time .12
6 Conformance tests for ISO/IEC 18000-6 Type B .13
6.1 Functional tests of interrogator .13
6.1.1 Interrogator modulation test .13
6.1.2 Interrogator demodulation and turn around time .14
6.2 Functional tests of tag .15
6.2.1 Tag demodulation and turn around time .15
6.2.2 Tag backscatter .16
6.2.3 Tag response time.17
6.2.4 Tag bit rate .17
6.2.5 Tag state storage time .18
7 Conformance tests for ISO/IEC 18000-6 Type C .19
7.1 Tag functional tests.19
7.1.1 Tag Frequency range .19
7.1.2 Tag demodulation capability.20
© ISO/IEC 2011 – All rights reserved iii

7.1.3 Tag duty cycle. 21
7.1.4 Tag preamble. 23
7.1.5 Tag link frequency tolerance and variation . 24
7.1.6 Tag link timing T1 . 25
7.1.7 Tag link timing T2 . 26
7.1.8 Tag state diagram . 29
7.2 Interrogator functional tests. 30
7.2.1 Interrogator data encoding. 30
7.2.2 Interrogator RF envelope parameters . 32
7.2.3 Interrogator RF power-up and power-down parameters . 33
7.2.4 Interrogator preamble parameters. 34
7.2.5 Interrogator link timing T2 . 35
7.2.6 Interrogator link timing T3 . 36
7.2.7 Interrogator link timing T4 . 37
8 Conformance tests for ISO/IEC 18000-6 Type D. 39
8.1 Functional tests of interrogator . 39
8.1.1 Interrogator modulation test. 39
8.1.2 Interrogator demodulation and data decoding. 39
8.2 Functional tests of tag . 41
8.2.1 Tag backscatter. 41
8.2.2 Data encoding . 42
8.2.3 Link bits . 43
8.2.4 Tag Timing Parameters . 43
8.2.5 Tag bit rate. 45
8.2.6 Tag multi-page timing . 45
8.2.7 Tag LBT. 46
9 Conformance tests for ISO/IEC 18000-6 Battery Assisted Passive (BAP) Type C. 46
9.1 Tag functional tests. 46
9.1.1 Battery assisted Passive tag persistence time test . 46
10 Conformance tests for ISO/IEC 18000-6 Sensor support . 48
10.1 Tag functional tests. 48
10.1.1 Simple sensor test. 48
10.1.2 Full-function sensor test. 49
Annex A (informative) Test measurement site . 50
A.1 Test sites and general arrangements for measurements involving the use of radiated
fields. 50
A.1.1 Anechoic chamber. 50
A.1.2 Anechoic chamber with a conductive ground plane . 51
A.1.3 Open area test site (OATS) . 52
A.1.4 Test antenna. 53
A.1.5 Substitution antenna . 54
A.1.6 Measuring antenna . 54
A.1.7 Stripline arrangement. 54
A.2 Guidance on the use of radiation test sites . 55
A.2.1 Verification of the test site. 55
A.2.2 Preparation of the DUT. 55
A.2.3 Power supplies to the DUT . 55
A.2.4 Range length . 55
A.2.5 Site preparation. 56
A.3 Coupling of signals. 57
A.3.1 General. 57
A.3.2 Data Signals . 57
A.4 Standard test position. 57
A.5 Test fixture. 57
A.5.1 Description . 58
A.5.2 Calibration . 58
A.5.3 Mode of use. 59
iv © ISO/IEC 2011 – All rights reserved

Annex B (normative) Command coding for conformance tests for the different types of
ISO/IEC 18000-6 .60
B.1 Command coding for type A .60
B.1.1 Init_round_all command and response .60
B.1.2 Next slot command and response.60
B.2 Command coding for type B .61
B.2.1 GROUP_SELECT_EQ command and response .61
Annex C (normative) State-transition tables.62
Annex D (normative) Technical performance of the digital oscilloscope.63
Annex E (normative) Technical performance of the spectrum analyser .64
Annex F (normative) Tag emulator .65
Annex G (informative) Measurement examples.67
G.1 Tag response time measurement .67
G.2 Tag bit rate accuracy measurement.67
Annex H (normative) Technical performance of the vector signal generator .68
Annex I (normative) Reference antenna.69
Bibliography.70

© ISO/IEC 2011 – All rights reserved v

Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are members of
ISO or IEC participate in the development of International Standards through technical committees
established by the respective organization to deal with particular fields of technical activity. ISO and IEC
technical committees collaborate in fields of mutual interest. Other international organizations, governmental
and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of information
technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of the joint technical committee is to prepare International Standards. Draft International
Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as
an International Standard requires approval by at least 75 % of the national bodies casting a vote.
In exceptional circumstances, when the joint technical committee has collected data of a different kind from
that which is normally published as an International Standard (“state of the art”, for example), it may decide to
publish a Technical Report. A Technical Report is entirely informative in nature and shall be subject to review
every five years in the same manner as an International Standard.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights.
ISO/IEC TR 18047-6 was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology,
Subcommittee SC 31, Automatic identification and data capture techniques.
This third edition cancels and replaces the second edition (ISO/IEC TR 18047-6:2008), which has been
technically revised.
ISO/IEC TR 18047 consists of the following parts, under the general title Information technology — Radio
frequency identification device conformance test methods:
⎯ Part 2: Test methods for air interface communications below 135 kHz
⎯ Part 3: Test methods for air interface communications at 13,56 MHz
⎯ Part 4: Test methods for air interface communications at 2,45 GHz
⎯ Part 6: Test methods for air interface communications at 860 MHz to 960 MHz
⎯ Part 7: Test methods for active air interface communications at 433 MHz

vi © ISO/IEC 2011 – All rights reserved

Introduction
ISO/IEC 18000 defines the air interfaces for radio frequency identification (RFID) devices used in item
management applications. ISO/IEC 18000-6 defines the air interface for these devices operating at
frequencies from 860 MHz to 960 MHz.
ISO/IEC TR 18047 provides test methods for conformance with the various parts of ISO/IEC 18000.
Each part of ISO/IEC TR 18047 contains all measurements required to be made on a product in order to
establish whether it conforms to the corresponding part of ISO/IEC 18000. For this part of ISO/IEC TR 18047,
each interrogator and each tag needs to support at least one of the types A or B or C or D.
NOTE Measurement of tag and interrogator performance is covered by the multiple parts of ISO/IEC 18046.
© ISO/IEC 2011 – All rights reserved vii

TECHNICAL REPORT ISO/IEC TR 18047-6:2011(E)

Information technology — Radio frequency identification device
conformance test methods —
Part 6:
Test methods for air interface communications at 860 MHz to
960 MHz
1 Scope
This part of ISO/IEC TR 18047 defines test methods for determining the conformance of radio frequency
identification (RFID) devices (tags and interrogators) for item management with the specifications given in
ISO/IEC 18000-6, but does not apply to the testing of conformity with regulatory or similar requirements.
The test methods require only that the mandatory functions, and any optional functions which are
implemented, be verified. This can, in appropriate circumstances, be supplemented by further, application-
specific functionality criteria that are not available in the general case.
The interrogator and tag conformance parameters in this part of ISO/IEC TR 18047 are the following:
• type-specific conformance parameters including nominal values and tolerances;
• parameters that apply directly affecting system functionality and inter-operability.
The following are not included in this part of ISO/IEC TR 18047:
• parameters that are already included in regulatory test requirements;
• high-level data encoding conformance test parameters (these are specified in ISO/IEC 15962).
Unless otherwise specified, the tests in this part of ISO/IEC TR 18047 are to be applied exclusively to
RFID tags and interrogators defined in ISO/IEC 18000-6.
Clause 5 describes all necessary conformance tests for ISO/IEC 18000-6 Type A.
Clause 6 describes all necessary conformance tests for ISO/IEC 18000-6 Type B.
Clause 7 describes all necessary conformance tests for ISO/IEC 18000-6 Type C.
Clause 8 describes all necessary conformance tests for ISO/IEC 18000-6 Type D.
Clause 9 describes all necessary conformance tests for ISO/IEC 18000-6 Type C Battery Assisted Passive
(BAP), whereas optional features will only be tested when supported.
Clause 10 describes all necessary conformance tests for ISO/IEC 18000-6 Type C Sensor support, whereas
optional features will only be tested when supported.
© ISO/IEC 2011 – All rights reserved 1

2 Normative references
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendment s) applies.
ISO/IEC 18000-6, Information technology — Radio frequency identification for item management — Part 6:
Parameters for air interface communications at 860 MHz to 960 MHz
ISO/IEC 19762 (all parts), Information technology — Automatic identification and data capture (AIDC)
techniques — Harmonized vocabulary
3 Terms, definitions, symbols and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO/IEC 19762 apply.
3.2 Symbols
For the purposes of this document, the symbols given in ISO/IEC 19762 and the following apply.
D Modulation depth of data coding pulse
d1 Distance between the interrogator and test antenna
d2 Distance between test antenna and DUT tag
ds Distance between the interrogator antenna and sense antenna
dT,IA Interrogator antenna to tag distance
dT,MA Measurement antenna to tag distance
dTE Distance between the interrogator antenna and tag emulator
GI Interrogator antenna gain
GIA Gain of interrogator antenna
GMA Gain of measurement antenna
K Calibration factor
L Maximum interrogator antenna dimension
M Modulation index
PI Delivered power at the carrier frequency
PM Measured power at the carrier frequency
Tf Fall time
Tr Rise time
2 © ISO/IEC 2011 – All rights reserved

3.3 Abbreviated terms
For the purposes of this document, the abbreviated terms given in ISO/IEC 19762 and the following apply.
DUT Device under test
RCS Radar cross-section
ΔRCS Change in radar cross-section
RBW Resolution bandwidth
VBW Video bandwidth
3.4 Default conditions applicable to the test methods
3.4.1 Test environment
Unless otherwise specified, testing shall take place in an environment of temperature 23 °C ± 3 °C and of
non-condensing humidity from 40 % to 60 %.
3.4.2 Pre-conditioning
Where pre-conditioning is required by the test method, the interrogators and tags to be tested shall be
conditioned to the test environment for an appropriate time period, which shall be recorded.
3.4.3 Default tolerance
Unless otherwise specified, a default tolerance of ± 5 % shall be applied to the quantity values given to specify
the characteristics of the test equipment (e.g. linear dimensions) and the test method procedures (e.g. test
equipment adjustments).
3.4.4 Noise floor at test location
Noise floor at test location shall be measured with the spectrum analyser using the same conditions as for the
measurement of the DUT.
The spectrum analyser shall measure the noise for at least 1 minute.
The maximum of the measured amplitude shall be 20 dB below the value of the amplitude of the measured
tag backscatter operating at minimum power (P , see clause 5.2.2.2), and the tag placed at 10 λ from the
I,min
measurement antenna.
Special attention has to be given to spurious emissions, e.g., insufficiently shielded computer monitors. The
electromagnetic test conditions of the measurements shall be checked by performing the measurements with
and without a tag in the field.
3.4.5 Total measurement uncertainty
The total measurement uncertainty for each quantity determined by these test methods shall be stated in the
test report.
NOTE Basic information is given in ISO Guide 98-3:2008.
© ISO/IEC 2011 – All rights reserved 3

4 Setup of test equipment
4.1 Setup of test equipment for interrogator tests
4.1.1 General
The DUT shall be an interrogator including an antenna.
All conformance measurements and setups shall be done in an anechoic chamber as defined in Annex A.
Dependent of the regulatory requirements all measurements shall be done at one of the test frequencies in
Table 1.
Table 1 — Test frequencies
Test carrier frequency Comment
866 MHz Recommended for tests under European regulations
910 MHz Recommended for tests under Korean or US regulations
922 MHz Recommended for tests under Australian regulations
953 MHz Recommended for tests under Japan regulations

NOTE With the test frequencies specified in Table 1 all frequencies of the entire band from 860 MHz to 960 MHz are
within ± 2,5 % of one of the test frequencies.
4.1.2 Sense antenna
Where applicable, tests shall be carried out using a sense antenna, which shall be a substantially non-reactive
non-radiating load of 50 Ω equipped with an antenna connector. The Voltage Standing Wave Ratio (VSWR) at
the 50 Ω connector shall not be greater than 1,2 : 1 over the frequency range of the measurement.
4.1.3 Test apparatus and test circuits for ISO/IEC 18000-6 Type A and B interrogator
4.1.3.1 Interrogator modulation test setup
For this test the sense antenna shall always be placed and orientated for optimum field strength reception in
the direction of the major power radiation of the interrogator antenna according Figure 1 at a distance d
S
which is defined in clause 5.1.1.2.
Interrogator
Scope
Antenna
Sense
Antenna
d
S
Figure 1 — Interrogator modulation test setup
4 © ISO/IEC 2011 – All rights reserved

4.1.3.2 Interrogator demodulation and turn around time test setup
For this test the tag emulator as defined in Annex F shall be placed and orientated for optimum field strength
reception in the direction of the major power radiation of the interrogator according Figure 2 at a distance d ,
TE
which is defined in clause 5.1.2.2.
Interrogator Tag
Antenna Emulator
d
TE
Figure 2 — Interrogator demodulation and turn around test setup
4.1.4 Test apparatus and test circuits for ISO/IEC 18000-6 Type C interrogator
The DUT shall be an interrogator including an antenna.
For this test, the sense antenna shall always be placed according to Figure 3. The distance between an
interrogator antenna and a sense antenna shall be d . The sense antenna shall be placed in the optimum
orientation so as to receive the highest possible power level radiated by the interrogator antenna.
Sense Antenna
Signal Analyser
DUT Interrogator
d
Figure 3 — Interrogator test setup
For some interrogator tests a tag emulator as defined in Annex F shall be used, the tag emulator shall be
placed and orientated for optimum field strength reception in the direction of the major power radiation of the
interrogator.
4.2 Setup of test equipment for tag tests
4.2.1 General
The DUT shall be a tag including all means in order to be capable to communicate with an interrogator.
When tests require use of an interrogator this shall be an interrogator including antenna that conforms to
ISO/IEC 18000-6 according to the methods defined in this Type of ISO/IEC TR 18047, or it shall be a signal
generator including antenna. Furthermore, the interrogator shall support the minimum tag response to
interrogator command turn around time.
The interrogator antenna shall fulfil the specification of Table 2.
Table 2 — Interrogator antenna requirements for tag tests
Symbol Parameter Minimum Value Maximum Value
L Maximum Interrogator antenna dimension 0,1 m
λ d
T ,IA
G Interrogator antenna gain 2 dBi 8 dBi
I
© ISO/IEC 2011 – All rights reserved 5

All conformance measurements and setups shall be done in an anechoic chamber as defined in Annex A.
Dependent of the regulatory requirements all measurements shall be done at either of the test frequencies in
Table 1.
4.2.2 Test apparatus and test circuits for ISO/IEC 18000-6 Type A, B and D tags
4.2.2.1 Tag demodulation and turn around time test setup
For this test the tag shall be placed and oriented for optimum field strength reception in the direction of the
major power radiation of the interrogator in a distance
2 2
2L 2L
d > , d >
T ,IA T ,MA
λ λ
with L being the maximum dimension of the interrogator antenna according Figure 4.

Figure 4 — Tag demodulation test setup
4.2.2.2 Tag backscatter test setup
For this test the test interrogator antenna setup, where the interrogator may alternately also be realized with a
vector signal generator according Annex H, shall consist of a set of two mechanically assembled antennas
specifically designed to reduce the signal coupling between each other. One shall be used as interrogator
antenna while the second, shall be used as measurement antenna and shall be connected either to a
spectrum analyser or to an oscilloscope as specified according to Annex D.
6 © ISO/IEC 2011 – All rights reserved

The main lobe axis of these two antennas cross each other with an angle value that shall be lower than 15°.
The tag under test shall be placed at this focal point and oriented for optimum field strength reception.
The distances between the tag and the antennas are d and d respectively (see Figure 4).
T,IA T,MA
The tag backscatter test setup parameters are defined in Table 3.
Table 3 — Tag backscatter setup parameters
Symbol Name Description
d Interrogator antenna to tag distance
T,IA
d Measurement antenna to tag distance
T,MA
G Gain of interrogator antenna The maximum 3 dB beam width shall be ± 35°
IA
G Gain of measurement antenna The maximum 3 dB beam width shall be ± 35°
MA
The residual signal coupling between the two antennas shall be measured in free space, and anechoic or
similar RF absorbing material shall be used between two antennas to increase isolation up to 45 dB when the
value in free space is not better than 45 dB.
L shall be the greater value of the maximum electrical dimension of the Interrogator and Measurement
Antenna.
The spectrum analyser shall be to a RBW of 30 kHz, a VBW of 100 kHz. The minimum span should be at
least 1 MHz or 8 times the data rate, whichever is greater. The frequency analyser shall use max peak
detection.
For this test the tag shall be setup to provide only one modulation frequency. Therefore the tag shall except
for the preamble, only reply with a bit stream of zero data bits.
4.2.2.3 Tag response time
The setup for this test shall be as described in chapter 4.2.2.1.
4.2.2.4 Tag bit rate accuracy test setup
The setup for this test shall be as described in chapter 4.2.2.1.
4.2.2.5 Tag state storage time test setup
The setup for this test shall be as described in chapter 4.2.2.1.
4.2.3 Test apparatus and test circuits for ISO/IEC 18000-6 Type C tags
The DUT shall be a tag including all means in order to be capable to communicate with an interrogator.
For this test the tag shall be placed and oriented for optimum field strength reception in the direction of the
major power radiation of the interrogator in a distance
2 2
2L 2L
d > , d >
T ,IA T ,MA
λ λ
with L being the maximum dimension of the interrogator antenna according to Figure 4.
© ISO/IEC 2011 – All rights reserved 7

5 Conformance tests for ISO/IEC 18000-6 Type A
5.1 Functional tests of interrogator
5.1.1 Interrogator modulation test
5.1.1.1 Test objective
The objective of this test is to verify that the interrogator provides the appropriate modulation waveform
required for operation of tags.
5.1.1.2 Test procedure
The interrogator shall transmit an Init_round_all command at the maximum power allowed under the
regulations of the selected carrier frequency for testing.
In case the interrogator is intended for operation of non-overlapping RF bands, then this test shall be done for
each RF band.
Measurements shall be done with a sense antenna positioned at a distance d = 3 λ and d = 10 λ and for
S S
each operation mode.
A digital oscilloscope as specified in Annex D and the sense antenna shall be used to record the waveform
provided by the interrogator.
5.1.1.3 Test report
The test report shall give the measured values of the parameters according Table 4. The pass/fail condition is
determined whether the measured values are within the requirements as specified in ISO/IEC 18000-6.
Furthermore, the DUT and the sense antenna orientation and position, as well as the used interrogator output
power and the used operation frequency shall be recorded.
Table 4 — Measurements to be made
Parameter Conditions
D Default modulation operation mode
Tapr Default modulation operation mode
Tapf Default modulation operation mode

5.1.2 Interrogator demodulation and turn around time
5.1.2.1 Test objective
The objectives of this test are to verify whether the interrogator is capable of
⎯ demodulating signals from the tags,
⎯ receiving the data transmitted by the tag emulator after the minimum specified turn-around time.
5.1.2.2 Test procedure
The interrogator shall transmit an Init_round_all command (see clause B.1.1) at the maximum power allowed
under the regulations of the selected carrier frequency for testing.
8 © ISO/IEC 2011 – All rights reserved

After the command provided by the interrogator has been sent and after the minimum turn around time, a tag
emulator as specified in Annex F shall transmit a typical response to the Init_round_all command at a
minimum ΔRCS specified in ISO/IEC 18000-6 Tag: 7d. The tag emulator does not need to demodulate the
command, but shall only detect its end to respond after the minimum turn-around time.
When the interrogator is intended for operation of non-overlapping RF bands this test shall be done for each
RF band.
Measurements shall be done with a tag emulator positioned at d = 10 λ for both the minimum and maximum
TE
tag response data rate, i.e. the turn around time from interrogator command to tag response.
In case the interrogator is design for shorter communication distances, then the distance d may be
TE
decreased and the actual used value shall be mentioned in test report.
The interrogator (digital) demodulator shall accept the tag response including verification of the CRC.
5.1.2.3 Test report
The test report shall contain the tag emulator distance to the interrogator and the ΔRCS value setup in the tag
emulator. Furthermore, also the set up turnaround time from the tag emulator, the DUT and the tag emulator
orientation and position, as well as the used interrogator output power and the used operation frequency shall
be recorded.
5.2 Functional tests of tag
5.2.1 Tag demodulation and turn around time
5.2.1.1 Test objective
The objectives of this test are to verify whether the tag is capable of
⎯ demodulating signals from the interrogator,
⎯ receiving the data transmitted by the interrogator after the minimum specified response to command
turn-around time.
5.2.1.2 Test procedure
The test interrogator shall transmit an Init_round_all (see clause B.1.1) command.
The tag (DUT) shall receive the command provided by the interrogator and shall provide an appropriate
response. After complete reception of the tag response the interrogator shall generate a Next_slot command
within the minimum specified turn around time between tag response and interrogator command.
Measurements shall be done by verifying that the tag detected the command appropriately by means of
evaluation of its response. Measurements shall be done at P = 1,2 P or the minimum tag activation power
I I,min
density S for each operation type of the interrogator command data rate.
T,min
The power density S is related to the test interrogator radiated power P as following:
T,min I,min
P = 4πd S
I,min T,IA T,min
G
IA
In case the interrogator is design for shorter communication distances, then the distance d may be
TE
decreased and the actual used value shall be mentioned in test report.
© ISO/IEC 2011 – All rights reserved 9

The test shall be seen as successful, when it could be shown that the tag sent the correct response for both
commands including verification of the CRC.
The interrogator waveform shall contain the setups of the waveform for the respective types according to
Table 5.
Table 5 — Setups of waveforms
Setup number Setup description Parameter setting
A-1 Minimum modulation depth D = Dmin
A-2 Medium modulation depth D = (Dmax + Dmin)/2
A-3 Maximum modulation depth D = Dmax

5.2.1.3 Test report
The test result shall be recorded as successful or unsuccessful. The test report shall contain the tag distance
to the interrogator. Furthermore, also the set up turn around time from the tag response to interrogator
command, the DUT and the interrogator orientation and position, as well as the used interrogator output
power and the used operation frequency shall be recorded.
5.2.2 Tag backscatter
5.2.2.1 Test objective
The objective of this test is to verify that the tag provides the appropriate modulation waveform and
backscatter strength required to be successfully detected and received by the interrogator.
Measurements are carried out in an anechoic chamber in bistatic antennas configuration as shown in
Figure 4, I and Q signals are measured with and without the tag present in the anechoic chamber that allows
measurement of the difference of re-radiated power issued only from the tag, and thus find the ΔRCS.
5.2.2.2 Test procedure
Measurements shall be done with a tag positioned d = 1m and d = 1m away from the interrogator
T,IA T,MA
antenna at a power P
.
I,min
Where P is the minimum power allowing the DUT tag activation.

I,min
A vector signal analyser as specified in Annex E shall be used to record the quadrature baseband voltages I
and Q versus time.
Test setup shall be calibrated to determine antennas gain and mismatch and also cables loss, to be taking
into account for all power measurements.
Delta radar cross-section measurement procedure:
1) The signal generator shall be set to the required test frequency.
2) The signal generator amplitude shall be set to a value that allows the DUT tag activation.
3) Using the power meter determine the power at the entrance of the transmit antenna Pe, which is
defined as the average power measured over at least 100µs period during the co
...