IEC 61000-4-6:2023

IEC 61000-4-6 ®
Edition 5.0 2023-06
REDLINE VERSION
INTERNATIONAL
STANDARD
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BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 4-6: Testing and measurement techniques – Immunity to conducted
disturbances, induced by radio-frequency fields

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IEC 61000-4-6 ®
Edition 5.0 2023-06
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 4-6: Testing and measurement techniques – Immunity to conducted
disturbances, induced by radio-frequency fields
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 33.100.20 ISBN 978-2-8322-7130-8

– 2 – IEC 61000-4-6:2023 RLV © IEC 2023
CONTENTS
FOREWORD . 7
INTRODUCTION . 9
1 Scope . 10
2 Normative references . 10
3 Terms and definitions . 10
4 General . 12
5 Test levels . 15
6 Test equipment and level adjustment procedure . 17
6.1 Test generator . 17
6.2 Coupling and decoupling devices . 19
6.2.1 General . 19
6.2.2 Coupling/decoupling networks (CDNs) . 24
6.2.3 Clamp injection devices . 26
6.2.4 Direct injection devices . 30
6.2.5 Decoupling networks . 30
6.3 Verification of the common-mode impedance at the EUT port of coupling and
decoupling devices . 30
6.3.1 General . 30
6.3.2 Insertion loss of the 150 Ω to 50 Ω adapters . 31
6.4 Setting of the test generator . 34
6.4.1 General . 34
6.4.2 Setting of the output level at the EUT port of the coupling device . 35
7 Test setup and injection methods . 38
7.1 Test setup . 38
7.2 EUT comprising a single unit. 39
7.3 EUT comprising several units . 42
7.4 Rules for selecting injection methods and test points . 44
7.4.1 General . 44
7.4.2 Injection method . 44
7.4.3 Ports to be tested . 46
7.5 CDN injection application . 47
7.6 Clamp injection application when the common mode impedance
requirements can be met.
7.7 Clamp injection application when the common mode impedance
requirements cannot be met .
7.6 Clamp injection application . 52
7.7 Direct injection application . 53
8 Test procedure . 54
9 Evaluation of the test results . 55
10 Test report . 56
Annex A (normative) EM and decoupling clamps . 57
A.1 EM clamps . 57
A.1.1 General . 57
A.1.2 Typical Specification of EM clamps . 57
A.2 EM clamp characterization . 60
A.2.1 Specification of the clamp test jig . 60

A.2.2 Clamp characterization . 61
A.3 Decoupling clamp characterization . 66
A.3.1 General . 66
A.3.2 Specification of decoupling clamps . 66
A.3.3 Impedance . 66
A.3.4 Decoupling factor. 67
Annex B (informative) Selection criteria for the frequency range of application . 69
Annex C (informative) Guidelines for selecting test levels . 71
Annex D (informative) Information on coupling and decoupling networks . 72
D.1 Basic features of the coupling and decoupling networks . 72
D.2 Examples of coupling and decoupling networks . 72
Annex E (informative) Information for the test generator specification . 77
Annex F (informative) Test setup for large EUTs . 78
F.1 General . 78
F.2 Test setup for large EUTs . 78
Annex G (informative) Measurement uncertainty of the voltage test level . 81
G.1 General . 81
G.2 General symbols . 81
G.3 Uncertainty budgets for test methods . 81
G.3.1 Definition of the measurand . 81
G.3.2 MU contributors of the measurand . 82
G.3.3 Input quantities and calculation examples for expanded uncertainty . 83
G.4 Expression of the calculated measurement uncertainty and its application . 91
G.5 Bibliography .
Annex H (informative) Measurement of AE impedance .
Annex H (informative) Testing with multiple signals. 96
H.1 General . 96
H.2 Intermodulation . 96
H.3 Power requirements . 97
H.4 Level-setting requirements . 98
H.5 Linearity check and harmonics checks of the test generator . 98
H.6 EUT performance criteria with multiple signals . 98
Annex I (informative) Port-to-port injection . 99
I.1 General . 99
I.2 Test setup for injection on identical ports . 99
I.2.1 Selection of ports . 99
I.2.2 Procedure for port-to-port injection . 99
Annex J (informative) Amplifier compression and non-linearity . 101
J.1 Objective of limiting amplifier distortion . 101
J.2 Possible problems caused by harmonics and saturation . 101
J.3 Limiting the harmonic content in the disturbance signal. 101
J.4 Effect of linearity characteristic on the immunity test . 102
J.4.1 General . 102
J.4.2 Evaluation of the amplifier linearity characteristic . 102
Bibliography . 106

Figure 1 – Diagram showing EM fields near the EUT due to common-mode currents on

its cables . 13

– 4 – IEC 61000-4-6:2023 RLV © IEC 2023
Figure 2 – Schematic setup for immunity test to RF conducted disturbances . 15
Figure 2 – Open circuit waveforms at the EUT port of a coupling device for test level 1 .
Figure 3 – Example of unmodulated and modulated RF signal . 17
Figure 4 – Test generator setup . 18
Figure 5 – Principle of coupling and decoupling – Symbols used for the indicated setup
principles . 21
Figure 6 – Principle of coupling and decoupling – Principle of direct injection to

screened cables . 22
Figure 7 – Principle of coupling and decoupling – Principle of coupling to unscreened
cables according to the CDN method . 23
Figure 8 – Principle of coupling and decoupling – Principle of decoupling . 24
Figure 5 – Principle of coupling and decoupling according to the clamp injection
method .
Figure 9 – Example of circuit for level-setting setup in a 150 Ω test jig . 28
Figure 7 – Example circuit for evaluating the performance of the current clamp .
Figure 10 – Example of circuit for evaluating the performance transmission loss
of the current clamp level-setting . 29
Figure 11 – Example of the setup geometry to verify the impedance characteristics of
the coupling and decoupling devices . 32
Figure 12 – Setup principle to verify Z of the coupling and decoupling device . 33
ce
Figure 13 – Setup principle for measuring the insertion loss of two 150 Ω to 50 Ω
adapters . 33
Figure 8 – Details of setups and components to verify the essential characteristics
of coupling and decoupling devices and the 150 Ω to 50 Ω adapters .
Figure 14 – Circuit and construction of the 150 Ω to 50 Ω adapter . 34
Figure 15 – Definition of a common-mode point for unscreened and screened cables . 37
Figure 16 – Setup for level-setting at the EUT port of the coupling/decoupling devices . 38
Figure 17 – Example of test setup with a single unit EUT with only one CDN for
injection (top view) . 39
Figure 18 – Example of test setup with a single unit EUT (top view) using multiple
CDNs . 42
Figure 11 – Example of a test setup with a multi-unit EUT (top view) .
Figure 19 – Example of a test setup with a multi-unit EUT (top view) . 44
Figure 20 – Rules for selecting the injection method . 46
Figure 21 – Immunity test for two-port EUT (when only one CDN can be used) . 49
Figure 22 – General principle of a test setup using clamp injection devices . 53
Figure 23 – Example of the test unit locations on the ground plane when using injection
clamps (top view) . 53
Figure A.1 – Example: Construction details of the EM clamp . 59
Figure A.2 – Example: Concept of the EM clamp . 60
Figure A.3 – Dimension of a reference plane . 61
Figure A.4 – Test jig . 61
Figure A.5 – Test jig with inserted clamp . 61
Figure A.6 – Impedance / decoupling factor measurement setup . 62
Figure A.7 – Typical examples for clamp impedance, three typical clamps . 64
Figure A.8 – Typical examples for decoupling factors, three typical clamps . 65

Figure A.9 – Normalization setup for coupling factor measurement . 65
Figure A.10 – S coupling factor measurement setup . 65
Figure A.11 – Typical examples for coupling factor, three typical clamps . 66
Figure A.12 – Decoupling clamp characterization measurement setup . 67
Figure A.13 – Typical examples for the decoupling clamp impedance . 67
Figure A.14 – Typical examples for decoupling factors . 68
Figure B.1 – Start frequency as function of cable length and equipment size . 70
Figure D.1 – Example of a simplified diagram for the circuit of CDN-S1 used with
screened cables (see 6.2.2.5) . 73
Figure D.2 – Example of simplified diagram for the circuit of CDN-M1, CDN-M2 and
CDN-M3 used with unscreened supply (mains) lines (see 6.2.2.2) . 73
Figure D.3 – Example of a simplified diagram for the circuit of CDN-AF2 used with
unscreened unbalanced lines (see 6.2.2.4) . 74
Figure D.4 – Example of a simplified diagram for the circuit of CDN-T2, used with an
unscreened balanced pair (see 6.2.2.3) . 74
Figure D.5 – Example of a simplified diagram of the circuit of CDN-T4 used with
unscreened balanced pairs (see 6.2.2.3) . 75
Figure D.6 – Example of a simplified diagram of the circuit of CDN AF8 used with
unscreened unbalanced lines (see 6.2.2.4) . 75
Figure D.7 – Example of a simplified diagram of the circuit of CDN-T8 used with
unscreened balanced pairs (see 6.2.2.3) . 76
Figure F.1 – Example of large EUT test setup with elevated horizontal reference
ground plane . 79
Figure F.2 – Example of large EUT test setup with vertical reference ground plane . 80
Figure G.1 – Example of influences upon voltage test level using CDN . 82
Figure G.2 – Example of influences upon voltage test level using EM clamp . 82
Figure G.3 – Example of influences upon voltage test level using current clamp . 82
Figure G.4 – Example of influences upon voltage test level using direct injection . 83
Figure G.5 – Circuit for level-setting setup of CDN . 84
Figure H.1 – Impedance measurement using a voltmeter .
Figure H.2 – Impedance measurement using a current probe .
Figure H.1 – Test frequencies f and f and intermodulation frequencies of the second
1 2
and third order . 96
Figure I.1 – Example of setup, port-to-port injection . 100
Figure J.1 – Amplifier linearity measurement setup . 103
Figure J.2 – Linearity characteristic . 104
Figure J.3 – Measurement setup for modulation depth . 104
Figure J.4 – Spectrum of AM modulated signal . 105

Table 1 – Test levels . 16
Table 2 – Characteristics of the test generator . 18
Table 3 – Main parameter of the combination of the coupling and decoupling device . 19
Table 4 – Usage of CDNs . 25
Table B.1 – Main parameter of the combination of the coupling and decoupling device
when the frequency range of the test is extended above 80 MHz . 69
Table E.1 – Required power amplifier output power to obtain a test level of 10 V . 77

– 6 – IEC 61000-4-6:2023 RLV © IEC 2023
Table G.1 – CDN level-setting process . 84
Table G.2 – CDN test process . 84
Table G.3 – EM clamp level-setting process . 87
Table G.4 – EM clamp test process . 87
Table G.5 – Current clamp level-setting process . 88
Table G.6 – Current clamp test process . 89
Table G.7 – Direct injection level-setting process . 90
Table G.8 – Direct injection test process . 90
Table H.1 – Impedance requirements for the AE .
Table H.2 – Derived voltage division ratios for AE impedance measurements .
Table H.3 – Derived voltage ratios for AE impedance measurements .

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-6: Testing and measurement techniques –
Immunity to conducted disturbances, induced by radio-frequency fields

FOREWORD
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
This redline version of the official IEC Standard allows the user to identify the changes
made to the previous edition IEC 61000-4-6:2013. A vertical bar appears in the margin
wherever a change has been made. Additions are in green text, deletions are in
strikethrough red text.
– 8 – IEC 61000-4-6:2023 RLV © IEC 2023
IEC 61000-4-6 has been prepared by subcommittee 77B: High frequency phenomena, of IEC
technical committee 77: Electromagnetic compatibility. It is an International Standard.
It forms Part 4-6 of IEC 61000. It has the status of a basic EMC publication in accordance with
IEC Guide 107.
This fifth edition cancels and replaces the fourth edition published in 2013. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) selection of injection devices revised;
b) need of AE impedance check for clamp injection removed and Annex H deleted;
c) saturation check revised;
d) new Annex H on testing with multiple signals;
e) level-setting only with feedback loop.
The text of this International Standard is based on the following documents:
Draft Report on voting
77B/863/FDIS 77B/865/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 61000 series, published under the general title Electromagnetic
compatibility (EMC), can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The "colour inside" logo on the cover page of this document indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this document using a colour printer.

INTRODUCTION
IEC 61000 is published in separate parts according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards
or as technical specifications or technical reports, some of which have already been published
as sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: IEC 61000-6-1).
This part is an international standard which gives immunity requirements and test procedures
related to conducted disturbances induced by radio-frequency fields.

– 10 – IEC 61000-4-6:2023 RLV © IEC 2023
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-6: Testing and measurement techniques –
Immunity to conducted disturbances, induced by radio-frequency fields

1 Scope
This part of IEC 61000 relates to the conducted immunity requirements of electrical and
electronic equipment to electromagnetic disturbances coming from intended radio-frequency
(RF) transmitters in the frequency range 150 kHz up to 80 MHz.
NOTE 1 Product committees might decide to use the methods described in this document also for frequencies up
to 230 MHz (see Annex B) although the methods and test instrumentation are intended to be used in the frequency
range up to 80 MHz.
Equipment not having at least one conducting wire and/or cable (such as mains supply, signal
line or earth connection) which can couple the equipment to the disturbing RF fields is excluded
from the scope of this document.
NOTE 2 Test methods are defined specified in this part of IEC 61000 to assess the effect that conducted disturbing
signals, induced by electromagnetic radiation, have on the equipment concerned. The simulation and measurement
of these conducted disturbances are not adequately exact for the quantitative determination of effects. The test
methods defined specified are structured for the primary objective of establishing adequate repeatability of results
at various facilities for quantitative analysis of effects.
The object of this document is to establish a common reference for evaluating the functional
immunity of electrical and electronic equipment when subjected to conducted disturbances
induced by RF fields. The test method in this document describes a consistent method to assess
the immunity of an equipment or system against a defined specified phenomenon.
NOTE 3 As described in IEC Guide 107, this document is a basic EMC publication for use by product committees
of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this
immunity test standard should be applied or not, and if applied, they are responsible for determining the appropriate
test levels and performance criteria.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60050 (all parts), International Electrotechnical Vocabulary (IEV) (available at
)
CISPR 16-1-2, Specification for radio disturbance and immunity measuring apparatus and
methods – Part 1-2: Radio disturbance and immunity measuring apparatus – Coupling devices
for conducted disturbance measurements
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60050-161 as well as
the following apply.
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
• IEC Electropedia: available at https://www.electropedia.org/
• ISO Online browsing platform: available at https://www.iso.org/obp
3.1
artificial hand
AH
electrical network simulating the impedance of the human body under average operational
conditions between a hand-held electrical appliance and earth
Note 1 to entry: The construction should be in accordance with CISPR 16-1-2.
[SOURCE: IEC 60050-161:1990, 161-04-27, modified – the note has been added.]
3.2
auxiliary equipment
AE
equipment necessary to provide the equipment under test (EUT) with the signals required for
normal operation and equipment to verify the performance of the EUT
Note 1 to entry: Auxiliary equipment can be useful for monitoring the EUT.
3.3
clamp injection
clamp injection is obtained by means of a clamp-on “current” injecting device on the cable
method of injecting signals onto cables using a clamp injection device
3.4
clamp injection device
clamp-on “current” injecting device on a cable being signal injecting device that is either a
current clamp or an electromagnetic clamp
3.4.1
current clamp
transformer, the secondary winding of which consists of the cable into which the injection is
made
3.4.2
electromagnetic clamp
EM clamp
injection device with combined capacitive and inductive coupling
3.5
common-mode impedance
ratio of the common-mode voltage and the common-mode current at a certain port
Note 1 to entry: This common-mode impedance can be determined by applying a unity common-mode voltage
between the terminal(s) or screen of that port and a reference plane (point). The resulting common-mode current is
then measured as the vectorial vectoral sum of all currents flowing through these terminal(s) or screen (see also
Figure 15a) and Figure 15b)).
– 12 – IEC 61000-4-6:2023 RLV © IEC 2023
3.6
coupling factor
ratio given determined by the open-circuit voltage (e.m.f.) obtained at the EUT port of the
coupling (and decoupling) device divided by the open-circuit voltage obtained at the output of
the test generator
3.7
coupling network
coupling device
electrical circuit or device for transferring energy from one circuit to another with a defined
specified impedance
Note 1 to entry: Coupling and decoupling devices can be integrated into one box (coupling and decoupling network
(CDN)) or they can be in separate networks.
3.8
coupling/decoupling network
CDN
electrical circuit incorporating the functions of both the coupling and decoupling networks
3.9
decoupling network
decoupling device
electrical circuit or device for preventing test signals applied to the EUT from affecting other
devices, equipment or systems that are not under test
3.10
test generator
generator (RF generator, modulation source, attenuators, broadband power amplifier and
filters) capable of generating the required test signal
SEE: Figure 4.
3.11
electromotive force
e.m.f.
voltage at the terminals of the ideal voltage source in the representation of an active element
3.12
measurement result
U
mr
voltage reading of the measurement equipment
3.13
voltage standing wave ratio
VSWR
ratio of a maximum to an adjacent minimum voltage magnitude along the line
4 General
The source of disturbance covered by this document is basically an electromagnetic field,
coming from intended RF transmitters, that may can act on the whole length of cables connected
to installed equipment. The dimensions of the disturbed equipment, mostly a sub-part of a larger
system, are assumed to be small compared with the wavelengths of the interfering signals. The
leads entering and exiting the EUT (e.g. mains, communication lines, interface cables) behave
as passive receiving antenna networks and signal conduction paths for both intentional and
unintentional signals.
Between those cable networks, the susceptible equipment is exposed to currents flowing
"through" the equipment. Cable systems connected to an equipment are assumed to be in
resonant mode (λ/4, λ/2 open or folded dipoles) and as such are represented by coupling and
decoupling devices having a common-mode impedance of 150 Ω with respect to a reference
ground plane. Where possible the EUT is tested by connecting it For the method described
herein, the EUT is connected between two 150 Ω common-mode impedance connections: one
providing an RF source and the other providing a return path for the current.
This test method subjects the EUT to a source of disturbance comprising electric and magnetic
fields, simulating those coming from intentional RF transmitters. These disturbing fields (E and
H) are approximated by the electric and magnetic near-fields resulting from the voltages and
currents caused by the test setup as shown in Figure 1.
The use of coupling and decoupling devices to apply the disturbing signal to one cable at a time,
while keeping all other cables nonexcited (see Figure 2), can only approximate the real situation
where disturbing sources act on all cables simultaneously, with a range of different amplitudes
and phases.
Coupling and decoupling devices are defined by their characteristics given specified in 6.2. Any
coupling and decoupling device fulfilling these characteristics can be used. The CDNs in Annex
D Annex C are only examples of commercially available networks.

Z Common-mode impedance of the CDN, Z = 150 Ω
ce ce
U Test generator source voltage (e.m.f.)
U Common-mode voltage between EUT and reference plane
com
I Common-mode current through the EUT
com
J Current density on conducting surface or current on other conductors of the EUT
com
E, H Electric and magnetic fields
NOTE The 100 Ω resistors are included in the CDNs. The left input is loaded by a (passive) 50 Ω load and the right
input is loaded by the source impedance of the test generator.
Figure a) 1 – Diagram showing EM fields near the EUT due
to common-mode currents on its cables

– 14 – IEC 61000-4-6:2023 RLV © IEC 2023
RF generator
0,1 m ≤ L ≤ 0,3 m
Test generator
L
L
T2
EUT
Auxiliary AuxiliaryAE 2
AE 1
T (equipment
equipment 1 equipment 2
under test)
CDN CDN
1 2
IEC  2585/13
Reference ground plane
0,1 m ± 0,05 m support
h ≥ 30 mm
Schematic setup for immunity test used for CDN
RF generator
0,1 m ≤ L ≤ 0,3 m
L2 ≤ 0,3 m where possible Test generator
L
L
L2
T2
EUT
AE 1
Auxiliary Auxiliary
AE 2
T T
(equipment
equipment 1 equipment 2
under test)
CDN Injection CDN
1 clamp 2
Reference ground plane
0,1 m ± 0,05 m support
0,1 m ± 0,05 m support
h ≥ 30 mm
IEC  2586/13
Schematic setup for immunity test used for injection clamp
T Termination 50 Ω
T2 Power attenuator (6 dB)
CDN Coupling and decoupling network
Injection clamp: Current clamp or EM clamp
b) Schematic setup for immunity test to RF conducted disturbances

a) Schematic setup for immunity test used for CDN

b) Schematic setup for immunity test used for injection clamp
T: Termination 50 Ω
T2: Attenuator (6 dB)
CDN: Coupling and decoupling network
Injection clamp: Current clamp or EM clamp
Insulating sheet or support: A non-conductive coating, foot, roller and/or caster may be used as an alternative
to an insulating support. The height shall be as specified. The height of the insulating
sheet or support under a decoupled AE need not be specified
Figure 2 – Schematic setup for immunity test to RF conducted disturbances
5 Test levels
According to this document, tests are required for induced disturbances caused by
electromagnetic fields coming from intentional RF transmitters in the frequency range 150 kHz
to 80 MHz.
The open circuit test levels (e.m.f.) of the unmodulated disturbing signal, expressed in RMS
(root mean square), are specified in Table 1.

– 16 – IEC 61000-4-6:2023 RLV © IEC 2023
Table 1 – Test levels
Frequency range 150 kHz to 80 MHz
Voltage level (e.m.f.)
Level
U U
0 0
V dB(μV)
1 1
...

IEC 61000-4-6 ®
Edition 5.0 2023-06
INTERNATIONAL
STANDARD
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BASIC EMC PUBLICATION
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Electromagnetic compatibility (EMC) –
Part 4-6: Testing and measurement techniques – Immunity to conducted
disturbances, induced by radio-frequency fields

Compatibilité électromagnétique (CEM) –
Partie 4-6: Techniques d'essai et de mesure – Immunité aux perturbations
conduites, induites par les champs aux fréquences radioélectriques

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IEC 61000-4-6 ®
Edition 5.0 2023-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Electromagnetic compatibility (EMC) –

Part 4-6: Testing and measurement techniques – Immunity to conducted

disturbances, induced by radio-frequency fields

Compatibilité électromagnétique (CEM) –

Partie 4-6: Techniques d'essai et de mesure – Immunité aux perturbations

conduites, induites par les champs aux fréquences radioélectriques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.20 ISBN 978-2-8322-7592-4

– 2 – IEC 61000-4-6:2023 © IEC 2023
CONTENTS
FOREWORD . 6
INTRODUCTION . 8
1 Scope . 9
2 Normative references . 9
3 Terms and definitions . 9
4 General . 11
5 Test levels . 13
6 Test equipment and level adjustment procedure . 15
6.1 Test generator . 15
6.2 Coupling and decoupling devices . 16
6.2.1 General . 16
6.2.2 Coupling/decoupling networks (CDNs) . 18
6.2.3 Clamp injection devices . 20
6.2.4 Direct injection devices . 22
6.2.5 Decoupling networks . 22
6.3 Verification of the common-mode impedance at the EUT port of coupling and
decoupling devices . 22
6.3.1 General . 22
6.3.2 Insertion loss of the 150 Ω to 50 Ω adapters . 23
6.4 Setting of the test generator . 25
6.4.1 General . 25
6.4.2 Setting of the output level at the EUT port of the coupling device . 25
7 Test setup and injection methods . 27
7.1 Test setup . 27
7.2 EUT comprising a single unit. 28
7.3 EUT comprising several units . 30
7.4 Rules for selecting injection methods and test points . 31
7.4.1 General . 31
7.4.2 Injection method . 31
7.4.3 Ports to be tested . 32
7.5 CDN injection application . 32
7.6 Clamp injection application . 34
7.7 Direct injection application . 36
8 Test procedure . 36
9 Evaluation of the test results . 37
10 Test report . 38
Annex A (normative) EM and decoupling clamps . 39
A.1 EM clamps . 39
A.1.1 General . 39
A.1.2 Specification of EM clamps . 39
A.2 EM clamp characterization . 41
A.2.1 Specification of the clamp test jig . 41
A.2.2 Clamp characterization . 42
A.3 Decoupling clamp characterization . 47
A.3.1 General . 47
A.3.2 Specification of decoupling clamps . 47

A.3.3 Impedance . 47
A.3.4 Decoupling factor. 48
Annex B (informative) Selection criteria for the frequency range of application . 50
Annex C (informative) Guidelines for selecting test levels . 52
Annex D (informative) Information on coupling and decoupling networks . 53
D.1 Basic features of the coupling and decoupling networks . 53
D.2 Examples of coupling and decoupling networks . 53
Annex E (informative) Information for the test generator specification . 58
Annex F (informative) Test setup for large EUTs . 59
F.1 General . 59
F.2 Test setup for large EUTs . 59
Annex G (informative) Measurement uncertainty of the voltage test level . 62
G.1 General . 62
G.2 General symbols . 62
G.3 Uncertainty budgets for test methods . 62
G.3.1 Definition of the measurand . 62
G.3.2 MU contributors of the measurand . 63
G.3.3 Input quantities and calculation examples for expanded uncertainty . 64
G.4 Expression of the calculated measurement uncertainty and its application . 71
Annex H (informative) Testing with multiple signals . 73
H.1 General . 73
H.2 Intermodulation . 73
H.3 Power requirements . 74
H.4 Level-setting requirements . 75
H.5 Linearity check and harmonics checks of the test generator . 75
H.6 EUT performance criteria with multiple signals . 75
Annex I (informative) Port-to-port injection . 76
I.1 General . 76
I.2 Test setup for injection on identical ports . 76
I.2.1 Selection of ports . 76
I.2.2 Procedure for port-to-port injection . 76
Annex J (informative) Amplifier compression and non-linearity . 78
J.1 Objective of limiting amplifier distortion . 78
J.2 Possible problems caused by harmonics and saturation . 78
J.3 Limiting the harmonic content in the disturbance signal. 78
J.4 Effect of linearity characteristic on the immunity test . 79
J.4.1 General . 79
J.4.2 Evaluation of the amplifier linearity characteristic . 79
Bibliography . 83

Figure 1 – Diagram showing EM fields near the EUT due to common-mode currents on
its cables . 12
Figure 2 – Schematic setup for immunity test to RF conducted disturbances . 13
Figure 3 – Example of unmodulated and modulated RF signal . 14
Figure 4 – Test generator setup . 16
Figure 5 – Principle of coupling and decoupling – Symbols used for the indicated setup
principles . 17

– 4 – IEC 61000-4-6:2023 © IEC 2023
Figure 6 – Principle of coupling and decoupling – Principle of direct injection to
screened cables . 17
Figure 7 – Principle of coupling and decoupling – Principle of coupling to unscreened

cables according to the CDN method . 18
Figure 8 – Principle of coupling and decoupling – Principle of decoupling . 18
Figure 9 – Example of circuit for evaluating the transmission loss of the current clamp
level-setting . 21
Figure 10 – Example of circuit for level-setting setup in a 150 Ω test jig . 21
Figure 11 – Example of the setup geometry to verify the impedance characteristics of
the coupling and decoupling devices . 23
Figure 12 – Setup principle to verify Z of the coupling and decoupling device . 24
ce
Figure 13 – Setup principle for measuring the insertion loss of two 150 Ω to 50 Ω
adapters . 24
Figure 14 – Circuit and construction of the 150 Ω to 50 Ω adapter . 24
Figure 15 – Definition of a common-mode point for unscreened and screened cables . 26
Figure 16 – Setup for level-setting at the EUT port of the coupling/decoupling devices . 27
Figure 17 – Example of test setup with a single unit EUT with only one CDN for
injection (top view) . 28
Figure 18 – Example of test setup with a single unit EUT (top view) using multiple
CDNs . 29
Figure 19 – Example of a test setup with a multi-unit EUT (top view) . 30
Figure 20 – Rules for selecting the injection method . 31
Figure 21 – Immunity test for two-port EUT (when only one CDN can be used) . 34
Figure 22 – General principle of a test setup using clamp injection devices . 35
Figure 23 – Example of the test unit locations on the ground plane when using injection

clamps (top view) . 36
Figure A.1 – Example: Construction details of the EM clamp . 40
Figure A.2 – Example: Concept of the EM clamp . 41
Figure A.3 – Dimension of a reference plane . 42
Figure A.4 – Test jig . 42
Figure A.5 – Test jig with inserted clamp . 42
Figure A.6 – Impedance / decoupling factor measurement setup . 43
Figure A.7 – Typical examples for clamp impedance, three typical clamps . 45
Figure A.8 – Typical examples for decoupling factors, three typical clamps . 45
Figure A.9 – Normalization setup for coupling factor measurement . 46
Figure A.10 – S coupling factor measurement setup . 46
Figure A.11 – Typical examples for coupling factor, three typical clamps . 47
Figure A.12 – Decoupling clamp characterization measurement setup . 48
Figure A.13 – Typical examples for the decoupling clamp impedance . 48
Figure A.14 – Typical examples for decoupling factors . 49
Figure B.1 – Start frequency as function of cable length and equipment size . 51
Figure D.1 – Example of a simplified diagram for the circuit of CDN-S1 used with
screened cables (see 6.2.2.5) . 54
Figure D.2 – Example of simplified diagram for the circuit of CDN-M1, CDN-M2 and
CDN-M3 used with unscreened supply (mains) lines (see 6.2.2.2) . 54

Figure D.3 – Example of a simplified diagram for the circuit of CDN-AF2 used with
unscreened unbalanced lines (see 6.2.2.4) . 55
Figure D.4 – Example of a simplified diagram for the circuit of CDN-T2, used with an

unscreened balanced pair (see 6.2.2.3) . 55
Figure D.5 – Example of a simplified diagram of the circuit of CDN-T4 used with
unscreened balanced pairs (see 6.2.2.3) . 56
Figure D.6 – Example of a simplified diagram of the circuit of CDN AF8 used with
unscreened unbalanced lines (see 6.2.2.4) . 56
Figure D.7 – Example of a simplified diagram of the circuit of CDN-T8 used with

unscreened balanced pairs (see 6.2.2.3) . 57
Figure F.1 – Example of large EUT test setup with elevated horizontal reference
ground plane . 60
Figure F.2 – Example of large EUT test setup with vertical reference ground plane . 61
Figure G.1 – Example of influences upon voltage test level using CDN . 63
Figure G.2 – Example of influences upon voltage test level using EM clamp . 63
Figure G.3 – Example of influences upon voltage test level using current clamp . 63
Figure G.4 – Example of influences upon voltage test level using direct injection . 64
Figure G.5 – Circuit for level-setting setup of CDN . 65
Figure H.1 – Test frequencies f and f and intermodulation frequencies of the second
1 2
and third order . 73
Figure I.1 – Example of setup, port-to-port injection . 77
Figure J.1 – Amplifier linearity measurement setup . 80
Figure J.2 – Linearity characteristic . 81
Figure J.3 – Measurement setup for modulation depth . 81
Figure J.4 – Spectrum of AM modulated signal . 82

Table 1 – Test levels . 14
Table 2 – Characteristics of the test generator . 15
Table 3 – Main parameter of the combination of the coupling and decoupling device . 16
Table 4 – Usage of CDNs . 19
Table B.1 – Main parameter of the combination of the coupling and decoupling device

when the frequency range of the test is extended above 80 MHz . 50
Table E.1 – Required power amplifier output power to obtain a test level of 10 V . 58
Table G.1 – CDN level-setting process . 65
Table G.2 – CDN test process . 65
Table G.3 – EM clamp level-setting process . 67
Table G.4 – EM clamp test process . 68
Table G.5 – Current clamp level-setting process . 69
Table G.6 – Current clamp test process . 69
Table G.7 – Direct injection level-setting process . 70
Table G.8 – Direct injection test process . 71

– 6 – IEC 61000-4-6:2023 © IEC 2023
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-6: Testing and measurement techniques –
Immunity to conducted disturbances, induced by radio-frequency fields

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC 61000-4-6 has been prepared by subcommittee 77B: High frequency phenomena, of IEC
technical committee 77: Electromagnetic compatibility. It is an International Standard.
It forms Part 4-6 of IEC 61000. It has the status of a basic EMC publication in accordance with
IEC Guide 107.
This fifth edition cancels and replaces the fourth edition published in 2013. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) selection of injection devices revised;
b) need of AE impedance check for clamp injection removed and Annex H deleted;
c) saturation check revised;
d) new Annex H on testing with multiple signals;

e) level-setting only with feedback loop.
The text of this International Standard is based on the following documents:
Draft Report on voting
77B/863/FDIS 77B/865/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 61000 series, published under the general title Electromagnetic
compatibility (EMC), can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The "colour inside" logo on the cover page of this document indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this document using a colour printer.

– 8 – IEC 61000-4-6:2023 © IEC 2023
INTRODUCTION
IEC 61000 is published in separate parts according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards
or as technical specifications or technical reports, some of which have already been published
as sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: IEC 61000-6-1).
This part is an international standard which gives immunity requirements and test procedures
related to conducted disturbances induced by radio-frequency fields.

ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-6: Testing and measurement techniques –
Immunity to conducted disturbances, induced by radio-frequency fields

1 Scope
This part of IEC 61000 relates to the conducted immunity requirements of electrical and
electronic equipment to electromagnetic disturbances coming from intended radio-frequency
(RF) transmitters in the frequency range 150 kHz up to 80 MHz.
NOTE 1 Product committees might decide to use the methods described in this document also for frequencies up
to 230 MHz (see Annex B) although the methods and test instrumentation are intended to be used in the frequency
range up to 80 MHz.
Equipment not having at least one conducting wire or cable (such as mains supply, signal line
or earth connection) which can couple the equipment to the disturbing RF fields is excluded
from the scope of this document.
NOTE 2 Test methods are specified in this part of IEC 61000 to assess the effect that conducted disturbing signals,
induced by electromagnetic radiation, have on the equipment concerned. The simulation and measurement of these
conducted disturbances are not adequately exact for the quantitative determination of effects. The test methods
specified are structured for the primary objective of establishing adequate repeatability of results at various facilities
for quantitative analysis of effects.
The object of this document is to establish a common reference for evaluating the functional
immunity of electrical and electronic equipment when subjected to conducted disturbances
induced by RF fields. The test method in this document describes a consistent method to assess
the immunity of an equipment or system against a specified phenomenon.
NOTE 3 As described in IEC Guide 107, this document is a basic EMC publication for use by product committees
of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this
immunity test standard should be applied or not, and if applied, they are responsible for determining the appropriate
test levels and performance criteria.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
CISPR 16-1-2, Specification for radio disturbance and immunity measuring apparatus and
methods – Part 1-2: Radio disturbance and immunity measuring apparatus – Coupling devices
for conducted disturbance measurements
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
• IEC Electropedia: available at https://www.electropedia.org/
• ISO Online browsing platform: available at https://www.iso.org/obp

– 10 – IEC 61000-4-6:2023 © IEC 2023
3.1
artificial hand
AH
electrical network simulating the impedance of the human body under average operational
conditions between a hand-held electrical appliance and earth
Note 1 to entry: The construction should be in accordance with CISPR 16-1-2.
[SOURCE: IEC 60050-161:1990, 161-04-27, modified – the note has been added.]
3.2
auxiliary equipment
AE
equipment necessary to provide the equipment under test (EUT) with the signals required for
normal operation
Note 1 to entry: Auxiliary equipment can be useful for monitoring the EUT.
3.3
clamp injection
method of injecting signals onto cables using a clamp injection device
3.4
clamp injection device
clamp-on signal injecting device that is either a current clamp or an electromagnetic clamp
3.4.1
current clamp
transformer, the secondary winding of which consists of the cable into which the injection is
made
3.4.2
electromagnetic clamp
EM clamp
injection device with combined capacitive and inductive coupling
3.5
common-mode impedance
ratio of the common-mode voltage and the common-mode current at a certain port
Note 1 to entry: This common-mode impedance can be determined by applying a unity common-mode voltage
between the terminal(s) or screen of that port and a reference plane (point). The resulting common-mode current is
then measured as the vectoral sum of all currents flowing through these terminal(s) or screen (see also Figure 15a)
and Figure 15b)).
3.6
coupling factor
ratio determined by the open-circuit voltage (e.m.f.) obtained at the EUT port of the coupling
(and decoupling) device divided by the open-circuit voltage obtained at the output of the test
generator
3.7
coupling network
coupling device
electrical circuit or device for transferring energy from one circuit to another with a specified
impedance
Note 1 to entry: Coupling and decoupling devices can be integrated into one box (coupling and decoupling network
(CDN)) or they can be in separate networks.

3.8
coupling/decoupling network
CDN
electrical circuit incorporating the functions of both the coupling and decoupling networks
3.9
decoupling network
decoupling device
electrical circuit or device for preventing test signals applied to the EUT from affecting other
devices, equipment or systems that are not under test
3.10
test generator
generator (RF generator, modulation source, attenuators, broadband power amplifier and
filters) capable of generating the required test signal
SEE: Figure 4.
3.11
electromotive force
e.m.f.
voltage at the terminals of the ideal voltage source in the representation of an active element
3.12
measurement result
U
mr
voltage reading of the measurement equipment
3.13
voltage standing wave ratio
VSWR
ratio of a maximum to an adjacent minimum voltage magnitude along the line
4 General
The source of disturbance covered by this document is basically an electromagnetic field,
coming from intended RF transmitters, that can act on the whole length of cables connected to
installed equipment. The dimensions of the disturbed equipment, mostly a sub-part of a larger
system, are assumed to be small compared with the wavelengths of the interfering signals. The
leads entering and exiting the EUT (e.g. mains, communication lines, interface cables) behave
as passive receiving antenna networks and signal conduction paths for both intentional and
unintentional signals.
Between those cable networks, the susceptible equipment is exposed to currents flowing
"through" the equipment. Cable systems connected to an equipment are assumed to be in
resonant mode (λ/4, λ/2 open or folded dipoles) and as such are represented by coupling and
decoupling devices having a common-mode impedance of 150 Ω with respect to a reference
ground plane. For the method described herein, the EUT is connected between two 150 Ω
common-mode impedance connections: one providing an RF source and the other providing a
return path for the current.
This test method subjects the EUT to a source of disturbance comprising electric and magnetic
fields, simulating those coming from intentional RF transmitters. These disturbing fields (E and
H) are approximated by the electric and magnetic near-fields resulting from the voltages and
currents caused by the test setup as shown in Figure 1.

– 12 – IEC 61000-4-6:2023 © IEC 2023
The use of coupling and decoupling devices to apply the disturbing signal to one cable at a time,
while keeping all other cables nonexcited (see Figure 2), can only approximate the real situation
where disturbing sources act on all cables simultaneously, with a range of different amplitudes
and phases.
Coupling and decoupling devices are specified in 6.2. Any coupling and decoupling device
fulfilling these characteristics can be used. The CDNs in Annex C are only examples of
commercially available networks.

Z Common-mode impedance of the CDN, Z = 150 Ω
ce ce
U Test generator source voltage (e.m.f.)
U Common-mode voltage between EUT and reference plane
com
I Common-mode current through the EUT
com
J Current density on conducting surface or current on other conductors of the EUT
com
E, H Electric and magnetic fields
NOTE The 100 Ω resistors are included in the CDNs. The left input is loaded by a (passive) 50 Ω load and the right
input is loaded by the source impedance of the test generator.
Figure 1 – Diagram showing EM fields near the EUT due
to common-mode currents on its cables

a) Schematic setup for immunity test used for CDN

b) Schematic setup for immunity test used for injection clamp
T: Termination 50 Ω
T2: Attenuator (6 dB)
CDN: Coupling and decoupling network
Injection clamp: Current clamp or EM clamp
Insulating sheet or support: A non-conductive coating, foot, roller and/or caster may be used as an alternative
to an insulating support. The height shall be as specified. The height of the insulating
sheet or support under a decoupled AE need not be specified
Figure 2 – Schematic setup for immunity test to RF conducted disturbances
5 Test levels
According to this document, tests are required for induced disturbances caused by
electromagnetic fields coming from intentional RF transmitters in the frequency range 150 kHz
to 80 MHz.
The open circuit test levels (e.m.f.) of the unmodulated disturbing signal, expressed in RMS
(root mean square), are specified in Table 1.

– 14 – IEC 61000-4-6:2023 © IEC 2023
Table 1 – Test levels
Frequency range 150 kHz to 80 MHz
Voltage level (e.m.f.)
Level
U U
0 0
V dB(μV)
1 1 120
2 3 129,5
3 10 140
a
Special
X
a
"X" can be any level, above, below or between the others. The level has to be
specified in the dedicated equipment specification.

The test levels are set at the EUT port of the coupling devices (see 6.4). For testing of the
equipment, this signal is 80 % amplitude modulated with a 1 kHz sine wave to simulate actual
threats. The effective amplitude modulation is shown in Figure 3. Annex C provides guidance
for selecting test levels.
NOTE 1 IEC 61000-4-3 also specifies test methods for establishing the immunity of electrical and electronic
equipment against radiated electromagnetic energy. It covers frequencies above 80 MHz. Product committees can
deci
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