IEC 60747-5-6:2016

IEC 60747-5-6 ®
Edition 1.0 2016-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices –
Part 5-6: Optoelectronic devices – Light emitting diodes

Dispositifs à semiconducteurs –
Partie 5-6: Dispositifs optoélectroniques – Diodes électroluminescentes

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IEC 60747-5-6 ®
Edition 1.0 2016-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices –
Part 5-6: Optoelectronic devices – Light emitting diodes

Dispositifs à semiconducteurs –

Partie 5-6: Dispositifs optoélectroniques – Diodes électroluminescentes

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.080.99 ISBN 978-2-8322-3209-5

– 2 – IEC 60747-5-6:2016 © IEC 2016
CONTENTS
FOREWORD . 7
1 Scope . 9
2 Normative references. 9
3 Terms and definitions . 10
3.1 General terms and definitions . 10
3.2 Terms and definitions relating to the measurement of the quantity of
radiation . 12
3.3 Terms and definitions relating to the measurement of the photometric
quantity . 14
4 Absolute maximum ratings . 17
5 Electrical and optical characteristics . 18
6 Measuring method . 19
6.1 Basic requirements . 19
6.1.1 Measuring conditions . 19
6.1.2 Measuring instruments and equipment . 20
6.1.3 Essential requirements . 21
6.1.4 General precautions . 21
6.2 Forward voltage (V ) measurement . 22
F
6.2.1 Purpose . 22
6.2.2 Circuit diagram . 22
6.2.3 Requirements . 22
6.2.4 Measurement procedure . 23
6.2.5 Precautions to be observed . 24
6.2.6 Specified conditions . 24
6.3 Reverse voltage (V ) measurement . 24
R
6.3.1 Purpose . 24
6.3.2 Circuit diagram . 24
6.3.3 Measurement procedure . 24
6.3.4 Precautions to be observed . 24
6.3.5 Specified conditions . 25
6.4 Differential resistance (r ) measurement . 25
f
6.4.1 Purpose . 25
6.4.2 Circuit diagram . 25
6.4.3 Requirements . 25
6.4.4 Measurement procedure . 25
6.4.5 Precautions to be observed . 26
6.4.6 Specified conditions . 26
6.5 Reverse current (I ) measurement . 26
R
6.5.1 Purpose . 26
6.5.2 Circuit diagram . 26
6.5.3 Provisions . 27
6.5.4 Measurement procedure . 27
6.5.5 Precautions to be observed . 27
6.5.6 Specified conditions . 27
6.6 Measurement of capacitance between terminals (C ) . 27
t
6.6.1 General . 27

6.6.2 Measurement using LCR meter . 27
6.6.3 Measurement using AC bridge . 28
6.7 Measurement of junction temperature and thermal resistance (R ) . 29
th(j-X)
6.7.1 Purpose . 29
6.7.2 Measurement principle . 29
6.7.3 Measurement procedure . 30
6.7.4 Precautions to be observed . 33
6.8 Response time measurement . 34
6.8.1 Purpose . 34
6.8.2 Circuit diagram . 34
6.8.3 Provisions . 34
6.8.4 Measurement procedure . 34
6.8.5 Precautions to be observed . 35
6.8.6 Specified conditions . 35
6.9 Frequency response and cut-off frequency (f ) measurement . 36
c
6.9.1 Purpose . 36
6.9.2 Circuit diagram . 36
6.9.3 Provisions . 37
6.9.4 Measurement procedure . 37
6.9.5 Precautions to be observed . 38
6.9.6 Specified conditions . 38
6.10 Luminous flux (Φ ) measurement . 38
V
6.10.1 Purpose . 38
6.10.2 Measurement principle . 38
6.10.3 Measuring circuit . 38
6.10.4 Measurement procedure . 39
6.10.5 Precautions to be observed . 39
6.10.6 Measurement conditions to be defined . 40
6.11 Radiant power (Φ ) measurement . 40
e
6.11.1 Purpose . 40
6.11.2 Measurement principle . 40
6.11.3 Measuring circuit . 40
6.11.4 Measurement procedure . 41
6.11.5 Precautions to be observed . 41
6.11.6 Measurement conditions to be defined . 42
6.12 Luminous intensity (I ) measurement . 42
V
6.12.1 Purpose . 42
6.12.2 Measurement principle . 42
6.12.3 Measuring circuit . 43
6.12.4 Measurement procedure . 44
6.12.5 Precautions to be observed . 44
6.12.6 Measurement conditions to be defined . 44
6.13 Radiant intensity (I ) measurement . 44
e
6.13.1 Purpose . 44
6.13.2 Measurement principle . 44
6.13.3 Measuring circuit . 45
6.13.4 Measurement procedure . 45
6.13.5 Measurement conditions to be defined . 45
6.14 Luminance (L ) measurement . 45
v
– 4 – IEC 60747-5-6:2016 © IEC 2016
6.14.1 Purpose . 45
6.14.2 Measuring circuit . 46
6.14.3 Measurement procedure . 46
6.14.4 Measurement conditions to be defined . 46
6.15 Emission spectrum distribution, peak emission wavelength (λ ), and spectral
p
half bandwidth (∆λ) measurement . 47
6.15.1 Purpose . 47
6.15.2 Measuring circuit . 47
6.15.3 Measurement procedure . 48
6.15.4 Measurement conditions to be defined . 48
6.16 Chromaticity measurement . 49
6.16.1 Purpose . 49
6.16.2 Measurement principle . 49
6.16.3 Measuring circuit . 51
6.16.4 Measurement procedure . 51
6.16.5 Measuring conditions to be defined . 51
6.17 Directional characteristics measurement . 51
6.17.1 Purpose . 51
6.17.2 Measuring circuit . 51
6.17.3 Measurement procedure . 52
6.17.4 Measuring conditions to be defined . 53
6.18 Illuminance (E ) measurement . 54
V
6.18.1 Purpose . 54
6.18.2 Measuring circuit . 54
6.18.3 Measurement procedure . 54
6.18.4 Measuring conditions to be defined . 54
7 Items to be indicated on the package . 54
8 Quality evaluation . 55
8.1 Classification of quality evaluations . 55
8.1.1 General . 55
8.1.2 Classification I . 55
8.1.3 Classification II . 55
8.1.4 Classification III . 55
8.1.5 Precautions to be observed . 55
8.2 Quality evaluation test . 60
8.2.1 General . 60
8.2.2 Specimens . 60
8.3 Lot quality inspection . 60
8.3.1 General . 60
8.3.2 Specimens . 60
8.4 Periodical quality inspection . 60
8.4.1 General . 60
8.4.2 Specimens . 60
8.4.3 Inspection period . 60
8.5 Easing of the lot quality inspection standards . 61
8.6 Periodical evaluation maintenance tests . 61
8.6.1 Test items and specimens . 61
8.6.2 Test period . 61
8.7 Long-term storage products . 61

8.8 Continuous current test . 61
8.8.1 General . 61
8.8.2 Initial measurement . 61
8.8.3 Test circuits . 61
8.8.4 Test conditions . 62
8.8.5 Post-treatment . 62
8.8.6 Final measurement . 62
Annex A (normative) Standard luminous efficiency . 63
Annex B (normative) How to obtain the self-absorption correction factor . 66
B.1 Purpose . 66
B.2 LED light sources for self-absorption measurement . 66
B.3 Method . 66
Annex C (normative) How to obtain the colour correction factor . 68
C.1 Purpose . 68
C.2 Method . 68
C.2.1 Luminous flux and luminous intensity measurement . 68
C.2.2 Radiant power and radiant intensity measurement . 69
Annex D (normative) Calibration of the luminance meter . 70
D.1 Purpose . 70
D.2 How to perform the calibration . 70
Annex E (normative) Colour-matching function of the XYZ colour system . 72
Annex F (normative) Spectral chromaticity coordinates . 77
Annex G (normative) Illuminometer calibration . 82
G.1 Purpose . 82
G.2 How to perform the calibration . 82
Bibliography . 83

Figure 1 – Radiant intensity . 12
Figure 2 – Radiance . 13
Figure 3 – Radiant exitance . 14
Figure 4 – Irradiance . 14
Figure 5 – Spectral luminous efficiency . 15
Figure 6 – Circuit diagram for V measurement . 22
F
Figure 7 – Circuit diagram for V measurement with a constant voltage source and a
F
current-limiting resistor . 23
Figure 8 – Circuit diagram for V measurement using an SMU . 23
F
Figure 9 – Circuit diagram for V measurement . 24
R
Figure 10 – circuit diagram for r mesurement . 25
f
Figure 11 – Circuit diagram for I measurement . 26
R
Figure 12 – Circuit diagram for C measurement . 27
t
Figure 13 – Circuit diagram for C measurement . 28
t
Figure 14 – Circuit diagram for measurement of change in V . 30
F
Figure 15 – Waveform of change in V . 32
F
Figure 16 – Transient change in thermal resistance (double-logarithmic plots) . 33
Figure 17 – Circuit diagram for response time measurement . 34
Figure 18 – Waveform of response time measurement . 36

– 6 – IEC 60747-5-6:2016 © IEC 2016
Figure 19 – Circuit diagram for f measurement . 37
c
Figure 20 – Circuit diagram for Φ measurement. 39
V
Figure 21 – circuit diagram for Φ measurement . 41
e
Figure 22 – Schematic diagram for I measurement . 43
V
Figure 23 – Circuit diagram for I measurement . 43
V
Figure 24 – circuit diagram for I measurement . 45
e
Figure 25 – Circuit diagram for L measurement . 46
v
Figure 26 – Circuit diagram for λ measurement . 47
p
Figure 27 – Circuit diagram for λ measurement . 48
p
Figure 28 – Schematic diagram of ∆λ measurement . 48
Figure 29 – Chromaticity . 50
Figure 30 – Circuit diagram for chromaticity measurement . 52
Figure 31 – Directional characteristics (example 1) . 53
Figure 32 – Directional characteristics (example 2) . 53
Figure 33 – Circuit diagram for E measurement. 54
v
Figure 34 – Circuit diagram for continuous current test . 62
Figure B.1 – Schematic diagram for self-absorption measurement . 66
Figure D.1 – Schematic diagrams for calibration . 71
Figure G.1 – Schematic diagram for calibration . 82

Table 1 – Absolute maximum ratings . 18
Table 2 – Electrical and optical characteristics . 19
Table 3 – CIE averaged LED intensity measurements . 43
Table 4 – Items for the screening test and their conditions(reference) . 55
Table 5 – Quality evaluation tests (1 of 2) . 56
Table 6 – Lot quality inspection . 58
Table 7 – Periodical quality inspection . 59
Table A.1 – Definitive values of the spectral luminous efficiency function for photopic
vision V(λ) (1 of 3) . 63
Table E.1 – Colour-matching function of the XYZ colour system (1 of 5) . 72
Table F.1 – Spectral chromaticity coordinates (1 of 5). 77

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
Part 5-6: Optoelectronic devices – Light emitting diodes

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
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interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60747-5-6 has been prepared by subcommittee 47E: Discrete
semiconductor devices, of IEC technical committee 47: Semiconductor devices.
This first edition of IEC 60747-5-6, together with IEC 60747-5-4, IEC 60747-5-5 and
IEC 60747-5-7, cancels and replaces IEC 60747-5-1, IEC 60747-5-2 and IEC 60747-5-3,
published in 1997, and their amendments. This edition constitutes a technical revision.
This edition includes significant technical changes to the clauses for light emitting diodes in
IEC 60747-5-1:1997, IEC 60747-5-2:1997 and IEC 60747-5-3:1997, including their
amendments.
– 8 – IEC 60747-5-6:2016 © IEC 2016
The text of this standard is based on the following documents:
FDIS Rapport de vote
47E/529/FDIS 47E/535/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60747 series, published under the general title Semiconductor
devices, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC website under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
SEMICONDUCTOR DEVICES –
Part 5-6: Optoelectronic devices – Light emitting diodes

1 Scope
This part of IEC 60747 specifies the terminology, the essential ratings and characteristics, the
measuring methods and the quality evaluations of light emitting diodes (LEDs) for general
industrial applications such as signals, controllers, sensors, etc. LEDs for lighting applications
are out of the scope of this part of IEC 60747.
The types of LED are divided into the following five classes:
a) LED package;
b) LED flat illuminator;
c) LED numeric display and alpha-numeric display;
d) LED dot-matrix display;
e) I LED (infrared-emitting diode).
LEDs with a heat spreader or having a terminal geometry that performs the function of a heat
spreader are within the scope of this part of IEC 60747.
An integration of LEDs and controlgears, integrated LED modules, semi-integrated LED
modules, integrated LED lamps or semi-integrated LED lamps, are out of the scope of this
part of IEC 60747.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60051 (all parts), Direct acting indicating analogue electrical measuring instruments and
their accessories
IEC 60068-2-30, Environmental testing – Part 2-30: Tests – Test Db: Damp heat, cyclic
(12 h + 12 h cycle)
IEC 60749-6, Semiconductor devices – Mechanical and climatic test methods – Part 6:
Storage at high temperature
IEC 60749-10, Semiconductor devices – Mechanical and climatic test methods – Part 10:
Mechanical shock
IEC 60749-12, Semiconductor devices – Mechanical and climatic test methods – Part 12:
Vibration, variable frequency
IEC 60749-14, Semiconductor devices – Mechanical and climatic test methods – Part 14:
Robustness of terminations (lead integrity)

– 10 – IEC 60747-5-6:2016 © IEC 2016
IEC 60749-15 Semiconductor devices – Mechanical and climatic test methods – Part 15:
Resistance to soldering temperature for through-hole mounted devices
IEC 60749-20 Semiconductor devices – Mechanical and climatic test methods – Part 20:
Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering
heat
IEC 60749-21 Semiconductor devices – Mechanical and climatic test methods – Part 21:
Solderability
IEC 60749-24 Semiconductor devices – Mechanical and climatic test methods – Part 24:
Accelerated moisture resistance – Unbiased HAST
IEC 60749-25 Semiconductor devices – Mechanical and climatic test methods – Part 25:
Temperature cycling
IEC 60749-36 Semiconductor devices – Mechanical and climatic test methods – Part 36:
Acceleration, steady state
ISO 2859, Sampling procedures for inspection by attributes
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1 General terms and definitions
3.1.1
integrating sphere
hollow sphere whose internal surface is a diffuse reflector, as non-selective as possible
[SOURCE: IEC 60050-845:1987, 845-05-24, modified – The term "Ulbricht sphere" and the
note have been removed.]
3.1.2
diffuse reflector
reflector composed of a surface with diffuse reflection
3.1.3
diffuse reflection
diffusion by reflection in which, on the macroscopic scale, there is no regular reflection
[SOURCE: IEC 60050-845:1987, 845-04-47]
3.1.4
diffuse transmission
diffusion by transmission in which, on the macroscopic scale, there is no regular transmission
[SOURCE: IEC 60050-845:1987, 845-04-48]
3.1.5
diffuse reflectance
R
d
ratio of the diffusely reflected part of the (whole) reflected flux, to the incident flux
Note 1 to entry: R = R + R
r d
Note 2 to entry: The results of the measurements of R and R depend on the instruments and the measuring
r d
techniques used.
[SOURCE: IEC 60050-845:1987, 845-04-62]
3.1.6
diffuse transmittance
T
d
ratio of the diffusely transmitted part of the (whole) transmitted flux, to the incident flux
Note 1 to entry: T = T + T
r d
Note 2 to entry: The results of the measurements of T and T depend on the instruments and the measuring
r d
techniques used.
[SOURCE: IEC 60050-845:1987, 845-04-63]
3.1.7
lambertian surface
ideal surface for which the radiation coming from that surface is distributed angularly
according to Lambert's cosine law
Note 1 to entry: For a lambertian surface, M = πL, where M is the radiant or luminous exitance, and L the radiance
or luminance.
[SOURCE: IEC 60050-845:1987, 845-04-57]
3.1.8
spectral reflectance
R(λ)
ratio between the spectral radiant flux of wavelength λ that is reflected by an object and the
spectral radiant flux of wavelength λ that is absorbed by the object
Note 1 to entry: Spectral reflectance is also known as the “spectral reflection factor.”
3.1.9
spectral transmittance
T(λ)
ratio between the spectral radiant flux of wavelength λ that is transmitted by an object and the
spectral radiant flux of wavelength λ that is absorbed by the object
Note 1 to entry: Spectral transmittance is also known as the “spectral transmittance factor”.
3.1.10
spectral distribution
proportion of the quantum of radiation per unit wavelength included in the micro wavelength
interval centre on wavelength λ, which is expressed as a function of wavelength λ
Note 1 to entry: Spectral distribution is also known as the “spectrum distribution”.
3.1.11
spectral sensitivity
S(λ)
light sensitivity as a function of wavelength
Note 1 to entry: The response output of the optical receiver for the radiant power (or luminous flux) input of
wavelength λ is expressed as a function of wavelength λ.

– 12 – IEC 60747-5-6:2016 © IEC 2016
3.1.12
distribution temperature
temperature of the Planckian radiator whose relative spectral distribution S(λ) is the same or
nearly the same as that of the radiation considered in the spectral range of interest
Note 1 to entry: The unit used is: K.
[SOURCE: IEC 60050-845:1987, 845-04-14]
3.2 Terms and definitions relating to the measurement of the quantity of radiation
3.2.1
radiant energy
Q
e
time integral of the radiant flux Φ over a given duration ∆t
e
Q = Φ dt
e e
∫
∆t
Note 1 to entry: The unit used is: J (1 J = 1 W ⋅ s).
[SOURCE: IEC 60050-845:1987, 845-01-27]
3.2.2
radiant flux
Φ
e
power emitted, transmitted or received in the form of radiation
dQ
e
Φ =
e
dt
Note 1 to entry: The unit used is: W.
[SOURCE: IEC 60050-845:1987, 845-01-24, modified – The formula has been added.]
3.2.3
radiant intensity
I
e
quotient of the radiant flux dΦ leaving the source and propagated in the element of solid
e
angle dΩ containing the given direction, by the element of solid angle
dΦ
e
(dΩ: solid angle)
I =
e
dΩ
Source
dΦ
dΩ I
e
e
IEC
Figure 1 – Radiant intensity
Note 1 to entry: For a rad
...