IEC 61000-4-6:2013

IEC 61000-4-6 ®
Edition 4.0 2013-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-6: Testing and measurement techniques – Immunity to conducted
disturbances, induced by radio-frequency fields

Compatibilité électromagnétique (CEM) –
Partie 4-6: Techniques d'essai et de mesure – Immunité aux perturbations
conduites, induites par les champs radioélectriques

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IEC 61000-4-6 ®
Edition 4.0 2013-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Electromagnetic compatibility (EMC) –

Part 4-6: Testing and measurement techniques – Immunity to conducted

disturbances, induced by radio-frequency fields

Compatibilité électromagnétique (CEM) –

Partie 4-6: Techniques d'essai et de mesure – Immunité aux perturbations

conduites, induites par les champs radioélectriques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX XC
ICS 33.100.20 ISBN 978-2-8322-1176-2

– 2 – 61000-4-6 © IEC:2013
CONTENTS
FOREWORD . 5
INTRODUCTION . 7
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 8
4 General . 10
5 Test levels . 12
6 Test equipment and level adjustment procedures . 13
6.1 Test generator . 13
6.2 Coupling and decoupling devices . 15
6.2.1 General . 15
6.2.2 Coupling/decoupling networks (CDNs) . 18
6.2.3 Clamp injection devices . 20
6.2.4 Direct injection devices . 22
6.2.5 Decoupling networks . 22
6.3 Verification of the common mode impedance at the EUT port of coupling
and decoupling devices . 23
6.3.1 General . 23
6.3.2 Insertion loss of the 150 Ω to 50 Ω adapters . 23
6.4 Setting of the test generator . 25
6.4.1 General . 25
6.4.2 Setting of the output level at the EUT port of the coupling
device . 26
7 Test setup and injection methods . 28
7.1 Test setup . 28
7.2 EUT comprising a single unit . 28
7.3 EUT comprising several units . 29
7.4 Rules for selecting injection methods and test points . 30
7.4.1 General . 30
7.4.2 Injection method . 30
7.4.3 Ports to be tested . 31
7.5 CDN injection application . 32
7.6 Clamp injection application when the common mode impedance
requirements can be met. 33
7.7 Clamp injection application when the common mode impedance
requirements cannot be met . 35
7.8 Direct injection application . 35
8 Test procedure . 36
9 Evaluation of the test results . 37
10 Test report . 37
Annex A (normative) EM and decoupling clamps . 39
Annex B (informative) Selection criteria for the frequency range of application . 49
Annex C (informative) Guide for selecting test levels . 51
Annex D (informative) Information on coupling and decoupling networks . 52
Annex E (informative) Information for the test generator specification . 57
Annex F (informative) Test setup for large EUTs . 58

61000-4-6 © IEC:2013 – 3 –
Annex G (informative) Measurement uncertainty of the voltage test level . 61
Annex H (informative) Measurement of AE impedance . 72
Annex I (informative) Port to port injection . 76
Annex J (informative) Amplifier compression and non-linearity . 78
Bibliography . 83

Figure 1 – Immunity test to RF conducted disturbances . 12
Figure 2 – Open circuit waveforms at the EUT port of a coupling device for test level 1 . 13
Figure 3 – Test generator setup . 15
Figure 4 – Principle of coupling and decoupling . 18
Figure 5 – Principle of coupling and decoupling according to the clamp injection
method . 20
Figure 6 – Example of circuit for level setting setup in a 150 Ω test jig . 21
Figure 7 – Example circuit for evaluating the performance of the current clamp . 22
Figure 8 – Details of setups and components to verify the essential characteristics of
coupling and decoupling devices and the 150 Ω to 50 Ω adapters . 25
Figure 9 – Setup for level setting . 27
Figure 10 – Example of test setup with a single unit EUT (top view) . 29
Figure 11 – Example of a test setup with a multi-unit EUT (top view) . 30
Figure 12 – Rules for selecting the injection method . 31
Figure 13 – Immunity test to 2-port EUT (when only one CDN can be used) . 33
Figure 14 – General principle of a test setup using clamp injection devices . 34
Figure 15 – Example of the test unit locations on the ground plane when using
injection clamps (top view) . 35
Figure A.1 – Example: Construction details of the EM clamp . 40
Figure A.2 – Example: Concept of the EM clamp . 41
Figure A.3 – Dimension of a reference plane . 42
Figure A.4 – Test jig . 42
Figure A.5 – Test jig with inserted clamp . 42
Figure A.6 – Impedance / decoupling factor measurement setup . 43
Figure A.7 – Typical examples for clamp impedance, 3 typical clamps . 44
Figure A.8 – Typical examples for decoupling factors, 3 typical clamps . 45
Figure A.9 – Normalization setup for coupling factor measurement . 45
Figure A.10 – S coupling factor measurement setup . 46
Figure A.11 – Typical examples for coupling factor, 3 typical clamps . 46
Figure A.12 – Decoupling clamp characterization measurement setup . 47
Figure A.13 – Typical examples for the decoupling clamp impedance . 47
Figure A.14 – Typical examples for decoupling factors . 48
Figure B.1 – Start frequency as function of cable length and equipment size . 50
Figure D.1 – Example of a simplified diagram for the circuit of CDN-S1 used with
screened cables (see 6.2.2.5) . 53
Figure D.2 – Example of simplified diagram for the circuit of CDN-M1/-M2/-M3 used
with unscreened supply (mains) lines (see 6.2.2.2) . 53
Figure D.3 – Example of a simplified diagram for the circuit of CDN-AF2 used with
unscreened unbalanced lines (see 6.2.2.4) . 54

– 4 – 61000-4-6 © IEC:2013
Figure D.4 – Example of a simplified diagram for the circuit of a CDN-T2, used with an
unscreened balanced pair (see 6.2.2.3) . 54
Figure D.5 – Example of a simplified diagram of the circuit of a CDN-T4 used with
unscreened balanced pairs (see 6.2.2.3) . 55
Figure D.6 – Example of a simplified diagram of the circuit of a CDN AF8 used with
unscreened unbalanced lines (see 6.2.2.4) . 55
Figure D.7 – Example of a simplified diagram of the circuit of a CDN-T8 used with
unscreened balanced pairs (see 6.2.2.3) . 56
Figure F.1 – Example of large EUT test setup with elevated horizontal reference
ground plane . 59
Figure F.2 – Example of large EUT test setup with vertical reference ground plane . 60
Figure G.1 – Example of influences upon voltage test level using CDN . 62
Figure G.2 – Example of influences upon voltage test level using EM clamp . 62
Figure G.3 – Example of influences upon voltage test level using current clamp . 63
Figure G.4 – Example of influences upon voltage test level using direct injection . 63
Figure G.5 – Circuit for level setting setup . 64
Figure H.1 – Impedance measurement using a voltmeter . 73
Figure H.2 – Impedance measurement using a current probe . 74
Figure I.1 – Example of setup, port-port injection . 77
Figure J.1 – Amplifier linearity measurement setup . 80
Figure J.2 – Linearity characteristic . 81
Figure J.3 – Measurement setup for modulation depth . 81
Figure J.4 – Spectrum of AM modulated signal . 82

Table 1 – Test levels . 13
Table 2 – Characteristics of the test generator . 14
Table 3 – Main parameter of the combination of the coupling and decoupling device . 15
Table 4 – Usage of CDNs . 18
Table B.1 – Main parameter of the combination of the coupling and decoupling device
when the frequency range of test is extended above 80 MHz . 49
Table E.1 – Required power amplifier output power to obtain a test level of 10 V . 57
Table G.1 – CDN level setting process . 65
Table G.2 – CDN test process . 65
Table G.3 – EM clamp level setting process . 67
Table G.4 – EM clamp test process . 67
Table G.5 – Current clamp level setting process . 68
Table G.6 – Current clamp test process . 69
Table G.7 – Direct injection level setting process . 70
Table G.8 – Direct injection test process . 70
Table H.1 – Impedance requirements for the AE . 72
Table H.2 – Derived voltage division ratios for AE impedance measurements . 73
Table H.3 – Derived voltage ratios for AE impedance measurements . 74

61000-4-6 © IEC:2013 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-6: Testing and measurement techniques –
Immunity to conducted disturbances,
induced by radio-frequency fields

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-6 has been prepared by subcommittee 77B: High
frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
It forms Part 4-6 of IEC 61000. It has the status of a basic EMC publication in accordance
with IEC Guide 107.
This fourth edition cancels and replaces the third edition published in 2008 and constitutes a
technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) use of the CDNs;
b) calibration of the clamps;
c) reorganization of Clause 7 on test setup and injection methods;

– 6 – 61000-4-6 © IEC:2013
d) Annex A which is now dedicated to EM and decoupling clamps;
e) Annex G which now addresses the measurement uncertainty of the voltage test level;
f) informative Annexes H, I and J which are new.
The text of this standard is based on the following documents:
FDIS Report on voting
77B/691/FDIS 77B/704/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 61000 series, published under the general title Electromagnetic
compatibility (EMC), can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
The contents of the corrigendum of June 2015 have been included in this copy.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
61000-4-6 © IEC:2013 – 7 –
INTRODUCTION
IEC 61000 is published in separate parts according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards
or as technical specifications or technical reports, some of which have already been published
as sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: IEC 61000-6-1).
This part is an international standard which gives immunity requirements and test procedures
related to conducted disturbances induced by radio-frequency fields.

– 8 – 61000-4-6 © IEC:2013
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-6: Testing and measurement techniques –
Immunity to conducted disturbances,
induced by radio-frequency fields

1 Scope
This part of IEC 61000 relates to the conducted immunity requirements of electrical and
electronic equipment to electromagnetic disturbances coming from intended radio-frequency
(RF) transmitters in the frequency range 150 kHz up to 80 MHz. Equipment not having at least
one conducting wire and/or cable (such as mains supply, signal line or earth connection)
which can couple the equipment to the disturbing RF fields is excluded from the scope of this
publication.
NOTE 1 Test methods are defined in this part of IEC 61000 to assess the effect that conducted disturbing signals,
induced by electromagnetic radiation, have on the equipment concerned. The simulation and measurement of these
conducted disturbances are not adequately exact for the quantitative determination of effects. The test methods
defined are structured for the primary objective of establishing adequate repeatability of results at various facilities
for quantitative analysis of effects.
The object of this standard is to establish a common reference for evaluating the functional
immunity of electrical and electronic equipment when subjected to conducted disturbances
induced by RF fields. The test method documented in this part of IEC 61000 describes a
consistent method to assess the immunity of an equipment or system against a defined
phenomenon.
NOTE 2 As described in IEC Guide 107, this standard is a basic EMC publication for use by product committees of
the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this
immunity test standard should be applied or not, and if applied, they are responsible for determining the
appropriate test levels and performance criteria.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60050 (all parts), International Electrotechnical Vocabulary (IEV) (available at
)
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60050-161 as well
as the following apply.
3.1
artificial hand
electrical network simulating the impedance of the human body under average operational
conditions between a hand-held electrical appliance and earth
Note 1 to entry: The construction should be in accordance with CISPR 16-1-2.
[SOURCE: IEC 60050-161:1990, 161-04-27]

61000-4-6 © IEC:2013 – 9 –
3.2
auxiliary equipment
AE
equipment necessary to provide the equipment under test (EUT) with the signals required for
normal operation and equipment to verify the performance of the EUT
3.3
clamp injection
clamp injection is obtained by means of a clamp-on “current” injecting device on the cable
3.4
clamp injection device
clamp-on “current” injecting device on a cable being either a current clamp or an
electromagnetic clamp
3.4.1
current clamp
transformer, the secondary winding of which consists of the cable into which the injection is
made
3.4.2
electromagnetic clamp
EM clamp
injection device with combined capacitive and inductive coupling
3.5
common mode impedance
ratio of the common mode voltage and the common mode current at a certain port
Note 1 to entry: This common mode impedance can be determined by applying a unity common mode voltage
between the terminal(s) or screen of that port and a reference plane (point). The resulting common mode current is
then measured as the vectorial sum of all currents flowing through these terminal(s) or screen (see also Figures
8a) and 8b)).
3.6
coupling factor
ratio given by the open-circuit voltage (e.m.f.) obtained at the EUT port of the coupling (and
decoupling) device divided by the open-circuit voltage obtained at the output of the test
generator
3.7
coupling network
electrical circuit for transferring energy from one circuit to another with a defined impedance
Note 1 to entry: Coupling and decoupling devices can be integrated into one box (coupling and decoupling
network (CDN)) or they can be in separate networks.
3.8
coupling/decoupling network
CDN
electrical circuit incorporating the functions of both the coupling and decoupling networks
3.9
decoupling network
decoupling device
electrical circuit for preventing test signals applied to the EUT from affecting other devices,
equipment or systems that are not under test

– 10 – 61000-4-6 © IEC:2013
3.10
test generator
generator (RF generator, modulation source, attenuators, broadband power amplifier and
filters) capable of generating the required test signal
Note 1 to entry: See Figure 3.
3.11
electromotive force
e.m.f.
voltage at the terminals of the ideal voltage source in the representation of an active element
3.12
measurement result
U
mr
voltage reading of the measurement equipment
3.13
voltage standing wave ratio
VSWR
ratio of a maximum to an adjacent minimum voltage magnitude along the line
4 General
The source of disturbance covered by this part of IEC 61000 is basically an electromagnetic
field, coming from intended RF transmitters, that may act on the whole length of cables
connected to installed equipment. The dimensions of the disturbed equipment, mostly a sub-
part of a larger system, are assumed to be small compared with the wavelengths of the
interfering signals. The leads entering and exiting the EUT (e.g. mains, communication lines,
interface cables) behave as passive receiving antenna networks and signal conduction paths
for both intentional and unintentional signals.
Between those cable networks, the susceptible equipment is exposed to currents flowing
“through" the equipment. Cable systems connected to an equipment are assumed to be in
resonant mode (λ/4, λ/2 open or folded dipoles) and as such are represented by coupling and
decoupling devices having a common mode impedance of 150 Ω with respect to a reference
ground plane. Where possible the EUT is tested by connecting it between two 150 Ω common
mode impedance connections: one providing an RF source and the other providing a return
path for the current.
This test method subjects the EUT to a source of disturbance comprising electric and
magnetic fields, simulating those coming from intentional RF transmitters. These disturbing
fields (E and H) are approximated by the electric and magnetic near-fields resulting from the
voltages and currents caused by the test setup as shown in Figure 1a).
The use of coupling and decoupling devices to apply the disturbing signal to one cable at a
time, while keeping all other cables nonexcited (see Figure 1b)), can only approximate the
real situation where disturbing sources act on all cables simultaneously, with a range of
different amplitudes and phases.
Coupling and decoupling devices are defined by their characteristics given in 6.2.1. Any
coupling and decoupling device fulfilling these characteristics can be used. The CDNs in
Annex D are only examples of commercially available networks.

61000-4-6 © IEC:2013 – 11 –
EUT
J
com
H
I
com
100 Ω 100 Ω
Z Z
ce ce U
com
50 Ω 50 Ω
E
Test
generator
U
Z Common mode impedance of the CDN system, Z = 150 Ω
e
ce ce
U Test generator source voltage (e.m.f.)
U Common mode voltage between EUT and reference plane
com
I Common mode current through the EUT
com
J Current density on conducting surface or current on other conductors of the EUT
com
E, H Electric and magnetic fields
NOTE The 100 Ω resistors are included in the CDNs. The left input is loaded by a (passive) 50 Ω load and the
right input is loaded by the source impedance of the test generator.
a) Diagram showing EM fields near the EUT
due to common mode currents on its cables

– 12 – 61000-4-6 © IEC:2013
RF generator
0,1 m ≤ L ≤ 0,3 m
Test generator
L
L
T2
EUT
Auxiliary Auxiliary
T (equipment AE 2
AE 1
equipment 1 equipment 2
under test)
CDN CDN
1 2
IEC  2585/13
Reference ground plane
0,1 m ± 0,05 m support
h ≥ 30 mm
Schematic setup for immunity test used for CDN
RF generator
0,1 m ≤ L ≤ 0,3 m
L2 ≤ 0,3 m where possible Test generator
L
L
L2
T2
EUT
Auxiliary Auxiliary
AE 1
T T
(equipment AE 2
equipment 1 equipment 2
under test)
CDN Injection CDN
1 clamp 2
Reference ground plane
0,1 m ± 0,05 m support
0,1 m ± 0,05 m support
h ≥ 30 mm
IEC  2586/ 13
Schematic setup for immunity test used for injection clamp
T Termination 50 Ω
T2 Power attenuator (6 dB)
CDN Coupling and decoupling network
Injection clamp: Current clamp or EM clamp
b) Schematic setup for immunity test to RF conducted disturbances
Figure 1 – Immunity test to RF conducted disturbances
5 Test levels
According to this standard, tests are required for induced disturbances caused by
electromagnetic fields coming from intentional RF transmitters in the frequency range 150 kHz
to 80 MHz.
The open circuit test levels (e.m.f.) of the unmodulated disturbing signal, expressed in r.m.s.,
are given in Table 1.
61000-4-6 © IEC:2013 – 13 –
Table 1 – Test levels
Frequency range 150 kHz to 80 MHz
Voltage level (e.m.f.)
Level
U U
0 0
V dB(µV)
1 1 120
2 3 129,5
3 10 140
a
X Special
a
"X" can be any level, above, below or in between the others. The level has to be
specified in the dedicated equipment specification.
The test levels are set at the EUT port of the coupling devices, see 6.4. For testing of the
equipment, this signal is 80 % amplitude modulated with a 1 kHz sine wave to simulate actual
threats. The effective amplitude modulation is shown in Figure 2. Guidance for selecting test
levels is given in Annex C.
NOTE 1 IEC 61000-4-3 also defines test methods for establishing the immunity of electrical and electronic
equipment against radiated electromagnetic energy. It covers frequencies above 80 MHz. Product committees can
decide to choose a lower or higher transition frequency than 80 MHz (see Annex B).
NOTE 2 Product committees can select alternative modulation schemes.

3 3
U
maximum rms
2 2
U
rms
1 1
U
rms
0 0
–1 –1
–2 –2
–3 –3
a - Unmodulated RF signal b - Modulated RF – signal 80 % AM
U = 5,09 V
U = 2,82 V p-p
p-p
U = 1,12 V
U = 1,00 V
rms rms
U = 1,80 V
maximum rms
IEC  2587/13 IEC  2588/13
Figure 2 – Open circuit waveforms at the EUT port
of a coupling device for test level 1
6 Test equipment and level adjustment procedures
6.1 Test generator
The test generator includes all equipment and components for supplying the input port of each
coupling device with the disturbing signal at the required signal level at the appropriate
injection point. A typical arrangement comprises the following items which may be separate or
integrated into one or more test instruments (see 3.10 and Figure 3):
U
p-p
U
p-p
– 14 – 61000-4-6 © IEC:2013
– RF generator(s), G1, capable of covering the frequency band of interest and of being
amplitude modulated by a 1 kHz sine wave with a modulation depth of 80 %. They shall
have manual control (e.g. frequency, amplitude, modulation index) or in the case of RF
synthesizers, they shall be programmable with frequency-dependent step sizes and dwell
times;
– attenuator T1, (typically 0 dB . 40 dB) of adequate frequency rating to control the
disturbing test source output level. T1 may be included in the RF generator and is
optional;
– RF switch S1, by which the disturbing test signal can be switched on and off when
measuring the immunity of the EUT. S1 may be included in the RF generator and is
optional;
– broadband power amplifier(s), PA, may be necessary to amplify the signal if the output
power of the RF generator is insufficient;
– low-pass filters (LPF) and/or high-pass filters (HPF) may be necessary to avoid
interference caused by (higher order or sub-) harmonics with some types of EUT, for
example RF receivers. When required they shall be inserted in between the broadband
power amplifier, PA, and the attenuator T2;
– attenuator T2, (fixed ≥ 6 dB), with sufficient power ratings. T2 is provided to reduce VSWR
to the power amplifier caused by the mismatch of the coupling device.
NOTE T2 can be included in a CDN and can be left out if the output impedance of the broadband power amplifier
remains within the specification under any load condition.
Characteristics of the test generator are given in Table 2.
Table 2 – Characteristics of the test generator
Output impedance
50 Ω, VSWR<1,5
Harmonics and within 150 kHz and 80 MHz, any spurious signal shall be at least 15 dB below the
distortion
carrier level, measured at the EUT port of the coupling device. The -15 dBc can also be
measured directly at the output of the amplifier.
Amplitude internal or external,
modulation
+ 5
 
,
 
m = 80 %
 
− 20
 
U − U
with pp,max pp,min
m = 100 ×
U + U
pp,max pp,min
1 kHz ± 0,1 kHz sine wave
Output level sufficiently high to cover test level
(see also Annex E)
NOTE 1 For current clamps, the -15 dBc can be measured at either side of the test jig.
NOTE 2 The harmonics and distortion are measured in continuous wave (CW) at 1,8 times the test level without
modulation.
61000-4-6 © IEC:2013 – 15 –
LPF/HPF
T2
PA
G1 T1 S1
(optional)
Broadband power
RF generator
amplifier
80 % AM
IEC  2589/13
G1 RF generator   T1 Variable attenuator
PA Broadband power amplifier  T2 Fixed attenuator (6 dB)
LPF/HPF Low pass filter and/or high pass filter (optional) S1 RF switch
Figure 3 – Test generator setup
6.2 Coupling and decoupling devices
6.2.1 General
Coupling and decoupling devices shall be used for appropriate coupling of the disturbing
signal (over the entire frequency range, with a defined common mode impedance at the EUT
port) to the various cables connected to the EUT and for preventing applied test signals from
affecting other devices, equipment and systems that are not under test.
The coupling and decoupling devices can be combined into one box (a CDN or an EM clamp)
or can consist of several parts.
The preferred coupling and decoupling devices are the CDNs, for reasons of test
reproducibility and protection of the AE. The main coupling and decoupling device parameter,
the common mode impedance seen at the EUT port, is specified in Table 3. If CDNs are not
applicable or available on the market, other injection methods can be used. Rules for
selecting the appropriate injection method are given in 7.4.1. Other injection methods, due to
their electrical properties, are unlikely to meet the parameters of Table 3.
NOTE 1 A CDN may not be applicable if the internal signal attenuation has an unacceptable influence on the
intended signal.
Table 3 – Main parameter of the combination
of the coupling and decoupling device
Frequency band
Parameter 0,15 MHz to 24 MHz 24 MHz to 80 MHz
|Z | 150 Ω ± 20 Ω
ce +60Ω
150 Ω
−45Ω
NOTE 2 Neither the argument of Z nor the decoupling factor between the EUT port and the AE port are
ce
specified separately. These factors are embodied in the requirement that the tolerance of |Z | shall be met with the
ce
AE port open or short-circuited to the reference ground plane.
NOTE 3 Details for clamps are given in Annex A.

– 16 – 61000-4-6 © IEC:2013
50 Ω coaxial line
Power, signal or ground cable
50 Ω coaxial load
T
150 Ω to 50 Ω adapter; a box with 100 Ω
series resistor between IN and OUT port
50 Ω signal source
50 Ω measuring equipment, e.g. selective voltmeter
A 10 dB, 50 Ω attenuator
EUT CDN AE
Coupling/decoupling network (CDN) with EUT,
IN
IN and AE ports
Power attenuator (6 dB)
T2
IEC  2590/13
a) List of symbols used for the indicated setup principles

61000-4-6 © IEC:2013 – 17 –
0,1 m ≤ L ≤ 0,3 m
L2 ≤ 0,3 m where possible
L2 L
50 Ω
EUT
Auxiliary
T
AE (equipment
equipment
under test)
Decoupling device CDN
Reference ground plane
0,1 m ± 0,05 m support h ≥ 30 mm 0,1 m ± 0,05 m support
100 Ω
T2
U
IEC  2591/13
b) Principle of direct injection to screened cables

n
EUT
port
C > 20 nF/n
R = n × 100 Ω
50 Ω
Test
generator
U
IEC  2592/13
c) Principle of coupling to unscreened cables according to the CDN met
...