IEC 60747-5-4:2022

IEC 60747-5-4 ®
Edition 2.1 2024-12
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-4: Optoelectronic devices – Semiconductor lasers

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IEC 60747-5-4 ®
Edition 2.1 2024-12
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-4: Optoelectronic devices – Semiconductor lasers
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.01; 31.260 ISBN 978-2-8327-0106-5
REDLINE VERSION – 2 – IEC 60747-5-4:2022+AMD1:2024 CSV
© IEC 2024
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
3.1 Physical concepts . 8
3.2 Types of devices . 9
3.3 General terms . 9
3.4 Terms related to ratings and characteristics . 10
3.4.1 Switching times . 10
3.4.2 Output and current characteristics . 12
3.5 Spatial profiles and spectral characteristics . 15
4 Essential rating and characteristics . 15
4.1 Type . 15
4.2 Semiconductor . 16
4.2.1 Material . 16
4.2.2 Structure . 16
4.3 Details of outline drawing and encapsulation. 16
4.4 Limiting values (absolute maximum ratings over the operating temperature
range, unless otherwise stated) . 16
4.5 Electrical and optical characteristics . 16
4.6 Supplementary information . 18
5 Measurement methods . 18
5.1 Power measurement . 18
5.2 Output stability . 18
5.2.1 Relative intensity noise . 18
5.2.2 Carrier-to-noise ratio . 18
5.2.3 Output power stability . 20
5.2.4 Output energy stability . 20
5.2.5 Temporal pulse shape . 20
5.3 Time domain profile . 20
5.3.1 Switching times . 20
5.3.2 Small signal cut-off frequency (f ) . 22
c
5.4 Lifetime . 22
5.5 Optical characteristics of the laser beam . 23
5.5.1 Polarization . 23
5.5.2 Half-intensity angle θ and 1/e -intensity angle θ 2 . 23
1/2 1/e
5.5.3 Half-intensity width D and 1/e -intensity width D 2 . 25
1/2 1/e
5.5.4 Spectral characteristics and other spatial profile . 26
Annex A (informative) Reference list of technical terms and definitions related to
spatial profile and spectral characteristics . 27
Annex B (informative) Reference list of measurement methods related to spatial
profile and spectral characteristics . 31
Annex C (informative) Reference list of technical terms and definitions, and
measurement methods, related to power measurement and lifetime . 32
Bibliography . 33

© IEC 2024
Figure 1 – Example of the device with window but without lens . 10
Figure 2 – Switching times . 12
Figure 3 – Threshold current of a laser diode . 14
Figure 4 – Basic circuit diagram . 19
Figure 5 – Basic circuits diagram . 21
Figure 6 – Typical pulse response diagram . 22
Figure 7 – Half-intensity angle . 23
Figure 8 – Relationship between the specified plane and the mechanical reference
plane . 23
Figure 9 – Basic measurement setup diagram . 24
Figure 10 – Measuring arrangement for D and D 2 . 25
1/2 1/e
Table 1 – Electrical and optical characteristics . 17

REDLINE VERSION – 4 – IEC 60747-5-4:2022+AMD1:2024 CSV
© IEC 2024
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
Part 5-4: Optoelectronic devices –
Semiconductor lasers
FOREWORD
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This consolidated version of the official IEC Standard and its amendment has been
prepared for user convenience.
IEC 60747-5-4 edition 2.1 contains the second edition (2022-04) [documents 47E/783/FDIS
and 47E/785/RVD] and its amendment 1 (2024-12) [documents 47E/819/CDV and
47E/841/RVC].
In this Redline version, a vertical line in the margin shows where the technical content is
modified by amendment 1. Additions are in green text, deletions are in strikethrough red
text. A separate Final version with all changes accepted is available in this publication.

© IEC 2024
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