IEC 62215-3:2013

IEC 62215-3 ®
Edition 1.0 2013-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Integrated circuits – Measurement of impulse immunity –
Part 3: Non-synchronous transient injection method

Circuits intégrés – Mesure de l'immunité aux impulsions –
Partie 3: Méthode d'injection de transitoires non synchrones

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IEC 62215-3 ®
Edition 1.0 2013-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Integrated circuits – Measurement of impulse immunity –

Part 3: Non-synchronous transient injection method

Circuits intégrés – Mesure de l'immunité aux impulsions –

Partie 3: Méthode d'injection de transitoires non synchrones

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX V
ICS 31.200 ISBN 978-2-8322-0994-3

– 2 – 62215-3 © IEC:2013
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 General . 8
5 Coupling networks . 9
5.1 General on coupling networks . 9
5.2 Supply injection network . 9
5.2.1 Direct injection . 9
5.2.2 Capacitive coupling . 10
5.3 Input injection . 10
5.4 Output injection . 11
5.5 Simultaneous multiple pin injection . 12
6 IC configuration and evaluation . 12
6.1 IC configuration and operating modes . 12
6.2 IC monitoring . 13
6.3 IC performance classes . 13
7 Test conditions . 14
7.1 General . 14
7.2 Ambient electromagnetic environment . 14
7.3 Ambient temperature . 14
7.4 IC supply voltage . 14
8 Test equipment . 14
8.1 General requirements for test equipment . 14
8.2 Cables . 14
8.3 Shielding . 14
8.4 Transient generator . 14
8.5 Power supply . 14
8.6 Monitoring and stimulation equipment . 14
8.7 Control unit . 15
9 Test set up . 15
9.1 General . 15
9.2 EMC test board . 15
10 Test procedure . 17
10.1 Test plan . 17
10.2 Test preparation . 17
10.3 Characterization of coupled impulses . 17
10.4 Impulse immunity measurement . 17
10.5 Interpretation and comparison of results . 18
10.6 Transient immunity acceptance level . 18
11 Test report . 18
Annex A (informative) Test board recommendations . 19
Annex B (informative) Selection hints for coupling and decoupling network values . 24
Annex C (informative) Industrial and consumer applications . 26
Annex D (informative) Vehicle applications . 29

62215-3 © IEC:2013 – 3 –
Figure 1 – Typical pin injection test implementation . 9
Figure 2 – Supply pin direct injection test implementation . 10
Figure 3 – Supply pin capacitive injection test implementation . 10
Figure 4 – Input pin injection test implementation . 11
Figure 5 – Output pin injection test implementation . 12
Figure 6 – Multiple pin injection test implementation . 12
Figure 7 – Test set-up diagram . 15
Figure 8 – Example of the routing from the injection port to a pin of the DUT . 16
Figure A.1 – Typical EMC test board topology. 22
Figure A.2 – Example of implementation of multiple injection structures . 23

Table A.1 – Position of vias over the board . 19
Table C.1 – Definition of pin types . 26
Table C.2 – Test circuit values . 27
Table C.3 – Example of IC impulse test level (IEC 61000-4-4) . 28
Table D.1 – IC pin type definition . 29
Table D.2 – Transient test level 12 V (ISO 7637-2) . 30
Table D.3 – Transient test level 24 V (ISO 7637-2) . 31
Table D.4 – Example of transient test specification . 32

– 4 – 62215-3 © IEC:2013
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
INTEGRATED CIRCUITS –
MEASUREMENT OF IMPULSE IMMUNITY –

Part 3: Non-synchronous transient injection method

FOREWORD
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...