IEC 62228-3:2019

IEC 62228-3 ®
Edition 1.0 2019-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Integrated circuits – EMC evaluation of transceivers –
Part 3: CAN transceivers
Circuits intégrés – Évaluation de la CEM des émetteurs-récepteurs –
Partie 3: Émetteurs-récepteurs CAN

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IEC 62228-3 ®
Edition 1.0 2019-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Integrated circuits – EMC evaluation of transceivers –

Part 3: CAN transceivers
Circuits intégrés – Évaluation de la CEM des émetteurs-récepteurs –

Partie 3: Émetteurs-récepteurs CAN

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.200 ISBN 978-2-8322-6639-7

– 2 – IEC 62228-3:2019 © IEC 2019
CONTENTS
FOREWORD . 6
1 Scope . 8
2 Normative references . 8
3 Terms, definitions and abbreviated terms . 9
3.1 Terms and definitions . 9
3.2 Abbreviated terms . 10
4 General . 10
5 Test and operating conditions . 11
5.1 Supply and ambient conditions. 11
5.2 Test operation modes . 12
5.3 Test configuration . 12
5.3.1 General test configuration for transceiver network . 12
5.3.2 General test configuration for unpowered ESD test . 13
5.3.3 Transceiver network tests – Coupling ports and networks . 14
5.3.4 ESD tests – Coupling ports and networks . 15
5.4 Test signals . 16
5.4.1 General . 16
5.4.2 Test signals for normal operation mode . 16
5.4.3 Test signal for wake-up from low power mode . 18
5.5 Evaluation criteria . 22
5.5.1 General . 22
5.5.2 Evaluation criteria for functional operation modes . 22
5.5.3 Evaluation criteria in unpowered condition after exposure to
disturbances . 28
5.5.4 Status classes . 29
6 Test and measurement . 29
6.1 Emission of RF disturbances . 29
6.1.1 Test method . 29
6.1.2 Test setup . 29
6.1.3 Test procedure and parameters . 30
6.2 Immunity to RF disturbances . 31
6.2.1 Test method . 31
6.2.2 Test setup . 31
6.2.3 Test procedure and parameters . 32
6.3 Immunity to impulses . 37
6.3.1 Test method . 37
6.3.2 Test setup . 37
6.3.3 Test procedure and parameters . 38
6.4 Electrostatic discharge (ESD) . 41
6.4.1 Test method . 41
6.4.2 Test setup . 41
6.4.3 Test procedure and parameters . 43
7 Test report . 44
Annex A (normative) CAN test circuits . 45
A.1 General . 45
A.2 Test circuit for CAN transceivers for functional tests . 45

A.3 Test circuit for CAN transceiver for ESD test . 49
Annex B (normative) Test circuit boards. 51
B.1 Test circuit board for functional tests . 51
B.2 ESD test . 51
Annex C (informative) Examples for test limits for CAN transceiver in automotive
application . 53
C.1 General . 53
C.2 Emission of RF disturbances . 53
C.3 Immunity to RF disturbances . 54
C.4 Immunity to impulses . 57
C.5 Electrostatic discharge (ESD) . 57
Annex D (informative) Characterization of common mode choke for CAN bus
interfaces . 58
D.1 General . 58
D.2 Abbreviations . 58
D.3 CMC test. 58
D.3.1 General . 58
D.3.2 Leakage inductance mismatch measurement . 59
D.3.3 S-parameter measurement mixed mode . 63
D.3.4 ESD damage . 68
D.3.5 Saturation test at RF disturbances . 71
Bibliography . 74

Figure 1 – General test configuration for tests in transceiver network . 13
Figure 2 – General test configuration for unpowered ESD test . 13
Figure 3 – Transceiver network tests – coupling ports and networks . 14
Figure 4 – Coupling ports and networks for ESD tests . 16
Figure 5 – Definition for trigger points and violation masks for CAN transceivers with
flexible data rate capability . 26
Figure 6 – Principal drawing of the maximum deviation on an I-V characteristic . 28
Figure 7 – Test setup for measurement of RF disturbances . 30
Figure 8 – Test setup for DPI tests. 32
Figure 9 – Test setup for impulse immunity tests . 37
Figure 10 – Test setup for direct ESD tests – principal arrangement . 42
Figure 11 – Test setup for direct ESD tests – stimulation and monitoring . 43
Figure A.1 – General drawing of the circuit diagram of test network for CAN standard
transceivers for functional test . 47
Figure A.2 – General drawing of the circuit diagram of test network for CAN PN
transceivers for functional test . 49
Figure A.3 – General drawing of the circuit diagram for direct ESD tests of CAN
transceivers in unpowered mode . 50
Figure B.1 – Example of IC interconnections of CAN signal . 51
Figure B.2 – Example of ESD test board for CAN transceivers . 52
Figure C.1 – Example of limits for RF emission – CAN with bus filter . 53
Figure C.2 – Example of limits for RF emission – other global pins . 54
Figure C.3 – Example of limits for RF emission – local supplies . 54

– 4 – IEC 62228-3:2019 © IEC 2019
Figure C.4 – Example of limits for RF immunity for functional status class A – CAN
IC
with bus filter . 55
Figure C.5 – Example of limits for RF immunity for functional status class A – CAN . 55
IC
Figure C.6 – Example of limits for RF immunity for functional status class A – other
IC
global pins . 56
Figure C.7 – Example of limits for RF immunity for functional status class C or D –
IC IC
CAN with bus filter . 56
Figure C.8 – Example of limits for RF immunity for functional status class C or D –
IC IC
other global pins . 57
Figure D.1 – General electrical drawing of a CMC . 59
Figure D.2 – Test setup for 2-port S-Parameter measurements for leakage inductance

evaluation . 59
Figure D.3 – Example of a two-port test board for CMC leakage inductance
characterization . 60
Figure D.4 – Example of CMC characterization measurement results. 63
Figure D.5 – Test setup for S-Parameter measurements . 64
Figure D.6 – Example test board S-Parameter measurement – mixed mode, top layer . 65
Figure D.7 – Example test board S-Parameter measurement – single ended, top layer . 65
Figure D.8 – Recommended characteristics for S (IL) . 67
dd21
Figure D.9 – Recommended characteristic for S (CMR) . 68
cc21
Figure D.10 – Recommended characteristic for S and S (DCMR) . 68
sd21 sd12
Figure D.11 – Test setup for ESD damage tests . 69
Figure D.12 – Example test board ESD, top layer . 70
Figure D.13 – Test setup for RF saturation measurements . 71
Figure D.14 – Example RF saturation / S-Parameter test board, top layer . 72

Table 1 – Overview of measurements and tests . 11
Table 2 – Supply and ambient conditions for functional operation . 12
Table 3 – Transceiver network tests – component value definitions of coupling ports
and networks . 15
Table 4 – Definitions of coupling ports for ESD tests . 16
Table 5 – Communication test signal TX1 . 17
Table 6 – Communication test signal TX2a . 17
Table 7 – Communication test signal TX2b . 18
Table 8 – Wake-up test signal TX3 . 18
Table 9 – Communication test signal TX4a . 19
Table 10 – Communication test signal TX4b . 19
Table 11 – Communication test signal TX4c . 19
Table 12 – Communication test signal TX4d . 20
Table 13 – Communication test signal TX4e . 20
Table 14 – Communication test signal TX4f1 . 20
Table 15 – Communication test signal TX4f2 . 21
Table 16 – Communication test signal TX4g . 21
Table 17 – Communication test signal TX4h . 21
Table 18 – Communication test signal TX4i . 22

Table 19 – Evaluation criteria for CAN transceiver standard functions . 23
Table 20 – Evaluation criteria for CAN transceivers with partial networking functionality . 23
Table 21 – Specific definition for test procedure for evaluation of CAN transceiver
partial networking function . 24
Table 22 – Evaluation criteria for CAN transceivers with flexible data rate capability. 25
Table 23 – Definitions for violation masks for CAN transceivers with flexible data rate
capability . 27
Table 24 – Definition of functional status classes . 29
Table 25 – Settings of the RF measurement equipment . 31
Table 26 – RF emission measurements . 31
Table 27 – Specifications for DPI tests . 33
Table 28 – DPI tests for functional status class A evaluation of CAN transceiver
IC
standard function . 34
Table 29 – DPI tests for functional status class A evaluation of CAN transceiver
IC
partial networking function . 35
Table 30 – DPI tests for functional status class A evaluation of CAN transceiver
IC
CAN FD function . 36
Table 31 – DPI tests for functional status class C or D evaluation of CAN
IC IC
transceivers . 36
Table 32 – Specifications for impulse immunity tests . 38
Table 33 – Parameters for impulse immunity test . 38
Table 34 – Impulse immunity tests for functional status class A evaluation of CAN
IC
transceiver standard function . 39
Table 35 – Impulse immunity tests for functional status class A evaluation of CAN
IC
transceiver partial networking function . 40
Table 36 – Impulse immunity tests for functional status class A evaluation of CAN
IC
transceiver CAN FD function . 40
Table 37 – Impulse immunity tests for functional status class C or D evaluation of
IC IC
CAN transceivers . 41
Table 38 – Specifications for direct ESD tests . 43
Table 39 – ESD tests in unpowered mode for functional status class D evaluation of
IC
CAN transceivers . 44
Table B.1 – Parameters of ESD test circuit board . 52
Table C.1 – Example of limits for impulse immunity for functional status class C or D . 57
IC IC
Table D.1 – Test procedure and parameters for leakage inductance evaluation . 61
Table D.2 – Leakage inductance measurements . 62
Table D.3 – Leakage inductance mismatch classes . 63
Table D.4 – Test procedure and parameters for 3-port test board characterization . 64
Table D.5 – Test procedure and parameters for S-Parameter measurements . 66
Table D.6 – Required S-Parameter measurements . 67
Table D.7 – Test parameters for ESD damage tests . 70
Table D.8 – Required ESD tests for damage . 71
Table D.9 – Test procedure and parameters for RF saturation tests . 72
Table D.10 – Required RF saturation tests. 73

– 6 – IEC 62228-3:2019 © IEC 2019
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
INTEGRATED CIRCUITS –
EMC EVALUATION OF TRANSCEIVERS –

Part 3: CAN transceivers
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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6) All users should ensure that they have the latest edition of this publication.
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62228-3 has been prepared by subcommittee 47A: Integrated
circuits, of IEC technical committee 47: Semiconductor devices.
This first edition cancels and replaces the first edition of IEC TS 62228 published in 2007 and
constitutes a technical revision.
This edition includes the following significant technical changes with respect to IEC TS 62228:
a) introduction of CAN transceivers with partial networking functionality and CAN
transceivers with flexible data rate capability and addition of operation modes and test
descriptions in the respective subclauses of the document;
b) introduction of minimal communication network with two CAN transceivers;
c) update of the test requirements and targets in Annex C;
d) addition of Annex D for common mode choke characterization.

The text of this standard is based on the following documents:
CDV Report on voting
47A/1050/CDV 47A/1069/RVC
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 62228 series, published under the general title Integrated
circuits – EMC evaluation of transceivers, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC website under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
– 8 – IEC 62228-3:2019 © IEC 2019
INTEGRATED CIRCUITS –
EMC EVALUATION OF TRANSCEIVERS –

Part 3: CAN transceivers
1 Scope
This part of IEC 62228 specifies test and measurement methods for EMC evaluation of CAN
transceiver ICs under network condition. It defines test configurations, test conditions, test
signals, failure criteria, test procedures, test setups and test boards. It is applicable for CAN
standard transceivers, CAN transceivers with partial networking functionality and CAN
transceivers with flexible data rate capability and covers
• the emission of RF disturbances,
• the immunity against RF disturbances,
• the immunity against impulses, and
• the immunity against electrostatic discharges (ESD).
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 61967-1, Integrated circuits – Measurement of electromagnetic emissions – Part 1:
General conditions and definitions
IEC 61967-4, Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to
1 GHz – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method
IEC 62132-1, Integrated circuits – Measurement of electromagnetic immunity – Part 1:
General conditions and definitions
IEC 62132-4, Integrated circuits – Measurement of electromagnetic immunity 150 kHz to
1 GHz – Part 4: Direct RF power injection method
IEC 62215-3, Integrated circuits – Measurement of impulse immunity – Part 3: Non-
synchronous transient injection method
IEC 62228-1, Integrated circuits – EMC evaluation of transceivers – Part 1: General
conditions and definitions
ISO 7637-2, Road vehicles – Electrical disturbances from conduction and coupling – Part 2:
Electrical transient conduction along supply lines only
ISO 10605, Road vehicles – Test methods for electrical disturbances from electrostatic
discharge
ISO 11898-1, Road vehicles – Controller area network (CAN) – Part 1: Data link layer and
physical signalling
ISO 11898-2, Road vehicles – Controller area network (CAN) – Part 2: High speed medium
access unit
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 62228-1,
IEC 61967-1, IEC 62132-1, as well as the following apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1.1
global pin
pin that carries a signal or power, which enters or leaves the application board without any
active component in between
3.1.2
CAN standard transceiver
transceiver with functionality according to ISO 11898-2 with data rates up to 1 MBit/s and
access to RxD and TxD signal
3.1.3
CAN PN transceiver
transceiver with partial networking functionality according to ISO 11898-2 with access to RxD
and TxD signal
3.1.4
CAN FD transceiver
transceiver with flexible data rate capability according to ISO 11898-2 with data rates up to
2 MBit/s or 5 Mbit/s and access to RxD and TxD signal
3.1.5
Low Power – standby
transceiver functional operation mode low power with active bus biasing
3.1.6
Low Power – sleep
transceiver functional operation mode low power with inactive bus biasing
3.1.7
Low Power – PN standby
transceiver functional operation mode low power with active bus biasing and frame detection
active
3.1.8
Low Power – PN sleep
transceiver functional operation mode low power with inactive bus biasing and frame detection
configured
3.1.9
mandatory components, pl
components needed for proper function of IC as specified by the IC manufacturer

– 10 – IEC 62228-3:2019 © IEC 2019
3.2 Abbreviated terms
ASIC application specific integrated circuit
CMC common mode choke
DUT device under test
DPI direct RF power injection
ERR error
FD flexible data rate
INH inhibit
CAN controller area network
PCB printed circuit board
PN partial networking
RxD receive data
SBC system base chip
TxD transmit data
WUF wake-up frame
4 General
The intention of this document is to evaluate the EMC performance of CAN transceivers under
application conditions in a minimal network.
The evaluation of the EMC characteristics of CAN transceivers shall be performed in
functional operation modes under network condition for RF emission, RF immunity and
impulse immunity tests and on a single transceiver for electrostatic discharge tests.
The aim of these tests is to determine the EMC performance on dedicated pins of the CAN
transceiver which are considered as EMC relevant in the application. For a CAN transceiver
IC, these pins are CAN_H, CAN_L, V and WAKE. Depending on the IC and its functionality,
BAT
other pins as for example V should be considered as well.
CC
The test methods used for the EMC characterization are based on the international standards
for IC EMC tests and are described in Table 1.

Table 1 – Overview of measurements and tests
Test Test method Evaluation Functional operation
mode
Normal
150 Ω direct coupling
RF emission (EMI) Spectrum
(IEC 61967-4) a
Low Power – standby
Normal
DPI
a
RF immunity (RF) Function Low Power – standby
(IEC 62132-4)
Transceiver network
a
Low Power – sleep
Normal
Non-synchronous
a
Impulse immunity (IMP) transient injection Function Low Power – standby
(IEC 62215-3)
a
Low Power – sleep
Contact discharge
Single transceiver ESD Damage Unpowered
(ISO 10605)
a
If provided by the implementation.

The 150 Ω direct coupling, DPI and non-synchronous transient injection test methods are
chosen for the evaluation of the EMC characteristic of transceivers in network condition.
These three test methods are based on the same approach using conductive coupling.
Therefore it is possible to use the same test board for all tests in functional operation mode,
which reduces the effort and increases the reproducibility and comparability of test results.
The ESD test is performed on single transceiver on a separate test board.
All measurements and tests should be done with soldered transceivers on special test boards
as described in Annex B to ensure application like conditions and avoid setup effects by
sockets. For automotive applications, test limit examples are described in Annex C.
In general, the test definition is done for stand-alone CAN transceivers. CAN transceiver IP
core embedded in SBCs or ASICs shall follow the test methods for single CAN transceivers,
adapting test conditions and targets as necessary. Such adaptations shall be done
individually for the dedicated IC but shall follow the general definitions.
In order to verify filter effects on the EMC performance of CAN transceivers, configurations
with and without a bus filter (e.g. common mode choke, capacitor) at the CAN_H and CAN_L
pins are defined in this document. As a consequence, the frequency characteristic of these
filter elements shall be taken into account for the interpretation of the test results. See
Annex D for more information about common mode choke characterization.
5 Test and operating conditions
5.1 Supply and ambient conditions
For all tests and measurements under operating conditions, the settings are based on
systems with 12 V power supply, which is the main application of CAN transceivers. If a
transceiver is designed or targeted for other power supply voltages, the test conditions and
test targets shall be adapted and documented accordingly. The defined supply and ambient
conditions for functional operation are given in Table 2.

– 12 – IEC 62228-3:2019 © IEC 2019
Table 2 – Supply and ambient conditions for functional operation
Parameter Value
a
Voltage supply V (14 ± 0,2) V (default)
BAText
a
Voltage supply V
(5 ± 0,1) V (default)
CCext
a
Voltage supply V (3,3 ± 0,1) V (default)
IOext
Test temperature (23 ± 5) °C
a
V means voltage at external terminal on the test board as shown e.g. in Figure A.1.
ext
For RF emission measurements, the ambient noise floor shall be at least 6 dB below the
applied target limit and documented in the test report.
For ESD tests, the requirements of ISO 10605 climatic environmental conditions shall be
applied.
5.2 Test operation modes
The CAN transceivers shall be tested in functional operation modes and unpowered according
to Table 1.
5.3 Test configuration
5.3.1 General test configuration for transceiver network
The test configuration in general consists of CAN transceivers with mandatory external
components and components for filtering and decoupling (CAN node) in a minimal test
network, when filtered power supplies, signals, monitoring probes and coupling networks are
connected as shown in Figure 1.

Figure 1 – General test configuration for tests in transceiver network
For evaluation of RF emission, RF immunity and impulse immunity characteristic of a CAN
transceiver in functional operation mode a minimal CAN test network consisting of two CAN
transceivers of same type shall be used.
NOTE In specific cases or for analyses, a deviation from this setup can be agreed between the users of this
document and noted in the test report.
General drawings of schematics with more details are given in Annex A.
5.3.2 General test configuration for unpowered ESD test
The general test configuration for unpowered ESD test of CAN transceivers consists of a
single CAN transceiver with mandatory external components and components for filtering on a
test board with discharge coupling networks as shown in Figure 2.

Figure 2 – General test configuration for unpowered ESD test

– 14 – IEC 62228-3:2019 © IEC 2019
5.3.3 Transceiver network tests – Coupling ports and networks
The coupling ports and coupling networks are used to transfer disturbances to or from the test
network with a defined transfer characteristic. The schematic of the coupling ports, networks
and pins are shown in Figure 3. The values of the components are depending on the test
method and defined in Table 3. The tolerance of the components shall be 1 % or less. For the
resistors R and R used for symmetrical decoupling, a maximum mismatch of 0,1 % is
CP1a CP1b
recommended.
NOTE Components can be selected by measurement of the value.

Figure 3 – Transceiver network tests – Coupling ports and networks

Table 3 – Transceiver network tests – Component value definitions
of coupling ports and networks
Port Type Purpose Component
R C R
CP1.3 CP1.3 CP1.3t
R = 120 Ω C = 4,7 nF
CP1a CP1a
EMI1 RF emission measurement on CAN R = 51 Ω
CP1t
R = 120 Ω C = 4,7 nF
CP1b CP1b
R = 120 Ω C = 4,7 nF
RF symmetrical coupling for immunity test on CP1a CP1a
RF1 not used
CAN
R = 120 Ω C = 4,7 nF
CP1b CP1b
R = 132 Ω C = 4,7 nF
RF asymmetrical coupling for immunity test CP1a CP1a
CP1 RF1a
not used
on CAN (+ 20 %)
C = 4,7 nF
R = 108 Ω
CP1b
CP1b
R = 108 Ω C = 4,7 nF
RF asymmetrical coupling for immunity test CP1a CP1a
RF1b not used
on CAN (- 20 %)
C = 4,7 nF
R = 132 Ω
CP1b
CP1b
R = 0 Ω C = 1 nF
CP1a CP1a
IMP1 Impulse coupling on CAN not used
C = 1 nF
R = 0 Ω
CP1b
CP1b
EMI2 RF emission measurement on V R = 120 Ω C = 6,8 nF R = 51 Ω
BAT CP2 CP2 CP2t
CP2 RF2 RF coupling for immunity test on V R = 0 Ω C = 6,8 nF not used
BAT CP2 CP2
IMP2 Impulse coupling on V shorted not used
R = 0 Ω
BAT
CP2
EMI3 RF emission measurement on WAKE R = 120 Ω C = 6,8 nF R = 51 Ω
CP3 CP3 CP3t
CP3 RF3 RF coupling for immunity test on WAKE R = 0 Ω C = 6,8 nF not used
CP3 CP3
IMP3 Impulse coupling on WAKE
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