CLC/TS 50625-3-3:2017

SLOVENSKI STANDARD
01-oktober-2017
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Collection, logistics & treatment requirements for WEEE - Part 3-3: Specification for de-
pollution - WEEE containing CRTs and flat panel displays
Exigences de collecte, logistique et traitement pour les déchets d'équipements
électriques et électroniques (DEEE) - Partie 3-3: Spécifications relatives à la dépollution -
DEEE contenant des tubes cathodiques et des écrans plats
Ta slovenski standard je istoveten z: CLC/TS 50625-3-3:2017
ICS:
13.030.99 Drugi standardi v zvezi z Other standards related to
odpadki wastes
31.120 Elektronske prikazovalne Electronic display devices
naprave
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

TECHNICAL SPECIFICATION CLC/TS 50625-3-3

SPÉCIFICATION TECHNIQUE
TECHNISCHE SPEZIFIKATION
August 2017
ICS 13.030.99; 31.120
English Version
Collection, logistics & treatment requirements for WEEE - Part 3-
3: Specification for de-pollution - WEEE containing CRTs and flat
panel displays
Exigences de collecte, logistique et traitement pour les Sammlung, Logistik und Behandlung von Elektro- und
déchets d'équipements électriques et électroniques (DEEE) Elektronik-Altgeräten (WEEE) - Teil 3-3: Spezifikation der
- Partie 3-3: Spécifications relatives à la dépollution - DEEE Schadstoffentfrachtung - WEEE mit CRT und
contenant des tubes cathodiques et des écrans plats Flachbildschirmgeräten
This Technical Specification was approved by CENELEC on 2017-06-19.

CENELEC members are required to announce the existence of this TS in the same way as for an EN and to make the TS available promptly
at national level in an appropriate form. It is permissible to keep conflicting national standards in force.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. CLC/TS 50625-3-3:2017 E

Contents Page
European foreword . 5
Introduction. 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 8
4 De-pollution monitoring . 8
4.1 Introduction . 8
4.2 Target value methodology . 8
4.3 Mass Balance methodology . 8
4.4 Analysis methodology . 9
4.101 Monitoring methodology . 9
4.101.1 Introduction . 9
4.101.2 CRT equipment . 9
4.101.3 Flat Panel Display (FPD) . 10
5 Overview of the applicable methodologies - Applicable methodologies . 10
6 Large appliances . 10
7 Cooling and freezing appliances . 10
8 CRT Display / FPD appliances. 11
8.1 Introduction . 11
8.2 CRT display appliances – Target value methodology . 11
8.3 CRT display appliances – Analysis methodology . 11
8.3.101 Residual CRT glass in CRT fractions . 11
8.3.102 Fluorescent coating remaining on cleaned CRT glass . 12
Table 101 — Number of analysis per year . 12
8.3.103 Lead content in separated panel glass . 12
8.4 FPD appliances – Mass balance methodology . 12
8.4.101 Introduction . 12
8.4.102 Procedure . 13
8.4.103 Results . 13
8.5 FPD appliances – Analysis methodology . 14
9 Lamps – introduction and analysis methodology . 14
10 Small appliances . 14
11 Protocol for components removed during a batch process . 15
11.1 General procedure . 15
11.2 Capacitors . 15
11.3 Batteries . 15
Annex A (normative) Sampling protocol for the physically smallest non-metallic mechanical treatment
fraction . 16
Annex B (normative) Sampling protocol for plastics . 17
Annex C (normative) Targets . 18
Annex D (informative) Target calculation example – Calculation example for large appliance . 19
Annex AA (normative) CRT and FPD: Sampling protocol . 20
AA.1 Introduction . 20
AA.2 Sample number and size . 20
AA.2.1 Deflection coils and electron canons from CRT treatment . 20
AA.2.2 Ferrous metal fraction from CRT treatment . 20
AA.2.3 Sampling procedure for lead oxide analysis on panel glass . 20
Table 102 — Sample size for lead oxide analysis on panel glass . 21
AA.2.4 Sampling procedure for the sulphur analysis on cleaned CRT glass . 21
AA.2.5 Sampling procedure for crushed or shredded mixed fractions from CRT and FPD . 21
Table 103 — Sample size for crushed or shredded mix fractions from CRT and FPD . 21
AA.3 Principles of sampling and sample preparation . 21
AA.4 Packaging, storing and sending of samples . 21
Annex BB (normative) CRT: Analysis protocol for residual CRT glass in CRT fractions . 23
BB.1 Analysis . 23
BB.2 Calculation of the residual CRT glass in fractions . 23
Annex CC (normative) CRT: Analysis protocol for fluorescent coating remaining on cleaned CRT glass 24
CC.1 Introduction . 24
CC.2 Visual inspection protocol . 24
CC.3 Chemical analysis protocol . 24
CC.3.1 General . 24
CC.3.2 Test portion preparation . 25
CC.3.3 Leaching step . 25
CC.3.4 Leaching procedure . 25
CC.3.5 Quantification technique . 25
CC.3.6 Sulphur standard . 26
Annex DD (normative) CRT: Analysis protocol for the lead oxide in separated panel glass . 27
DD.1 General . 27
DD.2 Analysis by XRF method (onsite analysis) . 27
DD.3 Analysis by XRF method (laboratory analysis) . 28
DD.4 Analysis by ICP OES method . 28
DD.5 Reporting . 28
Annex EE (normative) FPD: Main steps for Mass Balance . 29
EE.1 Preparation of the reference batch. 29
EE.2 Treatment of the reference batch for a manual treatment process . 29
EE.3 Calculation for manual treatment . 29
EE.3.1 Description of the parameters . 29
EE.3.2 Formulas . 29
EE.4 Calculation and validation for mechanical treatment . 30
EE.4.1 Description of the parameters . 30
EE.4.2 Formulas . 30
Figure 102 — Relation between parameters described in EE.4.1 and formula’s given in EE.4.2 . 30
Annex FF (normative) FPD: Analysis of the de-polluted physically sma
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