CISPR 16-2-3:2010/AMD1:2010

CISPR 16-2-3 ®
Edition 3.0 2010-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE
COMITÉ INTERNATIONAL SPÉCIAL DES PERTURBATIONS RADIOÉLECTRIQUES
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
AMENDMENT 1
AMENDEMENT 1
Specification for radio disturbance and immunity measuring apparatus and
methods –
Part 2-3: Methods of measurement of disturbances and immunity – Radiated
disturbance measurements
Spécifications des méthodes et des appareils de mesure des perturbations
radioélectriques et de l’immunité aux perturbations radioélectriques –
Partie 2-3: Méthodes de mesure des perturbations et de l'immunité – Mesures
des perturbations rayonnées
CISPR 16-2-3:2010/A1:2010
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CISPR 16-2-3 ®
Edition 3.0 2010-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE
COMITÉ INTERNATIONAL SPÉCIAL DES PERTURBATIONS RADIOÉLECTRIQUES
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
AMENDMENT 1
AMENDEMENT 1
Specification for radio disturbance and immunity measuring apparatus and
methods –
Part 2-3: Methods of measurement of disturbances and immunity – Radiated
disturbance measurements
Spécifications des méthodes et des appareils de mesure des perturbations
radioélectriques et de l’immunité aux perturbations radioélectriques –
Partie 2-3: Méthodes de mesure des perturbations et de l'immunité – Mesures
des perturbations rayonnées
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
H
CODE PRIX
ICS 33.100.10; 33.100.20 ISBN 978-2-88912-012-3
– 2 – CISPR 16-2-3 Amend. 1 © IEC:2010
FOREWORD
This amendment has been prepared by CISPR subcommittee A: Radio-interference
measurements and statistical methods, in cooperation with CISPR subcommittee D:
Electromagnetic disturbances related to electric/electronic equipment on vehicles and internal
combustion engine powered devices, of IEC technical committee CISPR: International special
committee on radio interference.
The text of this amendment is based on the following documents:
Enquiry draft Report on voting
CISPR/A/878/CDV CISPR/A/894/RVC

Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
INTRODUCTION
The recent addition of FFT-based measuring instrumentation in CISPR 16-1-1 necessitates
the addition of related specifications for the test methods covered in CISPR 16-2-3. Those
new specifications are introduced in this amendment.
3 Terms and definitions
3.18
measuring receiver
Replace the existing definition by the following new definition:
instrument such as a tunable voltmeter, an EMI receiver, a spectrum analyzer or an FFT-
based measuring instrument, with or without preselection, that complies with CISPR 16-1-1
Add, after the existing definition 3.24.5, the following new terms and definitions 3.25 and 3.26:
3.25
measurement
process of experimentally obtaining one or more quantity values that can reasonably be
attributed to a quantity
CISPR 16-2-3 Amend. 1 © IEC:2010 – 3 –
[2.1 of ISO/IEC Guide 99:2007][8]
3.26
test
technical operation that consists of the determination of one or more characteristics of a given
product, process or service according to a specified procedure
NOTE A test is carried out to measure or classify a characteristic or a property of an item by applying to the item
a set of environmental and operating conditions and/or requirements.
[IEC 60050-151:2001, 151-16-13][9]
6.1 General
Delete the existing item c) from the list.
6.2.1 General
Replace the second sentence of this subclause by the following new sentence:
Should the ambient noise level exceed the required level, it shall be recorded in the test
report.
Add, after the existing Subclause 6.5.2, the following new Subclause 6.5.3:
6.5.3 Measurement of the duration of disturbance
The duration of a disturbance must be known in order to measure it correctly and to determine
if it is discontinuous. The duration of a disturbance may be measured in one of the following
ways:
• through the connection of an oscilloscope to a measuring receiver’s IF output to allow
monitoring of the disturbance in the time-domain;
• through the tuning of either an EMI receiver or a spectrum analyzer to the disturbance
frequency without frequency scanning (i.e. ‘zero-span’ mode) to allow monitoring of the
disturbance in the time-domain; or
• through the use of the time-domain output of an FFT-based measuring receiver.
Guidance for the determination of the appropriate measurement time can be found in 8.3.
6.6.2 Minimum measurement times
Replace the existing first sentence of the first paragraph of this subclause by the following two
new sentences:
The minimum measurement (dwell) times are given in Table 7. The minimum measurement
(dwell) times for scanning receivers and FFT-based measuring instruments in Table 1 and the
scan times for spectrum analyzers in Table 2 apply to CW signals.
Add, immediately before the existing Table 1, the following new Table 7:
___________
Figures in square brackets refer to the Bibliography.

– 4 – CISPR 16-2-3 Amend. 1 © IEC:2010
Table 7 – Minimum measurement times for the four CISPR bands
Frequency band Minimum
measurement time T
m
A 9 kHz to 150 kHz 10,00 ms
B 0,15 MHz to 30 MHz 0,50 ms
C and D 30 MHz to 1 000 MHz 0,06 ms
E 1 GHz to 18 GHz 0,01 ms
Add, after the existing Subclause 6.6.5, the following new Subclause 6.6.6:
6.6.6 Timing considerations using FFT-based instruments
FFT-based measuring instruments may combine the parallel calculation at N frequencies and
a stepped scan. For this purpose the frequency range of interest is subdivided into a number
of segments N that are scanned sequentially. The procedure is shown in Figure 20 for
seg
three segments. The total scan time for the frequency range of interest T is calculated as:
scan
T = T N (18)
scan m seg
where
T is the measurement time for each segment, and
m
N is the number of segments.
seg
FFT-based measuring instruments may also provide methods to improve the frequency
resolution across a given frequency range. In general, an FFT-based measuring instrument
will have a fixed frequency step f that is determined by the number of frequencies of
step FFT
the FFT. Increased frequency resolution is achieved by performing repeat calculations over a
given frequency range. For each repeat calculation, the lowest frequency is incremented by a
frequency step, f .
step final
Hence the first calculation over the given frequency range considers the following
frequencies:
f ,
min
f + f ,
min step FFT
f + 2f ,
min step FFT
f + 3f …
min step FFT
The second calculation over the given frequency range considers the following frequencies:
f + f ,
min step final
f + f + f ,
min step final step FFT
f + f + 2f ,
min step final step FFT
f + f + 3f …
min step final step FFT
This procedure, applied for a step ratio of 3, is displayed on Figure 21.
The scan time T is calculated as:
scan
f
step FFT
T = T
(19)
scan m
f
step final
where
T is the measurement time, and
m
CISPR 16-2-3 Amend. 1 © IEC:2010 – 5 –

f
step FFT
is the step ratio.
f
step final
For a system that combines both methods the scan time T is calculated as:
scan
f
step FFT
T = T N
(20)
scan m seg
f
step final
NOTE 1 FFT-based measuring instruments may combine both methods, the stepped scan as well as a method to
improve the frequency resolution.
NOTE 2 Additional background information is currently in preparation for CISPR 16-3 .
___________
A CISPR/TR 16-3 is to be published to replace CISPR 16-3:2003 and its amendments.

– 6 – CISPR 16-2-3 Amend. 1 © IEC:2010

S(f)
Segment 1
T
m
f
S(f)
Segment 2
2 T
m
f
S(f)
Segment 3
3 T
m
f
t
S(f)
Final Result
f
IEC  1417/10
Figure 20 – FFT scan in segments
S(f)
f
CISPR 16-2-3 Amend. 1 © IEC:2010 – 7 –

S(f)
Calculation 1
T
m
f
F
step FFT
S(f)
Calculation 2
2 T
m
f
S(f)
Calculation 3
3 T
m
f
t
S(f)
Final Result
f
F
step final
IEC  1418/10
Figure 21 – Frequency resolution enhanced
by FFT-based measuring instrument
7.5.4 Specifications for EUT set-up in common emissions/immunity test setup
In the first bullet of the eighth paragraph, replace the existing third sentence as follows:
However, in case of conflicting requirements, the layout and maximum cable lengths defined
in the product emission standard shall be used.

S(f)
f
– 8 – CISPR 16-2-3 Amend. 1 © IEC:2010
7.6.6.2.1 General measurement procedure
In the last sentence of the first paragraph, delete the existing phrase “in case of dispute.”
8.5 Emission maximization and final measurement
Add, after the last paragraph of this subclause, a new note as follows:
NOTE The final measurement may be performed at several frequencies in parallel using FFT-based measurement
instrumentation.
Add, after the existing Subclause 8.6, the following new Subclause 8.7:
8.7 Emission measurement strategies with FFT-based measuring instruments
Depending on the implementation, FFT-based measuring instruments may perform weighted
measurements significantly faster than the tunable selective voltmeters. A weighted
measurement over the frequency range of interest may then be faster than a measurement
consisting of a prescan and final scan performed with a superheterodyne receiver as
descri
...