IEC 60747-5-4:2022

IEC 60747-5-4 ®
Edition 2.0 2022-04
INTERNATIONAL
STANDARD
Semiconductor devices –
Part 5-4: Optoelectronic devices – Semiconductor lasers
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IEC 60747-5-4 ®
Edition 2.0 2022-04
INTERNATIONAL
STANDARD
Semiconductor devices –
Part 5-4: Optoelectronic devices – Semiconductor lasers

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.01; 31.260 ISBN 978-2-8322-1100-7

– 2 – IEC 60747-5-4:2022 © IEC 2022
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
3.1 Physical concepts . 8
3.2 Types of devices . 9
3.3 General terms . 9
3.4 Terms related to ratings and characteristics . 10
3.4.1 Switching times . 10
3.4.2 Output and current characteristics . 12
3.5 Spatial profiles and spectral characteristics . 15
4 Essential rating and characteristics . 15
4.1 Type . 15
4.2 Semiconductor . 15
4.2.1 Material . 15
4.2.2 Structure . 15
4.3 Details of outline drawing and encapsulation. 16
4.4 Limiting values (absolute maximum ratings over the operating temperature
range, unless otherwise stated) . 16
4.5 Electrical and optical characteristics . 16
4.6 Supplementary information . 18
5 Measurement methods . 18
5.1 Power measurement . 18
5.2 Output stability . 18
5.2.1 Relative intensity noise . 18
5.2.2 Carrier-to-noise ratio . 18
5.2.3 Output power stability . 20
5.2.4 Output energy stability . 20
5.2.5 Temporal pulse shape . 20
5.3 Time domain profile . 20
5.3.1 Switching times . 20
5.3.2 Small signal cut-off frequency (f ) . 22
c
5.4 Lifetime . 22
5.5 Optical characteristics of the laser beam . 23
5.5.1 Polarization . 23
5.5.2 Half-intensity angle θ and 1/e -intensity angle θ 2 . 23
1/2 1/e
5.5.3 Half-intensity width D and 1/e -intensity width D 2 . 25
1/2 1/e
5.5.4 Spectral characteristics and other spatial profile . 26
Annex A (informative) Reference list of technical terms and definitions related to
spatial profile and spectral characteristics . 27
Annex B (informative) Reference list of measurement methods related to spatial
profile and spectral characteristics . 31
Annex C (informative) Reference list of technical terms and definitions, and
measurement methods, related to power measurement and lifetime . 32
Bibliography . 33

Figure 1 – Example of the device with window but without lens . 10
Figure 2 – Switching times . 12
Figure 3 – Threshold current of a laser diode . 14
Figure 4 – Basic circuit diagram . 19
Figure 5 – Basic circuits diagram . 21
Figure 6 – Typical pulse response diagram . 22
Figure 7 – Half-intensity angle . 23
Figure 8 – Relationship between the specified plane and the mechanical reference
plane . 23
Figure 9 – Basic measurement setup diagram . 24
Figure 10 – Measuring arrangement for D and D 2 . 25
1/2 1/e
Table 1 – Electrical and optical characteristics . 17

– 4 – IEC 60747-5-4:2022 © IEC 2022
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
Part 5-4: Optoelectronic devices –
Semiconductor lasers
FOREWORD
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IEC 60747-5-4 has been prepared by subcommittee 47E: Discrete semiconductor devices, of
IEC technical committee 47: Semiconductor devices. It is an International Standard.
This second edition cancels and replaces the first edition published in 2006. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) References for the terms and definitions related to the lighting area, IEC 60050-845, are
revised based on IEC 60050-845:2020;
b) Emission angle is changed to radiation angle in 3.3.2;
c) Definitions of rise time and fall time in 3.4.1 are revised based on the publication IEC 60050-
521:2002;
d) Spectral linewidth is added to Table 1 in Clause 4;
e) Conditions for carrier-to-noise ratio of Table 1 in Clause 4 is amended.

f) Error in the equation for carrier-to-noise ratio in 5.2.2 is corrected;
g) Precaution against the equipment used for carrier-to-noise ratio measurement is added in
5.2.2;
h) Explanation for the measurement method of the small signal cut-off frequency in 5.3.2 of
the first edition is delete
...