ENV 50219:1996
(Main)Description of the reliability test structures of the European mini test chip
Description of the reliability test structures of the European mini test chip
D116/196: TC 217 disbanded * D124/C049: Withdrawn
Description of the reliability test structures of the European mini test chip
General Information
- Status
- Withdrawn
- Publication Date
- 18-Feb-1996
- Withdrawal Date
- 30-Jun-2005
- Technical Committee
- CLC/SR 93 - Design automation
- Drafting Committee
- IEC/TC 93 - IEC_TC_93
- Parallel Committee
- IEC/TC 93 - IEC_TC_93
- Current Stage
- 9960 - Withdrawal effective - Withdrawal
- Start Date
- 01-Jul-2005
- Completion Date
- 01-Jul-2005
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Frequently Asked Questions
ENV 50219:1996 is a standardization document published by CLC. Its full title is "Description of the reliability test structures of the European mini test chip". This standard covers: D116/196: TC 217 disbanded * D124/C049: Withdrawn
D116/196: TC 217 disbanded * D124/C049: Withdrawn
ENV 50219:1996 is classified under the following ICS (International Classification for Standards) categories: 31.200 - Integrated circuits. Microelectronics; 35.240 - Applications of information technology. The ICS classification helps identify the subject area and facilitates finding related standards.
ENV 50219:1996 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
SLOVENSKI STANDARD
01-september-2002
Description of the reliability test structures of the European mini test chip
Description of the reliability test structures of the European mini test chip
Ta slovenski standard je istoveten z: ENV 50219:1996
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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