IEC 60115-9-1:2003

IEC 60115-9-1 ®
Edition 1.0 2003-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed resistors for use in electronic equipment –
Part 9-1: Blank detail specification: Fixed surface mount resistor networks with
individually measurable resistors – Assessment level EZ

Résistances fixes utilisées dans les équipements électroniques –
Partie 9-1: Spécification particulière cadre: Réseaux de résistances fixes montés
en surface avec des résistances mesurables individuellement – Niveau
d'assurance EZ
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IEC 60115-9-1 ®
Edition 1.0 2003-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed resistors for use in electronic equipment –

Part 9-1: Blank detail specification: Fixed surface mount resistor networks with

individually measurable resistors – Assessment level EZ

Résistances fixes utilisées dans les équipements électroniques –

Partie 9-1: Spécification particulière cadre: Réseaux de résistances fixes montés

en surface avec des résistances mesurables individuellement – Niveau

d'assurance EZ
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX L
ICS 31.040.10 ISBN 978-2-83220-351-4

– 2 – 60115-9-1  IEC:2003
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 9-1: Blank detail specification:
Fixed surface mount resistor networks
with individually measurable resistors –
Assessment level EZ
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
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transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
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5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60115-9-1 has been prepared by IEC technical committee 40:
Capacitors and resistors for electronic equipment.
This bilingual version (2012-09) corresponds to the monolingual English version, published in
2003-10.
The text of this standard is based on the following documents:
FDIS Report on voting
40/1345/FDIS 40/1367/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.

60115-9-1  IEC:2003 – 3 –
The French version of this standard has not been voted upon.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
– 4 – 60115-9-1  IEC:2003
INTRODUCTION
Blank detail specification
A blank detail specification is a supplementary document to the sectional specification and
contains requirements for style, layout and minimum content of detail specifications. Detail
specifications not complying with these requirements may not be considered as being in
accordance with IEC specifications nor shall they be so described.
In the preparation of detail specifications the content of 1.4 of the sectional specification shall
be taken into account.
The numbers between square brackets on the first page of the detail specification correspond
to the following information which shall be inserted in the position indicated.
Identification of the detail specification
[1] The "International Electrotechnical Commission" or the National Standards Organization
under whose authority the detail specification is drafted.
[2] The IEC or National Standards number of the detail specification, date of issue and any
further information required by the national system.
[3] The number and issue number of the IEC or national generic specification.
[4] The IEC number of the blank detail specification.
Identification of the resistor network
[5] A short description of the type of resistor network.
[6] Information on typical construction (when applicable).
[7] Outline drawing with main dimensions which are of importance for interchangeability
and/or reference to the national or international documents for outlines. Alternatively, this
drawing may be given in an annex to the detail specification.
[8] Application or group of applications covered and/or assessment level.
[9] Reference data on the most important properties, to allow comparison between the
various resistor network types.

60115-9-1  IEC:2003 – 5 –
IEC 60115-9-1-XXX  [2]
[1]
QC 400701XXXXXX
ELECTRONIC COMPONENTS OF ASSESSED
IEC 60115-9-1 [4]
QUALITY IN ACCORDANCE WITH:
QC 400701
[3]
FIXED SURFACE MOUNT
RESISTOR NETWORKS WITH [5]
INDIVIDUALLY MEASURABLE
Outline drawing: (see Table 1)
RESISTORS
(. angle projection)
[7]
[6]
(Other shapes are permitted within the dimensions

given)
Assessment level: EZ [8]
NOTE For [1] to [9]: see previous page.

Information on the availability of components qualified to
[9]
this detail specification is given in the IEC QC 001005

– 6 – 60115-9-1  IEC:2003
FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 9-1: Blank detail specification:
Fixed surface mount resistor networks
with individually measurable resistors –
Assessment level EZ
1 General data
1.1 Dimensions, ratings and characteristics
Table 1 – Styles related to dimensions, ratings and characteristics
Style Rated Rated Limiting Insulation Insulation Dimensions
element network element voltage voltage
between
dissipation dissipation voltage against mm
a)
at 70 °C (DC or AC ambient neighbouring
at 70 °C
r.m.s.) resistors L W T A B P …

V V V
W
W
a)
The detail specification shall specify the conditions under which the rated dissipation applies.

Resistance range
… Ω to … Ω
Tolerances on rated resistance
± … %
Climatic category
−/−/−/
Stability class
… %
Limits for change of resistance:
− for long-term tests ±(… %R + … Ω)
− for short-term tests ±(… %R + … Ω)
–6
Temperature coefficient
α: …10 /K
___________
The preferred values are those of the E24 and E96 series of IEC 60063.

60115-9-1  IEC:2003 – 7 –
1.1.1 Derating
Resistors covered by this specification are derated according to the following curve:

(A suitable curve to be included
in the detail specification)
NOTE See also 2.2.3 of the sectional specification.
1.2 Recommended method(s) of mounting (to be inserted)
(See 1.4.2 of IEC 60115-9.)
1.3 Related documents
Generic specification
IEC 60115-1:1999, Fixed resistors for use in electronic equipment – Part 1: Generic
specification
Sectional specification
IEC 60115-9:2003, Fixed resistors for use in electronic equipment – Part 9: Sectional
specification: Fixed surface mount resistor networks with individually measurable resistors
1.4 Marking
The marking of the resistors and the package shall be in accordance with the requirements of
2.4 of IEC 60115-1 and 1.4.5 of IEC 60115-9.
The details of the marking of the component and packaging shall be given in full in the detail
specification.
1.5 Ordering information
Orders for resistors covered by this specification shall contain, in clear or in coded form, the
following minimum information:
a) rated element resistance;
b) tolerance on rated resistance;
c) number and issue reference of the detail specification and style reference;
d) packaging instructions.
1.6 Certified records of released lots
Required/non required.
1.7 Additional information (not for inspection purposes)
1.8 Additional or increased severities or requirements to those specified in the
generic and/or sectional specification
NOTE Additions or increased requirements should be specified only when essential.

– 8 – 60115-9-1  IEC:2003
2 Inspection requirements
2.1 Procedures
2.1.1 For qualification approval, the procedure shall be in accordance with 3.2 of
IEC 60115-9.
2.1.2 For quality conformance inspection, the test schedule (Table 2) includes sampling,
periodicity, severities and requirements. The formation of inspection lots is covered by 3.3.1
of IEC 60115-9.
The following list applies to the test schedules developed in Table 2 and Table 3.
a) Subclause numbers of tests and performance requirements refer to the generic
specification, IEC 60115-1, except for resistance change requirements, which shall be
selected from Table 3 of IEC 60115-9, as appropriate.
b) Number to be tested: sample size as directly allotted to the code letter for IL in Table IIA
of IEC 60410 (single sampling plan for normal inspection).
p
c) In these tables: is the periodicity (in months)
n
is the sample size
c
is the acceptance criterion (permitted number of non-conforming items)
D indicates a destructive test
ND indicates a non-destructive test
IL
is the inspection level
d) 100 % testing shall be followed by re-inspection by sampling in order to monitor outgoing
quality level by non-conforming items per million (ppm). The sampling level shall be
–6
established by the manufacturer. For the calculation of × 10 values, any parametric
failure shall be counted as a non-conforming item. In case one or more non-conforming
items occur in a sample, this lot shall be rejected.
e) If one non-conforming item is obtained, all the tests of the subgroup shall be repeated on
a new sample and then no further non-conforming items are permitted. Release of product
may continue during repeat testing.

60115-9-1  IEC:2003 – 9 –
Table 2 – Test schedule for quality conformance inspection: lot-by-lot
Subclause number D Conditions of test IL n c Performance
and test or requirements
ND
(see 2.1.2, list item
(see 2.1.2, list item a of (see 2.1.2, list item a of this (see 2.1.2, list item a of
c of this
this specification) specification) this specification)
specification)
GROUP A INSPECTION
(lot-by-lot)
100 %
Subgroup A0 ND
(see 2.1.2, list item
d of this As in 4.5.2
4.5 Resistance
specification)
1)
Subgroup A1 ND S-4 0
4.4.1 Visual examination As in 4.4.1
4.4.2 Dimensions As specified in the detail
(gauging) specification
GROUP B INSPECTION
(lot-by-lot)
1)
Subgroup B1 ND S-3 0
4.7 Voltage proof As in 4.7.3
Method: …
(insulated resistors
only)
Insulation resistance ≥ 100 MΩ
(insulated resistors only)
Voltage proof
Voltage: … V As in 4.7.3
between
neighbouring
resistors
1)
Subgroup B2 D S-3 0
4.17 Solderability Aging, if applicable As in 4.17.5
1)
Subgroup B3 D S-3 0
4.31 Mounting Substrate material and
spacing: see 2.3.2 of
IEC 60115-9
4.13 Overload (in the The applied voltage shall be
mounted state) 2,5 times the rated voltage
or twice the limiting element
voltage, whichever is the
less severe
Duration: 2 s
Visual examination  No visible damage
Resistance
∆R ≤ ±(… %R + … Ω)
4.30 Solvent resistance Legible marking
Solvent: …
of the marking
Solvent temperature: …
(if applicable)
Method 1
Rubbing material: cotton
wool
Recovery: …
1)
See 2.1.2, list item b of this specification.

– 10 – 60115-9-1  IEC:2003
Table 3 – Test schedule for quality conformance inspection: periodic
Subclause number D Conditions of test Sample size Performance
and test or & criterion of requirements

ND acceptability
(see 2.1.2, list item a of (see 2.1.2, list item a of this (see 2.1.2, list item (see 2.1.2, list item a of
this specification) specification) c of this this specification)
specification)
1)
p n c
GROUP C INSPECTION
(periodic)
Subgroup C1 D 3 20 0
4.31 Mounting Substrate material: …
4.33 Substrate bending Resistance ∆R ≤ ±(…%R + … Ω)
test
4.33.6 Final Inspection Visual examination  No visible damage
Subgroup C2 D 3 20 0
4.18 Resistance to Visual examination As in 4.18.3
soldering heat
Resistance ∆R ≤ ±(…%R + … Ω)
4.29 Component solvent
Solvent: … See detail specification
resistance
Solvent temperature: …
Method 2
Recovery: …
Subgroup C3 D 3 20 0
4.31 Mounting
Substrate material: …
4.32 Shear Visual examination No visible damage
4.19 Rapid change of T : Lower category
A
temperature
temperature
T : Upper category
B
temperature
Visual examination  No visible damage
Resistance ∆R ≤ ±(…%R + … Ω)
4.23 Climatic sequence
- Dry heat
- Damp heat, cyclic,
Test Db, first cycle
- Cold
- Damp heat, cyclic,
Test Db,
remaining cycles
- DC load
Visual examination  No visible damage
Resistance ∆R ≤ ±(…%R + … Ω)
Subgroup C4 D 3 20 0
4.31 Mounting Substrate material: …
Spacing as in 2.3.2 of
IEC 60115-9
Duration: 1 000 h
4.25.1 Endurance at 70 °C Examination at 48 h, 500 h
and 1 000 h:
No visible damage
Visual examination
Resistance ∆R ≤ ±(…%R + … Ω)
60115-9-1  IEC:2003 – 11 –
Table 3 – Test schedule for quality conformance inspection
...