IEC 60747-5-5:2007/AMD1:2013

IEC 60747-5-5 ®
Edition 1.0 2013-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
Semiconductor devices – Discrete devices –
Part 5-5: Optoelectronic devices – Photocouplers

Dispositifs à semiconducteurs – Dispositifs discrets –
Partie 5-5: Dispositifs optoélectroniques – Photocoupleurs

IEC 60747-5-5:2007/A1:2013
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite ni
utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie et les
microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur.
Si vous avez des questions sur le copyright de la CEI ou si vous désirez obtenir des droits supplémentaires sur cette
publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.

IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé Fax: +41 22 919 03 00
CH-1211 Geneva 20 info@iec.ch
Switzerland www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.

Useful links:
IEC publications search - www.iec.ch/searchpub Electropedia - www.electropedia.org
The advanced search enables you to find IEC publications The world's leading online dictionary of electronic and
by a variety of criteria (reference number, text, technical electrical terms containing more than 30 000 terms and
committee,…). definitions in English and French, with equivalent terms in
It also gives information on projects, replaced and additional languages. Also known as the International
withdrawn publications. Electrotechnical Vocabulary (IEV) on-line.

IEC Just Published - webstore.iec.ch/justpublished Customer Service Centre - webstore.iec.ch/csc
Stay up to date on all new IEC publications. Just Published If you wish to give us your feedback on this publication
details all new publications released. Available on-line and or need further assistance, please contact the
also once a month by email. Customer Service Centre: csc@iec.ch.

A propos de la CEI
La Commission Electrotechnique Internationale (CEI) est la première organisation mondiale qui élabore et publie des
Normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.

A propos des publications CEI
Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possédez
l’édition la plus récente, un corrigendum ou amendement peut avoir été publié.

Liens utiles:
Recherche de publications CEI - www.iec.ch/searchpub Electropedia - www.electropedia.org
La recherche avancée vous permet de trouver des Le premier dictionnaire en ligne au monde de termes
publications CEI en utilisant différents critères (numéro de électroniques et électriques. Il contient plus de 30 000
référence, texte, comité d’études,…). termes et définitions en anglais et en français, ainsi que
Elle donne aussi des informations sur les projets et les les termes équivalents dans les langues additionnelles.
publications remplacées ou retirées. Egalement appelé Vocabulaire Electrotechnique
International (VEI) en ligne.
Just Published CEI - webstore.iec.ch/justpublished
Service Clients - webstore.iec.ch/csc
Restez informé sur les nouvelles publications de la CEI.
Just Published détaille les nouvelles publications parues. Si vous désirez nous donner des commentaires sur
Disponible en ligne et aussi une fois par mois par email. cette publication ou si vous avez des questions
contactez-nous: csc@iec.ch.
IEC 60747-5-5 ®
Edition 1.0 2013-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
Semiconductor devices – Discrete devices –

Part 5-5: Optoelectronic devices – Photocouplers

Dispositifs à semiconducteurs – Dispositifs discrets –

Partie 5-5: Dispositifs optoélectroniques – Photocoupleurs

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX D
ICS 31.080.01; 31.260 ISBN 978-2-83220-788-8

– 2 – 60747-5-5 Amend. 1 © IEC:2013
FOREWORD
This amendment has been prepared by subcommittee 47E: Discrete semiconductor devices,
of IEC technical committee 47: Semiconductor devices.
The text of this amendment is based on the following documents:
CDV Report on voting
47E/437/CDV 47E/451/RVC
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
_____________
5.2.7 Initial test voltage V , V
pd(ini) ini
Delete the NOTE at the end of this subclause.
7.4.3
Delete the following text below the paragraph “Package construction”:
Periodic testing shall be carried out at the latest 5 years after type testing and shall be
repeated at the latest every 5 years.
Delete the words “and periodic tests” in the sentence “Type tests and periodic tests shall
include at least the following subgroups (7.4.3.1 to 7.4.3.8), with the following conditions:”
above the fourth dashed item.
7.4.3.1 Preconditioning
Add, in the second paragraph, the terms “(IEC 60068-2-20, Test Tb, Method 1A)”, as follows:
Resistance to soldering heat 260 °C ± 5 °C, 5 s ± 1 s
(IEC 60068-2-20, Test Tb, Method 1A)
7.4.3.2.1 Tests
Replace, in the paragraph “Vibration”, the words "Amplitude: 75 mm" by "Amplitude: 0,75 mm".
7.4.3.2.2 Final measurements
Replace, in the paragraph “Apparent charge”, "F = 1,6 or 1,2 (see 5.2.7 c)" by "F = 1,6
(see 5.2.7 c)".
7.4.3.3.2 Final measurements:
Replace, in the paragraph “Apparent charge”, "F = 1,2 or 1,0 (see 5.3.1 a); " by "F = 1,2 (see
5.2.7 c); ".
Table 2 – Tests and test sequence for photocoupler providing protection against
electrical shock
Replace the existing Table 2 by the following new Table 2:

60747-5-5 Amend. 1 © IEC:2013 – 3 –
Table 2 – Tests and test sequence for photocoupler
providing protection against electrical shock
1) Routine test (non-destructive), see 7.4.1
1.1 Apparent charge magnitude at 1,875 V , method b1), b2) or b3), q ≤ 5 pC, V ≤ V

IORM c ini,b ini,a
See 5.2.11
1.2 Parametric test according to manufacturer’s specification

2) Sample test (destructive), n = 20/platform, with minimum n = 80 in total, c = 0, see 7.4.2
2.1 Visual inspection according to manufacturer’s specification see 7.4.3.1

2.2 Resistance to soldering heat see 7.4.3.1
2.3 Appa
...