EN IEC 62321-3-1:2026

SLOVENSKI STANDARD
01-september-2026
Nadomešča:
SIST EN 62321-3-1:2014
Določanje nekaterih snovi v elektrotehničnih izdelkih - 3-1. del: Presejalno
določanje vsebnosti svinca, živega srebra, kadmija, celotnega kroma, celotnega
broma, celotnega fosforja, celotnega klora, celotnega kositra in celotnega
antimona z rentgensko fluorescenčno spektrometrijo
Determination of certain substances in electrotechnical products - Part 3-1: Screening -
Lead, mercury, cadmium, total chromium total bromine, total phosphorus, total chlorine,
total tin and total antimony content by X-ray fluorescence spectrometry
Verfahren zur Bestimmung von bestimmten Substanzen in Produkten der Elektrotechnik
- Teil 3-1: Screening - Gehalt an Blei, Quecksilber, Cadmium, Gesamtchrom,
Gesamtbrom, Gesamtphosphor, Gesamtchlor, Gesamtzinn und Gesamtantimon durch
Röntgenfluoreszenz-Spektrometrie
Détermination de certaines substances dans les produits électrotechniques - Partie 3-1:
Détection de la présence de plomb, mercure, cadmium, chrome total, brome total,
phosphore total, chlore total, étain total et antimoine total par la spectrométrie de
fluorescence x
Ta slovenski standard je istoveten z: EN IEC 62321-3-1:2026
ICS:
29.020 Elektrotehnika na splošno Electrical engineering in
general
31.020 Elektronske komponente na Electronic components in
splošno general
71.040.50 Fizikalnokemijske analitske Physicochemical methods of
metode analysis
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN IEC 62321-3-1

NORME EUROPÉENNE
EUROPÄISCHE NORM July 2026
ICS 13.020.01; 43.040.10 Supersedes EN 62321-3-1:2014
English Version
Determination of certain substances in electrotechnical products
- Part 3-1: Screening - Lead, mercury, cadmium, total chromium,
total bromine, total phosphorus, total chlorine, total tin and total
antimony content by X-ray fluorescence spectrometry
(IEC 62321-3-1:2026)
Détermination de certaines substances dans les produits Verfahren zur Bestimmung von bestimmten Substanzen in
électrotechniques - Partie 3-1: Détection - Présence de Produkten der Elektrotechnik - Teil 3-1: Screening - Gehalt
plomb, mercure, cadmium, chrome total, brome total, an Blei, Quecksilber, Cadmium, Gesamtchrom,
phosphore total, chlore total, étain total et antimoine total Gesamtbrom, Gesamtphosphor, Gesamtchlor, Gesamtzinn
par la spectrométrie de fluorescence X und Gesamtantimon durch Röntgenfluoreszenz-
(IEC 62321-3-1:2026) Spektrometrie
(IEC 62321-3-1:2026)
This European Standard was approved by CENELEC on 2026-06-10. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Türkiye and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2026 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 62321-3-1:2026 E

European foreword
The text of document 111/871/FDIS, future edition 2 of IEC 62321-3-1, prepared by TC 111
"Environmental standardization for electrical and electronic products and systems" was submitted to
the IEC-CENELEC parallel vote and approved by CENELEC as EN IEC 62321-3-1:2026.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2027-07-31
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2029-07-31
document have to be withdrawn
This document supersedes EN 62321-3-1:2014 and all of its amendments and corrigenda (if any).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
This document has been prepared under a standardization request addressed to CENELEC by the
European Commission. The Standing Committee of the EFTA States subsequently approves these
requests for its Member States.
Any feedback and questions on this document should be directed to the users’ national committee. A
complete listing of these bodies can be found on the CENELEC website.
Endorsement notice
The text of the International Standard IEC 62321-3-1:2026 was approved by CENELEC as a
European Standard without any modification.
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1  Where an International Publication has been modified by common modifications, indicated by (mod),
the relevant EN/HD applies.
NOTE 2  Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cencenelec.eu.
Publication Year Title EN/HD Year
IEC 62321-1 - Determination of certain substances in EN 62321-1 -
electrotechnical products - Part 1:
Introduction and overview
IEC 62321-2 - Determination of certain substances in EN IEC 62321-2 -
electrotechnical products - Part 2:
Disassembly, disjointment and mechanical
sample preparation
ISO/IEC Guide 98-1 - Guide to the expression of uncertainty in - -
measurement – Part 1: Introduction

IEC 62321-3-1 ®
Edition 2.0 2026-05
INTERNATIONAL
STANDARD
HORIZONTAL STANDARD
Determination of certain substances in electrotechnical products -
Part 3-1: Screening - Lead, mercury, cadmium, total chromium, total bromine,
total phosphorus, total chlorine, total tin and total antimony content by X-ray
fluorescence spectrometry
ICS 13.020.01; 43.040.10 ISBN 978-2-8327-1223-8

IEC 62321-3-1:2026-05(en)
IEC 62321-3-1:2026 © IEC 2026
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 10
3 Terms, definitions and abbreviated terms . 10
3.1 Terms and definitions. 10
3.2 Abbreviated terms . 10
4 Principle . 11
4.1 Overview . 11
4.2 Principle of test . 11
4.3 Explanatory comments . 12
5 Apparatus, equipment and materials . 12
5.1 XRF spectrometer . 12
5.2 Materials and tools. 13
6 Reagents . 13
7 Sampling . 13
7.1 General . 13
7.2 Non-destructive approach . 13
7.3 Destructive approach . 13
8 Test procedure . 14
8.1 General . 14
8.2 Preparation of the spectrometer . 14
8.3 Test specimen . 16
8.4 Verification of spectrometer performance . 16
8.5 Tests . 17
8.6 Calibration . 17
9 Calculations. 18
10 Precision . 19
10.1 General . 19
10.2 Lead . 19
10.3 Mercury . 19
10.4 Cadmium . 20
10.5 Chromium . 20
10.6 Bromine . 20
10.7 Phosphorus, chlorine, tin, and antimony . 20
10.8 Repeatability statement for five tested substances sorted by type of tested
material . 20
10.9 Reproducibility statement for five tested substances sorted by type of tested
material . 23
11 Quality control . 26
11.1 Accuracy of calibration . 26
11.2 Control samples . 26
12 Special cases . 26
13 Test report . 27
Annex A (informative) Practical aspects of screening by X-ray fluorescence
spectrometry (XRF) and interpretation of the results . 28
IEC 62321-3-1:2026 © IEC 2026
A.1 Introductory remark . 28
A.2 Matrix and interference effects . 28
A.3 Interpretation of results (for regulated substances) . 29
A.4 Statistical data of the IIS2, IIS4, and IIS5 for the XRF method . 32
Annex B (informative) Practical examples of screening with XRF . 36
B.1 Introductory remark . 36
B.2 XRF instrumentation . 36
B.3 Factors affecting XRF results . 37
B.3.1 General . 37
B.3.2 Examples of screening with XRF . 37
Bibliography . 45

Figure B.1 – AC power cord, X-ray spectra of sampled sections . 38
Figure B.2 – RS232 cable and its X-ray spectra . 39
Figure B.3 – Cell phone charger shown partially disassembled . 39
Figure B.4 – PWB and cable of cell phone charger . 40
Figure B.5 – Analysis of a single solder joint on a PWB . 41
Figure B.6 – Spectra and results obtained on printed circuit board with two collimators . 42
Figure B.7 – Examples of substance mapping on PWBs . 43
Figure B.8 – SEM-EDX image of Pb free solder with small intrusions of Pb
(size = 30 µm). 44

Table 1 – Tested concentration ranges for lead in materials. 7
Table 2 – Tested concentration ranges for mercury in materials . 8
Table 3 – Tested concentration ranges for cadmium in materials . 8
Table 4 – Tested concentration ranges for total chromium in materials . 8
Table 5 – Tested concentration ranges for total bromine in materials . 8
Table 6 – Tested concentration ranges for total phosphorus in materials . 9
Table 7 – Tested concentration ranges for total chlorine in materials . 9
Table 8 – Tested concentration ranges for total tin in materials . 9
Table 9 – Tested concentration ranges for total antimony in materials . 9
a
Table 10 – Recommended X-ray lines for individual analytes . 15
Table 11 – Material: ABS (acrylonitrile butadiene styrene), as granules and plates . 21
Table 12 – Material: PE (low density polyethylene), as granules . 21
Table 13 – Material: PC/ABS (polycarbonate and ABS blend), as granules . 21
Table 14 – Material: HIPS (high impact polystyrene), as plate . 22
Table 15 – Material: PVC (polyvinyl chloride), as granules . 22
Table 16 – Material: Polyolefin, as granules . 22
Table 17 – Material: Crystal glass . 22
Table 18 – Material: Glass . 22
Table 19 – Material: Lead-free solder, chips . 22
Table 20 – Material: Si/Al Alloy, chips . 22
Table 21 – Material: Aluminum casting alloy, chips . 22
Table 22 – Material: PCB – Printed circuit board ground to less than 250 µm . 23
IEC 62321-3-1:2026 © IEC 2026
Table 23 – Material: different plastics materials, as plates . 23
Table 24 – Material: ABS (Acrylonitrile butadiene styrene), as granules and plates . 23
Table 25 – Material: PE (low density polyethylene), as granules . 24
Table 26 – Material: PC/ABS (Polycarbonate and ABS blend), as granules . 24
Table 27 – Material: HIPS (high impact polystyrene), as plate . 24
Table 28 – Material: PVC (polyvinyl chloride), as granules . 24
Table 29 – Material: Polyolefin, as granules . 24
Table 30 – Material: Crystal glass . 24
Table 31 – Material: Glass . 25
Table 32 – Material: Lead-free solder, chips . 25
Table 33 – Material: Si/Al alloy, chips . 25
Table 34 – Material: Aluminum casting alloy, chips . 25
Table 35 – Material: PCB – Printed circuit board ground to less than 250 µm . 25
Table 36 – Material: different plastics materials, as plates . 25
Table A.1 – Effect of matrix composition on limits of detection of some controlled
elements . 29
Table A.2 –Screening limits in mg/kg for regulated elements in various matrices . 30
Table A.3 – Statistical data from IIS2 . 33
Table A.4 – Statistical data from IIS4 . 34
Table A.5 –Statistical data from IIS5 . 35
Table B.1 – Selection of samples for analysis of AC power cord . 37
Table B.2 – Selection of samples (testing locations) for analysis after visual inspection
– Cell phone charger . 40
Table B.3 – Results of XRF analysis at spots (1) and (2) as shown in Figure B.7 . 42

IEC 62321-3-1:2026 © IEC 2026
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
Determination of certain substances in electrotechnical products -
Part 3-1: Screening - Lead, mercury, cadmium, total chromium, total
bromine, total phosphorus, total chlorine, total tin and total antimony
content by X-ray fluorescence spectrometry

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co‑operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as "IEC Publication(s)"). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non‑governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence between
any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) IEC draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). IEC takes no position concerning the evidence, validity or applicability of any claimed patent rights in
respect thereof. As of the date of publication of this document, IEC had not received notice of (a) patent(s), which
may be required to implement this document. However, implementers are cautioned that this may not represent
the latest information, which may be obtained from the patent database available at https://patents.iec.ch. IEC
shall not be held responsible for identifying any or all such patent rights.
IEC 62321‑3‑1 has been prepared by IEC technical committee 111: Environmental
standardization for electrical and electronic products and systems. It is an International
Standard.
This second edition cancels and replaces the first edition published in 2013 and the first edition
of IEC 62321 published in 2008. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
editions of IEC 62321‑3‑1:2013 and IEC 62321:2008:
a) This second edition of IEC 62321‑3‑1 includes the analysis of additional elements as
indicators for additional substances. The selection is based on IEC TR 62936:2016. There
are also comments about using the same methodology for screening for content of critical
raw materials (CRMs).
IEC 62321-3-1:2026 © IEC 2026
This document has been given the status of a horizontal document in accordance with the
ISO/IEC Directives, Part 1.
The text of this International Standard is based on the following documents:
Draft Report on voting
111/871/FDIS 111/887/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
Future parts in the IEC 62321 series will gradually replace the corresponding clauses in
IEC 62321:2008. Until such time as all parts are published, however, IEC 62321:2008 remains
valid for those clauses not yet re‑published as a separate part.
The language used for the development of this International Standard is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 62321 series, published under the general title Determination of
certain substances in electrotechnical products, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
– reconfirmed,
– withdrawn, or
– revised.
IEC 62321-3-1:2026 © IEC 2026
INTRODUCTION
The widespread use of electrotechnical products has drawn increased attention to their impact
on the environment. In many countries this has resulted in the adaptation of regulations
affecting wastes, substances and energy use of electrotechnical products.
The use of certain substances (e.g. lead (Pb), cadmium (Cd) and polybrominated diphenyl
ethers (PBDEs)) in electrotechnical products, is a source of concern in current and proposed
regional legislation. With the actual revision the following elements are added: phosphorus (P),
assuming the source of P is related to TCEP, Trixylyl-phosphate, chlorine (Cl), assuming the
source of Cl is related to SCCP, TCEP, TBTC, tin (Sn), assuming the source of Sn is related to
restricted organo-tin compounds, antimony (Sb), assuming the source of Sb is related to
Pyrochlore, antimony lead yellow.
The purpose of the IEC 62321 series is therefore to provide test methods that will allow the
electrotechnical industry to determine the levels of certain substances of concern in
electrotechnical products on a consistent global basis.
The first edition of IEC 62321:2008 was a 'stand alone' standard that included an introduction,
an overview of test methods, a mechanical sample preparation as well as various test method
clauses.
The first edition of IEC 62321‑3‑1 was a partial replacement of IEC 62321:2008, forming a
structural revision and generally replacing Clauses 6 and Annex D.

IEC 62321-3-1:2026 © IEC 2026
1 Scope
This part of IEC 62321 describes the screening analysis of substances, specifically lead (Pb),
mercury (Hg), cadmium (Cd), total chromium (Cr), total bromine (Br), total phosphorus (P),
assuming the source of P is related to TCEP (CAS 115‑96‑8), Trixylyl‑phosphate
(CAS 25155‑23‑1), total chlorine (Cl), assuming the source of Cl is related to SCCP
(CAS 85535‑84‑8), TCEP (CAS 115‑96‑8) , TBTC (CAS 1461‑22‑9), total tin (Sn), assuming the
source of Sn is related to restricted organo‑tin compounds, total antimony (Sb), assuming the
source of Sb is related to Pyrochlore, and antimony lead yellow (CAS 8012‑00‑8) in uniform
materials found in electrotechnical products, using the analytical technique of X‑ray
fluorescence (XRF) spectrometry.
The same methodology can also be used for screening of substances discussed as critical raw
materials in various countries (for example currently discussed in the EU: antimony (Sb), baryte,
bismuth (Bi), cobalt (Co), fluorspar, gallium (Ga), germanium (Ge), hafnium (Hf), indium (In),
magnesium (Mg), niobium (Nb), phosphorus (P), scandium (Sc), tantalum (Ta), tungsten (W),
vanadium (V), platinum group metals, heavy rare earth elements, light rare earth elements).
NOTE From EU information on critical raw materials [1] raw materials are crucial to Europe's economy. They form
a strong industrial base, producing a broad range of goods and applications used in everyday life and modern
technologies. Reliable and unhindered access to certain raw materials is a growing concern within the EU and across
the globe. To address this challenge, the European Commission has created a list of critical raw materials (CRMs)
for the EU, which is subject to a regular review and update. CRMs combine raw materials of high importance to the
EU economy and of high risk associated with their supply.
The method is applicable to plastics, metals and ceramic materials. The test method can be
applied to raw materials, individual materials taken from products and "homogenized" mixtures
of more than one material. Screening of a sample is performed using any type of XRF
spectrometer, provided it has the performance characteristics specified in this test method. Not
all types of XRF spectrometers are suitable for all sizes and shapes of sample. The appropriate
spectrometer design will be selected with care for the task concerned.
The performance of this test method has been tested for the following substances in various
media and within the concentration ranges as specified in Table 1 to Table 5. During an IIS
(international interlaboratory study) the feasibility of the test method to use for the added
elements was tested. The results are listed in Table 6 to Table 10.
Table 1 – Tested concentration ranges for lead in materials
Substance/
Lead
element
Medium/material tested
Unit of
a b d
Low- Al, Lead- Ground Crystal Polyolefin
Parameter ABS PE PVC
measure
c
alloy Al-Si free glass
PWB
steel alloy solder
Concentration
15,7 14 190 22 000 390
or 240
e
mg/kg to to 30 to 174 to to 380 to 640
concentration 000
954 108 930 23 000 665
range tested
a
Acrylonitrile butadiene styrene.
b
Polyethylene.
c
Printed wiring board.
d
Polyvinyl chloride.
e
This lead concentration was not detectable by instruments participating in tests.

___________
Numbers in square brackets refer to the Bibliography.
IEC 62321-3-1:2026 © IEC 2026
Table 2 – Tested concentration ranges for mercury in materials
Substance/element Mercury
Medium/material tested
Parameter Unit of measure
a b
ABS PE
Concentration or concentration range tested mg/kg 100 to 942 4 to 25
a
Acrylonitrile butadiene styrene.
b
Polyethylene.
Table 3 – Tested concentration ranges for cadmium in materials
Substance/element Cadmium
Medium/material tested
Unit of
Parameter
measure
a b
Lead-free solder
ABS PE
c
Concentration or concentration range tested mg/kg 10 to 183 19,6 to 141
a
Acrylonitrile butadiene styrene.
b
Polyethylene.
c
This cadmium concentration was not detectable by instruments participating in tests.

Table 4 – Tested concentration ranges for total chromium in materials
Substance/element Chromium
Medium/material tested
Parameter Unit of measure
Low-alloy
a b
Al, Al-Si alloy Glass
ABS PE
steel
Concentration or
concentration range mg/kg 16 to 944 16 to 115 240 130 to 1 100 94
tested
a
Acrylonitrile butadiene styrene.
b
Polyethylene.
Table 5 – Tested concentration ranges for total bromine in materials
Substance/element Bromine
Medium/material tested
Unit of
Parameter
measure
c a d b
HIPS , ABS PC/ABS PE
Concentration or concentration range tested mg/kg 25 to 118 400 800 to 2 400 96 to 808
a
Acrylonitrile butadiene styrene.
b
Polyethylene.
c
High impact polystyrene.
d
Polycarbonate and ABS blend.
IEC 62321-3-1:2026 © IEC 2026
Table 6 – Tested concentration ranges for total phosphorus in materials
Substance/element Phosphorus
Medium/material tested
Parameter Unit of measure
plastics
Concentration or concentration range tested mg/kg 90 to 8 300

Table 7 – Tested concentration ranges for total chlorine in materials
Substance/element Chlorine
Medium/material tested
Parameter Unit of measure
plastics
Concentration or concentration range tested mg/kg 100 to 380

Table 8 – Tested concentration ranges for total tin in materials
Substance/element Tin
Medium/material tested
Parameter Unit of measure
plastics
Concentration or concentration range tested mg/kg 30 to 110

Table 9 – Tested concentration ranges for total antimony in materials
Substance/element Antimony
Medium/material tested
Parameter Unit of measure
plastics
Concentration or concentration range tested mg/kg 190 to 380

These substances in similar media outside of the specified concentration ranges can be
analysed according to this test method; however, the performance has not been established for
this document.
WARNING – Persons using this International Standard should be familiar with normal
laboratory practice. This standard does not purport to address all of the safety problems,
if any, associated with its use. It is the responsibility of the user to establish appropriate
safety and health practices and to ensure compliance with any national regulatory
conditions.
This document is a basic environment horizontal publication focusing on test methods and is
primarily intended for use by committees in the preparation of publications within the area of
environment in accordance with the principles laid down in IEC Guide 123. Wherever applicable,
it is the responsibility of committees to make use of environment basic publications in the
preparation of their environment group and product publications. Committees can apply this
document directly to products when they do not develop a product publication in the area of
environment.
IEC 62321-3-1:2026 © IEC 2026
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 62321‑1, Determination of certain substances in electrotechnical products ‑ Part 1:
Introduction and overview
IEC 62321‑2, Determination of certain substances in electrotechnical products ‑ Part 2:
Disassembly, disjointment and mechanical sample preparation
ISO/IEC Guide 98‑1, Guide to the expression of uncertainty in measurement ‑ Part 1:
Introduction
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 62321‑1 and
IEC 62321‑2 apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
– IEC Electropedia: available at https://www.electropedia.org/
– ISO Online browsing platform: available at https://www.iso.org/obp
3.2 Abbreviated terms
CRM Certified reference material
CRMs Critical raw materials
HBCDD Hexabromocyclododecane
MCCP Medium chain chlorinated paraffins
PBB Polybrominated biphenyl
PBDE Polybrominated diphenyl ether
SCCP Short chain chlorinated paraffins
TBBPA Tetrabromobisphenol A
TBTC Tributyltin chloride
TCEP Tris(2-chloroethyl) phosphate
IEC 62321-3-1:2026 © IEC 2026
4 Principle
4.1 Overview
The concept of "screening" has been developed to reduce the amount of testing. Executed as
a predecessor to any other test analysis, the main objective of screening is to quickly determine
whether the screened part or section of a product:
– contains a certain substance at a concentration significantly higher than its value or values
chosen as criterion, and therefore can be deemed unacceptable;
– contains a certain substance at a concentration significantly lower than its value or values
chosen as criterion, and therefore can be deemed acceptable;
– contains a certain substance at a concentration so close to the value or values chosen as
criterion that when all possible errors of measurement and safety factors are considered,
no conclusive decision can be made about the acceptable absence or presence of a certain
substance and, therefore, a follow-up action can be required, including further analysis
using verification testing procedures.
For the screening analysis of critical raw materials only the analysis results are important, there
is no interpretation with regards to a maximum threshold value required.
This test method is designed specifically to screen for lead, mercury, cadmium, chromium,
bromine, phosphorus, chlorine, tin and antimony (Pb, Hg, Cd, Cr, Br, P, Cl, Sn, Sb) plus
elements required for screening for content of critical raw materials in uniform materials, which
occur in most electrotechnical products. Under typical circumstances, XRF spectrometry
provides information on the total quantity of each element present in the sample but does not
identify compounds or valence states of the elements. Therefore, special attention shall be paid
when screening for chromium, bromine, phosphorus, chlorine, tin and antimony, where the
result will reflect only the total chromium, total bromine, total phosphorus, total chlorine, total
tin and total antimony present. The presence of Cr(VI) or the brominated flame retardants PBB
or PBDE or TBBPA or HBCDD, or TCEP, Trixylyl-phosphate, red phosphorus, SCCP or MCCP,
TBTC, restricted organo-tin compounds, Pyrochlore, or antimony lead yellow shall be confirmed
by a verification test procedure that identify compounds or valence states of the elements. When
applying this method to electronics "as received", which, by the nature of their design, are not
uniform, care shall be taken in interpreting the results. Similarly, the analysis of Cr in conversion
coatings can be difficult due to the presence of Cr in substrate material. It also can be difficult
because of insufficient sensitivity for Cr in typically very thin (typically 200 nm to 600 nm)
conversion coating layers.
Screening analysis can be carried out by one of two means:
– non-destructively - by directly analysing the sample "as received";
– destructively - by applying one or more sample preparation steps prior to analysis.
In the latter case, the user shall apply the procedure for sample preparation as described in
IEC 62321‑2. This test method will guide the user in choosing the proper approach to sample
presentation.
4.2 Principle of test
The representative specimen of the object tested is placed in the measuring chamber or over
the measuring aperture of the X-ray fluorescence spectrometer. Alternatively, a measuring
window or aperture of a handheld, portable XRF analyser is placed flush against the surface of
the object tested. The analyser illuminates the specimen for a preselected measurement time
with a beam of X-rays which in turn excite characteristic X-rays of elements in the specimen.
The intensities of these characteristic X-rays are measured and converted to mass fractions or
concentrations of the elements in the tested sample using a calibration implemented in the
analyser.
IEC 62321-3-1:2026 © IEC 2026
The fundamentals of XRF spectrometry, as well as practical aspects of sampling for XRF, are
covered in detail in [2], [3], and [4].
4.3 Explanatory comments
To achieve its purpose, this test method shall provide rapid, unambiguous identification of the
elements of interest. The test method shall provide at least a level of accuracy that is sometimes
described as semi-quantitative, i.e. the relative uncertainty of a result is typically 30 % or better
at a defined level of confidence of 68 %. Some users can tolerate higher relative uncertainty,
depending on their needs. This level of performance allows the user to sort materials for
additional testing. The overall goal is to obtain information for risk management purposes.
This test method is designed to allow XRF spectrometers of all designs, complexity and
capability to contribute screening analyses. However, the capabilities of different XRF
spectrometers cover such a wide range that some will be relatively inadequate in their selectivity
and sensitivity while others will be more than adequate. Some spectrometers will allow easy
measurement of a wide range of sample shapes and sizes, while others, especially research-
grade WDXRF units, will be very inflexible in terms of test portions.
NOTE One technical parameter for ED-XRF instruments can be for example the detector resolution. A resolution of
better than 250 eV (at Mn K ) has been found suitable.
α
Given the above level of required performance and the wide variety of XRF spectrometers
capable of contributing useful measurements, the requirements for the specification of
procedures must be defined carefully. As guidance the information listed in Table A.2 can be
used.
This test method is based on the concept of a performance-based measurement system.
Apparatus, sample preparation and calibration are specified in this document in relatively
general terms. It is the responsibility of the user to document all procedures developed in the
laboratory that uses the test method. The user shall establish a written procedure for all cases
denoted in this method by the term "work instructions".
The user of this test method shall document all relevant spectrometer and method performance
parameters.
For additional practical aspects of screening by X-ray fluorescence spectrometry (XRF) and
interpretation of the results please also refer to Annex A. For practical examples of screening
with XRF refer to Annex B.
WARNING 1 Persons using the XRF test method shall be trained in the use
...