IEC 62899-202:2016

IEC 62899-202 ®
Edition 1.0 2016-02
INTERNATIONAL
STANDARD
Printed electronics –
Part 202: Materials – Conductive ink
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IEC 62899-202 ®
Edition 1.0 2016-02
INTERNATIONAL
STANDARD
Printed electronics –
Part 202: Materials – Conductive ink

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.180; 87.080 ISBN 978-2-8322-3197-5

– 2 – IEC 62899-202:2016 © IEC 2016
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references. 7
3 Terms and definitions . 8
4 Atmospheric conditions for evaluation and conditioning . 10
5 Evaluation of properties of conductive ink . 10
5.1 Specimen . 10
5.2 Contents . 10
5.2.1 Solid content . 10
5.2.2 Non-volatile content . 10
5.2.3 Ash content. 11
5.2.4 Foreign matter . 11
5.3 Physical properties . 12
5.3.1 Density . 12
5.3.2 Rheology . 12
5.3.3 Surface tension . 13
5.3.4 Size of conductive materials . 13
5.3.5 Flashpoint . 15
5.3.6 Evaporation rate . 15
6 Evaluation of the properties of a conductive layer . 16
6.1 Test piece . 16
6.1.1 General . 16
6.1.2 Substrate . 16
6.1.3 Conductive ink . 16
6.1.4 Dimensions of test piece . 16
6.1.5 Preparation of test piece . 16
6.2 Electrical properties . 16
6.2.1 Volume resistivity . 16
6.2.2 Surface resistivity . 21
6.3 Optical properties . 22
6.3.1 Overview . 22
6.3.2 Luminous transmittance . 22
6.3.3 Chromaticity. 22
6.3.4 Uniformity of colour . 23
6.3.5 Haze . 24
6.3.6 Refractive index . 25
7 Storage . 25
7.1 Storage conditions . 25
7.2 Method for measuring aged deterioration . 25
7.3 Report of the results . 25
Annex A (informative) Examples of the four-point probe for applying an appropriate
weight . 26
A.1 Internal structure . 26
A.2 Example of the general view . 26

Annex B (informative) Equation of correction factor F . 27
B.1 General . 27
B.2 Conditions for correction factor F . 27
B.3 Equation of correction factor F . 28
Annex C (informative) Influence of the measuring position and the size of specimen on
resistance . 29
C.1 Influence of the measuring position on resistance . 29
C.2 Influence of the size of the specimen on resistance . 29
Bibliography . 31

Figure 1 – Example of four-point probe measurement . 17
Figure 2 – Example of four-probe measurement equipment . 17
Figure 3 – Measuring positions of resistance (Type A) . 19
Figure 4 – Measuring positions of resistance (Type B) . 19
Figure 5 – Measuring positions of resistance (Type C) . 20
Figure A.1 – Example of the internal structure of probe . 26
Figure A.2 – Example of the general view of the probe . 26
Figure B.1 – Schematic diagram of the geometry of the conductive layer and the
configuration of probes A, B, C, and D . 27
Figure C.1 – Measurement model for the influence of the measuring position on sheet
resistance . 29
Figure C.2 – Model measurement of the influence of the specimen size . 30

Table 1 – Resistance range of the test piece and the applied current . 18
Table 2 – List of the size of the specimen . 18

– 4 – IEC 62899-202:2016 © IEC 2016
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PRINTED ELECTRONICS –
Part 202: Materials – Conductive ink

FOREWORD
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