IEC 60747-5-14:2022

IEC 60747-5-14 ®
Edition 1.0 2022-03
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the
surface temperature based on the thermoreflectance method

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

IEC Secretariat Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform IEC Products & Services Portal - products.iec.ch
The advanced search enables to find IEC publications by a Discover our powerful search engine and read freely all the
variety of criteria (reference number, text, technical publications previews. With a subscription you will always have
committee, …). It also gives information on projects, replaced access to up to date content tailored to your needs.
and withdrawn publications.
Electropedia - www.electropedia.org
IEC Just Published - webstore.iec.ch/justpublished
The world's leading online dictionary on electrotechnology,
Stay up to date on all new IEC publications. Just Published
containing more than 22 300 terminological entries in English
details all new publications released. Available online and once
and French, with equivalent terms in 19 additional languages.
a month by email.
Also known as the International Electrotechnical Vocabulary

(IEV) online.
IEC Customer Service Centre - webstore.iec.ch/csc

If you wish to give us your feedback on this publication or need
further assistance, please contact the Customer Service
Centre: sales@iec.ch.
IEC 60747-5-14 ®
Edition 1.0 2022-03
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the

surface temperature based on the thermoreflectance method

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.99 ISBN 978-2-8322-1085-1

– 2 – IEC 60747-5-14:2022 © IEC 2022
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms, definitions and abbreviated terms . 5
3.1 Terms and definitions . 5
3.2 Abbreviated terms . 7
4 Measuring methods . 7
4.1 Basic requirements . 7
4.1.1 Measuring conditions . 7
4.1.2 Measuring instruments and equipment . 7
4.2 Purpose . 7
4.3 Measurement . 8
4.3.1 Measurement setup . 8
4.3.2 Measurement principle. 9
4.3.3 Measurement sequence . 12
5 Test report . 13
Annex A (informative) Measurement of the thermoreflectance coefficient of a standard
metal film . 15
Annex B (informative) Test example. 16
Annex C (informative) Junction temperatures measured by different methods . 19
Bibliography . 21

Figure 1 – Schematic diagram of the TR setup . 8
Figure 2 – Schematic illustration of measuring the thermoreflectance coefficient,
surface temperature, and junction temperature by the TR effect . 10
Figure 3 – Sequence of the measurement of the junction temperature using the TR
method . 13
Figure A.1 – Experimental result of thermoreflectance coefficient of a standard Au film . 15
Figure B.1 – Photograph of a sample prepared for the junction temperature
measurements . 17
Figure B.2 – Junction temperature measured by the TR method of the sample shown in
Figure B.1 . 17
Figure C.1 – Junction temperature increase with forward current, measured by the
methods of forward voltage, thermocouple, and thermoreflectance of the sample shown
in Figure B.1 . 20

Table 1 – Summary of test report . 14
Table B.1 – Summary of test report in example . 18

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
Part 5-14: Optoelectronic devices – Light emitting diodes –
Test method of the surface temperature based on
the thermoreflectance method
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence between
any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC 60747-5-14 has been prepared by subcommittee 47E: Discrete semiconductor devices, of
IEC technical committee 47: Semiconductor devices. It is an International Standard.
The text of this International Standard is based on the following documents:
Draft Report on voting
47E/773/FDIS 47E/784/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.

– 4 – IEC 60747-5-14:2022 © IEC 2022
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/standardsdev/publications.
A list of all parts in the IEC 60747 series, published under the general title Semiconductor
devices, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The "colour inside" logo on the cover page of this document indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this document using a colour printer.

SEMICONDUCTOR DEVICES –
Part 5-14: Optoelectronic devices – Light emitting diodes –
Test method of the surface temperature based on
the thermoreflectance method
1 Scope
This part of IEC 60747-5 specifies the measuring method of the surface temperature of single
LED die or package, based on the thermoreflectance (TR) method. TR is the effect that the
reflectance of light changes with the temperature of a substance. This part measures relative
change in the reflectance of light from a metal film deposited nearby on the metallurgical pn
junction as the relative change in the LED junction temperature. The surface temperature can
be approximated as the junction temperature when the thermal resistance effect between the
metal surface and the pn junction is negligibly small.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60747-5-6:2021, Semiconductor devices – Part 5-6: Optoelectronic devices – Light emitting
diodes
3 Terms, definitions and abbreviated terms
For the purposes of this document, the terms and definitions given in IEC 60747-5-6 and the
following apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1 Terms and definitions
3.1.1
sample
measurement object consisting of an LED die and a metal (or any reflective) film formed on the
surface of the LED die or package
3.1.2
ambient temperature
T
a
temperature at or near the metal film specified for the purpose of the TR method

–
...