IEC 61000-4-3:2006
(Main)Electromagnetic compatibility (EMC) - Part 4-3 : Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test
Electromagnetic compatibility (EMC) - Part 4-3 : Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test
Is applicable to the immunity requirements of electrical and electronic equipment to radiated electromagnetic energy. It establishes test levels and the required test procedures. The object of this standard is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to radiated, radio-frequency electromagnetic fields. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. This part deals with immunity tests related to the protection against RF electromagnetic fields from any source. Particular considerations are devoted to the protection against radio-frequency emissions from digital radiotelephones and other RF emitting devices. It has the status of a basic EMC publication.
Compatibilité électromagnétique (CEM) - Partie 4-3 : Techniques d'essai et de mesure - Essai d'immunité aux champs électromagnétiques rayonnés aux fréquences radioélectriques
Traite de l'immunité des matériels électriques et électroniques à l'énergie électromagnétique rayonnée. Elle définit les niveaux d'essai et les procédures d'essai nécessaires. Cette norme a pour objet d'établir une référence commune d'évaluation des performances des matériels électriques et électroniques soumis à des champs électromagnétiques aux fréquences radioélectriques. La méthode d'essai documentée dans cette partie de la CEI 61000 décrit une méthode cohérente afin d'évaluer l'immunité d'un équipement ou d'un système vis-à-vis d'un phénomène défini. La présente partie traite des essais d'immunité relatifs à la protection contre les champs électromagnétiques RF de quelque source qu'ils soient. Des considérations particulières sont consacrées à la protection contre les émissions aux fréquences radioélectriques des radiotéléphones numériques et d'autres dispositifs d'émission RF. A le statut de publication fondamentale en CEM.
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IEC 61000-4-3
Edition 3.0 2006-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-3: Testing and measurement techniques – Radiated, radio-frequency,
electromagnetic field immunity test
Compatibilité électromagnétique (CEM) –
Partie 4-3: Techniques d'essai et de mesure – Essai d'immunité aux champs
électromagnétiques rayonnés aux fréquences radioélectriques
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by
any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or
IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.
Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur.
Si vous avez des questions sur le copyright de la CEI ou si vous désirez obtenir des droits supplémentaires sur cette
publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.
IEC Central Office
3, rue de Varembé
CH-1211 Geneva 20
Switzerland
Email: inmail@iec.ch
Web: www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
ƒ Catalogue of IEC publications: www.iec.ch/searchpub
The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,…).
It also gives information on projects, withdrawn and replaced publications.
ƒ IEC Just Published: www.iec.ch/online_news/justpub
Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available
on-line and also by email.
ƒ Electropedia: www.electropedia.org
The world's leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions
in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical
Vocabulary online.
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Centre FAQ or contact us:
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A propos de la CEI
La Commission Electrotechnique Internationale (CEI) est la première organisation mondiale qui élabore et publie des
normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.
A propos des publications CEI
Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possédez
l’édition la plus récente, un corrigendum ou amendement peut avoir été publié.
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Le premier dictionnaire en ligne au monde de termes électroniques et électriques. Il contient plus de 20 000 termes et
définitions en anglais et en français, ainsi que les termes équivalents dans les langues additionnelles. Egalement appelé
Vocabulaire Electrotechnique International en ligne.
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IEC 61000-4-3
Edition 3.0 2006-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-3: Testing and measurement techniques – Radiated, radio-frequency,
electromagnetic field immunity test
Compatibilité électromagnétique (CEM) –
Partie 4-3: Techniques d'essai et de mesure – Essai d'immunité aux champs
électromagnétiques rayonnés aux fréquences radioélectriques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
XA
CODE PRIX
ICS 33.100.20 ISBN 2-8318-8487-X
Publication IEC 61000-4-3 (Edition 3.0 – 2008) I-SH 01
Electromagnetic compatibility (EMC) – Part 4-3: Testing and measurement
techniques – Radiated, radio-frequency, electromagnetic
field immunity test
INTERPRETATION SHEET 1
This interpretation sheet has been prepared by SC 77B: High frequency phenomena, of IEC
technical committee 77: Electromagnetic compatibility.
The text of this interpretation sheet is based on the following documents:
ISH Report on voting
77B/568/ISH 77B/573/RVD
Full information on the voting for the approval of this interpretation sheet can be found in the
report on voting indicated in the above table.
___________
IEC 61000-4-3 contains quick checks embedded in the field calibration process (subclause
6.2), in which the operator tests whether the amplifier is able to produce the desired RF power
without saturation.
Step j) of the calibration process as per 6.2.1 describes this check for the constant field
strength calibration method:
j) Confirm that the test system (e.g. the power amplifier) is not in saturation. Assuming
that E has been chosen as 1,8 times E, perform the following procedure at each
C t
calibration frequency:
j-1) Decrease the output from the signal generator by 5,1 dB from the level needed to
establish a forward power of P , as determined in the above steps (-5,1 dB is the same
C
as E /1,8);
C
j-2) Record the new forward power delivered to the antenna;
j-3) Subtract the forward power measured in step j-2 from P . If the difference is between
C
3,1 and 5,1 dB, then the amplifier is not saturated and the test system sufficient for
testing. If the difference is less than 3,1 dB, then the amplifier is saturated and is not
suitable for testing.
The corresponding check within the constant power calibration method as per 6.2.2 is defined
as step m):
m) Confirm that the test system (e. g. the power amplifier) is not in saturation. Assuming
that E has been chosen as 1,8 times E, perform the following procedure at each
C t
calibration frequency:
m-1) Decrease the output from the signal generator by 5,1 dB from the level needed to
establish a forward power of P , as determined in the above steps (-5,1 dB is the same
C
as E /1,8);
C
- 2 -
m-2) Record the new forward power delivered to the antenna;
m-3) Subtract the forward power measured in step m-2 from P . If the difference is between
C
3,1 dB and 5,1 dB, then the amplifier is not saturated and the test system is sufficient
for testing. If the difference is less than 3,1 dB, then the amplifier is saturated and is not
suitable for testing.
Some amplifiers show deviations of more than 5,1 dB without causing any problems during
testing. That behaviour is caused by their special functional principle (above all travelling
wave tube amplifiers). Figures 1 and 2 show some measurement results obtained from a
semiconductor amplifier as well as from a TWT amplifier.
The text described in j-3, respectively m-3, unfortunately gives no clear answers on the
usability of these amplifiers.
th
After discussion at the 20 meeting of SC 77B/WG 10 on October, 22 - 26, 2007, the experts
of WG 10 unanimously expressed their opinion that j-3 and m-3 are to be interpreted such that
amplifiers showing a deviation of more than 5,1 dB are suitable for testing. E.g. the amplifiers
having a characteristic as shown in Figures 1 and 2 can be used to perform tests according to
IEC 61000-4-3.
1 000 1 100 1 200 1 300 1 400 1 500 1 600 1 700 1 800
Frequency (MHz)
IEC 1342/08
Target field strength is 30 V/m.
Figure 1 – Deviation as defined in step j-3 for a 200 W TWT-amplifier
Deviation (dB)
- 3 -
7,5
7,0
6,5
6,0
5,5
5,0
4,5
4,0
3,5
3,0
2,5
80 100 200 300 400 500 800 1 000
Frequency (MHz)
IEC 1343/08
Figure 2 – Deviation as defined in step j-3 for a semiconductor amplifier
___________
August 2008
Amplifier saturation
61000-4-3 IEC:2006 –– 2 – 3 – 61000-4-3 © IEC:2006
CONTENTS
FOREWORD.4
INTRODUCTION.6
1 Scope and object.7
2 Normative references .7
3 Terms and definitions .8
4 General .11
5 Test levels.11
5.1 Test levels related to general purposes .12
5.2 Test levels related to the protection against RF emissions from digital radio
telephones and other RF emitting devices .12
6 Test equipment.13
6.1 Description of the test facility .13
6.2 Calibration of field .14
7 Test setup .19
7.1 Arrangement of table-top equipment.19
7.2 Arrangement of floor-standing equipment .19
7.3 Arrangement of wiring .20
7.4 Arrangement of human body-mounted equipment.20
8 Test procedure .20
8.1 Laboratory reference conditions .20
8.2 Execution of the test.21
9 Evaluation of test results .22
10 Test report.22
Annex A (informative) Rationale for the choice of modulation for tests related to the
protection against RF emissions from digital radio telephones .31
Annex B (informative) Field generating antennas .36
Annex C (informative) Use of anechoic chambers .37
Annex D (informative) Amplifier non-linearity and example for the calibration
procedure according to 6.2 .40
Annex E (informative) Guidance for product committees on the selection of test levels .45
Annex F (informative) Selection of test methods .48
Annex G (informative) Description of the environment.49
Annex H (normative) Alternative illumination method for frequencies above 1 GHz
(“independent windows method”) .54
61000-4-3 IEC:2006 –– 3 – 5 –
61000-4-3 © IEC:2006
Figure 1 – Definition of the test level and the waveshapes occurring at the output of
the signal generator .24
Figure 2 – Example of suitable test facility .25
Figure 3 – Calibration of field.26
Figure 4 – Calibration of field, dimensions of the uniform field area .27
Figure 5 – Example of test setup for floor-standing equipment .28
Figure 6 – Example of test setup for table-top equipment.29
Figure 7 – Measuring setup .
...
IEC 61000-4-3
Edition 3.1 2008-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-3: Testing and measurement techniques – Radiated, radio-frequency,
electromagnetic field immunity test
Compatibilité électromagnétique (CEM) –
Partie 4-3: Techniques d'essai et de mesure – Essai d'immunité aux champs
électromagnétiques rayonnés aux fréquences radioélectriques
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by
any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or
IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.
Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur.
Si vous avez des questions sur le copyright de la CEI ou si vous désirez obtenir des droits supplémentaires sur cette
publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.
IEC Central Office
3, rue de Varembé
CH-1211 Geneva 20
Switzerland
Email: inmail@iec.ch
Web: www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
ƒ Catalogue of IEC publications: www.iec.ch/searchpub
The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,…).
It also gives information on projects, withdrawn and replaced publications.
ƒ IEC Just Published: www.iec.ch/online_news/justpub
Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available
on-line and also by email.
ƒ Electropedia: www.electropedia.org
The world's leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions
in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical
Vocabulary online.
ƒ Customer Service Centre: www.iec.ch/webstore/custserv
If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service
Centre FAQ or contact us:
Email: csc@iec.ch
Tel.: +41 22 919 02 11
Fax: +41 22 919 03 00
A propos de la CEI
La Commission Electrotechnique Internationale (CEI) est la première organisation mondiale qui élabore et publie des
normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.
A propos des publications CEI
Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possédez
l’édition la plus récente, un corrigendum ou amendement peut avoir été publié.
ƒ Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm
Le Catalogue en-ligne de la CEI vous permet d’effectuer des recherches en utilisant différents critères (numéro de référence,
texte, comité d’études,…). Il donne aussi des informations sur les projets et les publications retirées ou remplacées.
ƒ Just Published CEI: www.iec.ch/online_news/justpub
Restez informé sur les nouvelles publications de la CEI. Just Published détaille deux fois par mois les nouvelles
publications parues. Disponible en-ligne et aussi par email.
ƒ Electropedia: www.electropedia.org
Le premier dictionnaire en ligne au monde de termes électroniques et électriques. Il contient plus de 20 000 termes et
définitions en anglais et en français, ainsi que les termes équivalents dans les langues additionnelles. Egalement appelé
Vocabulaire Electrotechnique International en ligne.
ƒ Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm
Si vous désirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du
Service clients ou contactez-nous:
Email: csc@iec.ch
Tél.: +41 22 919 02 11
Fax: +41 22 919 03 00
IEC 61000-4-3
Edition 3.1 2008-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-3: Testing and measurement techniques – Radiated, radio-frequency,
electromagnetic field immunity test
Compatibilité électromagnétique (CEM) –
Partie 4-3: Techniques d'essai et de mesure – Essai d'immunité aux champs
électromagnétiques rayonnés aux fréquences radioélectriques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CR
CODE PRIX
ICS 33.100.20 ISBN 2-8318-9550-2
Publication IEC 61000-4-3 (Edition 3.0 – 2008) I-SH 01
Electromagnetic compatibility (EMC) – Part 4-3: Testing and measurement
techniques – Radiated, radio-frequency, electromagnetic
field immunity test
INTERPRETATION SHEET 1
This interpretation sheet has been prepared by SC 77B: High frequency phenomena, of IEC
technical committee 77: Electromagnetic compatibility.
The text of this interpretation sheet is based on the following documents:
ISH Report on voting
77B/568/ISH 77B/573/RVD
Full information on the voting for the approval of this interpretation sheet can be found in the
report on voting indicated in the above table.
___________
IEC 61000-4-3 contains quick checks embedded in the field calibration process (subclause
6.2), in which the operator tests whether the amplifier is able to produce the desired RF power
without saturation.
Step j) of the calibration process as per 6.2.1 describes this check for the constant field
strength calibration method:
j) Confirm that the test system (e.g. the power amplifier) is not in saturation. Assuming
that E has been chosen as 1,8 times E, perform the following procedure at each
C t
calibration frequency:
j-1) Decrease the output from the signal generator by 5,1 dB from the level needed to
establish a forward power of P , as determined in the above steps (-5,1 dB is the same
C
as E /1,8);
C
j-2) Record the new forward power delivered to the antenna;
j-3) Subtract the forward power measured in step j-2 from P . If the difference is between
C
3,1 and 5,1 dB, then the amplifier is not saturated and the test system sufficient for
testing. If the difference is less than 3,1 dB, then the amplifier is saturated and is not
suitable for testing.
The corresponding check within the constant power calibration method as per 6.2.2 is defined
as step m):
m) Confirm that the test system (e. g. the power amplifier) is not in saturation. Assuming
that E has been chosen as 1,8 times E, perform the following procedure at each
C t
calibration frequency:
m-1) Decrease the output from the signal generator by 5,1 dB from the level needed to
establish a forward power of P , as determined in the above steps (-5,1 dB is the same
C
as E /1,8);
C
- 2 -
m-2) Record the new forward power delivered to the antenna;
m-3) Subtract the forward power measured in step m-2 from P . If the difference is between
C
3,1 dB and 5,1 dB, then the amplifier is not saturated and the test system is sufficient
for testing. If the difference is less than 3,1 dB, then the amplifier is saturated and is not
suitable for testing.
Some amplifiers show deviations of more than 5,1 dB without causing any problems during
testing. That behaviour is caused by their special functional principle (above all travelling
wave tube amplifiers). Figures 1 and 2 show some measurement results obtained from a
semiconductor amplifier as well as from a TWT amplifier.
The text described in j-3, respectively m-3, unfortunately gives no clear answers on the
usability of these amplifiers.
th
After discussion at the 20 meeting of SC 77B/WG 10 on October, 22 - 26, 2007, the experts
of WG 10 unanimously expressed their opinion that j-3 and m-3 are to be interpreted such that
amplifiers showing a deviation of more than 5,1 dB are suitable for testing. E.g. the amplifiers
having a characteristic as shown in Figures 1 and 2 can be used to perform tests according to
IEC 61000-4-3.
1 000 1 100 1 200 1 300 1 400 1 500 1 600 1 700 1 800
Frequency (MHz)
IEC 1342/08
Target field strength is 30 V/m.
Figure 1 – Deviation as defined in step j-3 for a 200 W TWT-amplifier
Deviation (dB)
- 3 -
7,5
7,0
6,5
6,0
5,5
5,0
4,5
4,0
3,5
3,0
2,5
80 100 200 300 400 500 800 1 000
Frequency (MHz)
IEC 1343/08
Figure 2 – Deviation as defined in step j-3 for a semiconductor amplifier
___________
August 2008
Amplifier saturation
– 2 – 61000-4-3 © IEC:2006+A1:2007
CONTENTS
FOREWORD.4
INTRODUCTION.6
1 Scope and object.7
2 Normative references .7
3 Terms and definitions .8
4 General .11
5 Test levels.11
5.1 Test levels related to general purposes .12
5.2 Test levels related to the protection against RF emissions from digital radio
telephones and other RF emitting devices .12
6 Test equipment.13
6.1 Description of the test facility .13
6.2 Calibration of field .14
7 Test setup .19
7.1 Arrangement of table-top equipment.19
7.2 Arrangement of floor-standing equipment .19
7.3 Arrangement of wiring .20
7.4 Arrangement of human body-mounted equipment.20
8 Test procedure .20
8.1 Laboratory reference conditions .20
8.2 Execution of the test.21
9 Evaluation of test results .22
10 Test report.22
Annex A (informative) Rationale for the choice of modulation for tests related to the
protection against RF emissions from digital radio telephones .31
Annex B (informative) Field generating antennas .36
Annex C (informative) Use of anechoic chambers .37
Annex D (informative) Amplifier non-linearity and example for the calibration
procedure according to 6.2 .40
Annex E (informative) Guidance for product committees on the selection of test levels .45
Annex F (informative) Selection of test methods .48
Annex G (informative) Description of the environment.49
Annex H (normative) Alternative illumination method for frequencies above 1 GHz
(“independent windows method”) .54
Annex I (informative) Calibration method for E-field probes.57
Figure 1 – Definition of the test level and the waveshapes occurring at the output of
the signal generator .24
Figure 2 – Example of suitable test facility .25
Figure 3 – Calibration of field.26
Figure 4 – Calibration of field, dimensions of the uniform field area .27
Figure 5 – Example of test setup for floor-standing equipment .28
Figure 6
...
IEC 61000-4-3 ®
Edition 3.2 2010-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-3: Testing and measurement techniques – Radiated, radio-frequency,
electromagnetic field immunity test
Compatibilité électromagnétique (CEM) –
Partie 4-3: Techniques d'essai et de mesure – Essai d'immunité aux champs
électromagnétiques rayonnés aux fréquences radioélectriques
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by
any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or
IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.
Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur.
Si vous avez des questions sur le copyright de la CEI ou si vous désirez obtenir des droits supplémentaires sur cette
publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.
IEC Central Office
3, rue de Varembé
CH-1211 Geneva 20
Switzerland
Email: inmail@iec.ch
Web: www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
Catalogue of IEC publications: www.iec.ch/searchpub
The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,…).
It also gives information on projects, withdrawn and replaced publications.
IEC Just Published: www.iec.ch/online_news/justpub
Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available
on-line and also by email.
Electropedia: www.electropedia.org
The world's leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions
in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical
Vocabulary online.
Customer Service Centre: www.iec.ch/webstore/custserv
If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service
Centre FAQ or contact us:
Email: csc@iec.ch
Tel.: +41 22 919 02 11
Fax: +41 22 919 03 00
A propos de la CEI
La Commission Electrotechnique Internationale (CEI) est la première organisation mondiale qui élabore et publie des
normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.
A propos des publications CEI
Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possédez
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IEC 61000-4-3 ®
Edition 3.2 2010-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-3: Testing and measurement techniques – Radiated, radio-frequency,
electromagnetic field immunity test
Compatibilité électromagnétique (CEM) –
Partie 4-3: Techniques d'essai et de mesure – Essai d'immunité aux champs
électromagnétiques rayonnés aux fréquences radioélectriques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.20 ISBN 978-2-88910-374-4
Publication IEC 61000-4-3 (Edition 3.0 – 2008) I-SH 01
Electromagnetic compatibility (EMC) – Part 4-3: Testing and measurement
techniques – Radiated, radio-frequency, electromagnetic
field immunity test
INTERPRETATION SHEET 1
This interpretation sheet has been prepared by SC 77B: High frequency phenomena, of IEC
technical committee 77: Electromagnetic compatibility.
The text of this interpretation sheet is based on the following documents:
ISH Report on voting
77B/568/ISH 77B/573/RVD
Full information on the voting for the approval of this interpretation sheet can be found in the
report on voting indicated in the above table.
___________
IEC 61000-4-3 contains quick checks embedded in the field calibration process (subclause
6.2), in which the operator tests whether the amplifier is able to produce the desired RF power
without saturation.
Step j) of the calibration process as per 6.2.1 describes this check for the constant field
strength calibration method:
j) Confirm that the test system (e.g. the power amplifier) is not in saturation. Assuming
that E has been chosen as 1,8 times E, perform the following procedure at each
C t
calibration frequency:
j-1) Decrease the output from the signal generator by 5,1 dB from the level needed to
establish a forward power of P , as determined in the above steps (-5,1 dB is the same
C
as E /1,8);
C
j-2) Record the new forward power delivered to the antenna;
j-3) Subtract the forward power measured in step j-2 from P . If the difference is between
C
3,1 and 5,1 dB, then the amplifier is not saturated and the test system sufficient for
testing. If the difference is less than 3,1 dB, then the amplifier is saturated and is not
suitable for testing.
The corresponding check within the constant power calibration method as per 6.2.2 is defined
as step m):
m) Confirm that the test system (e. g. the power amplifier) is not in saturation. Assuming
that E has been chosen as 1,8 times E, perform the following procedure at each
C t
calibration frequency:
m-1) Decrease the output from the signal generator by 5,1 dB from the level needed to
establish a forward power of P , as determined in the above steps (-5,1 dB is the same
C
as E /1,8);
C
- 2 -
m-2) Record the new forward power delivered to the antenna;
m-3) Subtract the forward power measured in step m-2 from P . If the difference is between
C
3,1 dB and 5,1 dB, then the amplifier is not saturated and the test system is sufficient
for testing. If the difference is less than 3,1 dB, then the amplifier is saturated and is not
suitable for testing.
Some amplifiers show deviations of more than 5,1 dB without causing any problems during
testing. That behaviour is caused by their special functional principle (above all travelling
wave tube amplifiers). Figures 1 and 2 show some measurement results obtained from a
semiconductor amplifier as well as from a TWT amplifier.
The text described in j-3, respectively m-3, unfortunately gives no clear answers on the
usability of these amplifiers.
th
After discussion at the 20 meeting of SC 77B/WG 10 on October, 22 - 26, 2007, the experts
of WG 10 unanimously expressed their opinion that j-3 and m-3 are to be interpreted such that
amplifiers showing a deviation of more than 5,1 dB are suitable for testing. E.g. the amplifiers
having a characteristic as shown in Figures 1 and 2 can be used to perform tests according to
IEC 61000-4-3.
1 000 1 100 1 200 1 300 1 400 1 500 1 600 1 700 1 800
Frequency (MHz)
IEC 1342/08
Target field strength is 30 V/m.
Figure 1 – Deviation as defined in step j-3 for a 200 W TWT-amplifier
Deviation (dB)
- 3 -
7,5
7,0
6,5
6,0
5,5
5,0
4,5
4,0
3,5
3,0
2,5
80 100 200 300 400 500 800 1 000
Frequency (MHz)
IEC 1343/08
Figure 2 – Deviation as defined in step j-3 for a semiconductor amplifier
___________
August 2008
Amplifier saturation
– 2 – 61000-4-3 © IEC:2006+A1:2007
+A2:2010
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope and object . 7
2 Normative references . 7
3 Terms and definitions . 8
4 General . 11
5 Test levels . 11
5.1 Test levels related to general purposes . 12
5.2 Test levels related to the protection against RF emissions from digital radio
telephones and other RF emitting devices . 12
6 Test equipment . 13
6.1 Description of the test facility . 13
6.2 Calibration of field . 14
7 Test setup . 19
7.1 Arrangement of table-top equipment . 19
7.2 Arrangement of floor-standing equipment . 19
7.3 Arrangement of wiring . 20
7.4 Arrangement of human body-mounted equipment . 20
8 Test procedure . 20
8.1 Laboratory reference conditions . 20
8.2 Execution of the test . 21
9 Evaluation of test results . 22
10 Test report. 22
Annex A (informative) Rationale for the choice of modulation for tests related to the
protection against RF emissions from digital radio telephones . 31
Annex B (informative) Field generating antennas . 36
Annex C (informative) Use of anechoic chambers . 37
Annex D (informative) Amplifier non-linearity and example for the calibration
procedure according to 6.2 . 40
Annex E (informative) Guidance for product committees on the selection of test levels . 45
Annex F (informative) Selection of test methods . 48
Annex G (informative) Description of the environment . 49
Annex H (normative) Alternative illumination method for frequencies above 1 GHz
(“independent windows method”) . 54
Annex I (informative) Calibration method for E-field probes . 57
Annex J (informative) Measurement uncertainty due to test instrumentation . 72
Figure 1 – Definition of the test level and the waveshapes occurring at the output of
the signal generator . 24
Figure 2 – Example of suitable test facility . 25
Figure 3 – Calibration of f
...
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