EN 60747-16-5:2013

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Polprevodniški elementi - 16-5. del: Mikrovalovna integrirana vezja - Oscilatorji (IEC 60747-16-5:2013)Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators31.200Integrirana vezja, mikroelektronikaIntegrated circuits. Microelectronics31.080.01Polprevodniški elementi (naprave) na splošnoSemiconductor devices in generalICS:Ta slovenski standard je istoveten z:EN 60747-16-5:2013SIST EN 60747-16-5:2014en01-maj-2014SIST EN 60747-16-5:2014SLOVENSKI
STANDARD
EUROPEAN STANDARD EN 60747-16-5 NORME EUROPÉENNE
EUROPÄISCHE NORM September 2013
CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B - 1000 Brussels
© 2013 CENELEC -
All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60747-16-5:2013 E
ICS 31.080.99
English version
Semiconductor devices -
Part 16-5: Microwave integrated circuits -
Oscillators (IEC 60747-16-5:2013)
Dispositifs à semiconducteurs -
Partie 16-5: Circuits intégrés hyperfréquences -
Oscillateurs (CEI 60747-16-5:2013)
Halbleiterbauelemente -
Teil 16-5: Integrierte Mikrowellenschaltkreise -
Oszillatoren (IEC 60747-16-5:2013)
This European Standard was approved by CENELEC on 2013-07-24. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.
Foreword The text of document 47E/452/FDIS, future edition 1 of IEC 60747-16-5, prepared by SC 47E, "Discrete semiconductor devices", of IEC TC 47, "Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 60747-16-5:2013. The following dates are fixed: • latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2014-04-24 • latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2016-07-24
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 60747-16-5:2013 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following note has to be added for the standard indicated: IEC 60679-1:2007 NOTE
Harmonized as EN 60679-1:2007 (not modified).
- 3 - EN 60747-16-5:2013
Annex ZA
(normative)
Normative references to international publications with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
NOTE
When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.
Publication Year Title EN/HD Year
IEC 60617 Data base Graphical symbols for diagrams - -
IEC 60747-1 + corr. August
+ A1 2006 2008 2010 Semiconductor devices -
Part 1: General - -
IEC 60747-4 2007 Semiconductor devices - Discrete devices -
Part 4: Microwave diodes and transistors - -
IEC 60747-16-3 + A1 2002 2009 Semiconductor devices -
Part 16-3: Microwave integrated circuits - Frequency converters EN 60747-16-3 + A1 2002 2009
IEC 61340-5-1 - Electrostatics -
Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements EN 61340-5-1 -
IEC/TR 61340-5-2 - Electrostatics -
Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide CLC/TR 61340-5-2 -
IEC 60747-16-5 Edition 1.0 2013-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Semiconductor devices –
Part 16-5: Microwave integrated circuits – Oscillators
Dispositifs à semiconducteurs –
Partie 16-5: Circuits intégrés hyperfréquences – Oscillateurs
INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE X ICS 31.080.99 PRICE CODE CODE PRIX ISBN 978-2-83220-827-4
– 2 – 60747-16-5  IEC:2013 CONTENTS FOREWORD . 6 1 Scope . 8 2 Normative references . 8 3 Terms and definitions . 8 4 Essential ratings and characteristics . 11 4.1 General requirements . 11 4.1.1 Circuit identification and types . 11 4.1.2 General function description . 11 4.1.3 Manufacturing technology . 11 4.1.4 Package identification . 11 4.2 Application description . 11 4.2.1 Conformance to system and/or interface information . 11 4.2.2 Overall block diagram . 11 4.2.3 Reference data . 11 4.2.4 Electrical compatibility . 12 4.2.5 Associated devices . 12 4.3 Specification of the function . 12 4.3.1 Detailed block diagram – Functional blocks . 12 4.3.2 Identification and function of terminals . 12 4.3.3 Function description . 13 4.4 Limiting values (absolute maximum rating system) . 13 4.4.1 Requirements . 13 4.4.2 Electrical limiting values . 14 4.4.3 Temperatures . 14 4.5 Operating conditions (within the specified operating temperature range) . 15 4.6 Electrical characteristics . 15 4.7 Mechanical and environmental ratings, characteristics and data . 16 4.8 Additional information . 16 5 Measuring methods . 16 5.1 General . 16 5.1.1 General precautions . 16 5.1.2 Characteristic impedance . 17 5.1.3 Handling precautions . 17 5.1.4 Types . 17 5.2 Oscillation frequency (fosc) . 17 5.2.1 Purpose . 17 5.2.2 Circuit diagram . 17 5.2.3 Principle of measurement . 17 5.2.4 Circuit description and requirements . 17 5.2.5 Precautions to be observed . 17 5.2.6 Measurement procedure . 18 5.2.7 Specified conditions . 18 5.3 Output power (Po,osc) . 18 5.3.1 Purpose . 18 5.3.2 Circuit diagram . 18 5.3.3 Principle of measurement . 18 SIST EN 60747-16-5:2014

60747-16-5  IEC:2013 – 3 – 5.3.4 Circuit description and requirements . 18 5.3.5 Precautions to be observed . 18 5.3.6 Measurement procedure . 18 5.3.7 Specified conditions . 18 5.4 Phase noise (L (f)) . 19 5.4.1 Purpose . 19 5.4.2 Measuring methods . 19 5.5 Tuning sensitivity (Sf,v) . 24 5.5.1 Purpose . 24 5.5.2 Circuit diagram . 24 5.5.3 Principle of measurement . 24 5.5.4 Circuit description and requirements . 24 5.5.5 Precautions to be observed . 24 5.5.6 Measurement procedure . 24 5.5.7 Specified conditions . 24 5.6 Frequency pushing (fosc,push) . 24 5.6.1 Purpose . 24 5.6.2 Circuit diagram . 25 5.6.3 Principle of measurement . 25 5.6.4 Circuit description and requirements . 25 5.6.5 Precautions to be observed . 25 5.6.6 Measurement procedure . 25 5.6.7 Specified conditions . 25 5.7 Frequency pulling (fosc,pull) . 25 5.7.1 Purpose . 25 5.7.2 Circuit diagram . 25 5.7.3 Principle of measurement . 26 5.7.4 Circuit description and requirements . 26 5.7.5 Precautions to be observed . 26 5.7.6 Measurement procedure . 26 5.7.7 Specified conditions . 27 5.8 n-th order harmonic distortion ratio (Pnth/P1) . 27 5.8.1 Purpose . 27 5.8.2 Circuit diagram .
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