Amendment 1 - Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

Amendement 1 -

General Information

Status
Published
Publication Date
12-Dec-2024
Drafting Committee
WG 9 - TC 47/SC 47E/WG 9
Current Stage
PPUB - Publication issued
Start Date
13-Dec-2024
Completion Date
17-Jan-2025

Relations

Effective Date
05-Sep-2023

Overview

IEC 60747-5-4:2022/AMD1:2024 is an important international amendment to the IEC 60747-5-4 standard, published by the International Electrotechnical Commission (IEC). This document specifically addresses semiconductor devices, focusing on optoelectronic devices-particularly semiconductor lasers. As an update to the 2022 edition, Amendment 1 introduces refined definitions, measurement conditions, and technical requirements to enhance clarity and support industry uniformity in the testing and application of semiconductor lasers.

The IEC is the global leader in developing harmonized standards for electrical, electronic, and related technologies. This amendment reflects the current consensus of IEC National Committees and aligns with ISO/IEC directives to ensure consistent, up-to-date guidance on semiconductor lasers in optoelectronics.

Key Topics

  • Semiconductor lasers: The amendment specifically targets semiconductor laser devices, providing updated parameters and testing conditions important for manufacturers and users.
  • Relative Intensity Noise (RIN): The document revises the definition and formula for relative intensity noise, a critical parameter describing laser output stability. RIN now reflects the ratio of radiant power mean square fluctuation to the squared mean radiant power, normalized across a unit noise bandwidth.
  • Electrical and optical characteristics: Detailed updates are presented in measurement and specification conditions for:
    • Forward voltage and current conditions
    • Threshold current and output power at threshold
    • Differential output power and efficiency
    • Peak emission and central wavelength range
    • Spectral bandwidth, linewidth, and side-mode suppression ratio (SMSR)
    • Divergence angles and half-intensity angles in reference planes
    • Rise time, fall time, and small-signal cut-off frequency
    • Carrier-to-noise ratio (C/N) and total capacitance/inductance values
  • Measurement standardization: Annexes referenced include ISO standards (e.g., ISO 11145, ISO 11146-1) supporting the accurate determination of beam divergence and astigmatism values.
  • Conformity and safety: The document reiterates IEC’s stance on intellectual property rights and warns users about liability and correct application using the latest standard edition.

Applications

This amendment is essential for stakeholders in optoelectronics who design, manufacture, test, or integrate semiconductor lasers. It supports:

  • Manufacturers: To comply with consistent international performance metrics and accurately specify laser device parameters in datasheets.
  • Quality assurance engineers: To perform standardized testing ensuring devices meet safety, efficiency, and noise performance criteria.
  • System integrators and designers: To select semiconductor lasers with validated characteristics like emission wavelength, noise levels, and modulation capabilities for telecommunications, industrial lasers, medical devices, and sensing applications.
  • Regulatory bodies: To adopt unified measurement procedures and certification requirements, facilitating global market access.

Related Standards

  • IEC 60747 Series: This part of the broader IEC 60747 series covers various semiconductor devices, including discrete components and optoelectronic devices.
  • ISO 11145 - Optics and Photonics: Defines methods for measuring beam divergence in lasers.
  • ISO 11146-1 - Lasers and laser-related equipment: Provides procedures for beam width, divergence, and beam propagation measurements.
  • IEC and ISO Joint Directives: The amendment follows joint publication procedures to ensure alignment with international standardization policies.
  • Other Optoelectronic Device Standards: Related IEC standards covering LEDs, photodetectors, and integrated photonics that complement this laser-focused document.

Summary

IEC 60747-5-4:2022/AMD1:2024 Amendment 1 refines crucial technical definitions and measurement methods for semiconductor lasers, promoting global harmonization in optoelectronic device characterization. Staying compliant with this amendment ensures accurate performance evaluation, product reliability, and international market acceptance-key benefits for semiconductor manufacturers, test laboratories, and technology integrators utilizing semiconductor lasers.

Keywords: IEC 60747-5-4, semiconductor lasers, optoelectronic devices, relative intensity noise, RIN, laser performance standards, IEC amendment, laser characteristics, optical measurement, semiconductor device standards, international standard, laser noise, spectral bandwidth

Standard

IEC 60747-5-4:2022/AMD1:2024 - Amendment 1 - Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers Released:13. 12. 2024 Isbn:9782832700907

English language
5 pages
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Frequently Asked Questions

IEC 60747-5-4:2022/AMD1:2024 is a standard published by the International Electrotechnical Commission (IEC). Its full title is "Amendment 1 - Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers". This standard covers: Amendment 1 - Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

Amendment 1 - Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

IEC 60747-5-4:2022/AMD1:2024 is classified under the following ICS (International Classification for Standards) categories: 31.080.01 - Semiconductor devices in general; 31.260 - Optoelectronics. Laser equipment. The ICS classification helps identify the subject area and facilitates finding related standards.

IEC 60747-5-4:2022/AMD1:2024 has the following relationships with other standards: It is inter standard links to IEC 60747-5-4:2022. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.

IEC 60747-5-4:2022/AMD1:2024 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.

Standards Content (Sample)


IEC 60747-5-4 ®
Edition 2.0 2024-12
INTERNATIONAL
STANDARD
AMENDMENT 1
Semiconductor devices –
Part 5-4: Optoelectronic devices – Semiconductor lasers

IEC 60747-5-4:2022-04/AMD1:2024-12(en)

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IEC 60747-5-4 ®
Edition 2.0 2024-12
INTERNATIONAL
STANDARD
AMENDMENT 1
Semiconductor devices –
Part 5-4: Optoelectronic devices – Semiconductor lasers

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.01; 31.260 ISBN 978-2-8327-0090-7

– 2 – IEC 60747-5-4:2022/AMD1:2024
© IEC 2024
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
Part 5-4: Optoelectronic devices – Semiconductor lasers

AMENDMENT 1
FOREWORD
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